TY - CONF A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Gesatzke, Wolfgang A1 - Scholl, A. A1 - Kilcoyne, A. D. A1 - Koprinarov, I. A1 - Ade, H. A1 - Hitchcock, A. P. A1 - Schulz, H. A1 - Scheibe, H.-J. ED - Tamura, L. S. T1 - Spectromicroscopy with inhomogeneous ta - C samples PY - 2003 UR - http://repositories.cdlib.org/lbnl/LBNL-52519/ SP - 1 EP - 3(?) AN - OPUS4-4694 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Steers, E.B.M. A1 - Hoffmann, V. A1 - Unger, Wolfgang A1 - Paatsch, Wolfgang A1 - Wetzig, K. T1 - Influence of hydrogen on the analytical figures of merit of glow discharge optical emission spectroscopy - friend or foe? PY - 2003 DO - https://doi.org/10.1039/b305384a SN - 0267-9477 SN - 1364-5544 VL - 18 SP - 521 EP - 526 PB - Royal Society of Chemistry CY - London AN - OPUS4-2290 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Streeck, C. A1 - Glamsch, Stephan A1 - Ehlert, Christopher A1 - Lippitz, Andreas A1 - Nutsch, A. A1 - Kulak, N. A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Quantification of silane molecules on oxidized silicon: Are there options for a traceable and absolute determination? N2 - Organosilanes are used routinely to functionalize various support materials for further modifications. Nevertheless, reliable quantitative information about surface functional group densities after layer formation is rarely available. Here, we present the analysis of thin organic nanolayers made from nitrogen containing silane molecules on naturally oxidized silicon wafers with reference-free total reflection X-ray fluorescence (TXRF) and X-ray photoelectron spectroscopy (XPS). An areic density of 2−4 silane molecules per nm2 was calculated from the layer’s nitrogen mass deposition per area unit obtained by reference-free TXRF. Complementary energy and angle-resolved XPS (ER/ARXPS) in the Si 2p core-level region was used to analyze the outermost surface region of the organic (silane layer)−inorganic (silicon wafer) interface. Different coexisting silicon species as silicon, native silicon oxide, and silane were identified and quantified. As a result of the presented proof-of-concept, absolute and traceable values for the areic density of silanes containing nitrogen as intrinsic marker are obtained by calibration of the XPS methods with reference-free TXRF. Furthermore, ER/AR-XPS is shown to facilitate the determination of areic densities in (mono)layers made from silanes having no heteroatomic marker other than silicon. After calibration with reference-free TXRF, these areic densities of silane molecules can be determined when using the XPS component intensity of the silane’s silicon atom. PY - 2015 DO - https://doi.org/10.1021/acs.analchem.5b02846 SN - 0003-2700 SN - 1520-6882 VL - 87 IS - 19 SP - 10117 EP - 10124 PB - American Chemical Society CY - Washington, DC AN - OPUS4-34796 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Traceability of PDMS on TiO2 and HDPE substrates by a multi analytical approach T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Fabrication, microscopic and spectroscopic characterization of planar, nanopatterned,multi-metallic samples C T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34809 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Determination of lateral resolution and field of view in imaging and small area surface chemical analysis: Reference materials and standardization T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34810 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OBERFLÄCHEN- UND GRENZFLÄCHENANALYTIK MIT DEN VERFAHREN PHOTOELEKTRONEN-, AUGER-ELEKTRONENSPEKTROSKOPIE UND SEKUNDÄRIONEN-MASSENSPEKTROMETRIE T2 - ZVO-Oberflächentage Berlin 2015 CY - Berlin DA - 2015-09-24 PY - 2015 AN - OPUS4-34817 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Programmable ordered multiayers of nanometer-sized macrocycles and switchable rotaxanes on solid support T2 - Workshop "Koordinationsnetzwerke als Bausteine für Funktionssysteme" CY - Schloss Reisenburg, Günzburg DA - 2015-06-02 PY - 2015 AN - OPUS4-34819 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 13th Meeting (2014/15) T2 - CCQM Plenary Meeting, BIPM CY - Paris, Frankreich DA - 2015-04-20 PY - 2015 AN - OPUS4-34820 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Nietzold, Carolin A1 - Weise, Matthias A1 - Unger, Wolfgang A1 - Alnabulsi, Saad A1 - Moulder, John T1 - XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam N2 - The growing interest in artificial bioorganic Interfaces as a platform for applications in emerging Areas as personalized medicine, clinical diagnostics, biosensing, biofilms, prevention of biofouling, and other fields of bioengineering is the origin of a need for in Detail multitechnique characterizations of such layers and interfaces. The in-depth analysis of biointerfaces is of special interest as the properties of functional bioorganic coatings can be dramatically affected by in-depth variations of composition. In worst cases, the functionality of a device produced using such coatings can be substantially reduced or even fully lost. KW - XPS KW - Ar gas cluster gun KW - Depth profiling KW - Bioorganic film PY - 2016 UR - http://scitation.aip.org/content/avs/journal/bip/11/2/10.1116/1.4948341 DO - https://doi.org/10.1116/1.4948341 SN - 1934-8630 VL - 11 IS - 2 SP - 029603-1 EP - 029603-5 PB - American Vacuum Society CY - New York AN - OPUS4-36218 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales N2 - CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. The Surface Analysis Working Group (SAWG) has been formally founded in 2003. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology. Following the 2015 meeting of the CCQM, the pilot study CCQM-P130 “WD and ED Electron Probe Micro Analysis on Au-Cu alloys” lead by BAM&NIST has been finalized. The Key Comparison K-129 “Measurement of atomic fractions in Cu(In,Ga)Se2 Films” lead by KRISS has made substantial progress and is about to be finalized. The new Key Comparison K-136 on “BET specific surface of ” lead by UNIIM&BAM has made strong progress in 2015 and will be finished in 2016. T2 - 22nd Meeting of CCQM CY - Sevres, France DA - 21.4.16 KW - Surface chemical analysis KW - Metrology PY - 2016 AN - OPUS4-35865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - 2-D materials standardization N2 - The implementation of new 2-D materials based technologies in production processes requires the development of quality management tools. These have to be underpinned by appropriate measurements. Consequently there is a need for the development of the metrology for measurement methods, the development of certified reference materials (CRM) and finally standardization. This chain represents the ideal way to practically useful standards. The presentation will give an overview on the main players in the field and summarize the recent status of activities. At the highest level the metrology of chemical characterization of 2D materials is in the scope of the International Meter Convention, specifically the Consultative Committee for Amount of Substance: Metrology in Chemistry and Biology (CCQM). Pre-standardization is an activity field of the Versailles Project on Advanced Materials and Standards (VAMAS). Standardization is mainly addressed by addressed ISO Technical Committees. A summary on available CRMs relevant to the characterization of nano materials has been prepared by BAM. Examples from the work of BAM’s Division 6.1 “Surface Analysis and Interfacial Chemistry” showcasing the characterization of chemically modified graphene surfaces are given and specific needs for the development of metrology are addressed. In the discussion the audience is invited to define specific needs which will be streamlined to the respective bodies! T2 - Science-Industry-Workshop 2D Materials CY - EMPA Akademie, Dübendorf, Switzerland DA - 21.3.16 KW - Standardization KW - Graphene PY - 2016 AN - OPUS4-35866 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Glamsch, Stephan A1 - Ehlert, Christopher A1 - Lippitz, Andreas A1 - Kulak, N. A1 - Unger, Wolfgang T1 - Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon N2 - The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z95 of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) – inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS. KW - Synchrotron radiation XPS KW - Depth profiling KW - Silanes KW - Monolayer KW - Amines KW - Amides PY - 2016 DO - https://doi.org/10.1016/j.apsusc.2015.12.052 SN - 0169-4332 SN - 1873-5584 VL - 363 SP - 406 EP - 411 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-35262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bütefisch, S. A1 - Weimann, T. A1 - Busch, I. A1 - Danzebrink, H.-U. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Wirth, Thomas T1 - New reference material for imaging XPS (X-ray photoelectron spectroscopy) instrument characterization N2 - Reference materials without variations in topography are essential for the characterization of imaging XPS (X-ray Photoelectron Spectroscopy) Instruments. Therefore a new fabrication process for this kind of zero-topography reference material was developed at PTB and resulted in first prototypes. The fabrication process and first measurement results will be presented in this paper. T2 - Sensor 2015 - 17th International conference on sensors and measurement technology CY - Nuremberg, Germany DA - 19.05.2015 KW - Imaging XPS KW - Reference material KW - Topography free KW - Micro technology PY - 2015 SN - 978-3-9813484-8-4 DO - https://doi.org/10.5162/sensor2015/P7.1 SP - Chapter P7, 821 EP - 825 AN - OPUS4-33837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, P.-L. A1 - Unger, Wolfgang A1 - Dietrich, Paul A1 - Holländer, A. T1 - Innovative and established strategies for the surface analysis of nitrogen and oxygen-rich plasma polymer films by XPS: an introductory guide N2 - Nitrogen- and oxygen-based plasma polymer films are materials with a complex and partially elusive surface chemistry. We present an overview of innovative and established X-ray photoelectron spectroscopy (XPS)-based analysis strategies developed to elucidate the surface chemistry of such films. We focus on both experimental methods and data analysis strategies and include the following topics: high-resolution spectra curve fitting, aging, chemical derivatization, and depth profiling by angle- and energy-resolved XPS. KW - Chemical derivatization KW - Functional groups KW - Plasma polymerization KW - X-ray photoelectron spectroscopy PY - 2015 DO - https://doi.org/10.1002/ppap.201500115 SN - 1612-8850 SN - 1612-8869 VL - 12 IS - 9 SP - 953 EP - 967 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-35114 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Hidde, Gundula A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Plasma bromination of graphene for covalent bonding of organic molecules N2 - Plasma-chemical bromination applied to graphitic materials, in particular to highly ordered pyrolytic graphite is reviewed. The resulting bromination efficiency of the plasma-chemical treatment was subject of systematic process optimization. The plasma of elemental bromine vapour produced bromine concentrations on graphene surfaces of more than 30 % Br/C using either inductively or capacitively coupled low-pressure radio-frequency plasmas. Plasma brominated graphite surfaces have been studied by Near Edge X-ray Absorption Fine Structure, X-ray Photoelectron Spectroscopy, Atomic Force Microscopy and Scanning Electron Microscopy. The introduction of bromine into graphene-like graphite layers and its binding situation were investigated. To study the physical effect of the plasma bromination process, Kr plasma was also used because of its chemical inertness but similar atomic mass. Covering the samples with a Faraday cage or with a LiF window should help to differentiate between physical, chemical and radiation effects of the plasma. Bromination was assigned to radical or electrophilic addition of bromine onto fully substituted aromatic double bonds (sp² C) with exothermal reaction enthalpy. Low bromination shows a strong decay of aromatic double bonds, higher bromination percentage let disappear all aromatic rings. The formed C–Br bonds were well suited for efficient grafting of organic molecules by post-plasma wet-chemical nucleophilic substitution. This grafting onto the graphene surface was demonstrated using aminosilane and different diamines. The bromination of double bonds changes the hybridization of carbon atoms from plane sp² to tetrahedral sp³ hybridization. Thus, the plane topography of graphene is destroyed and the conductivity is lost. KW - Graphene KW - Bromination KW - Grafting of diamines KW - Plasma KW - Organic graphting PY - 2014 DO - https://doi.org/10.1007/s11090-013-9509-x SN - 0272-4324 VL - 34 SP - 621 EP - 645 PB - Plenum Publ. Corp. CY - New York, NY, USA AN - OPUS4-30575 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Investigation of silica nanoparticles by Auger electron spectroscopy (AES) N2 - High-priority industrial nanomaterials like SiO2, TiO2, and Ag are being characterized on a systematic basis within the framework of the EU FP7 research project NanoValid. Silica nanoparticles from an industrial source have been analyzed by Auger electron spectroscopy. Point, line, and map spectra were collected. Material specific and methodological aspects causing the special course of Auger line scan signals will be discussed. KW - Nanoparticles KW - Auger electron spectroscopy KW - Surface analysis PY - 2014 DO - https://doi.org/10.1002/sia.5378 SN - 0142-2421 SN - 1096-9918 VL - 46 IS - 10-11 SP - 952 EP - 956 PB - Wiley CY - Chichester AN - OPUS4-31604 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Ivanov-Pankov, S. A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Weigel, W. A1 - Unger, Wolfgang T1 - Functional group quantification on epoxy surfaces by chemical derivatization (CD)-XPS N2 - In this study, epoxy-terminated silicon oxide surfaces were chemically derivatized with trifluoroacetic anhydride (TFAA) and 4-(trifluoromethyl)-benzylamine (TFMBA) and analyzed by X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure spectroscopy and water contact angle measurements. TFAA was used for quantitative derivatization to determine the amount of reactive epoxy groups on these surfaces. Furthermore, epoxy-terminated surfaces were derivatized with TFMBA (a model compound for biomolecules with an amino linker) yielding secondary amines because of formation of covalent C–N bonds between TFMBA and the epoxy films. Fluorine being part of TFAA and TFMBA composition was used to follow the progress of the chemical derivatization reaction. Both derivatization agents – TFAA and TFMBA – gave comparable reaction yields of ~60% on epoxy silicon surfaces, whereas on epoxy glass slides, the derivatization yields were considerably lower (30–40%).The protocol for attachment of TFMBA (model compound) on epoxy-modified surfaces was adapted to (bio)molecules with an amino linker, e.g. carbohydrates to prepare carbohydrate-functionalized biointerfaces. KW - Biomolecular interfaces KW - Epoxy-functionalized surfaces KW - CD-XPS KW - Functional group quantification KW - Contact angle measurements PY - 2014 DO - https://doi.org/10.1002/sia.5433 SN - 0142-2421 SN - 1096-9918 VL - 46 IS - 10-11 SP - 668 EP - 672 PB - Wiley CY - Chichester AN - OPUS4-31605 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Stockmann, Jörg M. A1 - Senoner, Mathias A1 - Weimann, T. A1 - Bütefisch, S. A1 - Passiu, C. A1 - Spencer, N. D. A1 - Rossi, A. T1 - Introduction to lateral resolution and analysis area measurements in XPS N2 - Imaging and small-spot (small area) XPS have become increasingly important components of surface chemical analysis during the last three decades, and its use is growing. Some ambiguity in the use of terminology, understanding of concepts, and lack of appropriate reference materials leads to confusing and not always reproducible data. In this paper, it is shown that by using existing knowledge, appropriate test specimens, and standardized approaches, problems of comparability and such reproducibility issues recently observed for XPS data reported in the scientific literature can be overcome. The standardized methods of ISO 18516:2019, (i) the straight-edge, (ii) the narrow-line, and (iii) the grating method, can be used to characterize and compare the lateral resolution achieved by imaging XPS instruments and are described by reporting examples. The respective measurements are made using new test specimens. When running an XPS instrument in the small-spot (small area) mode for a quantitative analysis of a feature of interest, the question arises as to what contribution to the intensity originates from outside the analysis area. A valid measurement approach to control the intensity from outside the nominal analysis area is also described. As always, the relevant resolution depends on the specific question that needs to be addressed. The strengths and limitations of methods defining resolution are indicated. KW - Imaging XPS KW - Lateral resolution KW - Analysis area measurements KW - Small-spot XPS PY - 2020 DO - https://doi.org/10.1116/6.0000398 VL - 38 IS - 5 SP - 053206 AN - OPUS4-51394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, M. A1 - Stockmann, Jörg Manfred A1 - Fernandez, V. A1 - Fairley, N. A1 - Passiu, C. A1 - Spencer, N. D. A1 - Rossi, A. T1 - Summary of ISO/TC 201 International Standard ISO 18516:2019 Surface chemical analysis - Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres and its implementation for imaging laboratory X-ray photoelectron spectrometers (XPS) N2 - ISO 18516:2019 Surface chemical analysis—Determination of lateral resolution and sharpness in beam-based methods with a range from nanometres to micrometres revises ISO 18516:2006 Surface chemical analysis—Auger electron spectroscopy and X-ray photoelectron spectroscopy—Determination of lateral resolution. It implements three different methods delivering parameters useful to express the lateral resolution: (1) the straight edge method, (2) the narrow line method and (3) the grating method. The theoretical background of these methods is introduced in ISO/TR 19319:2013 Surface chemical analysis—Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods. The revised International Standard ISO 18516 delivers standardized procedures for the determination of the (1) effective lateral resolution by imaging of square-wave gratings, the (2) lateral resolution expressed as the parameter D12–88 characterizing the steepness of the sigmoidal edge spread function (ESF) determined by imaging a straight edge and (3) the lateral resolution expressed as the full width of half maximum of the line spread function (LSF), wLSF, determined by imaging a narrow line. The last method also delivers information on the shape of the LSF, which characterizes an individual imaging instrument. Finally, the implementation of all three standardized methods in the field of imaging laboratory X-ray photoelectron spectroscopy (XPS) is shortly presented. This part of the letter is based on the use of a new test sample developed at ETH Zurich, Switzerland. This test sample displays a micrometre scaled pattern motivated by the resolving power of recent imaging XPS instruments. KW - Grating method KW - Imaging AES KW - Imaging SIMS KW - Imaging XPS KW - Lateral resolution KW - Narrow line method KW - Noise in image KW - Resolution criterion KW - Straight edge method PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-536330 DO - https://doi.org/10.1002/sia.7025 SN - 1096-9918 VL - 54 IS - 4 SP - 320 EP - 327 PB - Wiley CY - Chichester AN - OPUS4-53633 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Improved quantitative XRF analysis of industrial thin film samples by calibration using thin film RMs certified by reference-free XRF enabling traceability to the SI N2 - Reference-free XRF is a SI traceable technique for the determination of the mass deposition (mass per unit area) of elements in films on the nano- and micro scale. The method is radiometrically calibrated instrumentation (PTB@BESSY II, Germany) and based on reliable knowledge of all relevant atomic fundamental, experimental and instrumental parameters. No calibration sample or reference materials are necessary. The approach had been validated in the CCQM-P140 pilot study and the K129 key comparison by determination of mole fractions in Cu(In,Ga)Se2 thin films. T2 - Annual Meeting of ISO TC 201 SC 10 XRR/XRF CY - Seoul, Korea DA - 12.10.2016 KW - Reference-free XRF KW - CIGS thin films PY - 2016 AN - OPUS4-38265 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Testing lateral resolution and field of view in imaging and small area analysis: reference materials and standardization N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. T2 - 7th International Symposium on Practical Surface Analysis(PSA-16) CY - Daejeon, Korea DA - 17.10.2016 KW - BAM L200 KW - SIMS KW - AES KW - XPS PY - 2016 AN - OPUS4-38266 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Schwarz, F. A1 - Heinrich, Thomas A1 - Kaufmann, J. O. A1 - Lippitz, Andreas A1 - Puttreddy, R. A1 - Rissanen, K. A1 - Schalley, C. A. T1 - Photocontrolled on-surface pseudorotaxane formation with well-ordered macrocycle multilayers N2 - The photoinduced pseudorotaxane formation between a photoresponsive axle and a tetralactam macrocycle was investigated in solution and on glass surfaces with immobilized multilayers of macrocycles. In the course of this reaction, a novel photoswitchable binding station with azobenzene as the photoswitchable unit and diketopiperazine as the binding station was synthesized and studied by NMR and UV/Vis spectroscopy. Glass surfaces have been functionalized with pyridine-terminated SAMs and subsequently withmultilayers of macrocycles through layer-by-layer self assembly. A preferred orientation of the macrocycles could be confirmed by NEXAFS spectroscopy. The photocontrolled Deposition of the axle into the surface-bound macrocycle-multilayers was monitored by UV/Vis spectroscopy and led to an increase of the molecular order, as indicated by more substantial linear dichroism effects in angle-resolved NEXAFS spectra. KW - Well-ordered macrocycle multilayers KW - XPS KW - NEXAFS PY - 2016 DO - https://doi.org/10.1002/chem.201603156 SN - 0947-6539 SN - 1521-3765 VL - 22 IS - 40 SP - 14383 EP - 14389 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-38270 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Pelster, A. A1 - Tyler, B.J. A1 - Kösgen, M. A1 - Kassenböhmer, R. A1 - Peterson, R.E. A1 - Stöver, M. A1 - Arlinghaus, H. F. T1 - Improved 3D-imaging of a sirolimus/probucol eluting stent coating using laser postionization secondary neutral mass spectrometry and time-of-flight secondary ion mass spectrometry N2 - Implantable drug delivery systems that provide controlled and sustained release of a therapeutic agent are used in a wide variety of applications. Drug eluting stents, which are used to treat coronary artery disease, are among the most widespread of these devices, with an estimated 3x10⁶ implants annually worldwide. Controlling the rate of drug release from these devices relies on precise control of the three dimensional (3D)-distribution of the drug, so methods for measuring this distribution are of great importance. The aims of this work were to determine how 3D-imaging of polymer-free sirolimus/probucol drug eluting stent coatings could be improved through the use of laser postionization secondary neutral mass spectrometry (Laser- SNMS) and Ar cluster sputtering with time-of-flight secondary ion mass spectrometry (ToF-SIMS) and to optimize conditions for this analysis. In this study, 3D-imaging of a sirolimus/probucol dual drug eluting stent has been investigated using Laser-SNMS and ToF-SIMS. Laser-SNMS studies of pure sirolimus and probucol were undertaken using 30 keV Bi₃⁺ primary Ions and a 157 nm excimer postionization laser. Under optimal conditions, a greater than 100-fold increase in detected ion yield was observed for Laser-SNMS when compared to ToF-SIMS, although ToF-SIMS provided equal or greater yields for higher mass characteristic ions. Although the optimal laser power density for detecting probucol (5x10⁶W/cm²) was significantly lower than the optimum for sirolimus(7x10⁷W/cm²), an intermediate laser power density of 1x10⁷W/cm² was sufficient to allow imaging of both drugs. Using individual selected ion signals, ToF-SIMS and Laser-SNMS produced similar images of the two drug species. When using, however, a multivariate approach (Maximum autocorrelation factors), Laser-SNMS provided significant improvements in image contrast and small area detection when compared to ToF-SIMS. Following optimization of the technique, 3D-images of the dual drug eluting stent coating were obtained using 10 keV Ar₂₀₀₀⁺ cluster ions for sputtering and 30 keV Bi₃⁺ cluster ions for Analysis for both ToF-SIMS and Laser-SNMS. This work demonstrates the advantages of Laser-SNMS for 3D-imaging of pharmaceutical devices, which has not been previously published. Both ToF-SIMS and Laser-SNMS revealed that the outermost surface of the drug eluting coating contained pure sirolimus to a depth of a few tens of nanometers, with a few channels of sirolimus extending to a depth of around 1 lm. Below about 1 lm, the two drugs were uniformly mixed. Using the 10 keV Ar₂₀₀₀⁺ sputter beam, the authors were able to sputter through the complete drug coating (~6 μm) without observing any accumulated damage in the organic layer. The two techniques showed complementary strengths: ToF-SIMS offers faster data collection and better detected ion yield for larger characteristic ions than Laser-SNMS, and Laser-SNMS offers significantly enhanced detected ion yield for smaller fragment ions, allowing for improved Image contrast and Resolution of smaller features. KW - Imaging ToF SIMS KW - Eluting stent PY - 2016 DO - https://doi.org/10.1116/1.4964687 SN - 1934-8630 SN - 1559-4106 VL - 11 IS - 4 SP - 041001-1 EP - 041001-10 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-38272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Kalbe, Henryk A1 - Rades, Steffi T1 - Determining shell thicknesses in stabilised CdSe@ZnS core-shell nanoparticles by quantitative XPS analysis using an infinitesimal columns model N2 - A novel Infinitesimal Columns (IC) simulation model is introduced in this study for the quantitativeanalysis of core-shell nanoparticles (CSNP) by means of XPS, which combines the advantages of exist-ing approaches. The IC model is applied to stabilised Lumidot™CdSe/ZnS 610 CSNP for an extensiveinvestigation of their internal structure, i.e. calculation of the two shell thicknesses (ZnS and stabiliser)and exploration of deviations from the idealised CSNP composition. The observed discrepancies betweendifferent model calculations can be attributed to the presence of excess stabiliser as well as synthesisresidues, demonstrating the necessity of sophisticated purification methods. An excellent agreement isfound in the comparison of the IC model with established models from the existing literature, the Shardmodel and the software SESSA. KW - XPS KW - Quantum dot KW - Core shell nano particle PY - 2016 DO - https://doi.org/10.1016/j.elspec.2016.08.002 SN - 0368-2048 VL - 212 SP - 34 EP - 43 PB - Elsevier B.V. AN - OPUS4-38273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Swaraj, S. A1 - Dietrich, Paul M. T1 - X-ray spectromicroscopy of nanoparticulate iron oxide phases N2 - Soft x-ray spectromicroscopy techniques have seen great amount of development in the recent years, and with the development of new diffraction limited synchrotron source, many new nanoscale and mesoscale characterization opportunities of applied materials are foreseen. In this perspective, the authors present some examples that illustrate the capabilities of spectromicroscopy techniques, namely, 2D and 3D spatially resolved chemical quantification, surface and bulk sensitive measurements, and polarization dependent measurements as applied to iron oxide nanoparticulate materials of biological, geological, and other origins. KW - X-ray spectromicroscopy KW - STXM KW - Iron oxide PY - 2016 DO - https://doi.org/10.1116/1.4966654 SN - 1934-8630 SN - 1559-4106 VL - 11 IS - 4 SP - 04B402-1 EP - 04B402-6 PB - AVS: Science & Technology of Materials, Interfaces, and Processing AN - OPUS4-38274 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surfchem - Traceable quantitative surface chemical analysis for industrial applications N2 - The project addresses chemical and topographical metrology at surfaces. The new methodologies of measurements at surfaces will be developed as good practice guides and new work item proposals for industrial ISO standards. The objectives of the Joint research project (JRP) are to provide measurement standards and methods with traceability wherever it is practicable to do so for quantitative surface chemical analysis for industrial applications. KW - Method development KW - Surface chemical analysis KW - Analytical methods KW - Reference material PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-386319 SP - 1 EP - 4 PB - Bundesanstalt für Materialforschung und -prüfung (BAM) CY - Berlin AN - OPUS4-38631 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Nele A1 - Dietrich, Paul M. A1 - Lippitz, Andreas A1 - Kulak, N. A1 - Unger, Wolfgang T1 - New azidation methods for the functionalization of silicon nitride and application in copper-catalyzed azide-alkyne cycloaddition (CuAAC) N2 - In this study, a new direct functionalization method of silicon nitride (Si3N4) using azidation and click chemistry is presented. First, amino groups (NHx) were created on a Si3N4 substrate by fluoride etching. These NHx-terminated Si3N4 surfaces were analyzed by chemical derivatization X-ray photoelectron spectroscopy (CD-XPS) with 4-trifluoromethylbenzaldehyde (TFBA) and a derivatization yield of 20% was concluded. In the second step freshly prepared NHx surfaces were transformed into azides which were used immediately in a click reaction with halogenated alkynes. The presented combination of amination, azidation and click reaction is a promising alternative for common silane-based Si3N4 functionalization methods. T2 - 16th European Conference on Applications of Surface and Interface Analysis CY - Granada, Spain DA - 28.09.2015 KW - XPS KW - Azidation KW - Click chemistry KW - Silicon nitride KW - Chemical derivatization PY - 2016 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.5950/full DO - https://doi.org/10.1002/sia.5950 VL - 48 SP - 621 EP - 625 PB - John Wiley & Sons, Ltd AN - OPUS4-36841 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Fréjafon, E. A1 - Salvi, O. A1 - Hazebrouck, B. A1 - Le Feber, M. A1 - López de Ipiña Peña, J. A1 - Unger, Wolfgang T1 - Creation of the European centre for risk management and safe innovation in nanomaterials & nanotechnologies (EC4SafeNano) N2 - Safe innovation & sustainable production with MNMs need that we: Understand risks and benefits (diagnostic, assessment) Identify and implement risk reduction strategies (manage) Communicate on residual risks (acceptance) Huge knowledge on characterization, hazards, diagnostic (science) Little effective use of it for operational risk management (expertise) Objectives of the centre: Bridge the gap between research and application (public, private), Bridge the gap between knowledge on risks and risk management, Balance between Science and Appliance, in a sustainable way: Efficient & Sustainable structure Collective, harmonized, shared expertise EU scale, internationally connected. T2 - Workshop "NanoSafety: from research to implementation" CY - Amsterdam, The Netherlands DA - 22.06.2016 KW - Nano materials KW - Risk management KW - Safe innovation PY - 2016 UR - http://nanomile.eu-vri.eu/news.aspx?lan=230&tab=2361&nid=991#n991 AN - OPUS4-36966 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Advanced surface chemical analysis of plasma modified polymers and plasma-polymers N2 - A comprehensive characterization of plasma modified polymer surfaces or plasma-polymerized thin films needs access to parameters as - concentration of saturated/unsaturated carbon species (e.g. aromaticity) or other double bonds as C=N or C=O, - branching, and - losses of crystallinty or other degrees of structural order. Furthermore the complex ageing phenomena of plasma modified polymers/plasma-polymers and the measurement of an in-depth distribution of chemical species are challenges for the analyst. The talk will display selected examples where such challenges have been met by using advanced methods of surface chemical analyses as Photoelectron Spectroscopy with variable excitation energy (“SyncXPS”), X-ray Absorption Spectroscopy (NEXAFS) at C, N and O K-edges and Time-of-Flight Secondary Mass Spectroscopy (ToF-SIMS) combined with Principal Component analysis (PCA). T2 - IAP workshop – IAP 2016 "Organic surface modifications by plasmas and plasma-polymers" CY - Nancy, France DA - 08.06.2016 KW - XPS KW - NEXAFS KW - SIMS KW - Plasmapolymer PY - 2016 AN - OPUS4-36725 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Zhang, Zhiyang A1 - Merk, V. A1 - Müller, Anja A1 - Unger, Wolfgang A1 - Kneipp, Janina T1 - Role of metal cations in plasmon-catalyzed oxidation: A case study of p-aminothiophenol dimerization N2 - The mechanism of the plasmon-catalyzed reaction of p-aminothiophenol (PATP) to 4,4′-dimercaptoazobenzene (DMAB) on the surface of metal nanoparticles has been discussed using data from surface-enhanced Raman scattering of DMAB. Oxides and hydroxides formed in a plasmon-catalyzed process were proposed to play a central role in the reaction. Here, we report DMAB formation on gold nanoparticles occurring in the presence of the metal cations Ag+, Au3+, Pt4+, and Hg2+. The experiments were carried out under conditions where formation of gold oxide or hydroxide from the nanoparticles can be excluded and at high pH where the formation of the corresponding oxidic species from the metal ions is favored. On the basis of our results, we conclude that, under these conditions, the selective oxidation of PATP to DMAB takes place via formation of a metal oxide from the ionic species in a plasmon-catalyzed process. By evidencing the necessity of the presence of the metal cations, the reported results underpin the importance of metal oxides in the reaction. KW - Metal ions KW - Plasmonic catalysis KW - p-aminothiophenol KW - 4,4'-dimercaptoazobenzene KW - Surface-enhanced Raman scattering PY - 2017 UR - http://pubs.acs.org/doi/abs/10.1021/acscatal.7b02700 DO - https://doi.org/10.1021/acscatal.7b02700 SN - 2155-5435 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. VL - 7 IS - 11 SP - 7803 EP - 7809 PB - American Chemical Society CY - Washington AN - OPUS4-43001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Müller, Anja A1 - Dietrich, P. A1 - Thissen, A. A1 - Bahr, S. A1 - Ritter, B. A1 - Kemnitz, E. A1 - Unger, Wolfgang T1 - Detection of suspended nanoparticles with near-ambient pressure x-ray photoelectron spectroscopy N2 - Two systems of suspended nanoparticles have been studied with near-ambient pressure x-ray photoelectron spectroscopy: silver nanoparticles in water and strontium fluoride—calcium fluoride core-shell nanoparticles in ethylene glycol. The corresponding dry samples were measured under ultra high vacuum for comparison. The results obtained under near-ambient pressure were overall comparable to those obtained under ultra high vacuum, although measuring silver nanoparticles in water requires a high pass energy and a long acquisition time. A shift towards higher binding energies was found for the silver nanoparticles in aqueous Suspension compared to the corresponding dry sample, which can be assigned to a change of surface potential at the water-nanoparticle interface. The shell-thickness of the core-shell nanoparticles was estimated based on simulated spectra from the National Institute of Standards and Technology database for simulation of electron spectra for surface analysis. With the instrumental set-up presented in this paper, nanoparticle suspensions in a suitable Container can be directly inserted into the analysis chamber and measured without prior sample preparation. KW - Nanoparticles KW - Suspensions KW - Core-shell nanoparticles KW - NAP-XPS PY - 2017 DO - https://doi.org/10.1088/1361-648X/aa8b9d SN - 1361-648X SN - 0953-8984 N1 - Geburtsname von Müller, Anja: Hermanns, A. - Birth name of Müller, Anja: Hermanns, A. VL - 29 IS - 47 SP - 474002, 1 EP - 474002, 9 PB - IOP Publishing CY - UK AN - OPUS4-42951 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Streeck, C. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Beckhoff, B. T1 - Qualifying calibration samples for advanced thin film materials characterisation N2 - In this article the question of the certification of calibration samples for the characterisation of advanced thin film materials is addressed within the framework of reliable process control or quality management purposes. Reference measurement techniques can be used in order to address the gap in appropriate certified reference materials (CRMs) for thin film analyses. They allow for qualifying out-of-production samples originating from an operating production line as calibration samples. As a template for this procedure, CIGS [Cu(In,Ga)Se2] layers, that are absorber layers for high efficiency thin-film solar cells, have been used for establishing and validating reference-free X-ray fluorescence (XRF) analysis and Auger-electron spectroscopy (AES) as reference measurement techniques. The focus was on determining the average mole fractions in the CIGS layers obtaining results traceable to the SI unit system. Reference-free XRF is physically traceable and is based upon radiometrically calibrated instrumentation and knowledge of atomic fundamental data. Sputter-assisted AES can be established as a chemically traceable method after careful calibration using a certified reference material (CRM) based on a total number counting method. KW - CIGS KW - X-ray fluorescence (XRF) KW - Auger-electron spectroscopy (AES) PY - 2018 UR - https://www.spectroscopyeurope.com/article/qualifying-calibration-samples-advanced-thin-film-materials-characterisation VL - 30 IS - 1 SP - 11 EP - 14 PB - John Wiley & Sons Ltd CY - Chichester, West Sussex PO19 8SQ, UK AN - OPUS4-44260 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Bütefisch, S. A1 - Busch, I. T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1 xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - Standardization KW - AES KW - XPS KW - SIMS KW - Lateral resolution KW - Certified reference material PY - 2017 SN - 1341-1756 VL - 24 IS - 2 SP - 123 EP - 128 AN - OPUS4-43138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Poppenberg, J. A1 - Richter, S. A1 - Traulsen, Ch. H.-H. A1 - Darlatt, Erik A1 - Baytekin, B. A1 - Heinrich, Thomas A1 - Deutinger, P. M. A1 - Huth, K. A1 - Unger, Wolfgang A1 - Schalley, Ch. T1 - Programmable multilayers of nanometer-sized macrocycles on solid support and stimuli-controlled on-surface pseudorotaxane formation N2 - Mechanically interlocked molecules (MIMs) such as rotaxanes and catenanes are capable of mechanical motion on the nanoscale and are therefore promising prototypes for molecular machines in recent nanotechnology. However, most of the existing examples are isotropically distributed in solution, which prohibits concerted movement and with it the generation of macroscopic effects. Thus, arranging them in ordered arrays is of huge interest in recent research. We report the deposition of quite densely packed multilayers of tetralactam macrocycles on gold surfaces by metal-coordinated layer-by-layer self-assembly. Linear dichroism effects in angle-resolved NEXAFS spectra indicate a preferential orientation of the macrocycles. The sequence of the metal ions can be programmed by the use of different transition metal ions at each deposition step. Additionally, reversible on-surface pseudorotaxane formation was successfully realized by repeated uptake and release of axle molecules inside the macrocycles cavities. KW - NEXAFS KW - XPS KW - Supramolecular Chemistry KW - Multilayers KW - Pyridine KW - UV/Vis KW - Macrocycles KW - Pseudorotaxanes PY - 2013 DO - https://doi.org/10.1039/c3sc50558h VL - 4 IS - 8 SP - 3131 EP - 3139 AN - OPUS4-42668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Acquiring and Documenting Reproducible Spectra, Depth Profiles and Images: XPS, AES and SIMS N2 - In this talk sample prep/handling, instrument calibration and data acquisition methods with examples from XPS, Auger and SIMS will be addressed in terms of their contributions to the reproducibility of data delivered by the methods. Active parties in the field are VAMAS TWA 2 “Surface chemical analysis” (http://www.vamas.org/twa2/index.html), ISO/TC 201 “Surface chemical analysis” (https://www.iso.org/committee/54618.html) and the Surface Analysis Working Group (SAWG) at the International Meter Convention (https://www.bipm.org/en/ committees/cc/wg/sawg.html). The tools to improve the reproducibility of spectra, depth profiles and images at these international platforms are inter-laboratory comparisons, validated SOPs, standards and certified reference materials (CRM) as well as uncertainty budgets and establishment of traceability chains. The last point is of specific importance because all the methods, XPS, Auger and SIMS, are not primary methods. To address quantitative XPS, AES and SIMS results of relevant inter-laboratory comparisons organized by SAWG considering measurands as alloy surface composition and thickness of thin films will be introduced. These comparisons delivered results which are viewed to be benchmarking, some of them resulted in ISO/TC 201 standards. For quantitative XPS and AES the principal outline of an uncertainty budget will be discussed together with the audience. Another issue of quantitative XPS which definitely needs consideration are valid methods for a determination of the transmission function of the instruments and even for the emission angle in the respective experiments. Concerning the field of depth profiling it has to be investigated together with the audience whether the ISO (or ASTM) standards we have are sufficient to guarantee comparable results. Having in mind the number of different sputter ion species available today and range of samples of interest (metals, semiconductors, organic films) this might be questionable. And, how do depth profiling by AR-XPS and variable excitation energy XPS compete here? For imaging surface chemical analysis, the characterization of the imaging system is an issue to be investigated. Here the determination of lateral resolution is a relevant topic. Finally, the future needs to develop metrology for new applications e.g., ambient-pressure XPS, bio samples, and core-shell nanoparticles, will be issues raised for a discussion with the audience. T2 - 17th Topical Conference on Quantitative Surface Analysis (QSA 17) CY - Long Beach, CA, USA DA - 21.10.2018 KW - Depth Profiles and Images KW - X-ray Photoelectron Spectroscopy (XPS) KW - Auger Electron Spectroscopy (AES) KW - SIMS KW - Reproducible Spectra PY - 2018 AN - OPUS4-46470 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Kjaervik, Marit T1 - New work item proposal for a technical report for ISO/TC 201 WG 4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. T2 - 27th Plenary Meeting of ISO/TC 201 CY - Cancun, Mexico DA - 2018-09-20 KW - Surface chemical analysis of biofilms KW - XPS KW - Fourier-Transform Infrared Spectroscopy KW - 3D nano SIMS KW - Raman-spectroscopy PY - 2018 AN - OPUS4-46214 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Swaraj, S. A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Shell thickness determination for PTFE‐PS core‐shell nanoparticles using scanning transmission X‐ray microscopy (STXM) N2 - A scanning transmission X‐ray microscopy (STXM)‐based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core‐shell nanoparticles, which exhibit a strong X‐ray absorption contrast and a well‐defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less X‐ray beam‐induced damage of the sample is achieved by recording STXM images only at 2 predetermined energies of maximum Absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core‐shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near‐edge X‐ray absorption fine structure spectroscopy confirms the significant difference in X‐ray absorption behavior between PTFE and PS. Additionally, because of the insolubility of styrene in PTFE a well‐defined interface between particle core and shell is expected. To validate the STXM results, both the naked PTFE cores as well as the complete core‐shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM‐based methodology yields particle dimensions in agreement with the SEM results and provides additional information such as the position of the particle core, which cannot be extracted from a SEM micrograph. T2 - European conference on applications of surface and interface analysis (ECASIA'17) CY - Montpellier, France DA - 24.09.2017 KW - Core-shell nanoparticles KW - Polymers KW - PS KW - PTFE KW - SEM KW - STXM PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-449700 DO - https://doi.org/10.1002/sia.6464 SN - 1096-9918 SN - 0142-2421 VL - 50 IS - 11 SP - 1077 EP - 1082 PB - John Wiley & Sons CY - Hoboken, New Jersey, USA AN - OPUS4-44970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 16th Meeting (2017/18) N2 - Following the 2017 meeting, progress with the Key Comparison CCQM-K153 related to the BET specific surface lead by UNIIM and the Pilot Study P-190 “Thickness Measurement of nm HfO2 Films” lead by KRISS will be discussed. The 16th meeting of SAWG will focus on •survey on CMC claims submitted with reference to K-129 and K-136. •the overall and SAWG specific aspects of the CCQM Strategy process, •a consideration of comparisons on convention methods as recommended by the CCQM Plenary Meeting 2017, •the 2019 CCQM Workshop and paper(s) for Metrologia’s Special Issue, •discussion of future comparisons. T2 - 24th meeting of the CCQM 2018 CY - Paris, France DA - 19.04.2018 KW - Surface chemical analysis KW - Metrology KW - Inter-laboratory comparisons PY - 2018 AN - OPUS4-44998 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Busch, I. A1 - Unger, Wolfgang T1 - Analytical and topographical Reference Material for the Nanoscale N2 - Reliable standards are required to support research and development as well as end-user in application. Appropriate standards have to fulfill three requirements: small uncertainty, easy to use and low overall costs of application. For calibration of microscopes at nanoscale and/or element analysis special requirements for standards are given, which are challenging in manufacture. T2 - Workshop on Reference Nanomaterials CY - Berlin, Germany DA - 14.05.2018 KW - XPS KW - Imaging KW - Reference material KW - NoStep Standards PY - 2018 AN - OPUS4-45156 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Designing a sustainable European centre for risk management and safe innovation in nanomaterials & nanotechnologies (EC4SafeNano) N2 - A central challenge to ensure the sustainable production and use of nanotechnologies is to understand the risks for environment, health and safety associated with this technology and resulting materials and products, and to identify and implement practical strategies to minimize these risks. Knowledge about nanotechnology-enabled processes and products and related environment, health and safety issues is growing rapidly, achieved through numerous European or national R&D programs over the last decade, but effective use of this knowledge for risk management by market actors is lagging behind. The EC4SafeNano initiative (www.EC4SafeNano.eu) is an ongoing effort to build a European Centre for Risk Management and Safe Innovation in Nanomaterials and Nanotechnologies. EC4SafeNano aims to bridge the gap between scientific knowledge on hazard and risk, and ‘fit-for-purpose’ risk management tools and strategies supported by measurement and control methods. The consortium comprises 15 partners (INERIS (coordinator), EU-VRi, TNO, BAM, FIOH, VITO, SP, DEMOKRITOS, TECNALIA, Health and Safety Executive, NRCWE, Paris Lodron University Salzburg, Université Libre de Bruxelles, University of Birmingham and ENEA) from 11 European Member States with significant expertise on risk assessment and management, who already provide knowledge and technical services to public and private organizations, to industry and to public authorities and regulatory bodies. The overall objective of the EC4SafeNano project is to develop a distributed Centre of European Organisations offering services for Risk Management and Safe Innovation for Nanomaterials & Nanotechnologies. The Centre will be structured as a hub-based network of organizations managed by a core group of public-oriented bodies providing risk management and safe innovation support to all stakeholders. It will be operated with the support of Associated Partners so as to expand its capabilities, resources and services. It will interact with existing platforms and centres of excellence in nanosafety and foster the organization or development of national hubs mirroring the European hub. The Centre will seek financial support from stakeholders and service users to sustain the services in the longer term. The operational objectives of the project involve understanding and mapping the needs of the various stakeholders (private and public). It will identify the resources and capabilities and develop a range of harmonized services required to meet these needs. The construction of the centre will include putting in place and implementing processes to deliver and update services, to test and benchmark services, to evaluate the governance of the Centre, and developing a business plan to ensure self-sufficiency of the Centre beyond the project lifetime. A cornerstone of the project is to build a community for risk management and safe innovation for nanotechnology. Interested persons or organisations are invited to join this initiative as registered stakeholders or Associated Partners, to engage in focus networks and to help shape the future Centre. The poster will present the EC4SafeNano initiative and will detail the role of registered stakeholders and Associated Partners. T2 - UBA Scientific Stakeholder Meeting on Nanomaterials in the Environment CY - Dessau, Germany DA - 10.10.2017 KW - Risk management KW - Nanomaterials KW - Nanotechnologies PY - 2017 AN - OPUS4-42788 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grötzsch, D. A1 - Streeck, C. A1 - Nietzold, Carolin A1 - Malzer, W. A1 - Mantouvalou, I. A1 - Nutsch, A. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Beckhoff, B. A1 - Kanngießer, B. T1 - A sealable ultrathin window sample cell for the study of liquids by means of soft X-ray spectroscopy N2 - A new sample cell concept for the analysis of liquids or solid-liquid interfaces using soft X-ray spectroscopy is presented, which enables the complete sealing of the cell as well as the Transport into vacuum via, for example, a load-lock system. The cell uses pressure monitoring and active as well as passive pressure regulation systems, thereby facilitating the full control over the pressure during filling, sealing, evacuation, and measurement. The cell design and sample preparation as well as the crucial sealing procedure are explained in detail. As a first proof-of-principle experiment, successful nitrogen K-edge fluorescence yield near-edge X-ray absorption fine structure experiments of a biomolecular solution are presented. For this purpose, it is shown that the careful evaluation of all involved parameters, such as window type or photon flux, is desirable for optimizing the experimental result. KW - X-ray spectroscopy KW - Analysis of liquids KW - Wet cell KW - Concanavalin A KW - NEXAFS PY - 2017 DO - https://doi.org/10.1063/1.5006122 SN - 0034-6748 SN - 1089-7623 VL - 88 IS - 12 SP - 123112-1 EP - 123112-7 PB - American Institute of Physics AN - OPUS4-43611 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Khosravi, Z. A1 - Kotula, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Klages, C.-P. T1 - IR- and NEXAFS-spectroscopic characterization of plasma-nitrogenated polyolefin surfaces N2 - Modification of polyethylene and polypropylene surfaces by atmospheric-pressure plasmas using mixtures of nitrogen and hydrogen was studied using Fouriertransform infrared spectroscopy in the attenuated total reflection mode (FTIR-ATR) and by near-edge x-ray absorption fine structure spectroscopy (NEXAFS) in order to shed some light on the chemical nature of nitrogen-containing functional Groups on the polymer surface. Using FTIR-ATR spectroscopy combined with hydrogendeuterium isotope exchange of active hydrogen atoms, it was shown that the direct treatment of PE foils by dielectric barrier discharges (DBDs) in N2/H2 mixtures and a subsequent exposure of the samples to the ambient air results in the formation of –NH2 moieties of primary amides on the polymer surface. Corresponding in situ experiments with streaming N2/H2 DBD post-discharges virtually free of H2O and O2, on the other hand, showing the absence of –NH2, proving that no primary amines or amides are formed by this treatment although substantial amounts of nitrogen are incorporated. Moreover, directly N2/H2-plasma-treated polymer surfaces, similar to afterglow-treated low-density polyethylene (LDPE), show amphiphilic character as to be seen by chemical derivatization with nucleophilic reagents 4-(trifluoromethyl) phenylhydrazine and 4-(trifluoromethyl)benzylamine, in addition to electrophilic aromatic aldehydes normally used to derivatize such surfaces. The presence of imines or other functional groups with CN moieties which may be invoked to explain the dual (amphiphilic) reactivity is proven by NEXAFS studies on ultrathin plasma-treated PE films, confirming significant amounts of nitrogen in CN bonds and carbon in CC bonds. KW - X-ray spectroscopy KW - IR spectroscopy KW - Plasma-nitrogenated polyolefin surfaces KW - Unsaturated CN bonds KW - NEXAFS PY - 2017 DO - https://doi.org/10.1002/ppap.201700066 SN - 1612-8869 SN - 1612-8850 VL - 15 IS - 1 SP - e1700066, 1 EP - 15 PB - WILEY-VCH Verlag GmbH & Co. KGaA, CY - Weinheim AN - OPUS4-43786 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Summary of ISO/TC 201 technical report: ISO/TR 19693 surface chemical analysis—characterization of functional glass substrates for biosensing applications N2 - ISO/TR 19693:2018—Surface chemical analysis—Characterization of functional glass substrates for biosensing applications gives an overview of methods, strategies, and guidance to identify possible sources of problems related to substrates, device production steps (cleaning, activation, and chemical modification), and shelf life (storage conditions and aging). It is particularly relevant for surface chemical analysts characterizing glass‐based biosensors, and developers or quality managers in the biosensing device production community. Based on quantitative and qualitative surface chemical analysis, strategies for identifying the cause of poor Performance during device manufacturing can be developed and implemented. A review of measurement capabilities of surface analytical methods is given to assist readers from the biosensing community. KW - Bio sensing device KW - Surface chemical analysis KW - XPS KW - SIMS KW - Standardization PY - 2018 DO - https://doi.org/10.1002/sia.6481 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 8 SP - 835 EP - 838 PB - John Wiley & Sons, Ltd. AN - OPUS4-45829 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baer, D. R. A1 - Karakoti, A. S. A1 - Clifford, C. A. A1 - Minelli, C. A1 - Unger, Wolfgang T1 - Importance of sample preparation on reliable surface characterisation of nano‐objects: ISO standard 20579‐4 N2 - The international ISO Standard 20579‐4, dealing with the history and preparation of nano‐objects for surface analysis, has been developed to help address some of the replication and reproducibility issues caused by the fundamental nature of nanoobjects. Although all types of samples requiring surface analysis need thoughtful preparation, nano‐objects, for which many properties are controlled by their surfaces, present additional challenges in order to avoid variations and artefacts due to the handling and preparation of materials prior to analysis. This international standard is part of a series of standards related to preparation of samples for surface chemical analysis. Parts 1 and 2 of ISO Standard series 20579 address general issues that apply to many samples. Part 3, which is still in development, will focus on biomaterials. Part 4 specifically considers issues that arise due to the inherent nature of nano‐objects. Because of sensitivity to their environment, the standard indicates the minimum Information that needs to be reported about the handling and preparation of nano‐objects prior to surface analysis. This information should become part of sample provenance information that helps assure the reliability and usefulness of data obtained from surface‐analysis in the context of the synthesis, processing, and analysis history of a batch of material. Application of this standard can help address reproducibility and traceability issues associated with synthesis, processing, and characterization of nano‐objects in research and commercial applications. KW - Nano‐object characterization KW - Nanoparticle characterization KW - Provenance information KW - Sample preparation KW - Surface analysis PY - 2018 DO - https://doi.org/10.1002/sia.6490 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 9 SP - 902 EP - 906 PB - John Wiley & Sons, Ltd. AN - OPUS4-45830 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - New work item proposal for a technical report for ISO/TC 201 WG4 “Surface characterization of biomaterials”: Surface chemical analysis – Surface chemical analysis of cells and biofilms N2 - The proposed ISO Technical Report provides a description of a variety of physical methods of analytical chemistry by which bacteria and biofilms can be analysed. The state of the art, sample requirements and strengths associated with each method are identified. Presented at the DIN-meeting for NA 062-08-16 AA „Chemische Oberflächenanalyse und Rastersondenmikroskopie“ T2 - 18. Sitzung des DIN-meeting NA 062-08-16 AA "Chemische Oberflächenanalyse und Rastersondenmikroskopie“ CY - Berlin, Germany DA - 08.11.2018 KW - 3D nano SIMS KW - Fourier transform infrared spectroscopy KW - Raman-spectroscopy KW - Biofilms KW - XPS PY - 2018 AN - OPUS4-46548 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Chemical Analysis at BAM: R&D, Metrology, Standardization T2 - Analytikseminar, Insitute of Chemical Technologies and Analytics, Vienna University of Technology CY - Vienna, Austria DA - 2015-01-09 PY - 2015 AN - OPUS4-32927 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Heinrich, Thomas A1 - Traulsen, Christoph Hans-Henning A1 - Holzweber, Markus A1 - Richter, S. A1 - Kunz, V. A1 - Kastner, S.K. A1 - Krabbenborg, S.O. A1 - Huskens, J. A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Coupled molecular switching processes in ordered mono- and multilayers of stimulus-responsive rotaxanes on gold surfaces N2 - Interfaces provide the structural basis for function as, for example, encountered in nature in the membrane-embedded photosystem or in technology in solar cells. Synthetic functional multilayers of molecules cooperating in a coupled manner can be fabricated on surfaces through layer-by-layer self-assembly. Ordered arrays of stimulus-responsive rotaxanes undergoing well-controlled axle shuttling are excellent candidates for coupled mechanical motion. Such stimulus-responsive surfaces may help integrate synthetic molecular machines in larger systems exhibiting even macroscopic effects or generating mechanical work from chemical energy through cooperative action. The present work demonstrates the successful deposition of ordered mono- and multilayers of chemically switchable rotaxanes on gold surfaces. Rotaxane mono- and multilayers are shown to reversibly switch in a coupled manner between two ordered states as revealed by linear dichroism effects in angle-resolved NEXAFS spectra. Such a concerted switching process is observed only when the surfaces are well packed, while less densely packed surfaces lacking lateral order do not exhibit such effects. KW - Molecular machine KW - Rotaxane KW - LBL growth KW - XPS KW - NEXAFS KW - SIMS PY - 2015 DO - https://doi.org/10.1021/ja512654d SN - 0002-7863 SN - 1520-5126 VL - 137 IS - 13 SP - 4382 EP - 4390 PB - American Chemical Society CY - Washington, DC, USA AN - OPUS4-33077 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Krüger, K. A1 - Jankowski, J. A1 - Unger, Wolfgang T1 - Surface characterization of dialyzer polymer membranes by imaging ToF-SIMS and quantitative XPS line scans N2 - The surfaces of polymeric dialyzer membranes consisting of polysulfone and polyvinylpyrrolidone were investigated regarding the lateral distribution and quantitative surface composition using time-of-flight secondary-ion-mass-spectrometry and x-ray photoelectron spectroscopy. Knowledge of the distribution and composition on the outer surface region is of utmost importance for understanding the biocompatibility of such dialyzer membranes. Both flat membranes and hollow fiber membranes were studied. KW - Tof SIMS KW - XPS KW - Dialyzer membrane KW - Surface analysis KW - Polymer PY - 2015 DO - https://doi.org/10.1116/1.4907937 SN - 1934-8630 SN - 1559-4106 VL - 10 IS - 1 SP - 019011-1 EP - 019011-7 PB - AVS CY - New York, NY, USA AN - OPUS4-32740 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Guo, Y. A1 - Lippitz, Andreas A1 - Saftien, P. A1 - Unger, Wolfgang A1 - Kemnitz, E. T1 - Tuning the surface properties of novel ternary iron(III) fluoride-based catalysts using the template effect of the matrix N2 - Sol–gel prepared ternary FeF3–MgF2 materials have become promising heterogeneous catalysts due to their porosity and surface Lewis/Brønsted acidity (bi-acidity). Despite the good catalytic performance, nanoscopic characterisations of this type of material are still missing and the key factors controlling the surface properties have not yet been identified, impeding both a better understanding and further development of ternary fluoride catalysts. In this study, we characterised the interaction between the bi-acidic component (FeF3) and the matrix (MgF2) on the nano-scale. For the first time, the formation pathway of FeF3–MgF2 was profiled and the template effect of MgF2 during the synthesis process was discovered. Based on these new insights two novel materials, FeF3–CaF2 and FeF3–SrF2, were established, revealing that with decreasing the atomic numbers (from Sr to Mg), the ternary fluorides exhibited increasing surface acidity and surface area but decreasing pore size. These systematic changes gave rise to a panel of catalysts with tuneable surface and bulk properties either by changing the matrix alkaline earth metal fluoride or by adjusting their ratios to Fe or both. The template effect of the alkaline earth metal fluoride matrix was identified as the most probable key factor determining the surface properties and further influencing the catalytic performance in ternary fluoride based catalysts, and paves the way to targeted design of next-generation catalysts with tunable properties. KW - Catalysis KW - Surface analysis KW - XPS PY - 2015 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-327410 DO - https://doi.org/10.1039/c4dt03229b SN - 1477-9226 SN - 1477-9234 SN - 1364-5447 VL - 44 IS - 11 SP - 5076 EP - 5085 PB - RSC CY - Cambridge AN - OPUS4-32741 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Shard, A.G. A1 - Jungnickel, H. A1 - Luch, A. A1 - Unger, Wolfgang T1 - Dual beam organic depth profiling using large argon cluster ion beams N2 - Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4'-bis[N-(1-naphthyl-1-)-N-phenyl- amino]-biphenyl (NPB) and aluminium tris-(8-hydroxyquinolate) (Alq3), materials commonly used in organic light-emitting diodes industry, was carried out using time-of-flight SIMS in dual beam mode. The sample used in this study consists of a ~400-nm-thick NPB matrix with 3-nm marker layers of Alq3 at depth of ~50, 100, 200 and 300 nm. Argon cluster sputtering provides a constant sputter yield throughout the depth profiles, and the sputter yield volumes and depth resolution are presented for Ar-cluster sizes of 630, 820, 1000, 1250 and 1660 atoms at a kinetic energy of 2.5 keV. The effect of cluster size in this material and over this range is shown to be negligible. KW - SIMS KW - Organic depth profiling KW - Argon cluster KW - ToF-SIMS KW - Ar-GCIB KW - Secondary Ion Mass Spectrometry PY - 2014 DO - https://doi.org/10.1002/sia.5429 SN - 0142-2421 SN - 1096-9918 VL - 46 SP - 936 EP - 939 PB - Wiley CY - Chichester AN - OPUS4-32573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Richter, S. A1 - Traulsen, C. H.-H. A1 - Heinrich, Thomas A1 - Poppenberg, J. A1 - Leppich, C. A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Sequence-programmable multicomponent multilayers of nanometer-sized tetralactam macrocycles on gold surfaces N2 - Multicomponent multilayers have been deposited on gold surfaces by metal-ion-mediated layer-by-layer self-assembly of differently functionalized tetralactam macrocycles. The layer stack can be programmed with respect to the sequences of metal ions and macrocycles by the deposition sequence. KW - Organic layer KW - XPS KW - SIMS KW - NEXAFS PY - 2013 DO - https://doi.org/10.1021/jp405492v SN - 1932-7447 SN - 1089-5639 VL - 117 IS - 37 SP - 18980 EP - 18985 PB - Soc. CY - Washington, DC AN - OPUS4-32576 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Options for standards for physical-chemical characterization of ENPs derived from NanoValid achievements T2 - CEN-CENELEC NanoValid Standardization Workshop CY - Brüssel, Belgium DA - 2014-11-28 PY - 2014 AN - OPUS4-32391 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Establishing of reference methods and materials for toxilogical testing and physical-chemical characterisation of ENPs T2 - NanoValid 2nd technical review meeting CY - Brussels, Belgium DA - 2014-11-26 PY - 2014 AN - OPUS4-32393 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis at the Nanoscale: Status and Challenges T2 - AVS 61th International Symposium, Applied Surface Science Session CY - Baltimore, United States of Amercia DA - 2014-11-09 PY - 2014 AN - OPUS4-32394 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Heinrich, T. A1 - Kunz, V. A1 - Richter, S. A1 - Traulsen, C.H.-H. A1 - Schalley, C.A. A1 - Unger, Wolfgang T1 - Principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS): a versatile method for the investigation of self-assembled monolayers and multilayers as precursors for the bottom-up approach of nanoscaled devices N2 - The production of high-quality self-assembled monolayers (SAMs) followed by layer-by-layer (LbL) self-assembly of macrocycles is essential for nanotechnology applications based on functional surface films. To help interpret the large amount of data generated by a standard ToF-SIMS measurement, principal component analysis (PCA) was used. For two examples, the advantages of a combination of ToF-SIMS and PCA for quality control and for the optimization of layer-by-layer self-assembly are shown. The first example investigates how different cleaning methods influence the quality of SAM template formation. The second example focuses on the LbL self-assembly of macrocycles and the corresponding stepwise surface modification. KW - ToF-SIMS KW - Principal component analysis KW - Self assembled monolayer KW - Layer by layer PY - 2014 DO - https://doi.org/10.1021/ac500059a SN - 0003-2700 SN - 1520-6882 VL - 86 IS - 12 SP - 5740 EP - 5748 PB - American Chemical Society CY - Washington, DC AN - OPUS4-30963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales T2 - CCQM Plenary Meeting 2014 CY - Paris, France DA - 2014-04-10 PY - 2014 AN - OPUS4-30969 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis at the Nanoscale: Status and Challenges T2 - ALTECH Symposium 2014 - Analytical techniques for precise characterization of nanomaterials, EMRS Spring Meeting 2014 CY - Lille, France DA - 2014-05-26 PY - 2014 AN - OPUS4-30970 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Nano-Analysis: Establishing Reference Methods for Characterizing Nano-Materials T2 - Workshop on Advanced Characterization of Nanomaterials CY - Zaragoza, Spain DA - 2013-09-19 PY - 2013 AN - OPUS4-29865 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Der FB "Oberflächenanalytik und Grenzflächenchemie" der BAM: Referenzmaterialien für die Nanoanalytik und ausgewählte Beispiele angewandter Forschung T2 - TU Berlin , Institut für Optik und Atomare Physik, AG Kannengießer, Wintersemester 2013/2014, Forschungsseminar "Moderne analytische Methoden der Physik" CY - Berlin, Germany DA - 2013-10-29 PY - 2013 AN - OPUS4-29870 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Surface Chemical Analysis: Status and Challenges T2 - ECASIA 2013 CY - Cagliari, Italy DA - 2013-10-14 PY - 2013 AN - OPUS4-29873 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Mozetic, M. A1 - Ostrikov, K. A1 - Ruzic, D.N. A1 - Curreli, D. A1 - Cvelbar, U. A1 - Vesel, A. A1 - Primc, G. A1 - Leisch, M. A1 - Jousten, K. A1 - Malyshev, O.B. A1 - Hendricks, J.H. A1 - Kövér, L. A1 - Tagliaferro, A. A1 - Conde, O. A1 - Silvestre, A.J. A1 - Giapintzakis, J. A1 - Buljan, M. A1 - Radic, N. A1 - Drazic, G. A1 - Bernstorff, S. A1 - Biedermann, H. A1 - Kylián, O. A1 - Hanus, J. A1 - Milosevic, S. A1 - Galtayries, A. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Lehocky, M. A1 - Sedlarik, V. A1 - Stana-Kleinschek, K. A1 - Drmota-Petric, A. A1 - Pireaux, J.J. A1 - Rogers, J.W. A1 - Anderle, M. T1 - Recent advances in vacuum sciences and applications N2 - Recent advances in vacuum sciences and applications are reviewed. Novel optical interferometer cavity devices enable pressure measurements with ppm accuracy. The innovative dynamic vacuum standard allows for pressure measurements with temporal resolution of 2 ms. Vacuum issues in the construction of huge ultra-high vacuum devices worldwide are reviewed. Recent advances in surface science and thin films include new phenomena observed in electron transport near solid surfaces as well as novel results on the properties of carbon nanomaterials. Precise techniques for surface and thin-film characterization have been applied in the conservation technology of cultural heritage objects and recent advances in the characterization of biointerfaces are presented. The combination of various vacuum and atmospheric-pressure techniques enables an insight into the complex phenomena of protein and other biomolecule conformations on solid surfaces. Studying these phenomena at solid–liquid interfaces is regarded as the main issue in the development of alternative techniques for drug delivery, tissue engineering and thus the development of innovative techniques for curing cancer and cardiovascular diseases. A review on recent advances in plasma medicine is presented as well as novel hypotheses on cell apoptosis upon treatment with gaseous plasma. Finally, recent advances in plasma nanoscience are illustrated with several examples and a roadmap for future activities is presented. KW - Vacuum KW - Surface KW - Plasma KW - Interface KW - Nanoscience PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-304884 DO - https://doi.org/10.1088/0022-3727/47/15/153001 SN - 0022-3727 SN - 1361-6463 VL - 47 IS - 15 SP - 153001-1 EP - 153001-23 PB - IOP Publ. CY - Bristol AN - OPUS4-30488 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Non-destructive surface measurements N2 - Materials and chemical producers require detailed knowledge of surface chemistry for research into new products. One way to understand a surface without damaging it is to bombard it with an electron beam, causing its atoms to emit characteristic X-rays enabling identification. The measurement of these must be precise as many elements emissions are close in energy – traceable reference materials will ensure instruments using this technique are stable and accurate. KW - Metrology KW - EDS KW - EDX PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388647 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38864 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Measuring organic layers N2 - Many innovative products - from touchscreens to solar panels to pharmaceuticals – utilise multiple organic layers to create complex functionality. New techniques have been developed to remove and measure layers individually enabling improved product development and assisting with quality assurance. However, manufacturers cannot be certain of the depth of layer being removed and new reference materials for these techniques are needed to increase uptake, and remove a major barrier to innovation. KW - Organic layers KW - XPS KW - SIMS PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388656 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38865 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surface analysis for Alzheimer’s N2 - Modifying or controlling surface chemistry is important in new product development, quality control and research. This is particularly true where functionality of surfaces, thin films and interfaces are key to the application, such as organic solar cells and devices for medical diagnostics. Surface chemical analysis aims to provide quantitative elemental, chemical state and functional group information from the surface of materials, but requires comparable test data and improved measurement traceability. KW - Liposomes KW - Proteins KW - ToF-SIMS KW - Peptides KW - Mapping PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388663 UR - http://www.euramet.org/metrology-for-societys-challenges/metrology-for-industry/impact-case-studies-emrp-industry-theme/ SP - 1 EP - 2 CY - Teddington AN - OPUS4-38866 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Treu, Dieter A1 - Kalbe, Henryk A1 - Krumrey, M. A1 - Gross, Thomas A1 - Marti, K. A1 - Unger, Wolfgang T1 - Experimental determination of the effective attenuation length of palladium 3d 5/2 photoelectrons in a magnetron sputtered Pd nanolayer N2 - An electron effective attenuation length (EAL) of 1.68nm for Al Kα excited Pd 3d 5/2 photoelectrons with a kinetic energy of 1.152 keV has been determined experimentally using a sputtered Pd film deposited on an ultra flat fused quartz substrate. The film thickness was reduced by Ar ion sputtering several times in order to obtain different Pd film thicknesses which are used to determine experimental EAL values. These results are compared to data generated by using a Simulation of Electron Spectra for Surface Analysis (SESSA) simulation using an inelastic mean free path (IMFP) calculated with the Tanuma–Powell–Penn (TPP)-2M formula and with ‘elastic scattering on and off’. Contributions to the uncertainty budget related to the experimental approach are discussed in detail. Proposals on how to further improve the approach are suggested. KW - Pd 3d KW - Electron effective attenuation length KW - XPS PY - 2017 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.6141/abstract?campaign=woletoc DO - https://doi.org/10.1002/sia.6141 SN - 0142-2421 SN - 1096-9918 VL - 49 IS - 5 SP - 464 EP - 468 PB - John Wiley & Sons, Ltd AN - OPUS4-39682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales - Surface analysis working group (SAWG) - Report for 15th meeting (2016/17) N2 - CCQM has established a framework of comparisons to demonstrate the international comparability of chemical measurements. The key point is the establishment of comparable measurements, with traceability to internationally or nationally stated references. Originally initiated by Dr Martin P Seah, NPL, the Surface Analysis Working Group (SAWG) has been formally founded in 2003. The following terms of reference were presented to CCQM in April 2002. CCQM ratified the group as a full working group of CCQM in April 2003 with these terms of reference: - to develop pilot studies and carry out key comparisons of national measurement standards for surface and micro/nano-analysis; - to assist in identifying and establishing inter-laboratory work to improve the traceability of surface and micro/nano-analysis; - to establish and update a work plan to be adopted by CCQM; - to discuss and review the scope of the working group and to liase with other working groups related to nanotechnology. Following the 2016 meeting, the Key Comparison K-129 "Measurement of atomic fractions in Cu(In,Ga)Se2 Films" lead by KRISS and the Key Comparison K-136 on "BET specific surface area of nanoporous Al2O3" lead by UNIIM&BAM have been finished in 2016. The 15th meeting of SAWG will focus on - survey on CMC claim submitted with reference to K-129 and K-136. - the overall and SAWG specific aspects of the CCQM Strategy process, - a joint meeting with the Inorganic Working Group addressing number concentrations of nano particles, - discussion of future comparisons. T2 - CCQM Plenary Meeting at BIPM 2017 CY - Paris, France DA - 27.4.17 KW - Metrology KW - Comparisons KW - CCQM PY - 2017 AN - OPUS4-40277 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Unger, Wolfgang T1 - IND15 JRP SurfChem: Traceable quantitative surface chemical analysis for industrial applications N2 - The SurfChem project has made a significant contribution to traceable quantitative surface chemical analysis for industrial applications by delivering new certified reference materials and test samples for specific technical applications. Regular performance tests of instruments, metrological methodology for the detection of (bio)organic surface species, ambient and non-destructive surface chemical analysis for in-line process control and new in situ characterisation techniques of catalytically active surfaces have been achieved. KW - Surface analysis KW - Metrology KW - Euramet EMRP PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-388673 UR - http://www.euramet.org/research-innovation/search-research-projects/details/?eurametCtcp_project_show%5Bproject%5D=1115&eurametCtcp_project%5Bback%5D=893&cHash=5fd23fc7f759db18176584b5d8a5fe89 SP - 1 EP - 39 CY - Teddington AN - OPUS4-38867 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Dietrich, P. A1 - Thissen, A. A1 - Kulak, N. A1 - Kjaervik, Marit A1 - Unger, Wolfgang T1 - XPS surface chemical analysis of aqueous solutions with EnviroESCA N2 - Water and aqueous reagents are essential in any biological process or system. But apart from a few special low vapor-pressure cases, liquids have not been accessible to any technique requiring UHV conditions. EnviroESCA opens up this exciting field of applications. In this paper first results from water based samples are presented as a proof of concept to demonstrate the special capabilities of EnviroESCA analyzing liquid samples. The following solutions were investigated under near ambient pressure conditions: i.) water, ii.) brine, iii.) an oil in water dispersion, iv.) aqueous iron(II) sulfate heptahydrate, and v.) a suspension of nano silver particles in water. KW - Surface Analysis KW - Near Ambient Pressure XPS KW - Aqueous Solutions PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-394603 UR - http://www.enviro.specs.de/cms/upload/bilder/EnviroESCA/Applications/Liquids/Application-Note_EnviroESCA_Aqueous_Solutions.pdf N1 - BAM Mitarbeiter Beitrag im Acknowledgement definiert. IS - #000394 SP - 1 PB - SPECS CY - Berlin AN - OPUS4-39460 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Lateral resolution delivered by imaging surface-analytical instruments as SIMS, AES and XPS: Application of the BAM-L200 Certified Reference Material and related ISO Standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1-xAs and InxGa1-xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers a plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods T2 - SIMS Europe 2016 CY - Münster, Germany DA - 18.09.2016 KW - ISO standards KW - XPS KW - AES KW - SIMS KW - Lateral resolution PY - 2016 AN - OPUS4-37507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Häusler, Ines A1 - Dörfel, Ilona A1 - Peplinski, Burkhard A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Österle, Werner T1 - Comprehensive characterization of ball-milled powders simulating a tribofilm system N2 - A model system was used to simulate the properties of tribofilms which form during automotive braking. The model system was prepared by ball milling of a blend of 70 vol.% iron oxides, 15 vol.% molybdenum disulfide and 15 vol.% graphite. The resulting mixture was characterized by X-ray powder diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and various transmission electron microscopic (TEM) methods, including energy dispersive X-ray spectroscopy (EDXS), high resolution investigations (HRTEM) with corresponding simulation of the HRTEM images, diffraction methods such as scanning nano-beam electron diffraction (SNBED) and selected area electron diffraction (SAED). It could be shown that the ball milling caused a reduction of the grain size of the initial components to the nanometer range. Sometimes even amorphization or partial break-down of the crystal structure was observed for MoS2 and graphite. Moreover, chemical reactions lead to a formation of surface coverings of the nanoparticles by amorphous material, molybdenum oxides, and iron sulfates as derived from XPS. KW - Tribofilm model system KW - Ball milling KW - X-ray powder diffraction KW - Transmission electron microscopy PY - 2016 DO - https://doi.org/10.1016/j.matchar.2015.11.024 SN - 1044-5803 SN - 1873-4189 VL - 111 SP - 183 EP - 192 PB - Elsevier CY - New York, NY AN - OPUS4-35051 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - NanoValid - Developing Reference Methods for Nanomaterials T2 - Workshop Bundesbehörden/VCI/VdMi "Messstrategien und Messmethoden für Nanomaterialien" CY - Berlin, Germany DA - 2015-09-08 PY - 2015 AN - OPUS4-34060 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Passiu, Cristiana A1 - Rossi, Antonella A1 - Bernard, Laetitia A1 - Paul, Dennis A1 - Hammond, John A1 - Unger, Wolfgang A1 - Venkataraman, Nagaiyanallur V. A1 - Spencer, Nicholas D. T1 - Fabrication and Microscopic and Spectroscopic Characterization of Planar, Bimetallic, Micro- and Nanopatterned Surfaces N2 - Micropatterns and nanopatterns of gold embedded in silver and titanium embedded in gold have been prepared by combining either photolithography or electron-beam lithography with a glue-free template-stripping procedure. The obtained patterned surfaces have been topographically characterized using atomic force microscopy and scanning electron microscopy, showing a very low root-mean-square roughness (<0.5 nm), high coplanarity between the two metals (maximum height difference ≈ 2 nm), and topographical continuity at the bimetallic interface. Spectroscopic characterization using X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (ToF-SIMS), and Auger electron spectroscopy (AES) has shown a sharp chemical contrast between the two metals at the interface for titanium patterns embedded in gold, whereas diffusion of silver into gold was observed for gold patterns embedded in silver. Surface flatness combined with a high chemical contrast makes the obtained surfaces suitable for applications involving functionalization with molecules by orthogonal adsorption chemistries or for instrumental calibration. The latter possibility has been tested by determining the image sharpness and the analyzed area on circular patterns of different sizes for each of the spectroscopic techniques applied for characterization.This is the first study in which the analyzed area has been determined using XPS and AES on a flat surface, and the first example of a method for determining the analyzed area using ToF-SIMS. KW - XPS KW - AES KW - SIMS KW - Lateral resolution KW - Test pattern PY - 2017 UR - http://pubs.acs.org/doi/abs/10.1021/acs.langmuir.7b00942 DO - https://doi.org/10.1021/acs.langmuir.7b00942 SN - 0743-7463 VL - 33 IS - 23 SP - 5657 EP - 5665 PB - ACS AN - OPUS4-40929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentrich, D. A1 - Taabache, Soraya A1 - Brezesinski, G. A1 - Lange, Nele A1 - Unger, Wolfgang A1 - Kübel, C. A1 - Bertin, Annabelle A1 - Taubert, A. T1 - A dendritic amphiphile for efficient control of biomimetic calcium phosphate mineralization N2 - The phase behavior of a dendritic amphiphile containing a Newkome-type dendron as the hydrophilic moiety and a cholesterol unit as the hydrophobic segment is investigated at the air–liquid interface. The amphiphile forms stable monomolecular films at the air–liquid interface on different subphases. Furthermore, the mineralization of calcium Phosphate beneath the monolayer at different calcium and phosphate concentrations versus mineralization time shows that at low calcium and Phosphate concentrations needles form, whereas flakes and spheres dominate at higher concentrations. Energy-dispersive X-ray spectroscopy, X-ray photoelectron spectroscopy, and electron diffraction confirm the formation of calcium phosphate. High-resolution transmission electron microscopy and electron diffraction confirm the predominant formation of octacalcium phosphate and hydroxyapatite. The data also indicate that the final products form via a complex multistep reaction, including an association step, where nano-needles aggregate into larger flake-like objects. KW - Dendritic amphiphile KW - Calcium phosphate KW - Biomineralization PY - 2017 DO - https://doi.org/10.1002/mabi.201600524 SN - 1616-5187 SN - 1616-5195 VL - 17 IS - 8 SP - Article 1600524, 1 EP - 14 AN - OPUS4-41825 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Yegen, E. A1 - Zimmermann, Uwe A1 - Unger, Wolfgang A1 - Braun, T. T1 - C-F bond cleavage during derivatization reactions of amino groups with TFBA and PFB at plasma-processed organic surfaces? N2 - Chemical derivatization XPS is used for the quantitative determination of amines at conventional organic surfaces, and it is also applied to plasma-processed aminated surfaces. When using TFBA and PFB as derivatization reagents for tagging primary amino groups, unexpected fluorine species were observed in the second case. The existence of reaction pathways other than those expected for amine derivatization with PFB or TFBA has to be assumed. This phenomenon is tentatively interpreted as the result of C—F bond cleavage during derivatization reactions of TFBA and PFB at plasma-polymerized allylamine and other plasma-processed aminated surfaces. As a consequence, quantification procedures based on derivatization by PFB or TFBA will underestimate amine surface concentrations. KW - Aminated surfaces KW - Chemical derivatization KW - ESCA KW - Plasma polymers KW - XPS PY - 2009 DO - https://doi.org/10.1002/ppap.200800100 SN - 1612-8850 SN - 1612-8869 VL - 6 IS - 1 SP - 11 EP - 16 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-18686 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Chemical imaging in the nanoworld - A certified reference material for chemical imaging at the nanoscale KW - Reference material KW - Nanoscale KW - ToF-SIMS KW - Chemical imaging PY - 2008 SN - 1614-7847 SN - 1614-7855 VL - 01 SP - 34 EP - 38 PB - Wiley-VCH CY - Weinheim AN - OPUS4-17392 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Brainstorming on future projects in surface bioanalysis and analysis of organic surfaces: Determination of functional groups at surfaces by derivatization ESCA T2 - CCQM Surface Analytical Working Group Meeting CY - Sèvres, France DA - 2008-04-01 PY - 2008 AN - OPUS4-17384 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - Surface chemical analysis of plasma polymer films: How far shines the light today? - Chemische Oberflächencharakterisierung von Plasmapolymerschichten: Was leisten die Messverfahren heute? N2 - A survey is given on how a combination of modern methods of surface analysis with appropriate data evaluation procedures can be used to provide a thorough chemical characterization of plasma polymerized organic films often called plasma polymers. Technologically relevant parameters can be monitored versus variation of plasma process parameters and during ageing of the films on air. The level of development of analytical approaches reached during the last ten years opens many options which are useful to be applied in plasma process development, optimization and control. However, in a number of important cases further development of analytical methods is required. Another future challenge is to develop standards with metrological underpinning to reach comparability of measurements in the community. Translated Abstract Chemische Oberflächencharakterisierung von Plasmapolymerschichten: Was leisten die Messverfahren heute? Es wird ein Überblick gegeben, wie mit dem kombinierten Einsatz moderner Methoden der Oberflächenanalytik und fortgeschrittener Datenreduktionsverfahren eine umfassende chemische Charakterisierung von plasmachemisch abgeschiedenen organischen Schichten, oft als Plasmapolymere bezeichnet, erreicht werden kann. Die chemischen Eigenschaften sind bestimmend für wichtige technologische Parameter der Schichten und können sowohl durch Plasmaprozessparameter als auch von der Liegezeit bestimmt werden. Eine Standardisierung von Prozeduren der Oberflächenanalytik zur Charakterisierung von Plasmapolymeren und ihre metrologische Begründung sind Schwerpunkte in der weiteren Entwicklung. KW - Plasma polymere KW - ESCA KW - NEXAFS KW - ToF-SIMS PY - 2008 DO - https://doi.org/10.1002/vipr.200800358 SN - 0947-076X SN - 1522-2454 VL - 20 IS - 4 SP - 20 EP - 27 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-17782 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baytekin, H.T. A1 - Baytekin, B. A1 - Schulz, a. A1 - Springer, A. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Artamonova, M. A1 - Schlecht, S. A1 - Lentz, D. A1 - Schalley, C.A. T1 - Metallo-supramolecular nanospheres via hierarchical self-assembly N2 - A novel coordination oligo/polymer is synthesized by metal-directed self-assembly from equimolar amounts of the (dppp)M(OTf)2 precursor complexes (dppp = bis-(diphenylphosphino)-propane, OTf = triflate; M = PdII or M = PtII) and banana-shaped bidentate dipyridyl ligands. The assemblies were characterized by ESI mass spectrometry and NMR spectroscopy. The analysis of the cloudy suspension prepared by dissolving the coordination polymer in aqueous methanol solutions indicates nanosized spherical objects to form. Evidence for vesicle formation from these metallo-supramolecular oligomers comes from (cryogenic) transmission electron microscopy (TEM, cryo-TEM). Atomic force microscopy revealed stable nanospheres on hydrophilic mica and monolayer formation on hydrophobic highly oriented pyrolitic graphite (HOPG) substrates. On mica, also torus-shaped object were observed, which are rationalized by vesicles that opened during the drying procedure and released the internal solvent. Elemental analysis of the nanoassemblies by X-ray photoelectron spectroscopy (XPS) indicates uncoordinated and coordinated pyridines in the coordination polymers that form the nanospheres. Various control experiments using different metal centers and modified ligands support the conclusions. KW - Self-assembly KW - Metallo-supramolecular chemistry KW - Coordination polymers KW - Vesicles KW - Electron microscopy KW - Nano-materials PY - 2009 DO - https://doi.org/10.1021/cm900642p SN - 0897-4756 SN - 1520-5002 VL - 21 IS - 13 SP - 2980 EP - 2992 PB - American Chemical Society CY - Washington, DC AN - OPUS4-19638 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrologie und Standardisierung in der Oberflächenanalytik mit XPS T2 - 1. Nutzertreffen deutscher Anwender von KRATOS ESCA-Spektrometern CY - Berlin, Germany DA - 2009-06-15 PY - 2009 AN - OPUS4-19539 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Graf, Nora A1 - Yegen, E. A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Weigel, W. A1 - Krakert, S. A1 - Terfort, A. A1 - Unger, Wolfgang T1 - XPS and NEXAFS studies of aliphatic and aromatic amine species on functionalized surfaces N2 - The chemical constitution of functionalized supports is an important parameter that determines their performance in a broad range of applications, e.g. for immobilization of biomolecules. Supports with amino functionalized surfaces are also often used for DNA microarray experiments. However, spectral data which have been reported for surfaces with amino functionalities suffer from some inconsistencies. In this article a detailed XPS (X-ray photoelectron spectroscopy) and NEXAFS (Near edge X-ray absorption fine structure) database for amino functionalized surfaces is presented. Amino-terminated surfaces prepared from aliphatic and aromatic aminosilanes or aminothiols and a field sample are considered. Effects of aging in air and damage by radiation are addressed as well. KW - Near edge X-ray absorption fine structure (NEXAFS) KW - Self-assembled monolayers KW - Amino-functionalized surfaces KW - X-ray photoelectron spectroscopy (XPS) PY - 2009 DO - https://doi.org/10.1016/j.susc.2009.07.029 SN - 0039-6028 VL - 603 IS - 18 SP - 2849 EP - 2860 PB - Elsevier CY - Amsterdam AN - OPUS4-19832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Graf, Nora A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Krakert, S. A1 - Schüpbach, B. A1 - Terfort, A. A1 - Unger, Wolfgang T1 - Amine species on self-assembled monolayers of omega-aminothiolates on gold as identified by XPS and NEXAFS spectroscopy N2 - Functionalised surfaces are of interest in many fields, e.g. in biomedicine, materials science and molecular electronics. In this study a series of self-assembled aliphatic and aromatic monolayers on gold substrates with terminal amino groups was investigated. Four different thiol molecules were used: aliphatic 11-aminoundecane-1-thiol (AUDT), aromatic 4-aminobenzenethiol (ABT) and aromatic ω-amino thiols with an alkyl spacer as 4-aminophenylbutane-1-thiol (APBT) and 3-(4''-amino-1,1':4',1''-terphenyl-4-yl)propane-1-thiol (ATPT). Evaluation of N 1s XPS data revealed that on the aromatic self-assembled monolayers (SAMs) amino groups exist preferentially as primary amines, whereas on the aliphatic SAM protonated and/or hydrogen-bonded amines are the major species. This result is crosschecked by N K edge near edge X-ray absorption fine structure (NEXAFS) spectroscopy and can be rationalised by the different basicity of aliphatic and aromatic amines. KW - Self-assembled monolayer KW - Amines KW - XPS KW - NEXAFS KW - Surface analysis PY - 2010 DO - https://doi.org/10.1002/sia.3224 SN - 0142-2421 SN - 1096-9918 VL - 42 SP - 1184 EP - 1187 PB - Wiley CY - Chichester AN - OPUS4-21498 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Gross, Thomas A1 - Wirth, Thomas A1 - Castelli, R. A1 - Shard, A.G. A1 - Alexander, M. A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Surface analytical characterization of carbohydrate microarrays N2 - Microarrays are a versatile platform for diagnostics and high-throughput analysis. Carbohydrate microarrays are valuable tools to investigate interactions with other molecules since many glycans are involved in fundamental biological processes. A combined X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) surface analysis was used to investigate the basic steps in the production of carbohydrate microarrays. The preparation included coupling of a thiol-terminated mannoside to maleimide-functionalized glass surfaces derived from γ-aminopropyl silane (GAPS) slides. XPS results clearly demonstrate successful chemical modification in each fabrication step, and ToF-SIMS imaging revealed immobilized carbohydrates in the spotted regions of the final microarray. KW - Carbohydrates KW - Microarrays KW - XPS KW - ToF-SIMS KW - Nona-mannoside KW - Maleimide surfaces KW - Surface analysis PY - 2010 DO - https://doi.org/10.1002/sia.3255 SN - 0142-2421 SN - 1096-9918 VL - 42 SP - 1188 EP - 1192 PB - Wiley CY - Chichester AN - OPUS4-21500 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Optimierung von Microarrays durch Anwendung physikalischer Methoden der chemischen Oberflächenanalytik T2 - 2. Berlin-Brandenburger Technologieforum "In-Vitro-Diagnostik und Bioanalytik" CY - Berlin, Germany DA - 2010-06-11 PY - 2010 AN - OPUS4-21655 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Pippig, F. A1 - Merz, B. A1 - Merz, R. A1 - Vohrer, U. A1 - Mix, Renate A1 - Steffen, H. A1 - Bremser, Wolfram A1 - Unger, Wolfgang T1 - Determination of OH groups at plasma oxidised poly(propylene) by TFAA chemical derivatisation XPS: an inter-laboratory comparison N2 - A first inter-laboratory comparison was conducted to demonstrate and document the capability of interested laboratories to measure the fraction of C—OH species on a plasma oxidised poly(propylene) sample by using a chemical derivatisation XPS approach. This report presents the results from that inter-laboratory comparison and includes the data received for the measured values and their associated standard deviations of laboratory means, at a 95% confidence level. The measurements were guided by a protocol developed within the group before and summarised shortly in the paper. Standard deviations that may characterise the state-of-the-art for the nominally simple and rather often practised case of TFAA chemical derivatisation XPS of C—OH species on a plasma oxidised polyolefin surface are calculated following ISO 5725-2:1994. The main conclusion is that the associated degree of equivalence reached by the participating laboratories in this comparison is still low. Further research to improve chemical derivatisation XPS protocols is mandatory. KW - Chemical derivatisation KW - ESCA/XPS KW - Inter-laboratory comparison KW - Photoelectron spectroscopy (PES) KW - Poly(propylene) (PP) PY - 2010 DO - https://doi.org/10.1002/ppap.200900142 SN - 1612-8850 SN - 1612-8869 VL - 7 IS - 6 SP - 494 EP - 503 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-21678 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, Pierre-Luc A1 - Retzko, Iris A1 - Swaraj, Sufal A1 - Matsubayashi, N. A1 - Gross, Thomas A1 - Mix, Renate A1 - Unger, Wolfgang T1 - Non-destructive sub-surface chemical characterization of air-exposed plasma polymers by energy-resolved XPS KW - Plasma polymers KW - Synchrotron XPS KW - Depth profiling KW - Derivatisation PY - 2010 DO - https://doi.org/10.1002/ppap.200900130 SN - 1612-8850 SN - 1612-8869 VL - 7 IS - 6 SP - 474 EP - 481 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-21711 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baytekin, H. Tarik A1 - Wirth, Thomas A1 - Gross, Thomas A1 - Sahre, Mario A1 - Unger, Wolfgang A1 - Theisen, J. A1 - Schmidt, M. T1 - Surface analytical characterization of micro-fluidic devices hot embossed in polymer wafers: Surface chemistry and wettability N2 - Recently, time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) instrumentation has been used to address areas of interest within micro-fluidic devices providing full access to the surface chemistry established at the bottom of micro-channels therein. After careful calibration, information on surface chemistry as obtained by ToF-SIMS or XPS can be interpreted in terms of wettability expressed as contact angles which are then characteristic for the inner walls of micro-channels. Standard contact angle measurement is not applicable in micro-channels. The approach has been demonstrated to be successful with two different micro-fluidic devices hot embossed into high-end quality poly(methyl methacrylate) (PMMA) or Polycarbonate wafers. A pre-selected surface chemistry at micro-channel walls can be established by plasma technologies but ageing and rinsing effects have to be under control. A combination of ToF-SIMS, XPS and contact angle measurement techniques has been demonstrated to provide the required information. Finally, it is shown by ToF-SIMS and XPS analysis that in the production of micro-fluidic parts during practical processing using hot embossing technologies, material originating from cover foils will reside on the polymer wafer's surface. Moreover, residues of releasing agents as silicone oil used during processing can be detected by ToF-SIMS. Both cover foil residues and silicones are issues of trouble shooting in micro-fluidics because they will change contact angles efficiently. KW - Micro-fluidic device KW - PMMA KW - Polycarbonate KW - Plasma treatment KW - Wettability KW - ToF-SIMS KW - XPS PY - 2010 DO - https://doi.org/10.1002/sia.3149 SN - 0142-2421 SN - 1096-9918 VL - 42 IS - 8 SP - 1417 EP - 1431 PB - Wiley CY - Chichester AN - OPUS4-21712 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Charakterisierung von Microarrays durch Anwendung physikalischer Methoden der chemischen Oberflächenanalytik KW - Oberflächenmodifizierungen KW - Self-assemblierende Monolagen KW - Thiole KW - Aminierte Oberflächen KW - Microarrays KW - XPS KW - ToF-SIMS PY - 2010 UR - http://www.analytik-news.de/Fachartikel/Volltext/BAM1.pdf SP - 1 EP - 11 PB - Dr. Beyer Internet-Beratung CY - Ober-Ramstadt AN - OPUS4-21834 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Dietrich, Paul A1 - Graf, Nora A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Schüpbach, B. A1 - Terfort, A. A1 - Unger, Wolfgang T1 - Characterization of self-assembled monolayers of terphenylthiols with amine head groups KW - Terphenylthiolate SAMs KW - Gold KW - Microarray KW - NEXAFS PY - 2008 SP - 195 EP - 197 AN - OPUS4-22909 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Einsatz molekularer Monoschichten in BAM - AG Schicht- und Oberflächenanalytik T2 - DFG-Rundgespräch "Molekulare Monoschichten" CY - Günzburg, Germany DA - 2010-07-12 PY - 2010 AN - OPUS4-23069 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Graf, Nora A1 - Yegen, E. A1 - Lippitz, Andreas A1 - Treu, Dieter A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Optimization of cleaning and aminosilanization protocols for Si wafers to be used as platforms for biochip microarrays by surface analysis (XPS, ToF-SIMS and NEXAFS spectroscopy) N2 - It is known that aminosilanized Si wafers may be used as microarray platforms. Results of an XPS study of a cleaning applied to Si wafers prior to aminosilanization are presented and discussed. Furthermore, the results of an aminosilanization protocol optimized in terms of nitrogen chemistry are described. After optimization of the protocol a free amine content of 94% was reached. The surface chemistry was investigated in this study by using XPS, time of flight (ToF)-SIMS and near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. Reference to aminosilanization protocols reported in the literature has been made. KW - Aminosilanization KW - Si wafers KW - Microarray KW - XPS KW - ToF-SIMS KW - NEXAFS PY - 2008 DO - https://doi.org/10.1002/sia.2621 SN - 0142-2421 SN - 1096-9918 VL - 40 IS - 3-4 SP - 180 EP - 183 PB - Wiley CY - Chichester AN - OPUS4-17192 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Yegen, E. A1 - Lippitz, Andreas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Derivatization of amino groups by pentafluorobenzaldehyde (PFB) as observed by XPS and NEXAFS spectroscopy on spin coated 4,4'-methylenebis(2,6-diethylaniline) films N2 - A toluene solution of 4,4´-methylenebis(2,6-diethylaniline) was spin coated on Si wafers. The samples were derivatized with pentafluorobenzaldehyde (PFB) in order to determine the primary amino groups on the surface. XPS C 1s and N 1s and C and N K-edge NEXAFS of underivatized and derivatized films were carefully analyzed. The result was that after 10 min of exposure the gas-surface reaction was already completed. A reasonable derivatization reaction yield in the order of 90% is derived from the experiments. This number correlates well to a reaction yield obtained by a wet chemical approach. KW - Amino groups KW - Derivatization KW - PFB KW - XPS KW - NEXAFS PY - 2008 DO - https://doi.org/10.1002/sia.2685 SN - 0142-2421 SN - 1096-9918 VL - 40 IS - 3-4 SP - 176 EP - 179 PB - Wiley CY - Chichester AN - OPUS4-17193 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baytekin, H.T. A1 - Wirth, Thomas A1 - Gross, Thomas A1 - Treu, Dieter A1 - Sahre, Mario A1 - Theisen, J. A1 - Schmidt, M. A1 - Unger, Wolfgang T1 - Determination of wettability of surface-modified hot-embossed polycarbonate wafers used in microfluidic device fabrication via XPS and ToF-SIMS N2 - The wettability of the surfaces inside the microchannels of a microfluidic device is an important property considering a liquid flows through them. Contact angle measurements usually applied to test the wettability of surfaces cannot be used for an analysis of microchannel walls within microfluidic devices. A workaround is the use of surface analytical methods, which are able to reach points of interest in microchannels and may provide information on the surface chemistry established there. In calibrating these methods by using flat polymer wafers, where the contact angle can be measured as usual, data measured in real microchannels can be evaluated in terms of wetting properties. Reference wafers of bisphenol-A polycarbonate, a polymeric material that is often used in fluidic microdevice fabrication, were treated under different oxygen plasma conditions. The modified surfaces were characterized by using XPS, time of flight (ToF)-SIMS and atomic force microscope (AFM). Surface chemistry and surface topography have been correlated with contact angle measurements. In addition, effects of ageing or rinsing after plasma treatment have also been investigated. KW - Oxygen plasma KW - Polycarbonate KW - XPS KW - ToF-SIMS KW - Principal component analysis PY - 2008 DO - https://doi.org/10.1002/sia.2724 SN - 0142-2421 SN - 1096-9918 VL - 40 IS - 3-4 SP - 358 EP - 363 PB - Wiley CY - Chichester AN - OPUS4-17340 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface chemical analysis - General procedures - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser T2 - The 17th plenary meeting of ISO/TC 201 "Surface Chemical Analysis" CY - Vevey, Switzerland DA - 2008-09-18 PY - 2008 AN - OPUS4-18127 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Chemische Oberflächencharakterisierung von Plasmapolymerschichten mit XPS, XAS und ToF-SIMS: Was leisten Messverfahren? T2 - 15. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 15) CY - Soest, Germany DA - 2008-09-08 PY - 2008 AN - OPUS4-18116 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Determination of OH Groups on Organic Surfaces T2 - The 17th plenary meeting of OSI/TC 201 "Surface Chemical Analysis" CY - Vevey, Switzerland DA - 2008-09-18 PY - 2008 AN - OPUS4-18135 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Powell, C. T1 - Surface chemical analysis - General procedures - Determination of lateral resolution KW - AES KW - Contrast transfer function KW - Imaging KW - ISO TC 201 KW - Lateral resolution KW - Performance of imaging instruments KW - Quality management systems KW - Simulation KW - SIMS KW - XPS PY - 2009 SP - 1 EP - 65 AN - OPUS4-19158 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winzer, Nicholas A1 - Xu, Ping A1 - Bender, S. A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Cross, Carl Edward T1 - Stress corrosion cracking of gas-tungsten arc welds in continuous-cast AZ31 Mg alloy sheet N2 - AZ31 Mg alloy sheet was welded using a gas-tungsten arc (GTA) process over inserts containing 2.3-9.3 wt.% Al. The welded specimens were susceptible to SCC in distilled water, with susceptibility increasing with decreasing weld metal Al (or β particle) concentration. Primary stress corrosion cracks initiated at the weld metal-HAZ interface by stress-assisted localised dissolution and propagated through the weld and base metals by transgranular and intergranular H-assisted fracture (TG-HAF and IG-HAF) respectively. The IG fracture mode may be intrinsic to the texture imparted upon the base metal by rolling. The increase in SCC susceptibility with decreasing weld metal Al concentration is contrary to the purported roles of β particles in promoting localised corrosion and as crack nucleation sites, but corresponds with increases in weld - base metal galvanic current density and weld metal localised corrosion susceptibility. KW - C. Stress corrosion KW - C. Hydrogen embrittlement KW - A. Magnesium KW - C. Welding PY - 2009 DO - https://doi.org/10.1016/j.corsci.2009.05.037 SN - 0010-938X VL - 51 IS - 9 SP - 1950 EP - 1963 PB - Elsevier CY - Orlando, Fla. AN - OPUS4-20049 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrological Challenges in Surface Micro/Nano Analysis (SMNA) T2 - 13th European Conference on Apllications of Surface and Interface Analysis, ECASIA 09 CY - Antalya, Turkey DA - 2009-10-18 PY - 2009 AN - OPUS4-20201 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Graf, Nora A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Schüpbach, B. A1 - Bashir, A. A1 - Wöll, Ch. A1 - Terfort, A. A1 - Unger, Wolfgang T1 - Self-assembled monolayers of aromatic omega-aminothiols on gold: surface chemistry and reactivity N2 - Amino-terminated self-assembled monolayers on gold substrates were studied by X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure (NEXAFS) measurements, and atomic force microscopy (AFM). Two different ω-amino-4,4'-terphenyl substituted alkanethiols of the general structure H2N-(C6H4)3-(CH2)n-SH (ATPn) were used: 2-(4''-amino-1,1':4',1''-terphenyl-4-yl)ethane-1-thiol (n = 2, ATP2) and 3-(4''-amino-1,1':4',1''-terphenyl-4-yl)propane-1-thiol (n = 3, ATP3). Moreover, the addressability of amino groups within the films was investigated by chemical derivatization of ATPn SAMs with 3,5-bis(trifluoromethyl)phenyl isothiocyanate (ITC) forming fluorinated thiourea ATPn-F films. Evaluation of high-resolution C 1s and N 1s XPS data revealed successful derivatization of at least 50% of surface amino species. Furthermore, it could be demonstrated by angle-resolved NEXAFS spectroscopy that chemical derivatization with ITC has no noticeable influence on the preferential upright orientation of the molecules in the SAMs. KW - Gold KW - Self-assembled monolayer KW - Thiols KW - Amino surfaces KW - XPS KW - NEXAFS PY - 2010 DO - https://doi.org/10.1021/la903293b SN - 0743-7463 SN - 1520-5827 VL - 26 IS - 6 SP - 3949 EP - 3954 PB - American Chemical Society CY - Washington, DC AN - OPUS4-20990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - König, R. A1 - Scholz, G. A1 - Scheurell, K. A1 - Heidemann, D. A1 - Buchem, I. A1 - Unger, Wolfgang A1 - Kemnitz, E. T1 - Spectroscopic characterization of crystalline AIF3 phases N2 - A comprehensive spectroscopic characterization of all known crystalline AlF3 phases (α-, β-, η-, κ-, θ-AlF3) is presented for the first time in this study. Beside their X-ray diffraction powder patterns, which were already published in the literature, 27Al and 19F MAS NMR, FT IR and XPS spectroscopic techniques were applied for all phases in a consistent manner. For all phases prepared the utilization of 27Al satellite transition (SATRAS) NMR allowed to determine the quadrupolar parameters of the aluminium sites including their distributions. In addition, η-AlF3 was isolated with high phase purity and characterized following a new preparation path different from those known so far in the literature. KW - Crystalline aluminium fluorides KW - Solid state NMR KW - FT IR KW - XPS PY - 2010 DO - https://doi.org/10.1016/j.jfluchem.2009.10.015 SN - 0022-1139 SN - 1873-3328 VL - 131 IS - 1 SP - 91 EP - 97 PB - Elsevier CY - Amsterdam AN - OPUS4-20991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - ISO/TC 201 - Inhalte und Stand der Dinge T2 - DIN-Workshop: Chemische Oberflächenanalyse - Ist eine Vertretung deutscher Interessen in der Internationalen Normung notwendig? CY - Berlin, Germany DA - 2010-04-19 PY - 2010 AN - OPUS4-21185 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis Working Group: Report for 2009/10 T2 - CCQM Plenary Meeting, BIPM CY - Sèvres, France DA - 2010-04-15 PY - 2010 AN - OPUS4-21186 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - BAM Certified Reference Materials for Surface Chemical and Nano Analysis T2 - International Symposium on Reference Materials NIM 2010 CY - Beijing, China DA - 2010-10-27 PY - 2010 AN - OPUS4-22398 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrological Challenges in Surface Micro/Nano Analysis (SMNA): The activities of the CCQM Surface Analysis Working Group (SAWG) T2 - International Symposium on Reference Materials NIM 2010 CY - Beijing, China DA - 2010-10-27 PY - 2010 AN - OPUS4-22399 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Leach, R.K. A1 - Boyd, R. A1 - Burke, T. A1 - Danzebrink, H.-U. A1 - Dirscherl, K. A1 - Dziomba, T. A1 - Gee, M. A1 - Koenders, L. A1 - Morazzani, V. A1 - Pidduck, A. A1 - Roy, D. A1 - Unger, Wolfgang A1 - Yacoot, A. T1 - The European nanometrology landscape N2 - This review paper summarizes the European nanometrology landscape from a technical perspective. Dimensional and chemical nanometrology are discussed first as they underpin many of the developments in other areas of nanometrology. Applications for the measurement of thin film parameters are followed by two of the most widely relevant families of functional properties: measurement of mechanical and electrical properties at the nanoscale. Nanostructured materials and surfaces, which are seen as key materials areas having specific metrology challenges, are covered next. The final section describes biological nanometrology, which is perhaps the most interdisciplinary applications area, and presents unique challenges. Within each area, a review is provided of current status, the capabilities and limitations of current techniques and instruments, and future directions being driven by emerging industrial measurement requirements. Issues of traceability, standardization, national and international programmes, regulation and skills development will be discussed in a future paper. KW - Nanotechnology KW - Metrology KW - Chemistry KW - Surface analysis PY - 2011 DO - https://doi.org/10.1088/0957-4484/22/6/062001 SN - 0957-4484 SN - 1361-6528 VL - 22 IS - 6 SP - 062001-1 - 062001-15 PB - IOP Publishing Ltd. CY - Bristol AN - OPUS4-23259 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Min, Hyegeun A1 - Wettmarshausen, Sascha A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - A ToF-SIMS study of the deuterium-hydrogen exchange induced by ammonia plasma treatment of polyolefins N2 - ToF-SIMS has been used to study the surface functionalization of polypropylene and polyethylene samples by exposure to low-pressure ammonia plasma. Static secondary ion mass spectrometry is an appropriate tool to determine hydrogen isotopes as elements and in fragment ions with high sensitivity and selectivity. Specifically the exchange of hydrogen isotopes and the incorporation of N-containing moieties in the near-surface layer of the polyolefins have been studied in ND3 plasma experiments with conventional polypropylene (h-PP) and polyethylene (h-PE) and NH3 plasma experiments with deuterated polyethylene (d-PE). Considering the exchange of hydrogen between the plasma and the polymer surface studied by using deuterated ammonia and polyolefin samples the conclusion has been derived that polypropylene with its side chain methyl groups is more susceptible to hydrogen exchange reactions. For ND3 plasma treatment of polyethylene and polypropylene similar N-containing fragments were obtained and the measured semi-quantitative ToF-SIMS N-uptake data are rather similar. The observation of a wide range of characteristic mixed CkNlHmDn+ secondary fragment ions suggests complex and manifold reaction pathways at the polymer–plasma interface besides simple grafting of –ND2 or –NH2 moieties formed by ammonia fragmentation in the plasma. Finally, indications of an isotopic effect for hydrogen isotopes in the plasma process have been observed by comparison of ND3/h-PE results with those of NH3/d-PE. KW - ToF-SIMS KW - Hydrogen-deuterium exchange KW - Ammonia plasma treatment KW - Amine-functionalized polymer KW - Polyolefins PY - 2011 DO - https://doi.org/10.1039/c1ja10043b SN - 0267-9477 SN - 1364-5544 VL - 26 SP - 1157 EP - 1165 PB - Royal Society of Chemistry CY - London AN - OPUS4-23754 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Treu, Dieter A1 - Ünveren, E. A1 - Kemnitz, G. A1 - Unger, Wolfgang T1 - Characterization of Cr(III) compounds of O, OH, F and Cl by XPS N2 - Cr2O3, CrCl3, α-CrF3, CrF3·3H20 and Cr(OH)3 were investigated by x-ray photoelectron (XPS) and x-ray excited Auger electron spectroscopy (XAES) using a latest generation XPS spectrometer. Non-conductive powders are analyzed with ultimate energy resolution. Multiplet splitting features and/or satellite emission were observed in the Cr 2p and Cr 3s spectra. Cr(III) compounds are of interest in many applications as for example in corrosion and catalysis. Chromia and chromium-III-fluoride activated by reaction with fluoroalkanes are very promising industrial catalysts. It is the aim of this selection of spectral reference data to enable deeper insight in the formation of catalytically active fluorinated chromia phases by using XPS analysis. KW - Chromium(III) compound KW - Cr2O3 KW - CrCl3 KW - Cr(OH)3 KW - CrF3 KW - CrF3.3H2O KW - XPS KW - XAES KW - Multiplet splitting KW - Satellite KW - Powder chromium(III) compounds PY - 2008 DO - https://doi.org/10.1116/11.20080801 SN - 1055-5269 SN - 1520-8575 VL - 15 SP - 77 EP - 123 PB - AIP CY - Woodbury, NY AN - OPUS4-23387 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Girard-Lauriault, Pierre-Luc A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Min, Hyegeun A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P. H. A1 - Unger, Wolfgang T1 - Adlayers of dimannoside thiols on gold: surface chemical analysis N2 - Carbohydrate films on gold based on dimannoside thiols (DMT) were prepared, and a complementary surface chemical analysis was performed in detail by X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), near-edge X-ray absorption fine structure (NEXAFS), FT-IR, and contact angle measurements in order to verify formation of ω-carbohydrate-functionalized alkylthiol films. XPS (C 1s, O 1s, and S 2p) reveals information on carbohydrate specific alkoxy (C–O) and acetal moieties (O–C–O) as well as thiolate species attached to gold. Angle-resolved synchrotron XPS was used for chemical speciation at ultimate surface sensitivity. Angle-resolved XPS analysis suggests the presence of an excess top layer composed of unbound sulfur components combined with alkyl moieties. Further support for DMT attachment on Au is given by ToF-SIMS and FT-IR analysis. Carbon and oxygen K-edge NEXAFS spectra were interpreted by applying the building block model supported by comparison to data of 1-undecanethiol, poly(vinyl alcohol), and polyoxymethylene. No linear dichroism effect was observed in the angle-resolved C K-edge NEXAFS. KW - Carbohydrates KW - Self-assembled monolayer KW - XPS KW - NEXAFS KW - ToF-SIMS KW - Surface chemical analysis PY - 2011 DO - https://doi.org/10.1021/la104038q SN - 0743-7463 SN - 1520-5827 VL - 27 IS - 8 SP - 4808 EP - 4815 PB - American Chemical Society CY - Washington, DC AN - OPUS4-23554 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Manier, Charles-Alix A1 - Spaltmann, Dirk A1 - Woydt, Mathias A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - NEXAFS study of carbon hard coatings tribo-tested under slip-rolling conditions KW - Synchrotron KW - NEXAFS KW - Carbon hard coating KW - Tribology PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2006.pdf#page=159 SN - 0179-4159 SP - 159 EP - 161 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Girard-Lauriault, P.-L. A1 - Wertheimer, M. R. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - NEXAFS Surface Chemical Characterisation of Atmospheric Pressure deposited N-rich Plasma-Polymer Films for Tissue Engineering KW - Synchrotron KW - NEXAFS KW - Plasma-Polymer KW - Tissue Engineering PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2006.pdf#page=248 SN - 0179-4159 SP - 248 EP - 250 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17453 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrological challenges in surface analysis T2 - CCQM 2008 Workshop CY - Sèvres, France DA - 2008-04-02 PY - 2008 AN - OPUS4-17476 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis T2 - BIPM Metrology Summer School 2008 CY - Sèvres, France DA - 2008-06-29 PY - 2008 AN - OPUS4-17804 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, P.-L. A1 - Desjardins, P. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Wertheimer, M. R. T1 - Chemical characterisation of nitrogen-rich plasma-polymer films deposited in dielectric barrier discharges at atmospheric pressure N2 - We have used an atmospheric pressure DBD apparatus to deposit novel families of N-rich plasma polymers (PP:N), using mixtures of three different hydrocarbon precursors in nitrogen at varying respective gas flow ratios. This research focuses on the overall chemical characterisation of those materials, with specific attention to (semi)-quantitative analysis of functional groups. Well-established and some lesser-known analytical techniques have been combined to provide the best possible chemical and structural characterisations of these three families of PP:N thin films, namely XPS, NEXAFS and FT-IR spectroscopy. KW - NEXAFS KW - XPS KW - DBD-plasma KW - Plasma polymerization PY - 2008 DO - https://doi.org/10.1002/ppap.200800054 SN - 1612-8850 SN - 1612-8869 VL - 5 IS - 7 SP - 631 EP - 644 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-17820 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weigel, W. A1 - Unger, Wolfgang A1 - Graf, Nora A1 - Gross, Thomas A1 - Wirth, Thomas T1 - Surface Chemical Analysis of DNA Microarrays - Application of XPS and ToF-SIMS for Surface Chemical Imaging on the µm Scale KW - Microarrays KW - Oberflächenanalytik KW - XPS KW - ToF-SIMS KW - Chemical imaging PY - 2008 SN - 1611-597X VL - 12 IS - 10 SP - 14 EP - 16 PB - GIT-Verlag CY - Darmstadt AN - OPUS4-18307 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Truica-Marasescu, F. A1 - Girard-Lauriault, P.-L. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Wertheimer, M. R. T1 - Nitrogen-rich plasma polymers: Comparison of films deposited in atmospheric- and low-pressure plasmas N2 - Low- and atmospheric-pressure plasma co-polymerisations of binary gas mixtures of C2H4 and NH3 or N2, respectively, were investigated for depositing N-rich plasma polymer coatings for biomedical applications. Deposition kinetics and relevant surface characteristics of resulting plasma polymerised ethylene enriched with nitrogen, “PPE:N”, coatings were investigated as a function of the gas mixture ratio, X = NH3(N2)/C2H4. Physico-chemical properties of the coatings were determined using a combination of complementary surface-sensitive techniques: for example, total nitrogen concentrations, [N], up to 40 at.% were measured by X-ray Photoelectron Spectroscopy, XPS, while those of primary amines, [–NH2], were determined by performing chemical derivatisation followed by XPS analyses. PPE:N films were further characterised by UV–VIS Ellipsometry, Near Edge X-ray Absorption Fine Structure Spectroscopy, IR Spectroscopy and by Contact Angle Goniometry measurements. The stability of the coatings was tested, both in terms of water solubility and of “ageing” in ambient atmosphere. For the latter, selected samples were stored in the laboratory for different durations, in order to assess possible changes in their chemical structures. KW - Aging KW - Deposition process KW - Ethylene KW - Fourier transform infrared spectroscopy (FTIR) KW - Glow discharge KW - Plasma polymers KW - Surface chemistry KW - Surface energy PY - 2008 DO - https://doi.org/10.1016/j.tsf.2008.02.033 SN - 0040-6090 VL - 516 IS - 21 SP - 7406 EP - 7417 PB - Elsevier CY - Amsterdam AN - OPUS4-18279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Graf, Nora A1 - Gross, Thomas A1 - Wirth, Thomas A1 - Weigel, W. A1 - Unger, Wolfgang T1 - Application of XPS and ToF-SIMS for surface chemical analysis of DNA microarrays and their substrates N2 - The chemical composition of the functional surfaces of substrates used for microarrays is one of the important parameters that determine the quality of a microarray experiment. In addition to the commonly used contact angle measurements to determine the wettability of functionalized supports, X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are more specific methods to elucidate details about the chemical surface constitution. XPS yields information about the atomic composition of the surface, whereas from ToF-SIMS, information on the molecular species on the surface can be concluded. Applied on printed DNA microarrays, both techniques provide impressive chemical images down to the micrometer scale and can be utilized for label-free spot detection and characterization. Detailed information about the chemical constitution of single spots of microarrays can be obtained by high-resolution XPS imaging. KW - Microarrays KW - Surface analysis KW - XPS KW - ToF-SIMS KW - Chemical imaging PY - 2009 DO - https://doi.org/10.1007/s00216-009-2599-x SN - 1618-2642 SN - 1618-2650 VL - 393 IS - 8 SP - 1907 EP - 1912 PB - Springer CY - Berlin AN - OPUS4-19245 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Seah, M.P. A1 - Unger, Wolfgang A1 - Wang, H. A1 - Jordaan, W. A1 - Gross, Thomas A1 - Dura, J.A. A1 - Moon, D.W. A1 - Totarong, P. A1 - Krumrey, M. A1 - Hauert, R. A1 - Zhiqiang, M. T1 - Ultra-thin SiO2 on Si IX: absolute measurements of the amount of silicon oxide as a thickness of SiO2 on Si N2 - Results from a study conducted between National Metrology Institutes (NMIs) for the measurements of the absolute thicknesses of ultra-thin layers of SiO2 on Si are reported. These results are from a key comparison and associated pilot study under the auspices of the Consultative Committee for Amount of Substance. ´Amount of substance´ may be expressed in many ways, and here the measurand is the thickness of the silicon oxide layers with nominal thicknesses in the range 1.5-8 nm on Si substrates, expressed as the thickness of SiO2. Separate samples were provided to each institute in containers that limited the carbonaceous contamination to approximately < 0.3 nm. The SiO2 samples were of ultra-thin on (100) and (111) orientated wafers of Si. The measurements from the laboratories which participated in the study were conducted using ellipsometry, neutron reflectivity, X-ray photoelectron spectroscopy or X-ray reflectivity, guided by the protocol developed in an earlier pilot study. A very minor correction was made in the different samples that each laboratory received. Where appropriate, method offset values attributed to the effects of contaminations, from the earlier pilot study, were subtracted. Values for the key comparison reference values (agreed best values from a Consultative Committee study) and their associated uncertainties for these samples are then made from the weighted means and the expanded weighted standard deviations of the means of these data. These results show a dramatic improvement on previous comparisons, leading to 95% uncertainties in the range 0.09-0.27 nm, equivalent to 0.4-1.0 monolayers over the 1.5-8.0 nm nominal thickness range studied. If the sample-to-sample uncertainty is reduced from its maximum estimate to the most likely value, these uncertainties reduce to 0.05-0.25 nm or ~1.4% relative standard uncertainties. The best results achieve ~1% relative standard uncertainty. It is concluded that XPS has now been made fully traceable to the SI, for ultra-thin thermal SiO2 on Si layers, by calibration using wavelength methods in an approach that may be extended to other material systems. KW - Attenuation length KW - Calibration KW - Silicon dioxide KW - Thickness KW - Ultra-thin oxide PY - 2009 DO - https://doi.org/10.1002/sia.3045 SN - 0142-2421 SN - 1096-9918 VL - 41 IS - 5 SP - 430 EP - 439 PB - Wiley CY - Chichester AN - OPUS4-19246 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Kühn, Gerhard A1 - Unger, Wolfgang T1 - Photoelectron spectroscopy on organic surfaces: X-ray degradation of oxygen-plasma-treated and chemically reduced poly(propylene) surfaces in comparison to conventional polymers N2 - The X-ray-induced sample damage during mono XPS analysis of an oxygen-plasma-oxidized and subsequently wet-chemically reduced poly(propylene) film was investigated as a showcase for plasma-modified or plasma-deposited samples. By doing this, the degradation index approach as introduced by Beamson and Briggs in the Scienta ESCA300 high-resolution XPS database of organic polymers has been adopted. As to be expected, the sample degrades by loosing oxygen as revealed by observation of decreasing O/C and COR/Csum ratios. However, the X-ray degradation indices are definitely higher than those of conventional reference polymers. Moreover, the COR/Csum degradation index is significantly higher in comparison with one obtained for the O/C ratio. In that context, there is no difference between the plasma sample and a conventional poly(vinyl alcohol) polymer. It is concluded that for reliable quantitative surface chemical analysis, the quality of spectra in terms of acquisition times must be optimized aimed to a minimization of X-ray degradation. Finally, it is proposed to describe the photon flux of an X-ray gun in an XPS experiment, which defines the degradation rate at the end, by using the sample current simply measured with a carefully grounded sputter-cleaned reference silver sample. KW - Photoelectron spectroscopy KW - ESCA/XPS KW - Surfaces KW - Surface modification KW - Poly(propylene) (PP) KW - Plasma treatment KW - X-ray KW - Degradation PY - 2009 DO - https://doi.org/10.1002/sia.3024 SN - 0142-2421 SN - 1096-9918 VL - 41 IS - 5 SP - 445 EP - 448 PB - Wiley CY - Chichester AN - OPUS4-19252 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hinze, A. A1 - Klages, C.-P. A1 - Zänker, A. A1 - Thomas, M. A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - ToF-SIMS imaging of DBD-plasma-printed microspots on BOPP substrates N2 - Imaging ToF-SIMS has been applied to characterize the surface chemistry variations across small areas produced by a DBD-type plasma printing technique on a BOPP substrate using pure nitrogen and a nitrogen-hydrogen gas mixture. CH4N+ and CNO- secondary ions are detected with high yields remote from the discharge region. They are discussed to be due to surface modifications of the substrate by metastable gas-phase species. On the other hand, surface species exist that are preferentially formed by reactions of the substrate with short-lived species which are only present close to the plasma discharge region. A C3H8O+ secondary fragment ion is assumed to be a key fragment of such a surface species. KW - ToF-SIMS KW - Plasma KW - Polymer KW - Dielectric barrier discharges (DBD) KW - Plasma printing KW - Polymer modification KW - Surface modification KW - Time-of-flight secondary-ion mass spectroscopy (ToF-SIMS) imaging PY - 2008 DO - https://doi.org/10.1002/ppap.200700138 SN - 1612-8850 SN - 1612-8869 VL - 5 IS - 5 SP - 460 EP - 470 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-19342 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Unger, Wolfgang A1 - Gross, Thomas ED - John C. Rivière, ED - Sverre Myhra, T1 - Catalyst characterization KW - Catalyst KW - Surface KW - Analysis KW - XPS KW - ESCA KW - SIMS PY - 2009 SN - 978-0-8493-7558-3 VL - 2nd Edition IS - Chapter 16 SP - 501 EP - 528 PB - CRC Press CY - Boca Raton, FL, USA AN - OPUS4-19602 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis at the Nano Scale: Metrological Challenges and Progress in Standardization T2 - Workshop: Application of Standards within Nanometrology at the EuroNanoForum 2009 CY - Prague, Czech Republic DA - 2009-06-02 PY - 2009 AN - OPUS4-19564 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Achievements and Challenges in Metrology in Surface and Thin Film Analysis T2 - European Nanometrology Workshop CY - Braunschweig, Germany DA - 2009-11-19 PY - 2009 AN - OPUS4-20571 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Graf, Nora A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Pippig, F. A1 - Holländer, A. A1 - Unger, Wolfgang T1 - Determination of accessible amino groups on surfaces by chemical derivatization with 3,5-bis(trifluoromethyl)phenyl isothiocyanate and XPS/NEXAFS analysis N2 - The determination of amino groups on surfaces capable of binding biomolecules is important for the understanding and optimization of technologically relevant coupling processes. In this study, three different types of amino-functionalized model surfaces, amino thiolate on Au, amino siloxane on Si, and polyethylene (PE) foils and films reacted with 1,2-diaminoethane (DAE) were derivatized with 3,5-bis(trifluoromethyl)phenyl isothiocyanate. Subsequently, these samples were analyzed by chemical derivatization X-ray photoelectron spectroscopy (CD-XPS) and near-edge X-ray absorption fine structure spectroscopy (NEXAFS). The determination of amino groups by this analytical approach allows gaining insight into the availability of groups on surfaces that can actually serve as attachment sites for biomolecules in technical applications. In the case of the amino thiolate on Au, almost 90% of the expected amino groups were detected by CD-XPS. Investigation of the amino siloxane films revealed lower yields for the derivatization reaction in the order of 30%. The lowered reaction yields are thought to be due to interactions between the amino siloxane`s amino and silanol groups or the underlying substrate, making them inaccessible to the derivatization agent. The aminated PE samples are characterized by a complex surface chemistry and structure, and reaction yields of the derivatization reaction cannot be unequivocally derived. However, 1-3% of the total carbon atoms in the surface layer were found to be bound to amino groups accessible to the derivatization agent. It can be concluded that, depending on the detailed character of the investigated amino-terminated surface, the amount of amino groups accessible to CD-XPS can be substantially lower than the total amount of amino groups present at the surface. KW - XPS/ESCA KW - NEXAFS/XANES KW - CD-XPS KW - Amino-functionalized surfaces KW - SAM PY - 2010 DO - https://doi.org/10.1007/s00216-009-3233-7 SN - 1618-2642 SN - 1618-2650 VL - 396 IS - 2 SP - 725 EP - 738 PB - Springer CY - Berlin AN - OPUS4-20744 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrological Challenges in Surface Micro/Nano Analysis (SMNA): The Activities of the CCQM Surface Analysis Working Group T2 - 5th Brazilian Congress of Metrology CY - Salvador, Brazil DA - 2009-11-09 PY - 2009 AN - OPUS4-20731 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Joint SAWG/BAWG Meeting 2009: Introduction of Activities of CCQM Surface Analysis Working Group (SAWG) in Bioanalysis T2 - CCQM Working Groups Meeting 2009 CY - Rio de Janeiro, Brazil DA - 2009-11-03 PY - 2009 AN - OPUS4-20732 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Imaging surface analysis: Lateral resolution and its relation to contrast and noise N2 - Lateral resolution, also called image resolution, is the most relevant quality parameter of maps and line scans. Therefore well defined procedures for the determination of lateral resolution are required. In the surface analysis community different definitions of lateral resolution are in use and there is no generally accepted method for the determination of lateral resolution which meets the demands of the state-of-the-art in surface analysis. We propose the determination of lateral resolution by imaging of well defined square-wave gratings with finely graded periods. This method enables the real time estimation of lateral resolution and the adjustment of instrument settings with respect to lateral resolution. The effect of noise and contrast on lateral resolution has been analysed by numerically simulated images of square-wave gratings. A new resolution criterion has been developed which is based on the dip-to-noise ratio and takes into account the sampling step width by introducing a "reduced noise". The contrast transfer function has been introduced and its relation to lateral resolution in the presence of noise was analysed. For that reason an "effective cut-off frequency" was defined which is the reciprocal of the lateral resolution. Normalized values of lateral resolution and their relation to signal-to-noise ratio and sampling step width were given for Gaussian and Lorentzian line spread functions. These values enable the calculation of experimental parameters which are necessary to get a required value of lateral resolution. Finally the successful application of the proposed approach to determine lateral resolution has been demonstrated by ToF-SIMS element mapping of the certified reference material BAM-L200. KW - Auflösungskriterium KW - BAM-L200 KW - Effektive cut-off Funktion KW - Laterale Auflösung KW - Kontrast KW - Kontrasttransferfunktion KW - Linienverwaschungsfunktion KW - Rauschen PY - 2010 DO - https://doi.org/10.1039/c004323k SN - 0267-9477 SN - 1364-5544 VL - 25 SP - 1440 EP - 1452 PB - Royal Society of Chemistry CY - London AN - OPUS4-21875 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Ghode, Archana A1 - Geng, Sh. A1 - Kühn, Gerhard T1 - Plasma-based introduction of monosort functional groups of different type and density onto polymer surfaces. Part 1: Behaviour of polymers exposed to oxygen plasma N2 - Several approaches were investigated to produce monosort functionalized polymer surfaces with a high density and homogeneity of functional groups: (i) Plasma oxidation followed by wet-chemical reduction, (ii) formation of radicals and grafting on of functional group carrying molecules, (iii) plasma bromination followed by (iv) Williamson or Gabriel-like synthesis of spacer molecules, and (v) a pulsed plasma polymerization of functional groups bearing monomers or (vi) their copolymerisation with other comonomers. The formation of hydroxyl (OH), primary amino (NH2), and carboxyl (COOH) groups was studied in detail. The oxygen plasma treatment (i) in a low-pressure non-isothermal glow discharge results in the formation of a wide variety of O functional groups, polymer degradation and crosslinking. Low power densities and short exposure times (0.1 to 2 s) are required to functionalize a surface while preserving the original polymer structure. Carbonate, ester, and aromatic groups are rapidly degraded by an oxygen plasma treatment leading to scissions of polymer backbones and loss in molecular weight. Also the formation of macrocycles and C=C bonds was observed in a region of around 4 nm in depth. The investigated polymers could be classified by their degradation behaviour on exposure to the oxygen plasma.___TAGSTART___BR___TAGEND___ In order to maximize the process selectivity for OH groups, the variety of oxygen functionalities formed by the oxygen plasma was wet-chemically reduced by diborane, vitridetrade (Na complex), and LiAlH4. Typical yields were 9 to 14 OH groups per 100 carbon atoms.___TAGSTART___BR___TAGEND___ Plasma bromination (iii) (40 Br per 100 C atoms) of polymers, followed by grafting of spacer molecules (iv), has been proved to be a highly selective reaction.___TAGSTART___BR___TAGEND___ Another way to produce high densities of monosort functionalities was the pulsed plasma polymerization of functional group bearing monomers such as allylamine, allylalcohol or acrylic acid (v). The retention of chemical structure and functional groups during plasma polymerization was achieved by using low power densities and the pulsed plasma technique. The maximum yields were 30 OH, 18 NH2, and 24 COOH groups per 100 C atoms. To vary the density of functional groups a chemical copolymerization with ''chain-extending'' comonomers such as butadiene and ethylene was initiated in the pulsed plasma (vi). Additionally, the often-observed post-plasma oxidations of such layers initiated by reaction of trapped radicals with oxygen from the air were successfully suppressed by using NO gas as radical quencher. PY - 2003 DO - https://doi.org/10.1163/156855403765826865 VL - 10 IS - 2-3 SP - 139 EP - 171 PB - North-Holland CY - New York, NY AN - OPUS4-2705 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Schönhals, Andreas A1 - Unger, Wolfgang T1 - Plasma-based introduction of monosort functional groups of different type and density onto polymer surfaces. Part 2: Pulsed plasma polymerization N2 - This new functionalization method consists of the deposition of very thin plasma polymer layers (20 to 100 nm) of functional group bearing monomers in pulsed plasma. With allylalcohol, a maximum of 30 OH groups per 100 C atoms was measured with a selectivity of about 90% and a significant stability at long-time exposure to air. Allylamine was used to produce primary amino groups, with a maximum of 18 NH2 groups per 100 C atoms. Side reactions were observed during the storage in air, such as oxidation of the amino groups. Carboxylic groups could be produced using acrylic acid with a maximum concentration of 24 COOH groups per 100 C atoms. The most prominent side reaction was the decarbonylation/ decarboxylation of the acid group during plasma deposition.___TAGSTART___BR___TAGEND___ The variation of the density of functional groups using the pulsed-plasma polymerization of functional-group-bearing monomers was possible by the chemically-initiated radical copolymerization with either a chain-extending monomer, such as ethylene, or a cross linker, such as butadiene, in plasma. The density of functional groups could be adjusted continuously (0 to 30 OH, 0 to 18 NH2 and 0 to 24 COOH groups per 100 C atoms).___TAGSTART___BR___TAGEND___ The successful application of these densely functionalized polymer surfaces for producing biocompatible surfaces and for use in metal–polymer composites is proposed. KW - Pulsed plasma polymerization KW - Plasma-initiated copolymerization KW - Charcterization of homo- and copolymers PY - 2003 DO - https://doi.org/10.1163/156855403765826874 VL - 10 IS - 2-3 SP - 173 EP - 223 PB - North-Holland CY - New York, NY AN - OPUS4-2706 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - FDS/NeMa Workshop und Präsentation CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-3354 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Hutton, S. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of highly resolved x-ray photoelectron Cr 2p spectra obtained with a Cr2O3 powder sample prepared with adhesive tape KW - High-resolution XPS KW - Cr2O3 powder KW - Multiplet splitting PY - 2004 SN - 0142-2421 SN - 1096-9918 VL - 36 SP - 92 EP - 95 PB - Wiley CY - Chichester AN - OPUS4-3427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - XPS/ESCA: Ringversuchserebnisse T2 - Seminar Oberflächenanalytik: Technische Aspekte der Akkreditierung nach ISO/IEC 17025, SOFA' 03 CY - Berlin, Germany DA - 2003-01-24 PY - 2003 AN - OPUS4-4395 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Measurement Capabilitiess for Characterization of Carbon Materials T2 - Kolloquium Materials Research Labs, Sony Corporation CY - Yokohama, Japan DA - 2003-02-20 PY - 2003 AN - OPUS4-4409 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectroscopy and X-ray absorption spectroscopy in interface analysis of metallized polymers T2 - AIST-BAM Symposium on Material Surface Technology in TWIN Institute Programme; AIST Tsukuba Research Centre CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 AN - OPUS4-4410 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquiumm "Analyse von Feststoffen unterchiedlicher Materialien aus Industrie und Umwelt" der Interessengemeinschaft Atomspektroskopie Berlin (IGAS) CY - Berlin, Germany DA - 2002-11-19 PY - 2002 AN - OPUS4-4388 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Holzmodifikation durch Tränkung mit Nanopartikeln T2 - Tagung "Rosenheimer Fenstertage 2004" CY - Rosenheim, Deutschland DA - 2004-01-01 KW - Holzmodifikation KW - Sol-Gel KW - Tränkverfahren KW - Holzschutz PY - 2004 SP - 23 EP - 26 PB - Institut für Fenstertechnik CY - Rosenheim AN - OPUS4-4487 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - Practical Surface Analysis PSA-04 & 5th Korea-Japan International Symposium on Surface Analysis - KJISSA CY - Jeju, South Korea DA - 2004-10-04 PY - 2004 AN - OPUS4-4598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-Absorptions-Spektroskopie (XAS) T2 - 12. Neues Dresdner Vakuumtechnisches Kolloquium, DTV CY - Dresden, Germany DA - 2004-10-14 PY - 2004 AN - OPUS4-4599 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films prepared from Organic Molecules: Characterization by Surface Analytical Tools T2 - KRISS Meeting - NanoSurface Group CY - Daejeon, South Korea DA - 2004-10-11 PY - 2004 AN - OPUS4-4600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Scanning transmission X-ray microscopy (STXM) of h-bar preparations of chemically modified DLC films T2 - 324. Heraeus-Seminar: Exploring the nanostructures of soft materials with x-rays, Wilhelm und Else Heraeus-Stiftung CY - Bonn, Germany DA - 2004-05-09 PY - 2004 AN - OPUS4-4605 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Das Labor für Oberflächen- und Mikrobereichsanalytik der BAM (VIII.23): Forschungsergebnisse aus den Bereichen Katalysatorentwicklung, Nanotubes und (Plasma-) Polymerschichten T2 - Kolloquium: Hahn-Meitner-Institut Berlin/Abt. SE2 c/o BESSY II CY - Berlin, Germany DA - 2004-05-06 PY - 2004 AN - OPUS4-4606 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Standard-free quantification in EPMA T2 - CCQM Surface Analysis Working Group Meeting for 2004 CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-4607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - 1. Metrological Directions in Surface and Micro/Nano Analysis in BAM 2. OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004 CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-4608 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - N and C stoichiometry of metal nitride and carbide hard coatings T2 - CCQM Surface Analysis Working Group Meeting for 2004 CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-4609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Oran, Umut A1 - Unger, Wolfgang T1 - Static TOF-SIMS Surface Analysis of a CCl2F2 Activated Chromia Catalyst Used for a Cl/F Exchange Reaction N2 - Static TOF-SIMS results strongly underpin earlier conclusions from ESCA, XANES, and tracer studies that the accumulation of fluorine and chlorine at the surface of chromia by a heterogeneous reaction with a chlorofluorocarbon compound results in the formation of mixed chromium oxide halide species and not in the nucleation of CrCl3 and/or CrF3 phases. KW - Oberflächenanalytik KW - Katalyse PY - 2004 DO - https://doi.org/10.1021/jp046773h SN - 1520-6106 SN - 1520-5207 SN - 1089-5647 VL - 108 SP - 15454 EP - 15456 PB - Soc. CY - Washington, DC AN - OPUS4-4718 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Unger, Wolfgang T1 - Formation of Plasma Polymer Layers with Functional Groups of Different Type and Density at Polymer Surfaces and their Interaction with Al Atoms N2 - Monotype functionalizations with different types of functional groups (OH, NH2, COOH) on polypropylene and poly(tetrafluoroethylene) surfaces were synthesized using pulsed plasma-initiated homo- or copolymerization of functional group-carrying monomers. The maximum concentrations of functional groups were 31 OH, 18 NH2 or 24 COOH groups per 100 C atoms using allyl alcohol, allylamine or acrylic acid respectively as the monomer. The measured peel strengths of aluminium deposits increased linearly with the concentration of functional groups. Near the maximum concentration of OH (>27 OH/100 C atoms) or at moderate concentrations of COOH groups (>10 COOH/100 C atoms), constant (maximum) peel strengths were measured due to the mechanical collapse of one component in the composite (cohesive failure). Interface failures in Al-PP composites were found with COOH, NH2 and OH groups and cohesive failures were seen when higher concentrations of COOH groups were applied (>10 COOH/100 C atoms). PY - 2004 DO - https://doi.org/10.1002/ppap.200400008 SN - 1612-8850 SN - 1612-8869 VL - 1 IS - 1 SP - 28 EP - 50 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-4707 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R.L. A1 - Bimberg, D. T1 - BAM-L002 - A new type of certified reference material for length calibration and testing of lateral resolution in the nanometre range N2 - A new type of test sample for the determination of lateral resolution in surface analysis is presented. The certified reference material BAM-L002 Nanoscale strip pattern for length calibration and testing of lateral resolution is an embedded cross-section of epitaxially grown layers of AlxGa1-xAs and InxGa1-xAs on GaAs substrate. The surface of the sample provides a flat pattern with strip widths of 0.4-500 nm. The combination of gratings, isolated narrow strips and sharp edges of wide strips offers improved possibilities for the calibration of a length scale, the determination of lateral resolution and the optimization of instrument settings. The feasibility of the reference material for an analysis of lateral resolution is demonstrated for SIMS. PY - 2004 DO - https://doi.org/10.1002/sia.1936 SN - 0142-2421 SN - 1096-9918 VL - 36 SP - 1423 EP - 1426 PB - Wiley CY - Chichester AN - OPUS4-4696 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface analysis of plasma-deposited polymer films, 1: Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) of plasma polystyrene before and after exposure to ambient air N2 - Pulsed plasma-deposited polystyrene films were studied by time-of-flight static secondary ion mass spectrometry (ToF-SSIMS) before and after exposure to ambient air. The influence of the external plasma parameters on the secondary ion mass spectra of plasma-deposited polystyrene films was investigated. From these data, information on the chemical character of the plasma polystyrene films was derived. In the range of deposition conditions applied in this study, the fragmentation of styrene is a minor process. The main process is probably the radical chain propagation to polymers. All the polystyrene plasma polymers, relying on ToF-SIMS, seem to be rather similar to a reference polystyrene oligomer sample. When the plasma polymers are exposed to air, extensive oxygen incorporation occurs. Oxygen uptake was found to alter the emission probabilities of secondary ions. A relation between the regularity of the plasma polymers and the amount of oxygen incorporation was found. The result was that the chemical regularity of the plasma polystyrene decreases when the effective power in the plasma is increased. PY - 2004 DO - https://doi.org/10.1002/ppap.200400002 SN - 1612-8850 SN - 1612-8869 VL - 1 SP - 123 EP - 133 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-4697 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - Editorial - Proceedings of the 10th European Conference on Applications of Surface and Interface Analysis, Berlin, Germany, 5-10 October 2003 T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin DA - 2003-10-05 PY - 2004 DO - https://doi.org/10.1002/sia.1891 SN - 0142-2421 SN - 1096-9918 VL - 36 IS - 8 SP - 672 PB - Wiley CY - Chichester AN - OPUS4-4698 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang ED - Blasek, G. T1 - Plasmapolymerschichten: Zu den Möglichkeiten einer chemischen Charakterisierung mit den Methoden ESCA, ToF-SIMS und Röntgen-absorptions-Spektroskopie (XAS) T2 - 12. Neues Dresdener Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2004-10-14 KW - ESCA KW - ToF-SIMS KW - XAS KW - Plasma-Polymerisation PY - 2004 SP - 133 EP - 140 PB - Dresdner Transferstelle für Vakuumtechnik CY - Dresden AN - OPUS4-4699 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Mix, Renate A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling by variable excitation energy XPS: TFAA derivatized allyl alcohol - ethylene plasma polymer films KW - Oberflächenanalytik KW - Plasmapolymerisation PY - 2004 UR - http://pfwww.kek.jp/acr2003pdf/part_b/pf03b076.pdf SN - 1344-6339 VL - 21 SP - 76 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-5849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray photoelectron spectroscopy (ESCA) and X-ray absorption spectroscopy (NEXAFS) in interface analysis of metallized polymers T2 - Center of Excellence in Analytical Chemistry (CEAC) Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" CY - Zurich, Switzerland DA - 1999-07-05 PY - 1999 AN - OPUS4-6050 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - ECASIA ´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6051 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - EMASS1999 CY - Neuhausen am Rheinfall, Switzerland DA - 1999-10-25 PY - 1999 AN - OPUS4-6052 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - Deutsche Bunsengesellschaft für Physikalische Chemie, Int. Discussion Meeting "Advanced Methods of Polymer Characterization: New Developments and Application in Industry" CY - Mainz, Germany DA - 1999-03-15 PY - 1999 AN - OPUS4-6075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - European Research Conferences Fundamental Aspects of Surface Science: Structure and Dynamics of Organic and Biological Molecules at Interfaces CY - Castelvecchio Pascoli, Italy DA - 1999-09-03 PY - 1999 AN - OPUS4-6078 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - ECASIA´99 CY - Seville, Spain DA - 1999-10-04 PY - 1999 AN - OPUS4-6079 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - VAMA TMA2 Project A2, Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples: Report on an inter-laboratory comparison T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik (AOFA 11) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6116 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy and X-ray Absorption Spectroscopy in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 CY - Munich, Germany DA - 2000-09-28 PY - 2000 AN - OPUS4-6117 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methods and Applications of Surface and Thin Film Analysis - BAM Laboratory VIII.23 T2 - Colloquium at Mechanical Engineering Laboratory (MEL) CY - Tsukuba, Japan DA - 2001-03-13 PY - 2001 AN - OPUS4-6151 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Elektronenspektroskopien in der chemischen Oberflächenanalytik T2 - DGM Fortbildungsseminar "Schicht- und Oberflächenanalytik" CY - Kaiserslautern, Germany DA - 2001-05-28 PY - 2001 AN - OPUS4-6152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Akkreditierung und Normung in der Oberflächenanalytik T2 - Seminar Nr. 21 437 S (WS 1998/1999), Freie Universität Berlin - FB Chemie, Experimentelle und Theoretische Aspekte der Oberflächenchemie CY - Berlin, Germany DA - 1999-12-10 PY - 1999 AN - OPUS4-6086 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden und Kompetenzen in der Oberflächen- und Schichtanalytik - Das BAM Labor VIII.23 T2 - BAM-Treffen mit Siemens ZTMF CY - Berlin, Germany DA - 2000-03-09 PY - 2000 AN - OPUS4-6087 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Bergisch Gladbach, Germany DA - 2000-05-11 PY - 2000 AN - OPUS4-6093 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - FDS/NEMA Workshop und Präsentation: Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie CY - Chemnitz, Germany DA - 2000-07-08 PY - 2000 AN - OPUS4-6094 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Unsaturated carbon species at polymer surfaces: The potential of X-ray absorption spectroscopy T2 - ECASIA 2001 CY - Avignon, France DA - 2001-09-30 PY - 2001 AN - OPUS4-6165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a VAMAS TWA 2 inter-laboratory test experiment: Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - IUVSTA 15th International Vacuum Congress/AVS 48th International Symposiun/ 11th Intern. Conf. On Solid Surfaces CY - San Francisco, CA, USA DA - 2001-10-28 PY - 2001 AN - OPUS4-6166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - K-edge soft x-ray absorption (NEXAFS) spectroscopy in surface chemical analysis of polymers T2 - BESSY Nutzertreffen CY - Berlin, Germany DA - 1999-12-09 PY - 1999 AN - OPUS4-6133 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Oberflächenanalytik CCQM P-38 T2 - Treffen der Netzwerkpartner "Metrologie in der Chemie", PTB CY - Braunschweig, Germany DA - 2002-11-04 PY - 2002 AN - OPUS4-6251 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Kompetenzen der Fachgruppe VIII.2 "Oberflächentechnologien" der BAM T2 - 9. Deutsches Anwendertreffen "Analytische GDS" CY - Berlin, Germany DA - 2002-09-09 PY - 2002 AN - OPUS4-6240 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Web site for information on reference materials T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-02 PY - 2002 AN - OPUS4-6217 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Alternativer Holzschutz KW - Holzschutz KW - Kieselsol KW - Biozide KW - Sol-Gel-Prozess PY - 2004 SN - 1435-1854 IS - 11 SP - 77 EP - 80 PB - Verl. f. Fachpublizistik CY - Stuttgart AN - OPUS4-6333 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - OH group density at polymer surfaces T2 - CCQM Surface Analysis Working Group Meeting for 2004, BIPM CY - Sèvres, France DA - 2004-04-20 PY - 2004 AN - OPUS4-6427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absorption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3rd International Symposium on Practical Surface Analysis and 5th Korea-Japan International Symposium on Surface Analysis (PSA-04) CY - Jeju, South Korea DA - 2004-09-26 PY - 2004 AN - OPUS4-6447 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface Analysis of Plasma-Deposited Polymer Films, 2: Analysis of Post-Plasma Air Reacted Plasma Polymerized Styrene by X-Ray Photoelectron Spectroscopy and X-Ray Absorption Spectroscopy N2 - Chemical properties of plasma-polymerized styrene films can be effectively controlled by the appropriate choice of external plasma parameters, such as duty cycle, power and monomer pressure. Chemical properties here are the regularity of the primary structure, the amount of long living radicals and branching or cross-linking or both in plasma polymerized styrene films, which can be indirectly monitored by X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy. Principally, XPS and NEXAFS spectra of plasma-polymerized styrene show all the spectroscopic fingerprints characteristic of atactic polystyrene indicating an inherent similarity of the respective primary chemical structures. There is an increase in irregularity and radical concentration for the plasma deposited films with increasing duty cycle or power. With an increase in monomer pressure, a decreased level of monomer fragmentation and, consequently, an increase in regularity must be concluded from the experimental data. The applied power regulates the fragmentation of the monomers as monitored by spectroscopic signals correlated to the aromatic rings. A trend in the extent of the post-plasma oxygen incorporation according to the variation of the various external plasma parameters was deduced, which agrees with earlier ToF-SIMS findings KW - Chemical characterization KW - ESCA/XPS KW - NEXAFS KW - Plasma polymerization KW - Polystyrene PY - 2004 DO - https://doi.org/10.1002/ppap.200400022 SN - 1612-8850 SN - 1612-8869 VL - 1 SP - 134 EP - 140 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-6935 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface Analysis of Plasma-Deposited Polymer Films, 3: In situ Characterization of Plasma-Deposited Ethylene Films by ToF-SSIMS N2 - Pulsed-plasma-deposited ethylene films were studied by time-of-flight static secondary ion mass spectrometry (ToF-SSIMS) before and after exposure to ambient air. The influence of the external plasma parameters on the secondary ion mass spectra of plasma-deposited ethylene films was investigated. From these data, information on the chemical character of the plasma-deposited ethylene films was derived. The investigation of the effect of external plasma parameters on the chemical character of the plasma-deposited ethylene films revealed that there were some drastic changes in the secondary ion mass spectra of the films. It was found that fragmentation and re-arrangement of the monomer molecules in the plasma, which affects the chemical character of the deposited films, vary according to the external plasma parameters. When the plasma polymers are exposed to air, extensive oxygen incorporation occurs. The oxygen uptake is high at the beginning and then it levels of. Some indications for the formation and decay of peroxy radicals (COO) and, subsequently, hydroperoxides (COOH) are found. It was observed that the oxygen uptake of the plasma deposited ethylene films increase when the plasma conditions become harder. KW - Ageing KW - Plasma polymerization KW - Polyethylene (PE) KW - ToF-SIMS PY - 2004 DO - https://doi.org/10.1002/ppap.200400025 SN - 1612-8850 SN - 1612-8869 VL - 1 SP - 141 EP - 152 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-6936 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Analysis of carbon materials by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy N2 - Since hard coating such as ta:C films are of growing interest for protecting surfaces of industrial machines and high capacity tools against wear and friction or for biomedical applications, more information about the structure-to-property relation is required. Therefore, core level X-ray photoelectron sprectroscopy and X-ray absorption spectroscopy and spectromicroscopy are used to derive chemical information about selected carbon species. PY - 2003 DO - https://doi.org/10.1002/adem.200320138 SN - 1438-1656 VL - 5 IS - 7 SP - 519 EP - 522 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-6937 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Chemical analysis of plasma-polymerized films: The application of X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (NEXAFS) and fourier transform infrared spectroscopy (FTIR) N2 - Selected FTIR, XPS and NEXAFS spectroscopy results obtained with films deposited with different plasma polymerization processes and different monomers (styrene, acetylene, ethylene and butadiene) are presented. In detail FTIR spectra, XPS surveys, XPS valence bands and core level signals including shake-up features as well as carbon K-edge absorption spectra are qualitatively and, in some cases, semi-quantitatively considered. Information on the film formation, the chemistry of the films and the film stability against air exposure are derived from spectroscopic features. With styrene chemically rather well defined plasma polymer layers can be formed with rather high deposition rates applying a pulse plasma process. Using ethylene, acetylene or butadiene as a monomer in the plasma deposition process the deposition rates are smaller. Using these monomers plasma polymer films can be obtained with a primary chemical structure which is similar to each other but more or less different from those of the respective conventional polymers. The main difference between these samples is their individual concentration of unsaturated carbon species. Finally, a technologically relevant example, i.e. a plasma deposited polymer barrier layer deposited on the inner wall of a poly(ethylene) vessel is briefly considered. KW - Plasma polymer KW - Styrene KW - Ethylene KW - Acethylene KW - Butadiene KW - XPS KW - NEXAFS KW - FTIR KW - Chemical characterization KW - Deposition process KW - Stability PY - 2001 DO - https://doi.org/10.1016/S0368-2048(01)00330-9 SN - 0368-2048 SN - 1873-2526 VL - 121 IS - 2 SP - 111 EP - 129 PB - Elsevier CY - Amsterdam AN - OPUS4-6938 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Lippitz, Andreas A1 - Fritz, Thomas A1 - Gelius, U. T1 - VAMAS TWA2 Project A2: evaluation of static charge stabilization and determination methods in XPS on non-conducting samples. Report on an inter-laboratory comparison N2 - First results of an inter-laboratory comparison (27 participants in Europe, Japan and USA) of XPS data obtained with non-conducting samples are presented. Binding energies of Al 2s for alumina, N 1s and imide C 1s for Kapton and Sr 3p3/2 for a strontium titanate film on glass were obtained after static charge referencing with the help of 15 nm gold particles deposited at the surface of the test samples. For the alumina sample C 1s static charge referenced data are also presented. Repeat standard deviations (sr), between standard deviations (sb), reproducibility standard deviations (sR) and total means are evaluated from the experimental data. It can be stated that although the repeat standard deviation is as small as 0.05 eV in the best case, the standard deviation characterizing the reproducibility of the method is obviously not better than 0.15 eV in the best case at the present time. The knowledge of these standard deviations is important for metrology, validations of analytical procedures relying on qualitative photoelectron spectroscopy and XPS databanking. KW - XPS KW - ESCA KW - Binding energy KW - Inter-laboratory comparison PY - 2000 DO - https://doi.org/10.1002/1096-9918(200008)29:8<535::AID-SIA900>3.0.CO;2-5 SN - 0142-2421 SN - 1096-9918 VL - 29 SP - 535 EP - 543 PB - Wiley CY - Chichester AN - OPUS4-6939 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Böse, Olaf A1 - Unger, Wolfgang A1 - Kemnitz, E. A1 - Schroeder, S. L. M. T1 - Active sites on an oxide catalyst for F/Cl-exchange reactions: X-ray spectroscopy of fluorinated y-Al2O3 N2 - The dismutation of CHClF2 to CHF3 and CHCl3 was used to probe the effect of γ-Al2O3 fluorination on fluorine-against-chlorine (Cl/F) exchange reactions. X-ray photoelectron spectroscopy (XPS), X-ray excited Auger electron spectroscopy (XAES) and X-ray absorption near edge structure (XANES) spectroscopy were employed to probe the modifications at the surface of γ-Al2O3 accompanying the initial stages of fluorination. The results suggest that fluorine uptake by γ-Al2O3 starts initially at the surface of the oxide particles, with the formation of a fluorine species that is characterised by a single bond and a high effective charge q. Catalytic Cl/F-exchange is only observed after accumulation of higher fluorine concentrations, for which insertion of fluorine into the sub-surface region of the oxide crystallites has commenced. Quantitative XPS shows that the fluorination level must exceed approximately 10 atom% of the anions to achieve catalytic activity. The spectroscopic evidence suggests that the formation of aluminium oxofluorides is sufficient to provide catalytic activity. The presence of an AlF3 phase is not a condition for the observation of catalytic activity, even though defect-rich AlF3 is ultimately the endpoint of the fluorination process and is itself a Cl/F exchange catalyst. PY - 2002 DO - https://doi.org/10.1039/b110792e SN - 1463-9076 SN - 1463-9084 VL - 4 IS - 12 SP - 2824 EP - 2832 PB - The Royal Soc. of Chemistry CY - Cambridge AN - OPUS4-6940 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ramm, M. A1 - Ata, M. A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Plasma-Polymerized C60 Films N2 - We studied the polymerization of C60 under different Ar plasma conditions. Films were either deposited in the pressure range between 1.3 and 40 Pa applying input power of 50 W or evaporated C60 films were exposed to Ar plasma of 30 and 50 W. The films were investigated by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and carbon K near-edge X-ray-absorption fine structure spectroscopy (NEXAFS). The films were non-uniform and consisted of unpolymerized C60, dimers, linear chains and polymeric planes. In comparison with evaporated C60 the XPS C 1s peak is broader and asymmetric for the C60 polymer and its shake-up satellites diminished. Furthermore, the features of the valence band as well as the features of the p * antibonding orbitals of the C60 polymer are broader and reduced in intensity. PY - 2001 UR - http://www.ipme.ru/e-journals/MPM/no_1401/ramm/ramm.html SN - 1605-2730 SN - 1605-8119 VL - 4 IS - 1 SP - 8 EP - 12 PB - Advanced Study Center CY - St. Petersburg AN - OPUS4-6941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Mix, Renate ED - Radusch, H.-J. ED - Fiedler, L. T1 - Plasma-initiated homo and copolymerisation for modifying polymer surfaces with funtional groups of different type and density T2 - Internationale Fachtagung Polymerwerkstoffe ; P-2002 CY - Halle (Saale), Germany DA - 2002-09-25 PY - 2002 SN - 3-86010-656-2 SP - 534 EP - 539 PB - Martin-Luther-Univ. Halle-Wittenberg CY - Halle (Saale) AN - OPUS4-6969 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Mix, Renate A1 - Kühn, Gerhard A1 - Unger, Wolfgang T1 - Functional groups bearing plasma homo and copolymer layers as adhesion promoters in metal-polymer composites T2 - 10. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Germany DA - 2002-10-17 PY - 2002 SP - 6 EP - 15 PB - DTVa CY - Dresden AN - OPUS4-6970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kühn, Gerhard A1 - Retzko, Iris A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Friedrich, Jörg Florian T1 - Homofunctionalized polymer surfaces formed by selective plasma processes N2 - Several possibilities exist to produce a modified polymer surface with a high density of only one sort of functional group such as: (i) the plasma grafting of unfragmented monomer molecules and their polymerization forms OH, NH2, COOH groups, etc. in concentrations of approximately 25 groups per 100 C atoms; (ii) selective plasma bromination provides 10–25 CBr groups; (iii) the plasma oxidation of polymer surfaces in an O2 plasma followed by the chemical reduction of all O-containing groups to OH groups by diborane, vitride™ (Na complex) or LiAlH4 yields 9–14 OH groups per 100 carbon atoms; and (iv) the grafting of spacers with different endgroups onto OH or CBr groups produces 7–10 spacer molecules/100 C. This work was focused on the formation of thin plasma deposited polymer layers with a maximum of (homo)functional groups and with a minimum of chemical irregularities using the pulsed plasma technique. The monomers were allylalcohol, allylamine, acrylonitrile and acrylic acid. The further intent was to study the interactions of functional groups (OH, COOH, NH2) and deposited metals (Cr, Al, Ti). It was expected that more basic (NH2), weakly basic or neutral (OH) or more acidic (COOH) groups would show different interactions and chemical reactions with metal atoms. KW - Pulsed plasma polymerization KW - Functional groups KW - Long-term stability KW - Polymer-metal composites PY - 2001 DO - https://doi.org/10.1016/S0257-8972(01)01056-8 SN - 0257-8972 VL - 142-144 SP - 494 EP - 500 PB - Elsevier Science CY - Lausanne AN - OPUS4-6971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Retzko, Iris A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Lippitz, Andreas T1 - Plasma polymers with chemically defined structures in contact with metals N2 - The retention of chemical structure and functional groups during plasma polymerization was investigated. Usually plasma polymer layers, prepared by a continuous wave radio-frequency plasma, are often chemically irregular in their structure and composition. To minimize these irregularities low wattages and the pulsed plasma technique were applied to avoid fragmentations. The first goal was to produce plasma polymers comprising double or triple bonds as precursors for electrically conducting polymers. Acetylene, ethylene, butadiene and polystyrene were used as monomers and deposited as thin polymer films by pulsed plasmas of low wattages. Styrene polymerization was strongly enhanced in the dark phase (plasma off) of a pulsed r.f. plasma caused by the reactivity of the vinyl-type double bond. This could be confirmed by a verification of a rather high chemical regularity of the film sample. The oxygen content of this film measured by X-ray photoelectron spectrometry (XPS) was in situ 0% and after 24 h exposure to air lower than 1%. Additionally, post-plasma oxidations of trapped radicals with air could be suppressed using NO gas as radical quencher. Such quenched plasma polymer layers were completely stable against oxidation for a number of weeks. During the low-wattage pulse plasma polymerization metal atoms were simultaneously or layer by layer evaporated into the growing layer and in situ measured by XPS. These metal atoms are acting as dopants. Here, Li, K, Mg and Cr were used at different concentrations providing electrical conductivity and magnetic properties for the film. KW - Pulsed plasma KW - Plasma polymerization KW - Doping with metal atoms KW - Encapsulation of nanoparticles PY - 2001 DO - https://doi.org/10.1016/S0257-8972(01)01051-9 SN - 0257-8972 VL - 142-144 SP - 460 EP - 467 PB - Elsevier Science CY - Lausanne AN - OPUS4-6972 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Möller, B. A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Krüger, P. T1 - Improvement of adhesion properties of polymers by producing oxyfluorinated surfaces PY - 2001 SN - 0016-4232 VL - 92 IS - 5 SP - 1334 EP - 1444 PB - Leuze CY - Saulgau, Württ. AN - OPUS4-6973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Eine neue Generation von alterungsbeständigen Plasmapolymeren mit definierter chemischer Struktur T2 - 8. Neues Dresdner Vakuumtechnisches Kolloquium (NDVaK) CY - Dresden, Deutschland DA - 2000-10-19 PY - 2000 VL - 8 SP - 110 EP - 114 CY - Dresden AN - OPUS4-6974 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. T1 - K-Edge Soft X-ray Absorption (NEXAFS) Spectroscopy In Surface Chemical Analysis of Polymers T2 - International Discussion Meeting Advanced Methods of Polymer Characterization: New Developments and Applications in Industry CY - Mainz, Germany DA - 1999-03-15 PY - 1999 SP - P3.53 CY - Mainz AN - OPUS4-6925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Surface Analysis by XPS and XAS Using a High-Rsolution and High-Flux Soft X-ray from Synchrotron T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 KW - XPS KW - XAS KW - DLC KW - Synchrotron Radiation PY - 2003 SP - 67 EP - 69 AN - OPUS4-6927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of carbon materials and plasma polymers by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 59 EP - 65 AN - OPUS4-6928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 53 EP - 58 AN - OPUS4-6929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Güttler, B. A1 - Schiel, D. A1 - Danzebrink, H. A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Müller, J.-P. T1 - Physical and Chemical Characterization of Thermal and Native Siliconoxide layers on Silicon T2 - Symposium "Reference Materials for Technologies in the New Millenium" CY - Berlin, BAM, Germany DA - 2000-05-22 PY - 2000 SP - 1(?) EP - 7(?) AN - OPUS4-6924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Weiss, K. A1 - Wöll, Ch. ED - Mittal, K. T1 - The Application of Near Edge X-ray Absorption Fine Structures (NEXAFS) Spectroscopy and X-ray Photoelectron Spectroscopy (XPS) in Surface Analysis of Chromium-evaporated Polymers and Organic Films PY - 1998 SN - 90-6764-290-8 SP - 147 EP - 168 PB - VSP CY - Utrecht AN - OPUS4-6986 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Koprinarov, Ivaylo A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Wöll, Ch. T1 - Oxygen plama induced degradation of the surface of poly(styrene), poly(bisphenol-A-carbonate) and poly(ethylene terephthalate) as observed by soft X-ray absorption spectroscopy (NEXAFS) KW - Oxygen DC plasma treatment KW - Plasma degradation KW - X-ray absorption spectroscopy (NEXAFS) PY - 1998 SN - 0032-3861 SN - 1873-2291 VL - 39 IS - 14 SP - 3001 EP - 3009 PB - Springer CY - Berlin AN - OPUS4-6990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface - Detected by XPS and NEXAFS Spectroscopy T2 - 4th European Conference on Adhesion (EURADH '98) ; 1st World Congress on Adhesion and Related Phenomena (WCARP) CY - Garmisch-Partenkirchen, Germany DA - 1998-09-06 PY - 1998 SN - 0021-8464 VL - 75 IS - 1 SP - 1.60 EP - 1.62 PB - Gordon & Breach CY - New York, NY AN - OPUS4-6991 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Koprinarov, Ivaylo A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Wöll, Ch. T1 - Surface analysis of DC oxygen plasma treated or chromium evaporated poly(ethylene terephthalate) foils by soft X-ray absorption spectroscopy (NEXAFS) KW - Biaxially streched poly(ehtylene terephthalate) KW - Oxygen DC plasma treatment KW - Metallization with chromium PY - 1997 SN - 0032-3861 SN - 1873-2291 VL - 38 IS - 8 SP - 2005 EP - 2010 PB - Springer CY - Berlin AN - OPUS4-6998 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Wittrich, H. T1 - Corona, spark and combined UV and ozone modification of polymer films WeBP23 N2 - Different types of plasma, irradiative and chemical activation were compared in terms of surface functionalization. Corona and spark jet plasmas are characterized by low gas temperatures and high rates in surface modification. UV irradiation in the presence of ozone does not involve any particle bombardment and acts only by enhanced photooxidative processes. Although ion implantation can be avoided, this method is not free of radiative damage in both the surface-near region and the bulk of polymers. Furthermore, its functionalization rate is low. In relation to low-pressure O2 plasma modification, all treatments mentioned here have a low efficiency in adhesion promotion due to oxidative degradation of macromolecules and formation of molecular debris known as the ''weak boundary layer''. PY - 1998 DO - https://doi.org/10.1016/S0257-8972(97)00318-6 SN - 0257-8972 VL - 98 IS - 1 SP - 879 EP - 885 PB - Elsevier Science CY - Lausanne AN - OPUS4-7000 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang ED - Worsfold, P. ED - Townshend, A. ED - Poole, C. T1 - Auger electron spectroscopy KW - AES KW - Auger Electron Spectroscopy KW - Oberflächenanalytik PY - 2005 SN - 0-12-764108-4 VL - 8 SP - 466 EP - 474 PB - Elsevier/Acad. Press CY - Amsterdam ET - 2. AN - OPUS4-7015 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Gross, Thomas ED - Rivière, J. C. ED - Myhra, S. T1 - Catalyst characterization PY - 1998 SN - 0-8247-0080-5 SP - 747 EP - 780 PB - Dekker CY - New York AN - OPUS4-7020 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Oberflächenvorbehandlung von Polypropylen in elektrischen Entladungen PY - 1995 SN - 0590-8450 VL - 1 SP - 123 EP - 127 PB - Verl. Coating Thomas CY - St. Gallen AN - OPUS4-7005 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Wittrich, H. A1 - Prescher, D. ED - Mittal, K. L. T1 - Barrier properties of plasma-modified polypropylene and polyethyleneterephthalate T2 - International Symposium on Polymer Surface Modification: Relevance to Adhesion CY - Las Vegas, NV, USA DA - 1993-11-03 KW - Plasma fluorination of polymers KW - Deposition of fluorine-containing plasma polymers KW - Barrier formation against solvent permeation KW - Permeation mechanism of solvent mixtures PY - 1996 SN - 90-6764-201-0 VL - 1 SP - 121 EP - 136 PB - VSP CY - Utrecht AN - OPUS4-7006 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Rohrer, P. A1 - Saur, W. A1 - Erdmann, J. A1 - Gorsler, H.-V. ED - Mittal, K. L. T1 - The improvement in adhesion of polyurethane-polypropylene composites by short-time exposure of polypropylene to low and atmospheric pressure plasmas KW - Polyurethane-polypropylene adhesion KW - Low pressure plasma pretreatment KW - Atmospheric pressure plasma treatment KW - Short-time exposure KW - Relevance of functional groups to adhesion KW - Molecular orientation at polymer surfaces PY - 1996 SN - 90-6764-201-0 SP - 49 EP - 72 PB - VSP CY - Utrecht AN - OPUS4-7007 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian T1 - Plasmabehandelte Polymere charakterisieren PY - 1995 SN - 0025-5300 VL - 37 IS - 6 SP - 233 EP - 237 PB - Carl Hanser Verlag CY - München AN - OPUS4-7009 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Rohrer, P. A1 - Saur, W. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - The improvement in adhesion of polyurethane-polypropylene composites by short-time exposure of polypropylene to low and atmospheric pressure plasmas KW - Polyurethane-polypropylene adhesion KW - Low pressure plasma pretreatment KW - Atmospheric pressure plasma treatment KW - Short-time exposure KW - Relevance of functional groups to adhesion KW - Molecular orientation at polymer surfaces PY - 1995 SN - 0169-4243 SN - 1568-5616 VL - 9 IS - 5 SP - 575 EP - 598 PB - VNU Science Press CY - Utrecht AN - OPUS4-7010 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Geng, Sh. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Neue Erkenntnisse zur Plasmamodifizierung von Polymeroberflächen PY - 1995 SN - 0949-8214 VL - 1 SP - 36 EP - 42 PB - Technische Fachhochschule CY - Wildau AN - OPUS4-7011 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas T1 - Plasma Modification of Polymer Surfaces PY - 1995 SN - 1022-1360 SN - 0258-0322 SN - 1521-3900 VL - 100 SP - 111 EP - 115 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-7012 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Wittrich, H. A1 - Prescher, D. A1 - Erdmann, J. A1 - Gorsler, H.-V. A1 - Nick, L. T1 - Barrier properties of plasma-modified polypropylene and polyethyleneterephthalate KW - Plasma fluorination of polymers KW - Deposition of fluorine-containing plasma polymers KW - Barrier formation against solvent permeation KW - Permeation mechanism of solvent mixtures PY - 1995 SN - 0169-4243 SN - 1568-5616 VL - 9 IS - 9 SP - 1165 EP - 1180 PB - VNU Science Press CY - Utrecht AN - OPUS4-7013 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Lippitz, Andreas A1 - Unger, Wolfgang ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - X-ray Absorption Spectroscopy (NEXAFS) of PET Surfaces T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 755 EP - 759 PB - Wiley CY - Chichester AN - OPUS4-7288 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Characterization by XAS, XPS und ToF-SIMS T2 - 12. Bundesdeutsche Fachtagung Plasmatechnologie der Deutschen Gesellschaft für Plasmatechnologie CY - Braunschweig, Germany DA - 2005-03-21 PY - 2005 AN - OPUS4-7293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - A reference material for calibration and testing of instruments with nanometric lateral resolution T2 - SIMS Europe 2002 ; 3rd European Workshop on Secondary Ion Mass Spectrometry CY - Münster, Germany DA - 2002-09-15 PY - 2002 SP - 58 AN - OPUS4-6841 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas T1 - Prüfartenakkreditierung am Beispiel der ESCA N2 - Die Akkreditierung für Prüfverfahren in der Oberflächenanalytik wird gemeinhin als sehr schwierig angesehen. Durch das unlängst eingeführte flexible Konzept der Akkreditierung, auch Prüfartenakkreditierung genannt, eröffnen sich nunmehr neue Möglichkeiten. Aus dem Bereich des Normenwesens in der Oberflächenanalytik erhalten die Prüflaboratorien zusätzliche Unterstützung. Die Validierung von ESCA-Prüfverfahren und ein wohldokumentiertes Prüfmittelmanagement sind weitere Bausteine auf dem Weg zur erfolgreichen Akkreditierung. Oberflächenanalyseverfahren sind akkreditierfähig. PY - 1999 SN - 0344-1733 SN - 1610-8256 SP - 90 EP - 93 PB - Vogel CY - Würzburg AN - OPUS4-6842 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Böse, Olaf A1 - Fritz, Thomas A1 - Gelius, U. T1 - Fortschritte im Qualitätsmanagement der Oberflächenanalytik PY - 2000 DO - https://doi.org/10.1002/nadc.20000480920 SN - 1439-9598 SN - 1521-3854 VL - 48 IS - 9 SP - 1108 EP - 1111 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-6831 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Quantitative Bestimmung von organischen Si-Verbindungen auf Elastomeroberflächen PY - 1999 SN - 0948-3276 SN - 0022-9520 VL - 52 IS - 12 SP - 842 PB - Hüthig CY - Heidelberg AN - OPUS4-6832 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Messung der Hydrophilie von mikroskopischen Bereichen an mikrofluidischen Bauteilen T2 - Status Seminar: Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen (DFG-SPP 1159) CY - Freiburg, Germany DA - 2005-02-28 PY - 2005 AN - OPUS4-7136 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface and Micro/Nano Analysis Activities at the Federal Institute for Materials Research and Testing (BAM) T2 - Seminar: MolecularSciences Laboratory, Interfacial and Nano Science Facility, Pacific North West National Laboratory CY - Richland, WA, USA DA - 2005-04-07 PY - 2005 AN - OPUS4-7358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pilot study on standard-free quantification in EPMA: Status report 2005 T2 - Meeting of the Surface Analytical Working Group @ CCQM CY - Sèvres, France DA - 2005-04-13 PY - 2005 AN - OPUS4-7359 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shiraishi, M. A1 - Swaraj, Sufal A1 - Takenobu, T. A1 - Iwasa, Y. A1 - Ata, M. A1 - Unger, Wolfgang T1 - Spetroscopic characterization of single-walled carbon nanotubes carrier-doped by encapsulation of TCNQ N2 - etracyano-p-quinodimethane (TCNQ) molecules encapsulated single-walled carbon nanotubes (SWNTs) were investigated by using core level and valence band x-ray photoemission spectroscopy as well as near-edge x-ray-absorption fine structure spectroscopy. The pi-band and pi*-band structures in these molecular systems were investigated, and it was clearly confirmed that a charge transfer occurred in TCNQ-doped SWNTs. TCNQ molecules were negatively charged as to be expected. A depletion of the pi-band density of states of the SWNTs caused by the charge transfer to the TCNQ molecules was observed. KW - NEXAFS KW - XPS KW - SWNT KW - Modified nanotubes PY - 2005 DO - https://doi.org/10.1103/PhysRevB.71.125419 SN - 1098-0121 SN - 0163-1829 SN - 0556-2805 SN - 1095-3795 SN - 1550-235X VL - 71 SP - 125419-1-125419-7 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-7418 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - NEXAFS - spectroscopy on plasma-polymerised films prepared from organic molecules (Acrylic acid, allylamine, ethylene) KW - NEXAFS KW - Plasmapolymere KW - Synchrotronstrahlung PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=315 SN - 0179-4159 SP - 315 EP - 317 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7387 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Shiraishi, M. A1 - Swaraj, Sufal A1 - Ata, M. T1 - Spectroscopic (NEXAFS, XPS) Characterization of Single-walled Carbon Nanotubes Carrier Doped by Encapsulation of Organic Molecules (TCNQ) KW - NEXAFS KW - XPS KW - Nanotubes KW - Synchrotronstrahlung PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=101 SN - 0179-4159 SP - 101 EP - 103 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7389 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krishna Murthy, J. A1 - Gross, U. A1 - Rüdiger, St. A1 - Ünveren, Ercan A1 - Unger, Wolfgang A1 - Kemnitz, E. T1 - Synthesis and characterization of chromium(III)-doped magnesium fluoride catalysts N2 - Cr3+-doped MgF2 systems are synthesised by a novel non-aqueous soft chemistry route using different Cr precursors and varying Cr loading. These systems have been characterized by X-ray powder diffraction (XRD), BET surface area, TPD of ammonia, FT-IR pyridine adsorption analysis and X-ray photoelectron spectroscopy, and tested for their catalytic activity in dismutation of CCl2F2 and CF3–CHClF. Catalysts synthesised starting from CrO3 or (CH3CO2)7Cr3(OH)2 showed better catalytic activity than those prepared with CrCl3. FT-IR pyridine adsorption studies reveal that the catalytic activity is highly correlated with the Lewis acid strength. In TPD of NH3 catalysts prepared from CrO3 and (CH3CO2)7Cr3(OH)2, precursors showed a similar behaviour, different from that of catalysts prepared from CrCl3. KW - Lewis acid KW - Heterogeneous catalysis KW - Metal fluoride KW - Doped systems PY - 2005 UR - http://www.sciencedirect.com/science/journal/0926860X DO - https://doi.org/10.1016/j.apcata.2004.12.004 SN - 0947-8396 VL - 282 IS - 1-2 SP - 85 EP - 91 PB - Springer CY - Berlin AN - OPUS4-7442 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Österle, Werner A1 - Kaiander, I. A1 - Sellin, R. L. A1 - Bimberg, D. ED - Wilkening, G. ED - Koenders, L. T1 - Testing the Lateral Resolution in the Nanometre Range with a New Type of Certified Reference Material T2 - NanoScale 2004 Seminar ; 6th Seminar on Quantitative Microscopy ; 2nd Seminar on Nanoscale Calibration Standards and Methods CY - Braunschweig, Germany DA - 2004-03-25 KW - Laterale Auflösung KW - Nanometrologie KW - Nanotechnologie KW - Oberflächenanalytik KW - Zertifiziertes Referenzmaterial PY - 2004 SN - 3-527-40502-X DO - https://doi.org/10.1002/3527606661.ch21 SP - 282 EP - 294 PB - Wiley-VCH CY - Weinheim AN - OPUS4-7541 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ünveren, Ercan A1 - Kemnitz, E. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Surface Characterization of Chromia for Chlorine/Fluorine Exchange Reactions N2 - The dismutation of CCl2F2 was used to probe the effect of halogenation of chromia by Cl/F exchange reactions to find out the difference between the halogenated inactive and active catalysts. The heterogeneous reactions were performed in a continuous flow Ni reactor and also under simulated reaction conditions in a reactor where after the reaction X-ray photoelectron spectroscopy (XPS) and X-ray excited Auger electron spectroscopy (XAES) analyses are possible without air exposure of the catalyst, i.e., under so-called "in situ" conditions. The Cr(III) 2p XP spectra, which revealed multiplet splitting features and satellite emission, were used for chemical analysis by using a simple evaluation procedure which neglects this inherent complexity. Chemical analysis was also applied by using chemical state plots for Cr 3s in order to cross-check Cr 2p related results. Both ex and in situ XPS show that as soon as Cr2O3 is exposed to CCl2F2 at 390°C fluorination as well as chlorination takes place at the catalyst surface. When the XPS surface composition reaches approximately 4 at. % fluorination and 6 at. % chlorination, maximum catalytic activity was obtained. Application of longer reaction times did not change significantly the obtained surface composition of the activated chromia. The fluorination and chlorination of chromia was further investigated by various HF and HCl treatments. The activated chromia samples and the Cr2O3, Cr(OH)3, CrF2OH, CrF3·H2O, α-CrF3, β-CrF3, and CrCl3 reference samples with well-known chemical structures were also characterized by X-ray absorption near edge structure (XANES), time-of-flight secondary ion mass spectroscopy (TOF-SIMS), pyridine-FTIR, wet chemical (F and Cl) analysis, X-ray powder diffraction (XRD), and surface area (BET) analysis. The results suggest that the formation of chromium oxide chloride fluoride species, e.g., chromium oxide halides, at the surface is sufficient to provide catalytic activity. The presence of any CrF3 and/or CrCl3 phases on the activated chromia samples was not found. PY - 2005 DO - https://doi.org/10.1021/jp045902r SN - 1520-6106 SN - 1520-5207 SN - 1089-5647 VL - 109 IS - 5 SP - 1903 EP - 1913 PB - Soc. CY - Washington, DC AN - OPUS4-10531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - (Pulsed) R. F. Plasma-polymerized Films Prepared From Small Organic Monomers: Chemical Characterization by XAS, XPS and ToF-SIMS T2 - Seminar: Dept. of Engineering Physics, Ecole Polytechnique CY - Montreal, Canada DA - 2005-08-15 PY - 2005 AN - OPUS4-10821 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Ageing studies of pulsed r. f. plasma-polymerized films prepared from organic monomers by XAS, ESCA und TOF-SIMS surface analysis T2 - 17th International Symposium on Plasma Chemistry CY - Toronto, Canada DA - 2005-08-07 PY - 2005 AN - OPUS4-10822 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The lateral resolution of ToF-SIMS analysed by means of an advanced nanoscale strip-pattern T2 - 15th International Conference on Secondary Ion Mass Spectrometry (SIMS XV) CY - Manchester, England DA - 2005-09-12 PY - 2005 AN - OPUS4-10872 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Gross, Thomas T1 - XPS/ESCA - Ringversuchsergebnisse T2 - Seminar Oberflächenanalytik "Technische Aspekte der Akkreditierung nach ISO/IEC 17025" CY - Berlin, Deutschland DA - 2003-01-24 PY - 2003 SP - 1 EP - 3 AN - OPUS4-2120 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter T1 - NEXAFS - spectroscopy on plasma-polymerized films prepared from organic molecules (ethylene, allyl alcohol, styrene) KW - Plasma KW - Beschichtung KW - Organische Filme KW - Röntgenabsorptionsspektroskopie PY - 2004 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2003.pdf#page=297 SN - 0179-4159 SP - 297 EP - 299 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-3478 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Ünveren, Ercan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Poly-dimethyl-siloxane (PDMS) contamination of polystyrene (PS) oligomers samples: a comparison of time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS) results N2 - Pure and PDMS contaminated PS oligomers films were investigated both by time-of-flight static secondary ion mass spectrometry (TOF-SSIMS) and X-ray photoelectron spectroscopy (XPS). The secondary ion spectra from the PDMS contaminated PS oligomers were almost completely related to PDMS. XPS revealed a PDMS contamination characterized by a silicon surface concentration of 6 at.%. Obviously siloxane contaminants existing on the surface of a silicon wafer may diffuse towards the PS oligomers outermost surface resulting in a rather high PDMS surface concentration of about 85%. Due to the known differences in the information depth and sensitivity of SSIMS and XPS very different detection limits are to be considered. In elimination of siloxane contaminants by ultrasonication in hexane was found to be an effective way. Another common organic cleaning procedure, which is ultrasonication in trichloroethylene (TCE), subsequently in isopropanol and finally in acetone was found to be ineffective for cleaning of PDMS contaminated silicon wafers. KW - PDMS KW - TOF-SIMS KW - Polystyrene KW - Segregation PY - 2004 DO - https://doi.org/10.1016/j.apsusc.2003.12.008 SN - 0169-4332 SN - 1873-5584 VL - 227 SP - 318 EP - 324 PB - North-Holland CY - Amsterdam AN - OPUS4-3479 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Teststreifen für den Nanokosmos KW - Laterale Auflösung KW - Nanometrologie KW - Nanotechnologie KW - Oberflächenanalytik KW - Zertifiziertes Referenzmaterial PY - 2004 UR - http://www.laborpraxis.de/ SN - 0344-1733 SN - 1610-8256 VL - 27 IS - Juli/Aug SP - 30 EP - 32, Sonderh. Nanotechnologie PB - Vogel CY - Würzburg AN - OPUS4-3808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b197.pdf SN - 1344-6339 VL - 20 SP - 197 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive XPS depth-profiling of ta:C-films by variable excitation energy PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b198.pdf SN - 1344-6339 VL - 20 SP - 198 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2799 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - Haftung im Verbund - Chemie und Hafteigenschaften von Metall-Polymergrenzflächen PY - 2003 SN - 0026-0797 SN - 0043-2792 VL - 57 IS - 7-8 SP - 26 EP - 31 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-2843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Reiners, Georg T1 - Quality assurance in nano-scale analysis N2 - Zusammenfassung Some methods of nano-scale analysis are on the threshold of being a standard method in industry and therefore quality assurance becomes important. But, at the present time, there are deficits in standardisation and validation of these methods. Therefore, we have organised method comparisons and interlaboratory comparisons to overcome these deficits. We report the results of an interlaboratory comparison in step-height determination by atomic force microscopy and the development of a reference material for laterally resolving methods of material analysis. PY - 2003 DO - https://doi.org/10.1007/s00339-002-1976-5 SN - 0947-8396 VL - 76 IS - 6 SP - 919 EP - 921 PB - Springer CY - Berlin AN - OPUS4-2289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Time-of-flight-SIMS and XPS characterization of metal doped polymers N2 - Organic thin films with defined chemical structures and physical properties are required for various applications. Plasma polymerization is of technological interest, since the deposition of plasma polymers is possible on any material of any shape in the desired thickness. We report on the TOF-SIMS (TOF: time-of-flight) and XPS investigations of pulse plasma ‘poly(acetylene)’ and alkali metal doped pulse plasma ‘poly(acetylene)’ films. The combination of TOF-SIMS and XPS supplies detailed information on the surface chemistry of these films. Application of both methods provides the possibility for cross-checking certain results. Moreover the different sensitivities of the methods can be utilized. According to the TOF-SIMS and XPS data it can be concluded that the interaction of alkali metals with plasma ‘poly(acetylene)’ results in electrovalent bonds of the type Me?+–C?- between carbon and metal. Furthermore carbon–oxygen–metal interactions were observed. These interactions are of the type C=O?-cdots, three dots, centeredMe?+ and/or C–O?-–Me?+. KW - SIMS KW - TOF-SIMS KW - XPS KW - Plasma KW - Polymer KW - Poly(acetylene) PY - 2003 DO - https://doi.org/10.1016/S0169-4332(02)00769-9 SN - 0169-4332 SN - 1873-5584 VL - 203-204 SP - 575 EP - 579 PB - North-Holland CY - Amsterdam AN - OPUS4-2271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita ED - Acker, J. V. T1 - Wood Modification by Sol-Gel Derived Precursors T2 - 1st European Conference on Wood Modification ; 1st ECWM 2003 CY - Ghent, Belgium DA - 2003-04-03 KW - Silica-sol treatment KW - Wood-inorganic composite KW - Water repellency KW - Environmental stability PY - 2003 SN - 90-806565-2-6 SN - 1018-5593 SP - 255 EP - 259 PB - Univ., Laboratory of Wood Technology CY - Ghent AN - OPUS4-2521 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absoption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - 3. BAMline Seminar, BESSY CY - Berlin, Germany DA - 2004-11-29 PY - 2004 AN - OPUS4-5018 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Pulsed Plasma-polymerized Films Prepared from Organic Molecules: Characterization by X-ray Absoption Spectroscopy, Photoelectron Spectroscopy and Time of Flight Static Secondary Ion Mass Spectrometry T2 - BESSY Users Meeting 2004 CY - Berlin, Germany DA - 2004-12-02 PY - 2004 AN - OPUS4-5019 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface analysis of Plasma Deposited Polymer Films, 5 - ToF-SSIMS Characterization of Plasma Deposited Allyl Alcohol Films N2 - The effect of the composite plasma parameter P/F, where P is the plasma power and F is the monomer flow rate, on the chemical character of pulsed plasma deposited allyl alcohol films was investigated by ToF-SSIMS. Information on the unsaturated character, the cross-linked and/or branched character of the plasma polymer films was derived in detail. The problem of the retention of OH groups in plasma deposited allyl alcohol films was elucidated in detail using SSIMS data. The lowest conversion rate from the monomer's hydroxyl groups to other oxygen functionalities in the plasma was concluded for the plasma polymer film produced at a P/F ratio of 0.05 W · sccm-1. It was found that the overall oxygen content of the films decreased vs. increasing P/F ratio. Because the freshly prepared films were investigated without air exposure, ageing on ambient air could be studied in detail. It was found that in the case of plasma deposited allyl alcohol films the ageing on air is probably based on two competing processes which are discussed in detail. Additionally, a review of literature data on the characterization of plasma deposited allyl alcohol films is given. KW - Ageing KW - Allyl alcohol KW - Plasma polymerization KW - ToF-SIMS PY - 2005 DO - https://doi.org/10.1002/ppap.200400075 SN - 1612-8850 SN - 1612-8869 VL - 2 IS - 7 SP - 563 EP - 571 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-11933 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Aging of Plasma-Deposited Films Prepared from Organic Monomers N2 - Plasma-deposited polymer films were prepared from organic molecules and investigated using near edge X-ray absorption fine structure (NEXAFS) and X-ray photoelectron spectroscopy (XPS) for aging effects after exposure to air. Results from the investigation of homopolymers are summarized. Primarily the effect of the deposition parameters duty cycle and power are dealt with. The effect of the deposition parameter pressure is briefly discussed. An example to show the effect of feed gas composition on the aging of plasma polymerized ethylene/allyl alcohol and styrene/allyl alcohol copolymer is also given. In general, change in content of unsaturated or aromatic species, change in concentration of monomer functionality, and change in the oxygen content was observed in the plasma polymerized films on aging. KW - Plasma copolymer KW - ESCA/XPS KW - NEXAFS KW - Plasma polymerization PY - 2007 SN - 1612-8850 SN - 1612-8869 VL - 4 IS - S1 SP - S784 EP - S789 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-11934 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Murthy, J.K. A1 - Gross, U. A1 - Rüdiger, S. A1 - Ünveren, Ercan A1 - Unger, Wolfgang A1 - Kemnitz, E. T1 - Synthesis and characterization of chromium(III)-doped magnesium fluoride catalysts N2 - Cr3+-doped MgF2 systems are synthesised by a novel non-aqueous soft chemistry route using different Cr precursors and varying Cr loading. These systems have been characterized by X-ray powder diffraction (XRD), BET surface area, TPD of ammonia, FT-IR pyridine adsorption analysis and X-ray photoelectron spectroscopy, and tested for their catalytic activity in dismutation of CCl2F2 and CF3–CHClF. Catalysts synthesised starting from CrO3 or (CH3CO2)7Cr3(OH)2 showed better catalytic activity than those prepared with CrCl3. FT-IR pyridine adsorption studies reveal that the catalytic activity is highly correlated with the Lewis acid strength. In TPD of NH3 catalysts prepared from CrO3 and (CH3CO2)7Cr3(OH)2, precursors showed a similar behaviour, different from that of catalysts prepared from CrCl3. KW - Lewis acid KW - Heterogeneous catalysis KW - Metal fluoride KW - Doped systems PY - 2005 SN - 0926-860X SN - 1873-3875 VL - 282 IS - 1-2 SP - 85 EP - 91 PB - Elsevier CY - Amsterdam AN - OPUS4-11953 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Schulze, Rolf-Dieter A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface Analysis of Plasma-Deposited Polymer Films, 4 - In situ Characterization of Plasma-Deposited Ethylene Films by XPS and NEXAFS N2 - XPS and NEXAFS spectroscopy were used for the chemical characterization of pulsed plasma-deposited ethylene films before and after exposure to ambient air. The influence of external plasma parameters on the spectroscopic results was investigated. Information on the chemical character of the plasma-polymerized films, such as the regularity of the primary structure, the amount of long-living radicals, and branching or cross-linking or both was derived from this data. Irregularity and radical concentration for post-plasma reactions of the plasma-deposited films increased with the duty cycle or power. A decreased level of monomer fragmentation and, consequently, an increase in regularity is partially concluded from the experimental data when the monomer pressure is increased. The concentration of surface radicals available for post-plasma reactions also increased with monomer pressure. The correlation found between the degree of the post-plasma oxygen incorporation and the variation of the various external parameters agreed with earlier ToF-SSIMS findings. KW - ESCA/XPS KW - NEXAFS KW - Plasma polymerization KW - Polyethylene (PE) KW - Thin films PY - 2005 DO - https://doi.org/10.1002/ppap.200400070 SN - 1612-8850 SN - 1612-8869 VL - 2 IS - 4 SP - 310 EP - 318 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-11940 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - Kontrollierte Abscheidung und Alterung von Plasmapolymerschichten N2 - Es wird gezeigt, dass mit einer Kombination der Oberflächenanalyseverfahren ESCA, ToF- SIMS und XAS eine erfolgreiche chemische Charakterisierung von Plasmapolymerfilmen erreicht werden kann. Es werden Elemente und Bindungstypen identifiziert und (semi-)quantitativ bestimmt. Eine Korrelation zwischen Abscheidebedingungen und chemischen Eigenschaften der Plasmapolymerschichten kann hergestellt werden; eine kontrollierte Abscheidung wird damit möglich. Alterungsprozesse, die als Folge einer Atmosphärenexposition auftreten, können beobachtet werden. Die direkte Verbindung der Analysetechniken mit einem Plasmareaktor ermöglicht es, die Alterungsphänomene der Schichten systematisch mit Bezug auf eine frisch abgeschiedene und keinerlei Atomsphäre ausgesetzte Plasmapolymerschicht zu studieren. Die Verfahrensweise wird exemplarisch am Beispiel von Ethylen-, Allylamin- und Allylalkohol-Plasmapolymerschichten demonstriert. KW - ESCA KW - XAS KW - ToF-SIMS KW - Plasmapolymer KW - Alterung PY - 2006 DO - https://doi.org/10.1002/vipr.200600276 SN - 0947-076X SN - 1522-2454 VL - 18 IS - 1 SP - 6 EP - 11 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-12061 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Abschlussbericht zum Vorhaben Verbundwerkstoff - Mineralisiertes Holz - FKZ: 033 9829 - Förderschwerpunkt "Integrierter Umweltschutz im Bereich der Holzwirtschaft" des Bundesministeriums für Bildung, Wissenschaft, Forschung und Technologie, BMBF - Projektlaufzeit: 1.10.2000-30.9.2003 KW - Mineralisiertes Holz KW - Sol-Gel KW - Holz KW - Vakuumtränkung KW - Holzschutz KW - Biozide PY - 2004 SP - 1 EP - 94 CY - Berlin AN - OPUS4-12055 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 PY - 2006 AN - OPUS4-12251 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas T1 - Radio frequency (r.f.) plasma-deposited polymer films: influence of external plasma parameters as viewed by comprehensive in-situ surface chemical analysis by XAS, XPS and ToF-SIMS N2 - The formation of plasma-deposited materials made from organic molecules is a technologically attractive way to obtain films with unique properties, e.g. adhesion, wettability, conductivity or selected chemical functionalization. A detailed chemical characterization of these films is a great challenge for the analyst because of the co-existence of a large number of chemical species in plasma-deposited films. We investigated these types of organic films using photoelectron spectroscopy for chemical analysis (ESCA, XPS), near edge X-ray absorption fine structure (NEXAFS) spectroscopy at synchrotron radiation source BESSY II and time-of-flight secondary ion mass spectroscopy (ToF-SIMS). A dedicated plasma preparation chamber was designed and added to the main analysis chamber of the respective spectrometers. This approach offers the possibility of studying plasma-deposited films without exposure to air before analysis (often called in-situ analysis) and the influence of post-plasma reactions, i.e. the ageing process. The present investigations are aimed at finding correlations between basic chemical properties of the deposited films and the plasma deposition parameters, e.g. duty cycle in pulsed plasmas and the power of discharge. KW - Plasma deposition KW - NEXAFS KW - XPS KW - ToF-SIMS KW - Plasma parameter PY - 2006 DO - https://doi.org/10.1002/sia.2158 SN - 0142-2421 SN - 1096-9918 VL - 38 IS - 4 SP - 522 EP - 525 PB - Wiley CY - Chichester AN - OPUS4-12271 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Surface analysis of Plasma Deposited Polymer Films, 7: "In situ" Characterization of Plasma Deposited Allylamine Films by ToF-SSIMS, XPS and NEXAFS Spectroscopy N2 - Plasma deposited allylamine films were studied by in situ ToF-SSIMS, XPS and NEXAFS Spectroscopy before exposure to ambient air. The influence of external plasma parameters such as duty cycle, plasma power, and monomer flow rate on (i) unsaturation, (ii) branching and cross-linking, (iii) nitrogen surface concentration and (iv) retention of amino groups was investigated. Harder plasma conditions, which can be obtained when high duty cycles, high plasma power, and low monomer flow rates are employed, increase the unsaturated, branched and cross-linked character of the plasma deposited films, while the surface concentration of N as well as the retention of the monomer's amino group decrease. As proven by NEXAFS findings and cross-checked by ToF-SSIMS results, the allylamine monomer's primary amino groups are partially transformed into other nitrogen functionalities during its plasma polymerization. Amongst them imines and nitriles are the conversion products with the highest probabilities of formation. Another conversion channel is the formation of nitrogen species not participating in the film growth. This is the reason for an increased N loss in plasma deposited allylamine films as observed independently by XPS and ToF-SSIMS when the plasma parameters are changed from mild to hard. KW - Allylamine KW - NEXAFS KW - Plasma polymerization KW - ToF-SSIMS KW - XPS PY - 2006 DO - https://doi.org/10.1002/ppap.200500168 SN - 1612-8850 SN - 1612-8869 VL - 3 IS - 3 SP - 288 EP - 298 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-12272 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Analysis Working Group (SAWG) Report for 2005/06 T2 - CCQM Plenary Meeting 2006, BIPM CY - Sèvres, France DA - 2006-04-06 PY - 2006 AN - OPUS4-12285 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: Development of certified reference materials and surface characterisation of plasma polymerized thin films T2 - Seminar im Lab. of Physical-Chemistry of Surfaces (CNRS-ENSCP), Ecole Nationale Superieure de Chemie de Paris CY - Paris, France DA - 2006-04-04 PY - 2006 AN - OPUS4-12286 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CCQM surface analysis working group (SAWG): introduction for WG meeting 2006 & summary 2006 and next steps T2 - CCQM Surface Analysis Working Group Meeting 2006 CY - Sèvres, France DA - 2006-04-05 PY - 2006 AN - OPUS4-12289 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Neuartig räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - 2. Statuskolloquium des DFG SPP 1159 "Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen" CY - Jena, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12451 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Controlled deposition from the gaseous phase: application of micro-surface analysis T2 - Marie Curie Actions: MINDE Micro and Nano Deposition (Course) European Academy of Surface Technology (EAST) CY - Schwäbisch Gmünd, Germany DA - 2006-05-29 PY - 2006 AN - OPUS4-12452 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface & thin film analysis at BAM: certified reference materials and R&D on plasma polymerization of organics T2 - Seminar, National ESCA and Surface Analysis Center for Biomedical Problems (NESCA/BIO), University of Washington CY - Seattle, WA, USA DA - 2006-06-29 PY - 2006 AN - OPUS4-12506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Charakterisierung von Plasmapolymeren: "Viel hilft viel!" T2 - AK Plasma, Frühjahrstreffen 2006 CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12497 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grohmann, I. A1 - Peplinski, Burkhard A1 - Unger, Wolfgang T1 - New entries in the XPS fingerprint database for the characterization of precipitated Cu-Zn-Al oxide catalysts PY - 1992 SN - 0142-2421 SN - 1096-9918 VL - 19 SP - 591 EP - 594 PB - Wiley CY - Chichester AN - OPUS4-12595 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Peplinski, Burkhard A1 - Unger, Wolfgang A1 - Grohmann, I. T1 - Characterization of Cu-Zn-Al oxide catalysts in the precipitated, calcined and reduced state by means of XPS with the help of a finger-print data base PY - 1992 SN - 0169-4332 SN - 1873-5584 VL - 62 SP - 115 EP - 129 PB - North-Holland CY - Amsterdam AN - OPUS4-12596 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - NEXAFS - spectroscopy on freshly prepared and aged plasma-polymerised films PY - 2006 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2005.pdf#page=322 SN - 0179-4159 SP - 320 EP - 322 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-12804 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Surface analysis of plasma-deposited polymer films by Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) before and after exposure to ambient air N2 - Pulsed plasma deposited styrene and ethylene films were studied by Time of Flight Static Secondary Ion Mass Spectrometry (ToF-SSIMS) before and after exposure to ambient air. The influence of the external plasma parameters on the secondary ion mass spectra of plasma deposited films was investigated. Approaches for the interpretation of SSIMS spectra of organic materials were reviewed and applied to the evaluation of SSIMS data of plasma deposited films. From these data, information on the chemical character of the plasma deposited films was derived. When the plasma polymers are exposed to air oxygen incorporation occurs. The oxygen uptake is high at the beginning and then it levels of. A relation that “higher the regularity of the film lower is the oxygen uptake” was found. Harder plasma conditions, which could be obtained by applying higher plasma power or lower monomer flow rate, result in higher oxygen uptake and vice versa. KW - Plasma polymerization KW - Polyethylene (PE) KW - Polystyrene (PS) KW - SIMS KW - Ageing PY - 2005 DO - https://doi.org/10.1016/j.surfcoat.2005.02.032 SN - 0257-8972 VL - 200 IS - 1-4 SP - 463 EP - 467 PB - Elsevier Science CY - Lausanne AN - OPUS4-11044 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Study of influence of external plasma parameters on plasma polymerised films prepared from organic molecules (acrylic acid, allyl alcohol, allyl amine) using XPS and NEXAFS N2 - Plasma polymerised films of acrylic acid, allyl alcohol and allyl amine were prepared and studied by XPS (X-ray photoelectron spectroscopy) and XAS (X-ray absorption spectroscopy). The influence of external plasma parameters on certain chemical aspects of the films was investigated. The use of XPS and NEXAFS (near edge X-ray absorption fine structure) as complimentary tools in the surface characterisation of thin films has been highlighted. Certain chemical aspects of the plasma polymerised films such as presence of ROCdouble bond; length as m-dashO in the case of plasma polymerised acrylic acid films, presence of RCdouble bond; length as m-dashO and RC–OR bonds in case of plasma polymerised allyl alcohol films and presence of RCdouble bond; length as m-dashN and C?N in case of plasma polymerised allyl amine films were studied. The concentration of ROCdouble bond; length as m-dashO species was found to decrease with increase in r.f. duty cycle in the case of plasma polymerised acrylic acid films. In case of plasma polymerised allyl alcohol films there is a decrease in the concentration of RCdouble bond; length as m-dashO species and increase in the concentration of RC–OR species at higher pressures, while in the case of plasma polymerised allyl amine films the concentration of RCdouble bond; length as m-dashN and C?N increases at higher powers, with an increase in C?N more pronounced at higher powers. KW - Plasma polymerization KW - NEXAFS KW - XPS KW - Plasma parameter PY - 2005 DO - https://doi.org/10.1016/j.surfcoat.2005.01.083 SN - 0257-8972 VL - 200 IS - 1-4 SP - 494 EP - 497 PB - Elsevier Science CY - Lausanne AN - OPUS4-11045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - R.F. Plasma-polymerized Polymer Films: Comprehensive Surface and in Depth Chemical Characterization by XAS, XPS and ToF-SIMS T2 - 11th Eurpean Conference on Applications of Surface and Interface Analysis, ECASIA`05 CY - Vienna, Austria DA - 2005-09-25 PY - 2005 AN - OPUS4-11283 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - New Work Item (Technical Report): Surface chemical analysis - General procedures - Guide for the determination of lateral resolution of imaging instruments in the nanometre range T2 - ISO/TC201 14th Plenary and SC Meetings, Hotel Budapest CY - Budapest, Hungary DA - 2005-09-22 PY - 2005 AN - OPUS4-11219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Escher, M. A1 - Weber, N. A1 - Funnenmann, D. A1 - Krömker, B. T1 - Testing of Lateral Resolution in the Nanometre Range Using the BAM-L002 - Certified Reference Material: Application to ToF-SIMS IV and NanoESCA Instruments T2 - International Symposium on Practical Surface Analysis CY - Jeju, Republic of Corea DA - 2004-10-04 KW - ESCA KW - Nanometrologie KW - Nanotechnologie KW - Oberflächenanalytik KW - SIMS KW - XPS KW - Zertifiziertes Referenzmaterial PY - 2005 SN - 1341-1756 SN - 1347-8400 VL - 12 IS - 2 SP - 78 EP - 82 CY - Tsukuba AN - OPUS4-11146 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface chemical characterization of plasma-polymerized organic films: State-of-the-art and shortcomings T2 - 10th International Conference on Plasma Surface Engineering CY - Garmisch-Partenkirchen, Germany DA - 2006-09-10 PY - 2006 AN - OPUS4-13062 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Static ToF-SIMS analysis of plasma chemically deposited ethylene/allyl alcohol co-polymer films N2 - A plasma co-polymerization of ethylene as a “chain extending” monomer and allyl alcohol as a carrier monomer for hydroxyl groups was studied. The composition of the feed gas was systematically varied and the plasma co-polymers were analyzed in terms of their relative concentrations of OH functional groups by static Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) immediately after their preparation without any air contact, i.e., under so called “in situ” conditions. The relative OH group concentration involved in the –CH2–OH groups was derived from the normalized yields of the CH3O+ secondary fragment ion. The density of functional groups in the plasma co-polymers was found to vary non-linearly with respect to the mole percentage of the monomers in the feed gas. Co-polymerization phenomena, i.e. chemical interactions and recombination reactions taking place between monomer molecules in the plasma and/or during the deposition process, become evident in ToF-SIMS spectra. KW - Plasma deposition KW - ToF-SIMS KW - Plasma co-polymerization KW - Ethylene KW - Allyl alcohol PY - 2006 DO - https://doi.org/10.1016/j.apsusc.2006.02.089 SN - 0169-4332 SN - 1873-5584 VL - 252 IS - 19 SP - 6588 EP - 6590 PB - North-Holland CY - Amsterdam AN - OPUS4-13724 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Senoner, Mathias A1 - Schmidt, M. T1 - Chemische Charakterisierung von mikro- und nanotechnologischen Bauteilen: Verfahrensentwicklung und Referenzmaterialien T2 - VDI/VDE-Tagung "Messtechnik für Mikro- und Nano-Engineering" CY - Erlangen, Germany DA - 2006-11-29 KW - Referenzmaterial KW - Mikrofluidik KW - Nanoanalytik PY - 2006 N1 - Serientitel: VDI-Berichte – Series title: VDI-Berichte IS - 1950 SP - 197 EP - 206 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-14110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Chemische Charakterisierung von mikro- und nanotechnologischen Bauteilen: Verfahrensentwicklung und Referenzmaterialien T2 - VDI/VDE GMA Tagung "Messtechnik für Mikro- und Nano-Engineering" CY - Erlangen, Germany DA - 2006-11-29 PY - 2006 AN - OPUS4-14231 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Results of a german survey on topics of interest in surface chemical analysis of organic surfaces in 2006: topics and priorities T2 - ISO/TC201 15th Plenary and SC Meetings (Morgan Hill Meeting) CY - Morgan Hill, CA, USA DA - 2006-11-09 PY - 2006 AN - OPUS4-14232 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Project A8: New procedures for the determination of lateral resolution of instruments for surface analysis in the nanometre range T2 - VAMAS Technical Working Area 2 on Surface Chemical Analysis, Meeting of National Representatives, Project Leaders and Observers CY - Morgan Hill, CA, USA DA - 2006-11-12 PY - 2006 AN - OPUS4-14223 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Lateral resolution of secondary ion mass spectrometry - results of an inter-laboratory comparison N2 - Recently, BAM organised an inter-laboratory comparison focussed on lateral resolution and accuracy of sub-micron length measurements by secondary ion mass spectrometry (SIMS). Results were submitted by 16 laboratories from 10 countries. The task was to analyse a cross-sectioned semiconductor multilayer stack. The resulting strip pattern in the surface of the sample shows narrow strips, step transitions and gratings of different periods. Imaging analysis of this pattern enables the determination of relevant parameters related to the lateral resolution: (i) The width (FWHM) of the primary ion beam, (ii) the distance between 16% and 84% intensity points in a profile across the image of a step transition and (iii) the modulation of intensity in the images of gratings with different periods. The parameter's data reported by the participants vary in a wide range. A strong variation in the data of primary ion beam width was observed for results measured with the same type of instrument. The distance between two narrow strips was measured with high accuracy. Twelve of sixteen of the submitted values are within the limits of uncertainty of the reference value 964 ± 35 nm. This result shows that the calibration of the length scale of the SIMS instruments is already rather precise in most of the participating laboratories. KW - ESF KW - LSF KW - MTF KW - SIMS KW - Accuracy KW - Deconvolution KW - Edge method KW - Edge spread function KW - Inter-laboratory comparison KW - Ion microscopy KW - Lateral resolution KW - Length scale calibration KW - Line spread function KW - Modulation transfer function KW - Nanometrology KW - Nanotechnology KW - Primary ion beam width KW - Square-wave grating KW - Strip pattern PY - 2007 SN - 0142-2421 SN - 1096-9918 VL - 39 IS - 1 SP - 16 EP - 25 PB - Wiley CY - Chichester AN - OPUS4-14427 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Swaraj, Sufal A1 - Lippitz, Andreas ED - Chandra, T. T1 - Ageing studies of plasma deposited organic films by surface chemical analysis (ESCA, ToF-SIMS, XAS) T2 - 5th International Conference on Processing & Manufacturing of Advanced Materials CY - Vancouver, Canada DA - 2006-07-04 KW - Plasma polymerized organic films KW - Ageing phenomena KW - ESCA KW - TOF-SIMS KW - XAS PY - 2007 SN - 0-87849-428-6 SN - 0255-5476 N1 - Serientitel: Materials science forum – Series title: Materials science forum VL - 539-543 IS - 539/543 SP - 623 EP - 628 PB - Trans Tech Publ. CY - Stafa-Zürich AN - OPUS4-14446 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Characterization of carbon materials and plasma deposited organic films by NEXAFS spectroscopy (and complementary methods of surface analysis) T2 - CRG Evaluation of the BM Beamline HE-SGM, BESSY, Lecture Hall CY - Berlin, Germany DA - 2007-03-20 PY - 2007 AN - OPUS4-14648 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - CRG Evaluation of the Bending Magnet Beamline HE-SGM: Future scientific program T2 - CRG Evaluation of the BM Beamline HE-SGM CY - Berlin, Germany DA - 2007-03-20 PY - 2007 AN - OPUS4-14649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Friedrich, Jörg Florian A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Surface Chemical Analysis of Plasma-Deposited Copolymer Films Prepared from Feed Gas Mixtures of Ethylene or Styrene with Allyl Alcohol N2 - Plasma deposited styrene/allyl alcohol and ethylene/allyl alcohol copolymer films were prepared and characterized using XPS, NEXAFS and ToF-SIMS. The relative partial flow rates of the co-monomers are used as deposition process parameters to vary and all other process parameters were constrained to conditions optimized for retention of functional groups. By doing this it is possible to control certain chemical properties of the copolymer films such as unsaturation, oxygen and hydroxyl group relative surface contents. The aging behavior of the plasma copolymer films on air was studied, too. Non-linear variations of relative oxygen contents, contents of C—OR species and contents of carbonyl species are obtained vs. variation of feed gas composition for both monomer combinations. The chemical character of the plasma copolymer films varies between the limits given by the respective plasma homopolymers. The observed non-linear correlations are discussed in terms of approaches developed for classic radical copolymerization. The aging behavior of the different plasma copolymers films depends on the feed gas composition. Principally these aging phenomena known from plasma polymer aging studies of that respective monomer which dominates the character of the plasma copolymer are observed. KW - Plasma polymers KW - Plasma copolymers KW - XPS KW - NEXAFS KW - Allyl alcohol KW - ESCA/XPS KW - Plasma polymerization KW - ToF-SIMS PY - 2007 SN - 1612-8850 SN - 1612-8869 VL - 4 IS - 4 SP - 376 EP - 389 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-14846 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Amino group determination on 4,4'-Methylenebis(2,6-diethylaniline) film surfaces by XPS and NEXAFS applying derivatization reactions T2 - ECASIA'07 CY - Brussels, Belgium DA - 2007-09-10 PY - 2007 AN - OPUS4-15843 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface chemical analysis of nano-scaled plasma polymer films by using a combination of "insitu" and ex-situ spectroscopies: ESCA, SIMS and X-ray absorption spectroscopy T2 - 12th European Conference on Applications of Surface and Interface Analysis (ECASIA) CY - Brussels, Belgium DA - 2007-09-09 PY - 2007 AN - OPUS4-15877 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface analysis (XPS, ToF-SIMS, NEXAFS) of organosilane functionalized substrates to be used as microarray platforms T2 - ECASIA'07 CY - Brussels, Belgium DA - 2007-09-10 PY - 2007 AN - OPUS4-15985 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface chemical analysis of nano-scaled r. f. plasma polymer and Co-polymer films by using a combination of "In-Situ" and ex-situ characterization tools: hydroxylated and aminated surfaces by XPS, ToF-SIMS and NEXAFS spectroscopy T2 - 54th AVS International Symposium and Exhibition, American Vacuum Society CY - Seattle, WA, USA DA - 2007-10-14 PY - 2007 AN - OPUS4-16075 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Die AG Schicht- und Oberflächenanalytik der BAM: Methodische Mögllichkeiten und ausgewählte Forschungsergebnisse T2 - Workshop Electronic materials and processes for organic FETs BASF Polymer Physics, Rheology and Materials Properties CY - Ludwigshafen am Rhein, Germany DA - 2007-10-31 PY - 2007 AN - OPUS4-16167 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - NEXAFS analysis of preferentially orientations of oligothiophene molecules T2 - Workshop Electronic materials and processes for organic FETs BASF Polymer Physics, Rheology and Materials Properties CY - Ludwigshafen am Rhein, Germany DA - 2007-10-31 PY - 2007 AN - OPUS4-16168 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Investigation of wettability of surface modified polymer wafers used in micro fluidic device fabrication T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16381 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, Sufal A1 - Oran, Umut A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Surface Chemical Analysis of Plasma-Deposited Copolymer Films Prepared from Feed Gas Mixtures of Ethylene or Styrene with Allylamine N2 - Plasma deposited ethylene/allylamine and styrene/allylamine copolymer films were prepared and analyzed using XPS, NEXAFS and ToF-SIMS. The relative partial flow rate of the each monomer was used as the variable deposition parameter, while the other deposition parameters were kept constant at optimized values for the retention of functional groups. The effect of the variation in the relative partial flow rates of co-monomers on various chemical aspects of the films like unsaturation, nitrogen retention and branching was investigated revealing several non-linear correlations. This observation is taken as an indication for chemical copolymerization processes during film deposition. An attempt is made to compare these non-linear correlations with approaches which have been developed for classic radical copolymerization processes. The aging behavior of these plasma copolymer films was also studied; the results indicated a stabilization against oxidation in comparison to the aging of allylamine plasma homopolymers. KW - Ethylene-allylamine copolymer KW - ESCA KW - NEXAFS KW - Plasma polymerization KW - Styrene-allylamine copolymer KW - Surface characterization KW - TOF-SIMS KW - XPS PY - 2008 DO - https://doi.org/10.1002/ppap.200700106 SN - 1612-8850 SN - 1612-8869 VL - 5 IS - 1 SP - 92 EP - 104 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-16466 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, Pierre-Luc A1 - Ruiz, J.-C. A1 - Gross, Thomas A1 - Wertheimer, M. R. A1 - Unger, Wolfgang T1 - Ultra-shallow chemical characterization of organic thin films deposited by plasma and vacuum-ultraviolet, using angle- and excitation energy-resolved XPS N2 - Nitrogen (N)-rich organic thin films were deposited using both low-pressure plasma- and vacuum-ultraviolet-based techniques, from mixtures of ammonia (NH3) and ethylene (C2H4). These films were investigated using angle-resolved and excitation energy resolved X-ray photoelectron spectroscopy (ARXPS and ERXPS, respectively) in order to determine their sub-surface chemical profiles. These two techniques enable one to tune the “XPS 95%” information depth, z 95%, by varying either the angle or the excitation energy. Using a combination of both techniques, z 95% can be varied continuously from 0.7 to 11 nm. The surface-near chemistry is investigated using both high-resolution C 1s spectra and elemental concentrations derived from elemental peak intensities. Results show that while laboratory XPS, and even ARXPS, suggest homogenous surface chemistries, the novel combination of ARXPS and ERXPS points to the existence of a compositional profile in the extreme outer surface layer. Our conclusions are supported by simulations using SESSA software. KW - Plasma polymers KW - Vacuum ultraviolet photopolymers KW - Synchrotron XPS KW - Depth profile PY - 2011 DO - https://doi.org/10.1007/s11090-011-9306-3 SN - 0272-4324 VL - 31 IS - 4 SP - 535 EP - 550 PB - Plenum Publ. Corp. CY - New York, NY, USA AN - OPUS4-23993 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wettmarshausen, Sascha A1 - Min, Hyegeun A1 - Unger, Wolfgang A1 - Jäger, Christian A1 - Hidde, Gundula A1 - Friedrich, Jörg Florian T1 - Significance of hydrogen-deuterium exchange at polyolefin surfaces on exposure to ammonia low-pressure plasma N2 - Since more than 40 years ammonia plasma exposure of polyolefins is used for introduction of primary amino groups. The selectivity of this reaction and the yield in primary amino groups was found to be low. Here, a prominent side-reactions of this process was investigated, the hydrogenation by NH3 plasma. For identification of hydrogenation ammonia (NH3) and deuterated ammonia (ND3) were exposed to Polyethylene (h-PE) and fully deuterated polyethylene (d-PE) as well as hexatriacontane (h-HTC) and fully deuterated hexatriacontane (d-HTC) as low-molecular weight model for PE. H–D exchange was assumed and detected by Time-of-Flight Secondary Ion Mass Spectrometry (ToF–SIMS), X-ray Photoelectron Spectroscopy (XPS), Attenuated Total Reflectance (ATR-FTIR) and 1H and 2H Nuclear magnetic Resonance. Results show a significant H–D exchange within the sampling depth of ATR (2.5 µm). However, N- and NH2 introduction was limited to the topmost surface as shown by SIMS and XPS (a few nanometers). KW - Deuterated ammonia KW - Ammonia plasma KW - Deuterated polyolefins KW - Hexatriacontane KW - H-D exchange PY - 2011 DO - https://doi.org/10.1007/s11090-011-9304-5 SN - 0272-4324 VL - 31 IS - 4 SP - 551 EP - 572 PB - Plenum Publ. Corp. CY - New York, NY, USA AN - OPUS4-24178 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Moritz, W. A1 - Werner, R. A1 - Tausche, A. A1 - Cherkaschinin, G. A1 - Molajew, R. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Linke, S. T1 - Alloys for gas sensors investigated using the continuous gradient-high throughput screening macroscope CG-HTSM N2 - Ternary alloys have been studied as the gate metal of chemical sensors based on the field effect in silicon. The investigation of reduced poisoning of hydrogen sensors by H2S is presented in the alloy system PdxNiyCo1-x-y. A new method in high throughput screening of alloys is applied. Not singular sample compositions but a continuous gradient in alloy concentrations was produced on a semiconductor sample. A laser scanning system produces a photo current in the semiconductor to map the sensor signal and provide a quasi continuous alloy characterization. The new system is therefore called Continuous Gradient—High Throughput Screening Macroscope (CG-HTSM). Typically 625 alloys are characterized in 15 minutes. The resolution of our set-up allows distinguishing 100.000 alloy compositions. KW - Alloy KW - Sensor KW - High throughput screening KW - Macroscope PY - 2011 DO - https://doi.org/10.1166/sl.2011.1586 SN - 1546-198X SN - 1546-1971 VL - 9 IS - 2 SP - 662 EP - 664 PB - American Scientific Publishers (ASP) CY - Stevenson Ranch, CA, USA AN - OPUS4-24504 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 DO - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - A ToF-SIMS study of the deuterium - hydrogen exchange induced by ammonia plasma treatment of polyolefins T2 - 18.th International Conference on Secondary Ion Mass Spectreometry CY - Riva del Garda, Italy DA - 2011-09-19 PY - 2011 AN - OPUS4-24510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - A ToF-SIMS study of the deuterium - hydrogen exchange induced by ammonia plasma treatment of polyolefins T2 - 14th European Conference on Applications of Surface and Interface Analysis (ECASIA'11) CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24511 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Aminated functional organic surfaces as viewed by XPS, X-ray absorption spectroscopy and ToF-SIMS T2 - 14th European Conference on Applications of Surface and Interface Analysis (ECASIA 11) CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24477 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Catalytic Properties of Pd-Ni-Co Alloy Thin Films used as Active Layer of a Hydrogen Sensor T2 - ECASIS 2011 - 14th Conference on Applications of Surface and Interface Analysis CY - Cardiff, Wales DA - 2011-09-04 PY - 2011 AN - OPUS4-24351 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Baytekin, H. Tarik A1 - Oran, Umut A1 - Theisen, J. A1 - Schmidt, Martin A1 - Unger, Wolfgang ED - Weckenmann, A. T1 - Validierte Messverfahren für die nichtgeometrische Größe Hydrophilie - Anwendung in der Mikrofluidik T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Deutschland DA - 2010-10-06 PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 163 EP - 172 PB - Shaker Verlag GmbH AN - OPUS4-24827 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Sahre, Mario A1 - Rooch, Heidemarie A1 - Unger, Wolfgang ED - Weckenmann, A. T1 - Neuartige, räumlich strukturierte Testproben für die Bestimmung der Abbildungsqualität und die Kalibrierung der Längenskala in der Rastersondenmikroskopie T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Germany DA - 2010-10-06 KW - MOVPE KW - Rasterkraftmikroskopie KW - Referenzmaterial KW - Schichtstapel KW - Selektives Ätzen KW - Spitzencharakterisierer KW - TEM PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 116 EP - 129 PB - Shaker Verlag GmbH AN - OPUS4-24790 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Horlacher, T. A1 - Girard-Lauriault, Pierre-Luc A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Min, Hyegeun A1 - Wirth, Thomas A1 - Castelli, R. A1 - Seeberger, P. A1 - Unger, Wolfgang T1 - Multimethod chemical characterization of carbohydrate-functionalized surfaces N2 - A combined XPS, NEXAFS, and ToF-SIMS chemical surface characterization of carbohydrate-functionalized gold and glass surfaces is presented. Spot shape and chemical composition across a spot surface are provided by surface-sensitive methods as ToF-SIMS and XPS, used in their imaging modes. Moreover, the feasibility of this multimethod approach to control relevant production steps of a carbohydrate microarray prototype is demonstrated. KW - Carbohydrates KW - Microarrays KW - Self-assembled monolayers KW - XPS KW - NEXAFS KW - ToF-SIMS PY - 2011 DO - https://doi.org/10.1080/07328303.2011.615181 SN - 0732-8303 VL - 30 IS - 4-6 SP - 361 EP - 372 PB - Taylor & Francis CY - London [u.a.] AN - OPUS4-24874 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology in Surface and Micro/Nano Analysis T2 - CCQM Plenary Meeting 2012 CY - Paris, France DA - 2012-04-19 PY - 2012 AN - OPUS4-25967 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Poppenberg, J. A1 - Richter, S. A1 - Darlatt, Erik A1 - Traulsen, C.H.-H. A1 - Min, Hyegeun A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Successive coordination of palladium(II)-ions and terpyridine-ligands to a pyridyl-terminated self-assembled monolayer on gold N2 - The deposition of palladium on a novel, reversibly protonatable, pyridyl-terminated self-assembled monolayer on gold substrates has been studied by X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure spectroscopy (NEXAFS spectroscopy) and time of flight-secondary ion mass spectrometry (ToF-SIMS). For this purpose, 12-(pyridin-4-yl)dodecane-1-thiol, consisting of a surface-active head group, an unfunctionalized hydrocarbon backbone and a terminal pyridyl group, has been synthesized and deposited on gold surfaces. Coordination of Pd(II) ions to the pyridyl group was examined. Furthermore, a reversible protonation/deprotonation cycle has been applied, and the relation between protonation and the amount of complexed palladium was studied. Investigation of the SAM by angle-resolved NEXAFS spectroscopy revealed the aliphatic backbone to be preferentially upright oriented with the aromatic head group being not preferentially oriented. The palladium layer was further coordinated with a CF3-labeled terpyridine ligand in order to prove the accessibility of the Pd(II) ions to further complexation and the platform useful for deposition of further layers toward a multi-layered system. KW - Supramolecular surface chemistry KW - Pyridine terminated monolayer KW - NEXAFS spectroscopy KW - ToF-SIMS KW - Pyridine-metal coordination PY - 2012 DO - https://doi.org/10.1016/j.susc.2011.10.020 SN - 0039-6028 VL - 606 IS - 3-4 SP - 367 EP - 377 PB - Elsevier CY - Amsterdam AN - OPUS4-25282 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Darlatt, Erik A1 - Traulsen, C.H.-H. A1 - Poppenberg, J. A1 - Richter, S. A1 - Kühn, Julius A1 - Schalley, C.A. A1 - Unger, Wolfgang T1 - Evidence of click and coordination reactions on a self-assembled monolayer by synchrotron radiation based XPS and NEXAFS N2 - An ethynylterpyridine was 'clicked' to an azide-terminated self-assembled monolayer on gold and characterized by synchrotron radiation based surface analysis as NEXAFS and XPS. The detection of azide and terpyridine signatures confirmed a partial click reaction at room temperature. The absence of the azides after reaction at 50 °C indicates an almost complete conversion. For the latter case successful Pd(II) coordination has been proven. The Au–S interface of the SAMs has been characterized by S 1s and S 2p XPS. KW - Synchrotron radiation XPS KW - NEXAFS spectroscopy KW - Surface click chemistry KW - Self-assembled monolayer KW - HAXPES KW - XANES PY - 2012 DO - https://doi.org/10.1016/j.elspec.2012.02.004 SN - 0368-2048 SN - 1873-2526 VL - 185 IS - 3-4 SP - 85 EP - 89 PB - Elsevier CY - Amsterdam AN - OPUS4-25596 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Song, X. A1 - Ma, Y. A1 - Wang, C. A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Luo, Y. T1 - Effects of protonation, hydrogen bonding, and photodamaging on X-ray spectroscopy of the amine terminal group in aminothiolate monolayers N2 - The amine headgroup, NH2, in aminothiolate monolayers can often generate unexpectedly rich structures in its N K-edge X-ray photoelectron spectra (XPS) and near-edge X-ray absorption fine structure (NEXAFS) spectra that are difficult to assign. We have carried out density functional theory (DFT) calculations to study the XPS and NEXAFS of amine headgroup in four different aminothiolate monolayers, namely, aliphatic 11-aminoundecane-1-thiol (AUDT), aromatic 4-aminobenzenethiol (ABT), araliphatic 4-aminophenylbutane-1-thiol (APBT), and 3-(4''-amino-1,1':4',1''-terphenyl-4-yl)propane-1-thiol (ATPT), with the focus on structure changes caused by protonation, hydrogen bonding, and X-ray damaging. Spectra of all possible saturated and unsaturated species, as well as X-ray damage products, such as imine, nitrile, azo species, and cumulative double bonds, have been thoroughly examined. It is found that extra spectral structures observed in the experimental XPS spectra do not result from protonation but from the formation of a primary ammonium. The X-ray excitation can induce cross-linking between two neighboring molecules to form different complexes that contribute to the π* features in NEXAFS spectra. KW - Surface analysis KW - Spectrum simulation KW - X-ray absorption spectroscopy KW - Self assembling monolayer PY - 2012 DO - https://doi.org/10.1021/jp302716w SN - 1932-7447 SN - 1089-5639 VL - 116 IS - 23 SP - 12649 EP - 12654 PB - Soc. CY - Washington, DC AN - OPUS4-26255 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, Pierre-Luc A1 - Illgen, René A1 - Ruiz, J.-C. A1 - Wertheimer, M. R. A1 - Unger, Wolfgang T1 - Surface functionalization of graphite and carbon nanotubes by vacuum-ultraviolet photochemical reactions N2 - Graphite and multiwall carbon nanotube surfaces were functionalized by vacuum-ultraviolet induced photochemistry in NH3 or O2, in order to introduce amino- (NH2) or hydroxyl (OH) functionalities, respectively. Modified surfaces were characterized by X-ray photoelectron spectroscopy (XPS), which showed significant incorporation of nitrogen (N) and oxygen (O) at the materials’ surface. While high-resolution XP spectra did not yield much specific information about the incorporated functional groups, chemical derivatization with 4-trifluoromethyl benzaldehyde and trifluoroacetic anhydride accompanied by XPS enabled quantification of NH2 and OH groups, respectively. Using near edge X-ray absorption fine structure spectroscopy, we assessed the conservation of the aromatic structure following functionalization treatments. KW - Carbon nanotubes KW - Graphite KW - Vacuum ultraviolet photochemistry KW - Surface functionalization KW - Amino groups KW - Hydroxyl KW - Derivatization PY - 2012 DO - https://doi.org/10.1016/j.apsusc.2012.03.012 SN - 0169-4332 SN - 1873-5584 VL - 258 IS - 22 SP - 8448 EP - 8454 PB - North-Holland CY - Amsterdam AN - OPUS4-26233 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, Pierre-Luc A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Is quantitative chemical derivatization XPS of plasma deposited organic coatings a valid analytical procedure? N2 - Functionalized organic layers prepared by plasma processes have complex surface chemistries. The problem of elucidating such chemistries is an extensively studied subject. One of the preponderant methods used to acquire information on specific functional groups is chemical derivatization XPS. In this communication, we focus on rather popular chemical derivatization XPS approaches, for instance, the quantification of amines with 4-trifluoromethyl benzaldehyde and of hydroxyl groups with trifluoroacetic anhydride. Although these procedures have been used for a long period by various laboratories, the use of varying protocols is obvious. Comparison of results is therefore difficult. We discuss steps toward a valid experimental procedure, in particular, the calculation of concentrations, the preparation of test samples, the pitfalls, and the shortcomings. KW - Organic coatings KW - Amine KW - Alcohol KW - Chemical derivatization KW - XPS PY - 2012 DO - https://doi.org/10.1002/sia.4947 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 8 SP - 1135 EP - 1140 PB - Wiley CY - Chichester AN - OPUS4-26234 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Funk, C. A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Min, Hyegeun A1 - Unger, Wolfgang A1 - Weigel, W. T1 - Epoxy-functionalized surfaces for microarray applications: surface chemical analysis and fluorescence labeling of surface species N2 - Methods for characterization of epoxy-functionalized substrates used for microarray applications, prepared by silanization with 3-glycidoxypropyltrimethoxysilane, have been developed. Contact angle measurements, X-ray photoelectron spectroscopy, time of flight secondary ion mass spectrometry and fluorescence based methods have been applied to investigate these epoxy-functionalized microarray substrates. The surface density of epoxy-functionalized glass slides was investigated by fluorescence labeling of surface species utilizing Rhodamine 110 as fluorescence probe. KW - Epoxy silane KW - Microarrays KW - Fluorescence KW - XPS KW - ToF-SIMS KW - Surface analysis PY - 2012 DO - https://doi.org/10.1002/sia.3856 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 8 SP - 890 EP - 894 PB - Wiley CY - Chichester AN - OPUS4-26342 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, Pierre-Luc A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Chemical and elemental depth profiling of very thin organic layers by constant kinetic energy XPS: a new synchrotron XPS analysis strategy N2 - We present a new synchrotron X-ray photoelectron spectroscopy strategy for surface chemical analysis of materials. Our approach is based on the acquisition of photoelectron spectra at constant kinetic energies with the help of a tunable synchrotron X-radiation source. This ensures both constant and tunable information depth for all elements in a very thin organic layer. Many of the problems known to XPS depth profiling using laboratory equipment are thereby avoided. Using our methodology, the 95% information depth, z95%, can be tuned down to about 0.7 nm in organic materials. The upper limit in our study at the HE-SGM monochromator dipole magnet beamline at the synchrotron radiation source BESSY II is about 4.3 nm. Elemental quantification is achieved through relative sensitivity factors (RSF) specific to the measurement conditions, determined either with the help of calculated photoionization cross sections and inelastic mean free paths or experimentally. The potential of the technique is demonstrated for the in-depth analysis of plasma deposited nitrogen-rich organic thin films used in biomedical applications. PY - 2012 DO - https://doi.org/10.1021/ac300585q SN - 0003-2700 SN - 1520-6882 VL - 84 IS - 14 SP - 5984 EP - 5991 PB - American Chemical Society CY - Washington, DC AN - OPUS4-26299 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Traulsen, C.H.-H. A1 - Darlatt, Erik A1 - Richter, S. A1 - Poppenberg, J. A1 - Hoof, S. A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Intermixed terpyridine-functionalized monolayers on gold: nonlinear relationship between terpyridyl density and metal ion coordination properties N2 - Aiming at the functionalization of surfaces with terpyridine anchors for the coordinative deposition of additional layers, mixed self-assembled monolayers (SAMs) were prepared from binary solutions of 12-(2,2':6',2''-terpyridine-4'-yl)dodecane-1-thiol (TDT) and 1-decanethiol (DT). The SAMs and the order of the constituting molecules were analyzed by X-ray photoelectron spectroscopy (XPS), near-edge X-ray absorption fine structure spectroscopy (NEXAFS), and time-of-flight-secondary ion mass spectrometry (ToF-SIMS). The composition of the (TDT/DT)-SAMs and with it the surface density of terpyridyl groups correlates linearly with the relative concentrations of the two compounds in the solution used for depositing them. In marked contrast, the amount of terpyridine-coordinated PdII ions significantly deviates from this trend with an optimum at a 1:3 ratio of TDT/DT. This indicates a major fraction of the terpyridines in TDT-rich SAMs not to be accessible for PdII ion coordination. In agreement, NEXAFS spectroscopy reveals the alkyl backbones in TDT-rich SAMs not to be ordered, while they are preferentially upright oriented in the optimal 1:3-(TDT/DT)-SAMs. We interpret this in terms of terpyridine backfolding in TDT-rich SAMs, while they are located in accessible positions on top of the SAM in the 1:3-(TDT/DT)-SAM. While the alkyl backbones in the 1:3-(TDT/DT)-SAM are ordered, NEXAFS spectroscopy shows the terpyridyl groups not to have a preferential orientation in this SAM and thus retain enough flexibility to adjust to molecules that are deposited on top of the mixed SAM. In conclusion, the novel SAM does not undergo phase separation and consists predominantly of intermixed phases with adjustable surface density of quite flexible terpyridine anchor groups. The terpyridine–PdII anchors are not only available for a future deposition of the next layer, but the metal ions also represent a sensitive probe for the accessibility of the terpyridyl groups. PY - 2012 DO - https://doi.org/10.1021/la301644r SN - 0743-7463 SN - 1520-5827 VL - 28 IS - 29 SP - 10755 EP - 70763 PB - American Chemical Society CY - Washington, DC AN - OPUS4-26430 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The Activities of the CCQM Surface Analysis Working Group (SAWG) - Achievements and Challenges in Metrology in Surface and Thin Film Analysis T2 - EURAMET TC-MC Plenary Meeting CY - Braunschweig, Germany DA - 2013-02-07 PY - 2013 AN - OPUS4-27656 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for Monitoring Infectious Diseases, Antimicrobial Resistance, and Harmful Micro-Organisms T2 - 30th IFBLS World Congress (International Federation of Biomedical Laboratory Science) CY - Berlin, Germany DA - 2012-08-18 PY - 2012 AN - OPUS4-26555 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Richter, S. A1 - Poppenberg, J. A1 - Traulsen, C.H.-H. A1 - Darlatt, Erik A1 - Sokolowski, A. A1 - Sattler, D. A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - Deposition of ordered layers of tetralactam macrocycles and ether rotaxanes on pyridine-terminated self-assembled monolayers on gold N2 - The deposition of tetralactam macrocycles and the corresponding benzyl ether rotaxanes on gold substrates is investigated for the first time exploiting metallo-supramolecular chemistry. Two pyridine-terminated self-assembled monolayers (SAMs) are developed that are used as well-ordered template layers. The two SAMs differ with respect to the rigidity of the terminal pyridines as shown by angle-resolved near-edge X-ray absorption fine structure (NEXAFS) spectroscopy. The template layers are then used for the metal-mediated self-assembly of macrocylces and rotaxanes on solid supports. The SAM with the more rigid terminal pyridine shows a higher coverage with the macrocycles and is therefore preferable. Angle-resolved NEXAFS spectroscopy also shows the deposited supramolecules to be oriented preferentially upright. This order is only achieved for the macrocycles through the deposition on the more rigid SAM template, whereas rotaxanes form oriented layers on both SAMs. Time-of-flight secondary-ion mass spectrometry analysis was used to determine the deposition time required for the self-assembly process. PY - 2012 DO - https://doi.org/10.1021/ja306212m SN - 0002-7863 SN - 1520-5126 VL - 134 IS - 39 SP - 16289 EP - 16297 PB - American Chemical Society CY - Washington, DC AN - OPUS4-26740 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface chemical analysis - Determination of lateral resolution and sharpness in beam-based methods T2 - Annual Meeting ISO TC 201 "Surface Chemical Analysis" CY - Tampa, FL, USA DA - 2012-10-24 PY - 2012 AN - OPUS4-27140 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Referenzmaterialien für die Oberflächen- und Mikrobereichsanalytik: Stand und zukünftige Entwicklungen T2 - Festkolloquium 100 Jahre Referenzmaterialien der BAM 1912 - 2012 CY - Berlin, Germany DA - 2012-11-15 PY - 2012 AN - OPUS4-27141 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - X-ray Photoelectron Spectroscopy (XPS) T2 - Workshop: Instrumentierung für das Avogadro-Projekt CY - Berlin, Germany DA - 2012-08-03 PY - 2012 AN - OPUS4-27142 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Optimierung von Microarrays durch Anwendung physikalischer Methoden der chemischen Oberflächenanalytik T2 - Arbeitstreffen "Quantitative Analytik von (Protein-)Microarrays" CY - Potsdam, Germany DA - 2012-10-04 PY - 2012 AN - OPUS4-27145 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Ageing Processes Occurring on Nanoscaled Aminated Surfaces as Observed by ToF-SIMS/PCA, NEXAFS Spectroscopy and XPS T2 - AVS 59th International Symposium and Exhibition CY - Tampa, FL, USA DA - 2012-10-28 PY - 2012 AN - OPUS4-27148 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Zum Stand von Normung in der Oberflächenanalytik T2 - 17. Arbeitstreffen "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27150 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - Summary of ISO/TC 201 technical report: ISO/TR 19319:2013 - Surface chemical analysis - Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods N2 - This Technical Report revises ISO/TR 19319:2003 - Surface chemical Analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area and sample area viewed by the analyser. The revised Technical Report gives a short introduction to basic models of image formation and introduces functions which characterize the performance of imaging instruments with respect to lateral resolution and sharpness. The determination of lateral resolution by imaging of square-wave gratings and the determination of sharpness by imaging of narrow stripes and straight edges are described in detail. Finally, physical factors affecting lateral resolution, analysis area and sample area viewed by the analyser are discussed. KW - CTF KW - ESF KW - Lateral resolution KW - LSF KW - MTF KW - Narrow stripe KW - Noise KW - PSF KW - Resolution criterion KW - Sharpness KW - Square-wave grating KW - Straight edge PY - 2013 DO - https://doi.org/10.1002/sia.5294 SN - 0142-2421 SN - 1096-9918 VL - 45 IS - 9 SP - 1313 EP - 1316 PB - Wiley CY - Chichester AN - OPUS4-29012 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Girard-Lauriault, P.-L. A1 - Dietrich, Paul A1 - Gross, Thomas A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Chemical characterization of the long-term ageing of nitrogen-rich plasma polymer films under various ambient conditions N2 - Nitrogen rich plasma polymer films (L-PPE:N) were prepared by low-pressure RF plasma using a 1:1 mixture of ethylene and ammonia and aged for 345 d in four different ambient conditions: (i) at room temperature (RT) in air; (ii) at RT in nitrogen; (iii) at -20?°C in air and; (iv) at –20 °C in nitrogen. The films were analyzed by X-ray photoelectron spectroscopy (XPS) and by time-of-flight secondary ion mass spectrometry (ToF-SIMS) at various intervals over the duration of the experiment. The ageing of primary amines, NH2, was followed by chemical derivatization with 4-trifluoromethyl benzaldehyde. Storage at –20 °C, mostly independently of ambient atmosphere, slowed down ageing to almost undetectable levels as evaluated by the analytical methods used for this study. KW - Ageing KW - Plasma polymers KW - Primary amines KW - ToF-SIMS KW - XPS PY - 2013 DO - https://doi.org/10.1002/ppap.201200118 SN - 1612-8850 SN - 1612-8869 VL - 10 IS - 4 SP - 388 EP - 395 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-28006 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang T1 - Plasma bromination of HOPG surfaces: a NEXAFS and synchrotron XPS study N2 - Br bonding on plasma brominated graphite surfaces has been studied by using Near Edge X-ray Absorption Fine Structure (NEXAFS) and X-ray Photoelectron Spectroscopy (XPS). Br2 and bromoform were used as plasma gases in an r.f. cw low pressure plasma process. Kr plasma had been used to study separately the physical and chemical plasma etching effects. At early steps of plasma bromination which lead to only small XPS Br surface concentration values a quick decay of aromaticity has been observed. At low Br surface concentration radical or even electrophilic addition of bromine onto sp2 carbon atoms is discussed as the dominating reaction pathway. At higher Br surface concentrations the inherent formation of sp3 defects in the graphene network by chemical etching processes promotes nucleophilic substitution of bromine at sp3 carbons as a competing reaction pathway. Both reaction pathways lead to C–Br species characterized by the same Br 3d XPS binding energy. However more than one Br 3d component in XP spectra has been found at lower Br2 plasma induced Br surface concentrations and complexation of bromine at HOPG is assumed as a third way of interaction with Br2 plasma. KW - HOPG KW - Graphite KW - Plasma bromination KW - Low pressure plasma KW - NEXAFS KW - XPS PY - 2013 DO - https://doi.org/10.1016/j.susc.2013.01.020 SN - 0039-6028 VL - 611 SP - L1 EP - L7 PB - Elsevier CY - Amsterdam AN - OPUS4-27928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Imaging SIMS: Status and selected applications at BAM T2 - DGMS Workshop "Imaging MS" CY - Berlin, Germany DA - 2013-03-10 PY - 2013 AN - OPUS4-28044 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Darlatt, Erik A1 - Nefedov, A. A1 - Traulsen, C.H.-H. A1 - Poppenberg, J. A1 - Richter, S. A1 - Dietrich, Paul A1 - Lippitz, Andreas A1 - Illgen, René A1 - Kühn, Julius A1 - Schalley, C.A. A1 - Wöll, Ch. A1 - Unger, Wolfgang T1 - Interperetation of experimental N K NEXAFS of azide, 1,2,3-triazole and terpyridyl groups by DFT spectrum simulations N2 - Experimental N K-edge NEXAFS data of surface immobilized azide, 1,2,3-triazole and terpyridyl groups are interpreted with the help of DFT spectrum simulations. Assignments of π* resonances in experimental N K-edge NEXAFS spectra to nitrogen atoms within these functional groups have been made. The azide was immobilized on gold as the head group of a thiol SAM, 1,2,3-triazole was formed on this SAM by click reaction and terpyridyl groups were introduced as substituents of the acetylene used for the click reaction. For azide-terminated molecules, DFT spectrum simulations are found to be useful to find measurement conditions delivering experimental N K-edge NEXAFS data with negligible X-ray damage. The 1,2,3-triazole group is found to be rather stable under X-ray irradiation. KW - N K-edge NEXAFS KW - XANES KW - Surface click chemistry KW - Density functional theory KW - Azide KW - 1,2,3-Triazole PY - 2012 DO - https://doi.org/10.1016/j.elspec.2012.09.008 SN - 0368-2048 SN - 1873-2526 VL - 185 IS - 12 SP - 621 EP - 624 PB - Elsevier CY - Amsterdam AN - OPUS4-27774 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Research and Standardisaton Efforts in Surface Characterisation at BAM in Support of New Technology T2 - Seminar, School of Mechanical and Systems Engineering Newcastle University CY - Newcastle upon Tyne, England DA - 2013-04-25 PY - 2013 AN - OPUS4-28798 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales - Surface Analysis Working Group (SWAG) 11th Meeting for 2012/13 T2 - CCQM Plenary Meeting 2013 CY - Paris, France DA - 2013-04-18 PY - 2013 AN - OPUS4-28799 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Summaries of achievements and future activities of the CCQM Surface Analysis Working Group (SAWG) T2 - 20 Years of the CCQM: Progess made, inpact provided, lessons learned, and future challenges CY - Paris, France DA - 2013-04-17 PY - 2013 AN - OPUS4-28800 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Traulsen, C. H.-H. A1 - Kunz, V. A1 - Heinrich, Thomas A1 - Richter, S. A1 - Holzweber, Markus A1 - Schulz, A. A1 - von Krbek, L. K. S. A1 - Scheuschner, U. T. J. A1 - Poppenberg, J. A1 - Unger, Wolfgang A1 - Schalley, C. A. T1 - Synthesis and coordinative layer-by-layer deposition of pyridine-functionalized gold nanoparticles and tetralactam macrocycles on silicon substrates N2 - Coordination chemistry was applied to deposit pyridine-functionalized gold nanoparticles on silicon substrates. The particles were synthesized through the Brust/Schiffrin route with a subsequent ligand exchange reaction yielding well-defined particles of two different sizes. Multilayer deposition was carried out on a pyridine-terminated SAM, anchored on a hydroxyl-terminated silicon surface. Analogously, Hunter/Vögtle-type tetralactam macrocycle multilayers were deposited as well as mixed layers containing both either in an alternating sequence or as a macrocycle multilayer with a terminating nanoparticle layer. These composite layers were examined with respect to their ability to bind squaraine axles in the macrocycle cavities. The amount of guest bound is higher for the composite layer with alternating macrocycles and nanoparticles. KW - Layer-by-layer deposition KW - Functionalized Au nanoparticles KW - SEM KW - TEM KW - DLS KW - XPS KW - NEXAFS KW - ToF-SIMS KW - IR KW - UV-vis PY - 2013 DO - https://doi.org/10.1021/la403222x SN - 0743-7463 SN - 1520-5827 VL - 29 IS - 46 SP - 14284 EP - 14292 PB - American Chemical Society CY - Washington, DC AN - OPUS4-29699 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - Surface analysis - Auger electron spectroscopy N2 - Basic principles and technical realization of Auger Electron Spectroscopy (AES) are presented. Different modes of application are briefly addressed. These are spectroscopy at nanoscaled surface layers including quantitative element analysis and chemical state analysis, in-depth element analysis, imaging and element mapping. A survey on standards related to application of AES in surface chemical analysis is given. KW - Auger electron spectroscopy KW - AES KW - Surface analysis KW - Chemical state analysis KW - Depth profiling KW - Element analysis KW - Imaging KW - Surface chemical analysis PY - 2013 UR - http://www.sciencedirect.com/science/article/pii/B9780124095472005163 SN - 978-0-12-409547-2 DO - https://doi.org/10.1016/B978-0-12-409547-2.00516-3 SP - 466 EP - 475 PB - Elsevier Inc. AN - OPUS4-29263 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Controlled Layer-by-Layer Assembly of Tetraactram Macrocycles based on Coordination Chemistry T2 - 15th European Conference on Applications of Surface and Interface Analysis CY - Cagliari, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-29557 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Charakterisierung von Siliziumoxidschichten auf Silizium mit ESCA - Ein Beitrag zur Präszisionsbestimmung der Avogadro-Konstanten T2 - EMASS 2000 CY - Berlin, Deutschland DA - 2000-11-10 PY - 2000 AN - OPUS4-1020 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Güttler, B. T1 - Uncertainty in measurement of overlayer thickness of thermally oxidized silicon using x-ray photoelectron spectroscopy N2 - Overlayers of SiO2 (nominally 4, 6 and 8 nm thick) on silicon, prepared by thermal oxidation, were investigated using x-ray photoelectron spectroscopy (XPS). The thickness of these overlayers was obtained from a measurement of the photoelectron intensities originating from the substrate and the oxide overlayer by applying an appropriate quantitative model. The uncertainty budget of that thickness measurement method is given. The relative combined standard uncertainty of the method was found to be 15%. The effective attenuation lengths or the corresponding electron inelastic mean free paths are of considerable importance for both the estimated values of overlayer thickness and combined standard uncertainties. The XPS results were compared with ellipsometry data. KW - XPS KW - ESCA KW - Uncertainty KW - Overlayer KW - SiO2 PY - 2000 DO - https://doi.org/10.1002/1096-9918(200012)29:12<891::AID-SIA943>3.0.CO;2-A SN - 0142-2421 SN - 1096-9918 IS - 29 SP - 891 EP - 894 PB - Wiley CY - Chichester AN - OPUS4-1075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang T1 - The Application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Materials Week 2000 ; International Congress on Advanced Materials, Their Processes and Applications 2000 CY - Munich, Germany DA - 2000-09-25 PY - 2000 SN - 3-88355-296-8 CY - München AN - OPUS4-1106 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Reinsch, Stefan A1 - Unger, Brita A1 - Britz, Roswitha T1 - Mineralisiertes Holz - Verbundwerkstoff mit verbesserten Eigenschaften PY - 2001 CY - München AN - OPUS4-1197 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bücker, Michael A1 - Böcker, Wolfgang D. G. A1 - Reinsch, Stefan A1 - Unger, Brita ED - Wielage, B. ED - Leonhardt, G. T1 - Entwicklung umweltverträglicher Holzverbundwerkstoffe mit verbesserter biologischer und Feuchtebeständigkeit T2 - Tagung "Verbundwerkstoffe und Werkstoffverbunde" CY - Chemnitz, Deutschland DA - 2001-09-05 PY - 2001 SN - 3-527-30319-7 SP - 463 EP - 467 PB - Wiley-VCH CY - Weinheim AN - OPUS4-1160 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinsch, Stefan A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Seeger, Stefan A1 - Unger, Brita ED - Specht, K. T1 - Development of wood-inorganic composites with enhanced properties and environmental stability T2 - 4th International Wood and Natural Fibre Composites Symposium CY - Kassel, Germany DA - 2002-04-10 PY - 2002 VL - 4 SP - 50-1-50-6 CY - Kassel AN - OPUS4-1365 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Böcker, Wolfgang D. G. A1 - Bücker, Michael A1 - Reinsch, Stefan A1 - Unger, Brita T1 - Holzverbundwerkstoffe mit verbesserten Eigenschaften N2 - Die offenporige Struktur des Holzes und dessen chemische Zusammensetzung bieten sich an, über Tränkverfahren geeignete Precursoren so an den inneren Oberflächen des Holzes zu fixieren, dass bei anschließender thermischer Behandlung ein umweltfreundlicher anorganisch-organischer Verbundwerkstoff entsteht. Aus der Literatur sind hierzu verschiedene Ansätze bekannt. - Ziel der vorliegenden Arbeit sind Verbesserungen der biologischen Beständigkeit, der Feuchtebeständigkeit unter Beibehaltung bzw. leichter Verbesserung der mechanischen Eigenschaften des Holzes. Dies wird durch eine chemische Verbindung (Haftung) zwischen den verbundbildenden Phasen Holz und Precursor und eventuell zusätzlichen Einbau von funktionellen organischen Gruppen realisiert. Als Precursoren dienen über den Sol-Gel Weg hergestellte Kieselsole, die nach vollständiger thermischer Umsetzung zu rein anorganischen Phasen (SiO2) führen. Die Sol-Gel Synthese konnte so optimiert werden, dass durch die Behandlung eine homogene Beschichtung aller Oberflächen erreicht werden kann. T2 - Integrierter Umweltschutz im Bereich der Holzwirtschaft CY - Göttingen, Deutschland DA - 2002-01-22 PY - 2002 SP - 100 EP - 102 PB - DGfH CY - München AN - OPUS4-1366 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. ED - Hasche, K. ED - Mirande, W. ED - Wilkening, G. T1 - Results of the inter-laboratory comparison "Determination of nanometric step heights with AFM" T2 - 5th Seminar on Quantitative Microscopy ; 1st Seminar on Nanoscale Calibration Standards and Methods ; NanoScale 2001 CY - Bergisch Gladbach, Germany DA - 2001-11-15 PY - 2002 SN - 3-89701-840-3 SN - 0179-0609 N1 - Serientitel: PTB-Bericht: PTB-F – Series title: PTB-Bericht: PTB-F VL - F-44 IS - 44 SP - 70 EP - 77 PB - Wirtschaftsverl. NW CY - Bremerhaven AN - OPUS4-1327 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Senoner, Mathias A1 - Unger, Wolfgang A1 - Koenders, L. A1 - Wilkening, G. T1 - Accuracy of step height determination by Atomic Force Microscopy - results of an inter-laboratory comparison T2 - 3rd International Conference European Society for Precision Engineering and Nanotechnology (euspen) CY - Eindhoven, The Netherlands DA - 2002-05-26 PY - 2002 SP - 773 EP - 776 AN - OPUS4-1415 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Patscheider, J. T1 - Quantitative surface chemical analysis of stainless steel 1.4301 using Surface Science Instruments XPS spectrometers: report on an interlaboratory comparison N2 - Results of an interlaboratory comparison of XPS data obtained with stainless steel are presented. Only one photoelectron spectrometer model was used. The stainless-steel sample surfaces were analysed in different states by XPS: as received, after sputtering to I(C 1s)/I(Fe 2p3/2) 0.025 and after removing a chromium-enriched oxide layer following a certain protocol. The Fe, Cr and Ni elemental concentrations were evaluated from the respective XPS data submitted by the participants of the interlaboratory test experiment. Total means, repeat standard deviations (sr) and reproducibility standard deviations (sR) are presented. The best reproducibility standard deviations were obtained for the XPS analysis after removal of a chromium-enriched oxide layer and quantification of the XPS intensities without taking the contamination elements of carbon and oxygen into account. The absolute reproducibility standard deviation of the elemental concentrations in that case is as small as 1.1-1.5 at.%. This gives 2%, 6% and 16% for the relative reproducibility standard deviation of the concentrations of iron, chromium and nickel, respectively. The total means of the iron, chromium and nickel concentrations finally obtained agree within 2sR with bulk values determined by wavelength-dispersive x-ray fluorescence spectroscopy. Comparison to an earlier interlaboratory test experiment shows that using only one model of photoelectron spectrometer reduces the reproducibility standard deviations efficiently. Copyright © 2002 John Wiley & Sons, Ltd. KW - XPS KW - ESCA KW - Quantitative surface chemical analysis KW - Stainless steel KW - Interlaboratory comparison PY - 2002 DO - https://doi.org/10.1002/sia.1229 SN - 0142-2421 SN - 1096-9918 VL - 33 IS - 5 SP - 426 EP - 432 PB - Wiley CY - Chichester AN - OPUS4-1409 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Web site for information on reference materials T2 - Proceedings of the Final Meeting CY - Wiener Neustadt, Austria DA - 2002-03-04 PY - 2002 SP - 1(?) EP - 3(?) AN - OPUS4-1472 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Schulz, H. A1 - Scheibe, H.-J. A1 - Treu, Dieter A1 - Matsubayashi, N. T1 - Analysis of carbon materials by XPS T2 - Materials Week 2002 ; European Congress on Advanced Materials, their Processes and Applications ; 6th International Conference on Joining Ceramics, Glass and Metal CY - Munich, Germany DA - 2002-09-30 PY - 2002 SN - 3-88355-314-X PB - Werkstoff-Informationsges. AN - OPUS4-1734 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Boese, O. A1 - Kemnitz, E. T1 - y-Al2O3 by Au 4f7/2-referenced XPS and XAES N2 - Powder x-ray diffraction (XRD) defined -Al2O3 has been investigated by x-ray photoelectron spectroscopy (XPS) and x-ray excited Auger electron spectroscopy (XAES). The Au 4f7/2 orbital is used for static charge referencing. This feature originates from well-defined and chemically inert 20 nm highly dispersed gold particles deposited on the sample surface. The particles, with a narrow particle size distribution, were obtained from a highly purified colloidal solution (sodium concentration below 1 mg/l). This procedure allows a determination of gold-referenced XPS and XAES data sets. ©2001 American Vacuum Society. KW - Au 4f referenced XPS data KW - Aluminium KW - Oxide PY - 2001 UR - http://scitation.aip.org/vsearch/servlet/VerityServlet?KEY=SSSPEN&ONLINE=YES&smode=strresults&sort=chron&maxdisp=25&threshold=0&possible1zone=article&possible4=lippitz&possible4zone=author&bool4=and&fromyear=2001&OUTLOG=NO&viewabs=SSSPEN&key=DISPLAY&docID DO - https://doi.org/10.1116/11.20020305 SN - 1055-5269 SN - 1520-8575 VL - 8 IS - 1-4 SP - 214 EP - 219 PB - AIP CY - Woodbury, NY AN - OPUS4-1910 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Methoden der Oberflächen- und Schichtanalytik - Anwendungen, Normung und Qualitätssicherung T2 - 12. Jahreskolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 AN - OPUS4-1997 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Dietrich, P. A1 - Beblo-Vranesevic, K. A1 - Kjærvik, Marit A1 - Unger, Wolfgang A1 - Schwibbert, Karin A1 - Hardie, K. A1 - Brown, J. T1 - XPS surface analysis of bacterial samples N2 - This application note presents how EnviroESCA can be used to analyze bacterial samples under near ambient pressure conditions in various states of hydration using different levels of humidity. Such investigations of bacterial cell wall surfaces in their hydrated state are essential for studying biological interfaces at work. The use of innovative near-ambient pressure (NAP-)XPS instrumentation allows the detailed analysis of irregularly-surfaced biofilms. NAP-XPS enables the surface analysis of bacterial samples in their natural hydrated state without complex sample preparation techniques such as freeze-drying or fast-freezing, which are needed for XPS analysis in ultrahigh vacuum. KW - Near ambient pressure XPS KW - Biofilms PY - 2018 UR - http://www.enviroai.com/uploads/1/0/2/8/102861712/xps_surface_analysis_of_bacillus_subtilis_biofilms_final.pdf IS - Application Note #000399 SP - 1 EP - 5 CY - Berlin AN - OPUS4-44588 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kjaervik, Marit A1 - Schwibbert, Karin A1 - Dietrich, P. A1 - Thissen, A. A1 - Unger, Wolfgang T1 - Near-ambient pressure XPS of hydrated Escherichia coli samples with EnviroESCA N2 - This application note presents how EnviroESCA can be used to analyze E. coli biofilms on silicon under near ambient pressure conditions in various states of hydration. Such investigations of the outer bacterial cell surface in their hydrated state are essential for studying biological interfaces at work. KW - Biofilms KW - E. coli KW - NAP-XPS PY - 2018 UR - http://www.enviroai.com/uploads/1/0/2/8/102861712/nap_xps_of_escherichia_coli_samples.pdf IS - Application Note #000400 SP - 1 EP - 4 CY - Berlin, Germany AN - OPUS4-45720 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Schwibbert, Karin A1 - Dietrich, P.M. A1 - Unger, Wolfgang T1 - NAP-XPS spectra of the bacterial cell-envelope of Pseudomonas fluorescens bacteria N2 - Pseudomonas fluorescens (Gram-negative) bacteria purchased from Leibniz Institute DSMZ-German Collection of Microorganisms and Cell Cultures were analyzed using high-resolution x-ray photoelectron spectroscopy at near ambient pressure conditions (NAP-XPS), 1500 Pa water vapor atmosphere. Fresh layers of P. fluorescence bacteria were grown on Luria Broth agar plates. Bacteria were taken from the agar plate with a sterile spatula and gently spread on a Si-wafer piece for NAP-XPS analysis. The NAP-XPS spectra of the bacterial envelope of P. fluorescence were obtained using monochromatic Al Kα radiation and include a survey scan and high-resolution spectra of C 1s, N 1s, P 2p, and O 1s as well. The presentation of the C 1s high-resolution spectrum includes the results of peak fitting analysis. KW - Pseudomonas fluorescens KW - Cell-envelope KW - Water atmosphere KW - Near ambient x-ray photoelectron spectroscopy KW - NAP-XPS PY - 2022 DO - https://doi.org/10.1116/6.0001543 SN - 1055-5269 VL - 29 IS - 1 SP - 014008-1 PB - AVS AN - OPUS4-54464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Bewertung & Charakterisierung technischer Oberflächen für die verarbeitende Industrie T2 - Workshop und Präsentation CY - Bergisch Gladbach, Deutschland DA - 2000-05-11 PY - 2000 CY - Dresden AN - OPUS4-999 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Treu, Dieter A1 - Unger, Wolfgang T1 - Standard operating procedure (SOP) for the quantitative determination of organic silicon compounds at the surface of elastomeric sealants N2 - Elastomeric sealants may contain organic silicon compounds. The use of these sealants for housings for electronic components is harmful for the reliability of electric contacts inside. In order to prevent electronic components from malfunction, quality control of elastomeric sealants is required. An analytical procedure developed to fulfil this requirement was developed. It is based on electron spectroscopy for chemical analysis (ESCA). Information on the silicon compounds existing at the surface of elastomeric sealants is provided by this method. Silicon in organic and inorganic compounds can be differentiated with the help of Si 2p photoelectron spectra. Quantitative results can be obtained too. The uncertainty budget of the quantitative procedure is estimated. T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 KW - ESCA KW - Silicone KW - Standard operation procedure PY - 2001 SN - 0169-4332 SN - 1873-5584 VL - 179 IS - 1-4 SP - 109 EP - 112 PB - North-Holland CY - Amsterdam AN - OPUS4-977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang A1 - Böse, Olaf A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Gelius, U. ED - Boehlig, H. T1 - Results of a VAMAS TWA 2 inter-laboratory test experimen - Evaluation of static charge stabilization and determination methods in XPS on non-conducting samples T2 - 11th Conference on Applied Surface Analysis (AOFA) CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 SN - 0169-4332 VL - 179 IS - 1 PB - Elsevier CY - Amsterdam AN - OPUS4-978 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Brzezinka, Klaus-Werner A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Ramm, M. A1 - Ata, M. T1 - Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy KW - Amorphous materials KW - Carbon KW - Plasma processing and deposition KW - Structural properties PY - 1999 SN - 0040-6090 VL - 354 SP - 106 EP - 110 PB - Elsevier CY - Amsterdam AN - OPUS4-891 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Retzko, Iris A1 - Kühn, Gerhard A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Mittal, K. T1 - Metal doped plasma polymer films T2 - 7th Symposium on Metallized Plastics CY - Newark, NJ, USA DA - 1999-12-02 KW - Plasma polymer KW - r.f. pulsed plasma KW - Conducting films KW - Metal-polymer interface PY - 2001 SN - 90-6764-340-8 VL - 7 SP - 117 EP - 142 PB - VSP CY - Utrecht AN - OPUS4-929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Ramstedt, M. A1 - Schwibbert, Karin A1 - Dietrich, P. M A1 - Unger, Wolfgang T1 - Comparative Study of NAP-XPS and Cryo-XPS for the Investigation of Surface Chemistry of the Bacterial Cell-Envelope N2 - Bacteria generally interact with the environment via processes involving their cell-envelope. Thus, techniques that may shed light on their surface chemistry are attractive tools for providing an understanding of bacterial interactions. One of these tools is Al Kα-excited photoelectron spectroscopy (XPS) with its estimated information depth of <10 nm. XPS-analyses of bacteria have been performed for several decades on freeze-dried specimens in order to be compatible with the vacuum in the analysis chamber of the spectrometer. A limitation of these studies has been that the freeze-drying method may collapse cell structure as well as introduce surface contaminants. However, recent developments in XPS allow for analysis of biological samples at near ambient pressure (NAP-XPS) or as frozen hydrated specimens (cryo-XPS) in vacuum. In this work, we have analyzed bacterial samples from a reference strain of the Gram-negative bacterium Pseudomonas fluorescens using both techniques. We compare the results obtained and, in general, observe good agreement between the two techniques. Furthermore, we discuss advantages and disadvantages with the two analysis approaches and the output data they provide. XPS reference data from the bacterial strain are provided, and we propose that planktonic cells of this strain (DSM 50090) are used as a reference material for surface chemical analysis of bacterial systems. KW - P. Fluorescens KW - Cryo XPS KW - NAP-XPS KW - DSM 5009 PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-525640 DO - https://doi.org/10.3389/fchem.2021.666161 VL - 9 SP - Article 666161 PB - Frontiers CY - Switzerland AN - OPUS4-52564 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Schwibbert, Karin A1 - Dietrich, P. A1 - Thissen, A. A1 - Unger, Wolfgang T1 - Surface characterisation of Escherichia coli under various conditions by near-ambient pressure XPS N2 - Bacteria are inherently in a hydrated state and therefore not compatible to ultra-high vacuum techniques such as XPS without prior sample preparation involving freeze drying or fast freezing. This has changed with the development of near-ambient pressure (NAP)-XPS, which makes it possible to characterise the bacterial surface with minimal sample preparation. This paper presents NAP-XPS measurements of Escherichia coli under various NAP conditions: at 11 mbar in a humid environment, at 2 mbar after drying in the chamber, pre-dried at 4 mbar, and at 1 mbar after overnight pumping at 10^−4 mbar. The high-resolution spectra of carbon, nitrogen, and oxygen are presented and found to be in general agreement with XPS measurements from freeze-dried and fast-frozen bacteria. However, it was found that the amount of carbon components associated with polysaccharides increases relative to aliphatic carbon during drying and increases further after overnight pumping. This implies that drying has an impact on the bacterial surface. T2 - European conference on applications of surface and interface analysis (ECASIA'17) CY - Montpellier, France DA - 24.09.2018 KW - Bacteria KW - E. coli KW - NAP-XPS PY - 2018 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-454047 DO - https://doi.org/10.1002/sia.6480 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 11 SP - 996 EP - 1000 PB - John Wiley & Sons CY - Hoboken, New Jersey, USA AN - OPUS4-45404 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Holzweber, M. A1 - Lippitz, Andreas A1 - Kamalakumar, A. A1 - Blanchard, V. A1 - Ivanov-Pankov, S. A1 - Weigel, W. A1 - Panne, Ulrich A1 - Unger, Wolfgang T1 - Surface chemical characterization of model glycan surfaces and shelf life studies of glycan microarrays using XPS, NEXAFS spectroscopy, ToF-SIMS and fluorescence scanning N2 - Biomedical applications, including functional biomaterials, carbohydrate-arrays, and glycan-based biosensors. The chemistry of glycan immobilization plays an essential role in the bioavailability and function of surface bound carbohydrate moieties. For biomedical applications the stability over time (shelf life) of glycan arrays is a crucial factor. Herein we report on approaches for surface and interface characterization relevant to the needs of production of glycan microarrays which were tested using model carbohydrate surfaces. For detailed characterization of glycan model surfaces we used a combination of X-ray photoelectron spectroscopy (XPS), near edge X-ray absorption fine structure spectroscopy (NEXAFS) and ToF SIMS which are complementary techniques of surface chemical analysis. Links to fluorescence spectroscopy often used for characterization in the microarray community were established as well. In detail, amine-reactive silicon oxide and glass surfaces were used for anchoring oligosaccharides with an amino linker. The amount of surface bound carbohydrates was estimated by X-ray photoelectron spectroscopy (XPS). Glycan immobilization was investigated using lectins, which are glycan-binding molecules. A shelf life study of model glycan microarrays on epoxy-coated glass surfaces was done over a period of 160 days under different storage conditions utilizing fluorescence, ToF-SIMS and XPS analysis. It was shown that glycan activity of the models used can be maintained at least for half a year of storage at 4 °C. KW - Glycan microarray KW - XPS KW - NEXAFS KW - ToF-SIMS KW - Fluorescence PY - 2018 UR - https://www.sciencedirect.com/science/article/pii/S0169433218320300?via%3Dihub DO - https://doi.org/10.1016/j.apsusc.2018.07.133 SN - 0169-4332 SN - 1873-5584 VL - 459 SP - 860 EP - 873 PB - Elsevier B.V. AN - OPUS4-46212 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Geng, Sh. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasma functionalization and reorientation of macromolecules at polymer surfaces KW - Plasma KW - Polymer KW - Monolayer KW - Einschichtsystem KW - NEXAFS KW - Spektroskopie KW - Oberflächenanalyse PY - 1995 SN - 0257-8972 VL - 74-75 SP - 664 EP - 669 PB - Elsevier Science CY - Lausanne AN - OPUS4-627 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Wigan, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Barrier properties of plasma and chemically fluorinated polypropylene and polyethyleneterephthalate N2 - The functionalization, perfluorination or an coating of polypropylene (PP) and polyethyleneterephthalate (PET) surfaces in different plasma atmospheres and in an F[2] + N[2] gas mixture were investigated. The aim of this work was to form a barrier layer against solvent and fuel permeation. Typical test solvents were n-pentane, toluene, tetrachloroethylene and mixtures of n-pentane and methanol. The permeation was gravimetrically measured. The permeation of the solvent mixtures was analyzed by mass spectrometry and Fourier transform IR spectroscopy. The permeation of the solvent mixtures through the plasma-modified polymer samples was associated with increased absorption of polar solvent components in the polymer film. The thickness of the plasma-fluorinated PP surface layer was 10-100 nm and that of chemically fluorinated PP about 5000 nm. Nearly the same barrier efficiency was measured for both plasma- and chemically fluorinated samples. T2 - International Conference on Plasma Surface Engineering No. 4 CY - Garmisch-Partenkirchen, Germany DA - 1994-09-19 KW - Plasma KW - Fluor KW - Plasmapolymer KW - Sperrschicht KW - Permeation PY - 1995 UR - http://cat.inist.fr/?aModele=afficheN&cpsidt=3158319 SN - 0257-8972 VL - 74-75 IS - 1-3 SP - 910 EP - 918 PB - Elsevier Science CY - Lausanne AN - OPUS4-628 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Weiss, K. A1 - Wöll, Ch. T1 - Surface analysis of metaillized poly(bisphenol A cabonate) films by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Film, metallisiert KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3157 EP - 3160 PB - Springer CY - Berlin AN - OPUS4-649 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - Surface analysis of partially crystalline and amorphous poly(ethylene terephthalate) samples by x-ray absorption spectroscopy (NEXAFS) KW - NEXAFS KW - Röntgenadsorptionsspektroskopie KW - Oberflächenanalyse KW - Polymeroberfläche PY - 1996 SN - 0032-3861 SN - 1873-2291 VL - 37 IS - 14 SP - 3151 EP - 3155 PB - Springer CY - Berlin AN - OPUS4-650 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Grohmann, I. A1 - Kemnitz, E. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Curve Fitting of Cr2p Photoelectron Spectra of Cr2O3 and CrF3 KW - Photoelektronenspektroskopie KW - Kurvenglättung KW - Chrom PY - 1995 SN - 0142-2421 SN - 1096-9918 VL - 23 SP - 887 EP - 891 PB - Wiley CY - Chichester AN - OPUS4-678 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Schertel, A. A1 - Wöll, Ch. T1 - NEXAFS analysis of a plasma treated, partially crystalline poly(ehtylene terephtalate) surface KW - NEXAFS KW - Röntgenstrukturanalyse KW - Oberflächen behandeln KW - Plasma PY - 1996 SN - 0179-4159 SP - 279 EP - 281 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Grohmann, I. A1 - Hess, A. A1 - Kemnitz, E. A1 - Frentrup, W. A1 - Unger, Wolfgang T1 - XANES-Investigations of coprecipitated AIF3/MgF2 phases KW - XANES-Spektrum KW - Kalzienieren KW - Magnesium PY - 1996 SN - 0179-4159 SP - 222 EP - 223 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-682 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Verfahren zur Bestimmung des Gehaltes an organischen Siliciumverbindungen auf der Oberfläche von Elastomerformteilen KW - Elektronenspektroskopie KW - ESCA KW - Elastomere PY - 2000 SN - 0176-1625 N1 - Sprachen: Deutsch/Englisch - Languages: German/English VL - 53 IS - 2 SP - 97 EP - 99 PB - Gupta CY - Ratingen AN - OPUS4-805 LA - mul AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Gross, Thomas A1 - Friedrich, Jörg Florian A1 - Wöll, Ch. A1 - Nick, L. T1 - The Use of Octadecyltrichlorosilane Self-Assembled Layers as a Model for the Assessment of Plasma Treatment and Metallization Effects on Polyolefins N2 - Self-assembled octadecyltrichlorosilane (CH3(CH2)17SiCl3, OTS) films were deposited on an oxidized silicon wafer. They were carefully exposed to a low-pressure oxygen direct current (dc) plasma and/or Cr vapor. Subsequently, they were characterized by X-ray photoelectron spectroscopy, near-edge X-ray absorption fine structure spectroscopy, and atomic force microscopy. Detailed information on the oxygen functionalization and the molecular conformation of the OTS films was obtained. The main result was that functionalization conditions can be found where the order of the film remains almost unaffected. Similarly, Cr evaporation of pure OTS films revealed only slight effects on the order in the film. Cr evaporation of an ordered but functionalized OTS film immediately changes its state toward a fully isotropic one. In the course of interaction, oxygen sites at the surface of the functionalized OTS film are reduced whereas Cr becomes oxidized. A redox reaction scheme is proposed for this interfacial reaction. Finally, it is concluded that the given study should be of importance for advanced plasma processing of polyolefins. KW - NEXAFS KW - OTS Self-Assembled Layers PY - 1999 DO - https://doi.org/10.1021/la981174l SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1161 EP - 1166 PB - American Chemical Society CY - Washington, DC AN - OPUS4-808 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Giebler, Rainer A1 - Unger, Wolfgang A1 - Schulz, B. A1 - Reiche, J. A1 - Brehmer, L. A1 - Wühn, M. A1 - Wöll, Ch. A1 - Smith, A.P. A1 - Urquhart, S.G. T1 - Near-Edge X-ray Absorption Fine Structure Spectroscopy on Ordered Films of an Amphiphilic Derivate of 2,5-Diphenyl-1,3,4-Oxadiazole KW - NEXAFS KW - OMBD KW - X-ray Absorption Spectroscopy PY - 1999 SN - 0743-7463 SN - 1520-5827 VL - 15 IS - 4 SP - 1291 EP - 1298 PB - American Chemical Society CY - Washington, DC AN - OPUS4-828 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - The application of X-ray Photoelectron Spectroscopy (ESCA) and X-Ray Absorption Spectroscopy (NEXAFS) in Interface Analysis of Metallized Polymers T2 - Summer Workshop "Functionalized Surfaces: Applications and Analytical Tools" CY - Zurich, Switzerland DA - 1999-07-05 KW - ESCA KW - NEXAFS PY - 1999 SP - F1 EP - F12 AN - OPUS4-797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Koprinarov, Ivaylo A1 - Giebler, Rainer A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Reactions and Intermediates at the Metal-Polymer Interface as Observed by XPS and NEXAFS Spectroscopy KW - XPS KW - NEXAFS KW - Interfacial polymer-metal redox reactions KW - Chromium-polymer intermediates KW - Near edge X-ray absorption fine structure spectroscopy KW - Adhesion KW - Polymer-metal bonds KW - Polymer-aluminium bonds KW - Polymer-copper bonds PY - 1999 SN - 0021-8464 SN - 1545-5823 VL - 71 SP - 297 EP - 321 PB - Gordon & Breach CY - New York, NY AN - OPUS4-798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Gross, Thomas A1 - Güttler, J. T1 - Neues vom Urkilogramm KW - Oberflächenanalytik PY - 1999 SN - 0341-5163 SN - 1521-3854 VL - 47 IS - 7 SP - 784 EP - 786 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-791 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Streeck, C. A1 - Ray, S. A1 - Nutsch, A. A1 - Shard, A. A1 - Beckhoff, B. A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Quantification of variable functional-group densities of mixed-silane monolayers on surfaces via a dual-mode fluorescence and XPS label N2 - The preparation of aminated monolayers with a controlled density of functional groups on silica surfaces through a simple vapor deposition process employing different ratios of two suitable monoalkoxysilanes, (3-aminopropyl)diisopropylethoxysilane (APDIPES) and (3-cyanopropyl)dimethylmethoxysilane (CPDMMS), and advances in the reliable quantification of such tailored surfaces are presented here. The one-step codeposition process was carried out with binary silane mixtures, rendering possible the control over a wide range of densities in a single step. In particular, APDIPES constitutes the functional silane and CPDMMS the inert component. The procedure requires only small amounts of silanes, several ratios can be produced in a single batch, the deposition can be carried out within a few hours and a dry atmosphere can easily be employed, limiting self-condensation of the silanes. Characterization of the ratio of silanes actually bound to the surface can then be performed in a facile manner through contact angle measurements using the Cassie equation. The reliable estimation of the number of surface functional groups was approached with a dual-mode BODIPY-type fluorescence label, which allows quantification by fluorescence and XPS on one and the same sample. We found that fluorescence and XPS signals correlate over at least 1 order of magnitude, allowing for a direct linking of quantitative fluorescence analysis to XPS quantification. Employment of synchrotron-based methods (XPS; reference-free total reflection X-ray fluorescence, TXRF) made the traceable quantification of surface functional groups possible, providing an absolute reference for quantitative fluorescence measurements through a traceable measurement chain. KW - Oberflächenanalytik KW - Fluoreszenz KW - XPS KW - TXRF KW - Funktionelle Gruppen PY - 2015 DO - https://doi.org/10.1021/ac503850f SN - 0003-2700 SN - 1520-6882 VL - 87 IS - 5 SP - 2685 EP - 2692 PB - American Chemical Society CY - Washington, DC AN - OPUS4-34470 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Surface Chemical Analysis of Carbohydrates on Epoxy-Functionalized Surfaces T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34812 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Nietzold, Carolin A1 - Dietrich, Paul A1 - Lippitz, Andreas A1 - Panne, Ulrich A1 - Unger, Wolfgang T1 - Cyclodextrin – ferrocene host – guest complexes on silicon oxide surfaces N2 - Research on carbohydrate based interactions with proteins, nucleic acids or antibodies has gained increased interest in the last years especially in clinical diagnosis or drug development. The efficiency of diagnostic interfaces depends upon the number of probe molecules, e.g. carbohydrates. The control of surface parameters as density and distribution of immobilized carbohydrates is essential for a reliable interaction with protein analytes. A controlled production of biomolecular interfaces can be reached by a stepwise quality control during buildup of these biointerfaces. Here, ß-amino-cyclodextrin molecules were attached to amine-reactive silicon oxide surfaces via click chemistry to construct a model biosensor surface. The amount of surface bound carbohydrates was determined indirectly after chemical derivatization with 4-(trifluoromethyl)-benzylamine (TFMBA). Moreover, these surfaces were used to form host-guest complexes of ferrocene (guest) and β-cyclodextrin (host) moieties to mimic the target binding (sensing) of the model biosensor. Surface chemical analysis of all steps during biosensor construction was performed using X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure spectroscopy (NEXAFS). Our approach widens the possibilities to generate switchable surfaces based on ß-Cyclodextrin surfaces for biosensor applications. KW - ß-amino-cyclodextrin KW - Ferrocene KW - Guest complexe KW - XPS KW - NEXAFS PY - 2016 DO - https://doi.org/10.1002/sia.5958 SN - 0142-2421 SN - 1096-9918 VL - 48 IS - 7 SP - 606 EP - 610 PB - Wiley AN - OPUS4-36856 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hennig, Andreas A1 - Dietrich, Paul A1 - Hemmann, Felix A1 - Thiele, T. A1 - Borcherding, H. A1 - Hoffmann, Angelika A1 - Schedler, U. A1 - Jäger, Christian A1 - Resch-Genger, Ute A1 - Unger, Wolfgang T1 - En route to traceable reference standards for surface group quantifications by XPS, NMR and fluorescence spectroscopy N2 - The fluorine content of polymer particles labelled with 2,2,2-trifluoroethylamine was reliably quantified with overlapping sensitivity ranges by XPS and solid-state NMR. This provides a first step towards reference materials for the metrological traceability of surface group quantifications. The extension of this concept to fluorescence spectroscopy is illustrated. KW - Polymer beads KW - Poly(acrylic acid)-grafted particles KW - XPS KW - SEM KW - Surface analysis KW - Fluorescent dye labeling KW - NMR PY - 2015 DO - https://doi.org/10.1039/c4an02248c SN - 0003-2654 SN - 1364-5528 VL - 140 IS - 6 SP - 1804 EP - 1808 PB - Royal Society of Chemistry CY - Cambridge AN - OPUS4-32794 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Traceable and Absolute Quantification of Silane Molecules on Silica Surfaces T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34807 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Traceable and Absolute Quantification of Silane Molecules on Silica Surface T2 - 16th European Conference on Applicatins of Surface and Interface Analysis ECASIA ´15 CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34701 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - X-Ray Spectrometry for In-Situ Detection of Biomolecules T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34815 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Multimode surface functional group determination: combining steady-state and time-resolved fluorescence with X‑ray photoelectron spectroscopy and absorption measurements for absolute quantification N2 - The quantitative determination of surface functional groups is approached in a straightforward laboratory-based method with high reliability. The application of a multimode BODIPY-type fluorescence, photometry, and X-ray photoelectron spectroscopy (XPS) label allows estimation of the labeling ratio, i.e., the ratio of functional groups carrying a label after reaction, from the elemental ratios of nitrogen and fluorine. The amount of label on the surface is quantified with UV/vis spectrophotometry based on the molar absorption coefficient as molecular property. The investigated surfaces with varying density are prepared by codeposition of 3-(aminopropyl) triethoxysilane (APTES) and cyanoethyltriethoxysilane (CETES) from vapor. These surfaces show high functional group densities that result in significant fluorescence quenching of surface-bound labels. Since alternative quantification of the label on the surface is available through XPS and photometry, a novel method to quantitatively account for fluorescence quenching based on fluorescence lifetime (τ) measurements is shown. Due to the complex distribution of τ on high-density surfaces, the stretched exponential (or Kohlrausch) function is required to determine representative mean lifetimes. The approach is extended to a commercial Rhodamine B isothiocyanate (RITC) label, clearly revealing the problems that arise from such charged labels used in conjunction with silane surfaces. KW - surface group quantification KW - fluorescence spectroscopy KW - absorption spectroscopy KW - X-ray photoelectron spectroscopy KW - dyes PY - 2016 DO - https://doi.org/DOI: 10.1021/acs.analchem.5b03468 SN - 0003-2700 VL - 88 IS - 2 SP - 1210 EP - 1217 PB - American Chemical Society CY - Washington, DC AN - OPUS4-35832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hecht, Mandy A1 - Fischer, Tobias A1 - Dietrich, Paul A1 - Kraus, Werner A1 - Descalzo López, Ana Belén A1 - Unger, Wolfgang A1 - Rurack, Knut T1 - Fluorinated Boron-Dipyrromethene (BODIPY) dyes: bright and versatile probes for surface analysis N2 - A family of bright boron-dipyrromethene-type fluorophores with a high number of fluorine atoms (F-BODIPYs) has been developed and characterized by X-ray crystallography and optical spectroscopy. The introduction of 3,5-bis(trifluoromethyl)phenyl and pentafluorophenyl moieties significantly enhances the photostability of such dyes, yielding for instance photostable near-infrared (NIR) fluorophores that show emission maxima>750 nm, when the BODIPY's π system is extended with two (dimethylamino)styryl and (dimethylamino)naphthastyryl moieties, or green-emitting BODIPYs with fluorescence quantum yields of unity. When equipped with a suitable group that selectively reacts for instance with amines, F-BODIPYs can be used as potent dual labels for the quantification of primary amino groups on surfaces by X-ray photoelectron spectroscopy (XPS) and fluorescence, two powerful yet complementary tools for the analysis of organic surface functional groups. The advantage of reactive F-BODIPYs is that they allow a fast and non-destructive mapping of the labelled supports with conventional fluorescence scanners and a subsequent quantification of selected areas of the same sample by the potentially traceable XPS technique. The performance is exemplarily shown here for the assessment of the amino group density on SiO2 supports, one of the most common reactive silica supports, in particular, for standard microarray applications. KW - Amino groups KW - Dyes KW - Fluorescence KW - Surface analysis KW - X-ray photoelectron spectroscopy KW - Amino-Gruppen KW - Farbstoffe KW - Fluoreszenz KW - Oberflächenanalytik KW - Röntgen-Photoelektronen-Spektroskopie PY - 2013 DO - https://doi.org/10.1002/open.201200039 SN - 2191-1363 VL - 2 IS - 1 SP - 25 EP - 38 PB - Wiley-VCH-Verl. CY - Weinheim AN - OPUS4-27783 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Reference-free total reflection X-ray fluorescence analysis for quantification of functional groups on surfaces for bioanalytical applications T2 - ALTECH Symposium 2014 - Analytical techniques for precise characterization of nanomaterials, EMRS Spring Meeting 2014 CY - Lille, France DA - 2014-05-26 PY - 2014 AN - OPUS4-30971 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Unger, Wolfgang T1 - SIMS imaging of the nanoworld: applications in science and technology N2 - Secondary Ion Mass Spectrometry (SIMS) enables surface chemical analysis of nano-scaled objects and chemical imaging of nano-scaled details of natural or artificial objects. This review presents the state of the art in nanoscale SIMS analysis. At first a short introduction into recent instrumentation for high resolution SIMS imaging and the limiting factors of lateral resolution is given. The next section covers the chemical analysis of nanoparticles. Recent applications of nanoscale imaging SIMS in geology, cosmochemistry, materials research, cellular biology, ecology and medical research are summarized and illustrated by examples. KW - Nanoparticle KW - Nanopartikel KW - Nanoscale imaging KW - Lateral resolution KW - Sekundärionenmassenspektrometrie (SIMS) PY - 2012 DO - https://doi.org/10.1039/c2ja30015j SN - 0267-9477 SN - 1364-5544 VL - 27 IS - 7 SP - 1050 EP - 1068 PB - Royal Society of Chemistry CY - London AN - OPUS4-26080 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul A1 - Hennig, Andreas A1 - Holzweber, Markus A1 - Thiele, T. A1 - Borcherding, H. A1 - Lippitz, Andreas A1 - Schedler, U. A1 - Resch-Genger, Ute A1 - Unger, Wolfgang T1 - Surface analytical study of poly(acrylic acid)-grafted microparticles (beads): characterization, chemical derivatization, and quantification of surface carboxyl groups N2 - We report a surface analytical study of poly(methyl methacrylate) (PMMA) microparticles (beads) with a grafted shell of poly(acrylic acid) (PAA) with thicknesses up to 4 nm using scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary ion mass spectrometry (ToF-SIMS), and near-edge X-ray adsorption fine structure (NEXAFS) spectroscopy. These polymer microparticles were analyzed before and after reaction of the surface carboxyl (CO2H) groups with 2,2,2-trifluoroethylamine (TFEA) to gain a better understanding of methods with use of covalently bound probe molecules for surface group analysis. The results obtained with chemical derivatization XPS using TFEA are discussed in terms of surface quantification of reactive CO2H groups on these PAA-coated microparticles. A labeling yield of about 50% was found for TFEA-derivatized particles with amounts of surface-grafted CO2H groups of 99 µmol/g or more, which is consistent with predicted reaction yields for homogeneously dispersed PAA hydrogels. KW - Polymer microparticles KW - Poly(acrylic acid)-grafted microparticles KW - Beads KW - XPS KW - SEM KW - NEXAFS KW - Surface analysis KW - Fluorine labeling PY - 2014 DO - https://doi.org/10.1021/jp505519g SN - 1932-7447 SN - 1089-5639 VL - 118 IS - 35 SP - 20393 EP - 20404 PB - Soc. CY - Washington, DC AN - OPUS4-31326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - BAM Reference materials for surface and nano analysis: status and projects T2 - 4th International Symposium on Practical Surface Analysis (PSA-07) and 6th Korea-Japan International Symposium on Surface Analysis CY - Kanazawa, Japan DA - 2007-11-25 PY - 2007 AN - OPUS4-16384 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Improvements in quantitative EDS: A 5-year plan T2 - VAMAS Technical Working Area 2 on Surface Chemical Analysis - Meeting of National Representative, Project Leaders and Observers CY - Vevey, Switzerland DA - 2008-09-21 PY - 2008 AN - OPUS4-18208 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Test Materials and Procedures for the day-by-day Performance Check of X-Ray Spectrometers attached to a SEM in Compliance with ISO 15632 T2 - 17. Arbeitstagung "Angewandte Oberflächenanalytik" AOFA CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-27149 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kulka, M. W. A1 - Donskyi, Ievgen A1 - Wurzler, Nina A1 - Salz, D. A1 - Özcan Sandikcioglu, Özlem A1 - Unger, Wolfgang A1 - Haag, R. T1 - Mussel-Inspired Multivalent Linear Polyglycerol Coatings Outperform Monovalent Polyethylene Glycol Coatings in Antifouling Surface Properties N2 - Biofouling constitutes a major challenge in the application of biosensors and biomedical implants, as well as for (food) packaging and marine equipment. In this work, an antifouling surface coating based on the combination of mussel-inspired dendritic polyglycerol (MI-dPG) and an amine-functionalized block copolymer of linear polyglycerol (lPG−b−OA11, OA = oligo-amine) was developed. The coating was compared to a MI-dPG surface which was postfunctionalized with commercially available amine-terminated Polyethylene glycol (HO−PEG−NH2) of similar molecular weight. In the current work, These coatings were compared in their chemical stability, protein fouling characteristics, and cell fouling characteristics. The lPG−b−OA11-functionalized coating showed high chemical stability in both phosphate buffered saline (PBS) and sodium dodecyl sulfate (SDS) solutions and reduced the adhesion of fibrinogen from human plasma with 99% and the adhesion of human serum albumin with 96%, in comparison to the bare titanium dioxide substrate. Furthermore, the Proliferation of human umbilical vein endothelial cells (HUVECs) was reduced with 85% when the lPG−b−OA11 system was compared to bare titanium dioxide. Additionally, a reduction of 94% was observed when the lPG−b−OA11 system was compared to tissue culture polystyrene. KW - Antifouling surface coatings KW - Human umbilical cell adhesion KW - Linear polyglycerol KW - Polyethylene glycol KW - Mussel-inspired adhesives PY - 2019 DO - https://doi.org/10.1021/acsabm.9b00786 VL - 2 IS - 12 SP - 5749 EP - 5759 PB - ACS AN - OPUS4-50342 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, S. A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Simultaneous surface and bulk sensitive XAS measurements of magnetic particle clusters N2 - Magnetic iron oxide nanoparticle clusters (mnpc) coated with organic stabilizers were investigated using scanning transmission x-ray microscopy (STXM). Simultaneous surface and bulk sensitive Fe L₃ edge absorption spectra, obtained using a photomultiplier tube and a channeltron, were used to detect subtle changes in the oxidation state in the surface and bulk of Iron Oxide mnpc. The effectiveness of this mode of STXM operation is demonstrated for these nanoparticle clusters. T2 - X-Ray Microscopy Conference 2016 (XRM 2016) CY - Oxford, UK DA - 15.08. 2016 KW - Fe L3 edge absorption spectra KW - Scanning transmission x- ray microscopy KW - Magnetic iron oxide nanoparticle clusters KW - XAS PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-410576 UR - http://iopscience.iop.org/article/10.1088/1742-6596/849/1/012014/pdf DO - https://doi.org/10.1088/1742-6596/849/1/012014 SN - 1742-6588 VL - 849 SP - 012014, 1 EP - 012014, 5 PB - IOP Publishing AN - OPUS4-41057 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Holzlechner, Gerald A1 - Holzweber, Markus A1 - Lohninger, H. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - First use of data fusion and multivariate analysis of ToF-SIMS and SEM image data for studying deuterium-assisted degradation processes in duplex steels N2 - Time-of-flight secondary ion mass spectrometry (ToF-SIMS) and high-resolution scanning electron microscopy are well-acknowledged tools in materials characterization. The ability to map chemical species on the surface of an investigated sample with often low mass detection limits makes ToF-SIMS an essential tool in fields where many question marks concerning Degradation processes and damage mechanisms exist. The aim of this paper is to describe the power of data fusion of ToF-SIMS and high-resolution scanning electron microscopy results employing computational methods for multivariate data Analysis such as principal component analysis. As a case study the investigation of hydrogen distribution in an artificially charged Duplex stainless steel microstructure is presented aiming on a better understanding of hydrogen embrittlement. T2 - 16th European Conference on Applications of Surface and Interface Analysis CY - Granada, Spain DA - 28.09.2015 KW - ToF-SIMS KW - HR-SEM KW - Data fusion KW - Duplex stainless steel KW - Hydrogen embrittlement PY - 2016 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.6015/full DO - https://doi.org/10.1002/sia.6015 VL - 48 IS - 7 SP - 474 EP - 478 PB - John Wiley & Sons, Ltd CY - Surface and Interface Analysis AN - OPUS4-36832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Silverstein, R. A1 - Sobol, Oded A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang A1 - Eliezer, D. T1 - Hydrogen behavior in SAF 2205 duplex stainless steel N2 - This paper describes austenitic-ferritic duplex stainless steels, SAF 2205, in the presence of hydrogen. The duplex stainless steels (DSS) properties include excellent resistance to stress corrosion cracking, high strength and good weldability. Those steels are preferably used in industries combining hydrogen and loads. Hydrogen location in addition to hydrogen binding energy with the steel's defects are of great importance for the analysis of hydrogen embrittlement model in that steel. It is known from previously published works that the susceptibility to hydrogen embrittlement will depend on the competition between reversible and irreversible traps; meaning a direct relation to the hydrogen's state and position in the steel. In this work, we examine the local hydrogen concentration, trapping and distribution by two modern and advanced techniques: thermal desorption spectrometry (TDS) and we support it by time of flight-secondary ion mass spectrometer (ToF-SIMS). In this paper, we support and give for the first time new insights and better understanding to the hydrogen embrittlement mechanism in SAF 2205. The trapping energies levels were calculated using TDS and Lee and Lee's model. This model revealed reversible in addition to irreversible trapping sites. Also the trapping controlling mechanism was found to be a combination of detrapping controlled mechanism and diffusion controlled mechanism. The use of ToF-SIMS for local imaging the distribution of hydrogen species supports the discussion of the different hydrogen traps in this type of steel. The hydrogen embrittlemet phenomenon in SAF 2205 will be discussed in details in that paper. KW - Hydrogen trapping KW - Duplex stainless steel KW - Thermal desorption spectrometry (TDS) KW - ToF-SIMS PY - 2017 DO - https://doi.org/10.1016/j.jallcom.2016.11.184 SN - 0925-8388 SN - 1873-4669 VL - 695 SP - 2689 EP - 2695 PB - Elsevier B.V. AN - OPUS4-38856 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Holzlechner, Gerald A1 - Sobol, Oded A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang ED - Udomkichdecha, W. ED - Mononukul, A. ED - Böllinghaus, Thomas ED - Lexow, Jürgen T1 - Imaging ToF-SIMS as a chemical metrology tool to support material and analytical science N2 - As a chemical metrology tool time-of-flight secondary ion mass spectrometry (ToF-SIMS) has become a very popular technique to monitor the elemental, isotopic and molecular distribution in two or three dimensions. Its reduced sampling depth, high sensitivity, great structural specificity and the direct detection of hydrogen thereby increase the emergence of ToF-SIMS for material and analytical surface science, particularly due to recent instrumental developments improving mass, depth and lateral resolution. For basic surface science, adsorption processes and surface reactivity thus can be investigated in high detail on organic as well as inorganic samples. The use of multivariate data analysis in addition can effectively assist to identify trends in the complex SIMS raw data set and define key co-variances between certain samples or mass spectra. In this contribution the essence of ToF-SIMS is illustrated by discussing two highly relevant energy applications. First, for piezoelectric electroceramics oxygen exchange active zones have been visualized to determine the impact of external field-load to the oxygen vacancy distribution between anode and cathode. As a second case study the interaction of hydrogen species with the microstructure of a duplex stainless steel was investigated. It was concluded that ToF-SIMS has a valuable essence for detailing hydrogen related degradation mechanisms. T2 - 4th WMRIF Young scientists workshop CY - Boulder, CO, USA DA - 08.09.2014 PY - 2016 SN - 978-981-287-723-9 SN - 978-981-287-724-6 DO - https://doi.org/10.1007/978-981-287-724-6_7 SP - 63 EP - 72 PB - Springer AN - OPUS4-34881 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sobol, Oded A1 - Böllinghaus, Thomas A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Eliezer, D. T1 - High resolution ToF-SIMS imaging of deuterium permeation and cracking in duplex stainless steels N2 - Fundamental understanding and elucidation of hydrogen assisted degradation and trapping mechanisms is dependent on sufficient imaging techniques for respective hydrogen interactions, in particular with multi-phase metallic microstructures. The present work shows the progress in elucidating the deuterium behavior in austenitic-ferritic duplex stainless steels under the consideration that deuterium behaves in many ways similarly to hydrogen. A novel combination of deuterium permeation and in-situ Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) imaging technique is compared with post charging ToF-SIMS imaging experiments. As a step beyond state-of-the-art, integration of chemo-metric and high resolution structural characterization techniques with computational multivariate data analysis (MVA) and data fusion is presented. T2 - 2016 International Hydrogen Conference CY - Grand Teton National Park, Jackson Lake Lodge, Wyoming, USA DA - 11.09.2016 KW - DSS KW - ToF-SIMS KW - Data-fusion KW - EBSD PY - 2017 SN - 978-0-7918-6138-7 SP - 407 EP - 415 PB - ASME Press CY - Two Park Ave. New-York, NY 10016, USA AN - OPUS4-42647 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Tof-SIMS imaging of Deuterium in DSS steel microstructures and data fusion with SEM topography data: Towards a better understanding of hydrogen assisted cracking in steel N2 - The use of duplex stainless steels (DSS) in energy related applications is well known. Nowadays, DSS steels become more favorable than austenitic steels due to the outstanding mechanical properties, the good corrosion resistance and the lower nickel content. However, the use of the duplex grade in acidic environments such as seawater often leads to severe degradation of the structural integrity of the steel by hydrogen-induced/assisted cracking (HAC) phenomena, which can eventually result in premature failure. Hydrogen assisted degradation and cracking of steels are active fields of research even though this topic is intensively studied for more than a century. A bottleneck is the analytical validation of the theoretical models proposed ion the literature at the sub-micron scale. Industrial and the research communities see a need for an accurate analytical method by which it is possible to image the distribution of hydrogen in the microstructure of a steels or and other alloys. Among the very few available methods hydrogen imaging methods, Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) has the principal capability for mapping of hydrogen in a steel’s microstructure. The combination of ToF-SIMS with multivariate data analysis (MVA), electron microscopy (SEM) and electron-backscattered diffraction (EBSD) is a powerful approach for providing chemical and structural information. The use of data fusion techniques has been shown recently to enhance the better understanding of the hydrogen induced degradation processes in in a DSS steel. T2 - The Scientific International Symposium on SIMS and Related Techniques Based on Ion-Solid Interactions (SISS19) CY - Kyoto, Japan DA - 11.5.17 KW - Hydrogen KW - DSS steel KW - ToF SIMS KW - SEM KW - EDX KW - EBSD KW - Data fusion PY - 2017 AN - OPUS4-40276 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Röhsler, Andreas A1 - Sobol, Oded A1 - Nolze, Gert A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Use of time-of-flight secondary ion mass spectrometry for the investigation of hydrogen-induced effects in austenitic steel AISI 304L N2 - During the energy transformation from fossil fuels to renewable energy sources, the use of hydrogen as fuel and energy storage can play a key role. This presents new challenges to industry and the scientific community alike. The storage and transport of hydrogen, which is nowadays mainly realized by austenitic stainless steels, remains problematic, which is due to the degradation of mechanical properties and the possibility of phase transformation by hydrogen diffusion and accumulation. The development of materials and technologies requires a fundamental understanding of these degradation processes. Therefore, studying the behavior of hydrogen in austenitic steel contributes to an understanding of the damage processes, which is crucial for both life assessment and safe use of components in industry and transportation. As one of the few tools that is capable of depicting the distribution of hydrogen in steels, time-of-flight secondary ion mass spectrometry was conducted after electrochemical charging. To obtain further information about the structural composition and cracking behavior, electron-backscattered diffraction and scanning electron microscopy were performed. Gathered data of chemical composition and topography were treated employing data fusion, thus creating a comprehensive portrait of hydrogen-induced effects in the austenite grade AISI 304L. Specimens were electrochemically charged with deuterium instead of hydrogen. This arises from the difficulties to distinguish between artificially charged hydrogen and traces existing in the material or the rest gas in the analysis chamber. Similar diffusion and permeation behavior, as well as solubility, allow nonetheless to draw conclusions from the experiments. T2 - 21st International Conference on Secondary Ion Mass Spectrometry CY - Kraków, Poland DA - 10.09.2017 KW - AISI 304L KW - Hydrogen KW - ToF-SIMS KW - Austenitic stainless steel PY - 2018 DO - https://doi.org/10.1116/1.5013931 SN - 1071-1023 VL - 36 IS - 3 SP - Article 03F103, 1 EP - 6 PB - American Vacuum Society (AVS) AN - OPUS4-44840 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Sobol, Oded A1 - Wirth, Thomas A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Deuterium permeation and cracking in duplex steels as viewed by ToF-SIMS and HR-SEM with data fusion N2 - Better understanding of hydrogen assisted degradation and trapping mecha-nisms requires sufficient imaging techniques for respective hydrogen-microstructure interaction studies, in particular with multi-phase metallic micro-structures [1]. The present work is focusing on the elucidation of deuterium be-havior in two austenitic-ferritic duplex stainless steels (DSS) under the assumption that deuterium behaves in many ways similarly to hydrogen [2]. For case studies standard 2205 and lean 2101 DSSs were chosen due to the extensive use of these steels in industry [3]. The analyses were conducted by using a novel in-situ permeation and Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) imaging technique or by ex-situ ToF-SIMS imaging following electrochemical charging experiments. Another pioneering procedure was data fusion (including chemometry) of results of powerful laterally resolved chemical analysis and high resolution structural characterization techniques . Results for the ex-situ observations showed a different influence of deuterium loading on the two steel grades as well as different damage mechanisms in each phase. Formation of sub-surface blisters between the ferrite and austenite were obtained in both the standard and the lean DSS. In both steels, an increased deuterium concentration was observed around deformed regions such as cracks, confirming that they originate from the presence of deuterium [4]. The formation of parallel cracks was obtained only in the austenite within the standard duplex whereas in the lean duplex the highest intensity of deuterium was obtained in the austenite along the ferrite-austenite interphase. In comparison, application of the novel in-situ permeation technique enabled to register and record the deuterium permeation through the material and the respective saturation sequence of the two phases as well as the interfaces. Faster diffusion of the deuterium was observed in the ferrite and a direct proof for deuterium enrichment at the austenite-ferrite interface has been given [1]. The integration of the specified techniques gives a better insight into the processes leading to hydrogen induced failure. These two experimental techniques provide very valuable tools for elucidation of respective metallurgical failure mechanisms that can be used for the validation of respective numerical models for hydrogen assisted cracking (HAC). T2 - 19. Arbeitstagung Angewandte Oberflächenanalytik CY - Soest, Germany DA - 05.09.2016 KW - ToF-SIMS KW - Hydrogen assisted cracking KW - Data fusion KW - SEM PY - 2016 AN - OPUS4-37484 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - In-situ detection of deuterium in duplex stainless steels by TOF-SIMS T2 - 17. Arbeitstagung Angewandte Oberfächen-Analytik (AOFA) CY - Soest, Germany DA - 2012-09-24 PY - 2012 AN - OPUS4-26560 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Straub, Franka A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang A1 - Mente, Tobias ED - Somerday, B. P. ED - Sofronis, P. T1 - In-situ detection of Deuterium in duplex stainless steels by time-of-flight secondary ion mass spectrometry (TOF-SIMS) N2 - Local in-situ measurements of hydrogen distribution in the microstructure become increasingly important to elucidate the degradation mechanisms. In contrast to other attempts, modern TOF-SIMS instruments might provide precise element and phase mappings at sub-μm lateral resolution, enabling imaging of the microstructure and analysis of the chemical composition. Such technique has thus been applied to image the deuterium distribution in duplex stainless steel microstructures. After electrochemical charging, accumulations of deuterium have been detected in the austenite grains, causing parallel cracking in this phase which up to the present has been regarded as less prone to hydrogen or deuterium deterioration in comparison to the δ-ferrite. Hydrogen and deuterium behave quite similarly in metallic microstructures. TOF-SIMS imaging of Deuterium and Hydrogen might thus significantly contribute to elucidate respective metallurgical failure mechanisms. Such imaging also represents a valuable tool to validate respective numerical analyses of hydrogen distributions. T2 - Hydrogen-materials interactions - 2012 International hydrogen conference CY - Moran, WY, USA DA - 09.09.2012 PY - 2014 SN - 978-0-7918-6029-8 SP - 505 EP - 512 PB - ASME CY - New York AN - OPUS4-27669 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Nolze, Gert A1 - Saliwan Neumann, Romeo A1 - Eliezer, D. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Novel approach to image hydrogen distribution and related phase transformation in duplex stainless steels at the sub-micron scale N2 - The effect of electrochemical charging of hydrogen on the structure of a lean duplex stainless steel LDX 2101® (EN 1.4162, UNS S32101) was examined by both Time-of-Flight secondary ion mass spectrometry and electron back-scatter diffraction. The goal is to correlate hydrogen concentration and induced structural changes. Chemical and structural characterizations were done for the same region at the sample's surface with sub-micron spatial resolution. Regions of interest were varying in size between 50 × 50 μm and 100 × 100 μm. The results show a phase transformation of austenite to mainly a defect-rich BCC and scarcely a HCP phase. The phase transformation occurred in deuterium rich regions in the austenite. KW - Time-of-flight secondary ion mass spectrometry KW - ToF-SIMS KW - Electron backscatter diffraction KW - EBSD KW - Hydrogen-assisted cracking KW - Data fusion KW - Lean duplex stainless steel PY - 2017 DO - https://doi.org/10.1016/j.ijhydene.2017.08.016 SN - 0360-3199 VL - 42 IS - 39 SP - 25114 EP - 25120 AN - OPUS4-42022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tan, K. H. A1 - Sattari, S. A1 - Donskyi, Ievgen A1 - Cuellar-Camacho, J. L. A1 - Cheng, C. A1 - Schwibbert, Karin A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Gorbushina, Anna A1 - Adeli, M. A1 - Haag, R. T1 - Functionalized 2D nanomaterials with switchable binding to investigate graphene–bacteria interactions N2 - Graphene and its derivatives have recently attracted much attention for sensing and deactivating pathogens. However, the mechanism of multivalent interactions at the graphene–pathogen interface is not fully understood. Since different physicochemical parameters of graphene play a role at this interface, control over graphene’s structure is necessary to study the mechanism of these interactions. In this work, different graphene derivatives and also zwitterionic graphene nanomaterials (ZGNMs) were synthesized with defined exposure, in terms of polymer coverage and functionality, and isoelectric points. Then, the switchable interactions of these nanomaterials with E. coli and Bacillus cereus were investigated to study the validity of the generally proposed “trapping” and “nano-knives” mechanisms for inactivating bacteria by graphene derivatives. It was found that the antibacterial activity of graphene derivatives strongly depends on the accessible area, i.e. edges and basal plane of sheets and tightness of their agglomerations. Our data clearly confirm the authenticity of “trapping” and “nano-knives” mechanisms for the antibacterial activity of graphene sheets. KW - XPS KW - Graphene KW - Graphene–bacteria interaction PY - 2018 DO - https://doi.org/10.1039/c8nr01347k SN - 2040-3364 SN - 2040-3372 VL - 10 IS - 20 SP - 9525 EP - 9537 PB - RSC CY - London AN - OPUS4-45084 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Min, Hyegeun A1 - Girard-Lauriault, Pierre-Luc A1 - Gross, Thomas A1 - Lippitz, Andreas A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Ambient-ageing processes in amine self-assembled monolayers on microarray slides as studied by ToF-SIMS with principal component analysis, XPS, and NEXAFS spectroscopy N2 - We investigated the ageing of amine-terminated self-assembled monolayers (amine-SAMs) on different silica substrates due to exposure to different ambient gases, pressures, and/or temperatures using time-of-flight secondary ion mass spectrometry (ToF-SIMS) with principal component analysis and complementary methods of surface analysis as X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS). The goal of this study is to examine the durability of primary amine groups of amine-SAMs stored in a user laboratory prior to being used as supports for biomolecule immobilization and other applications. We prepared amine-SAMs on the native oxides of silicon wafers and glass slides using 3-aminopropyl triethoxysilane, by using optimized conditions such as anhydrous organic solvent and reaction time scale of hours to avoid multilayer growth. Selected commercial amine-SAM slides have been investigated, too. When the amine-SAMs are exposed to air, oxygen incorporation occurs, followed by formation of amide groups. The formation of oxygen species due to ageing was proved by ToFSIMS, XPS, and NEXAFS findings such as CNO- secondary ion emission at m/z 42, observation of the N 1s HNC=O component peak at 400.2–400.3 eV in XPS, and, last but not least, by formation of a π*(HNC=O) resonance at 401 eV in the N K-edge X-ray absorption spectrum. It is concluded that the used multi-method approach comprising complementary ToF-SIMS, XPS, and NEXAFS analyses is well suited for a thorough study of chemical aspects of ageing phenomena of amine-SAM surfaces. KW - Amine-SAM KW - Ageing process KW - ToF-SIMS KW - NEXAFS KW - XPS PY - 2012 DO - https://doi.org/10.1007/s00216-012-5862-5 SN - 1618-2642 SN - 1618-2650 VL - 403 IS - 2 SP - 613 EP - 623 PB - Springer CY - Berlin AN - OPUS4-25829 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Guday, G. A1 - Donskyi, Ievgen A1 - Gholami, M. F. A1 - Algara-Siller, G. A1 - Witte, F. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Paulus, B. A1 - Rabe, J. A1 - Adeli, M. A1 - Haag, R. T1 - Scalable Production of Nanographene and Doping via Nondestructive Covalent Functionalization N2 - A new method for top‐down, one‐pot, gram‐scale production of high quality nanographene by incubating graphite in a dilute sodium hypochlorite solution at only 40 °C is reported here. The produced sheets have only 4 at% oxygen content, comparable with nanographene grown by chemical vapor deposition. The nanographene sheets are covalently functionalized using a nondestructive nitrene [2+1] cycloaddition reaction that preserves their π‐conjugated system. Statistical analyses of Raman spectroscopy and X‐ray photoelectron spectroscopy indicate a low number of sp3 carbon atoms on the order of 2% before and 4% after covalent functionalization. The nanographene sheets are significantly more conductive than conventionally prepared nanographene oxide, and conductivity further increases after covalent functionalization. The observed doping effects and theoretical studies suggest sp2 hybridization for the carbon atoms involved in the [2+1] cycloaddition reaction leading to preservation of the π‐conjugated system and enhancing conductivity via n‐type doping through the bridging N‐atom. These methods are easily scalable, which opens the door to a mild and efficient process to produce high quality nanographenes and covalently functionalize them while retaining or improving their physicochemical properties. KW - Graphene KW - XPS KW - NEXAFS PY - 2019 DO - https://doi.org/10.1002/smll.201805430 VL - 15 IS - 12 SP - 1805430 PB - WILEY-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-48021 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Potthoff, A. A1 - Unger, Wolfgang T1 - Report on SOP for dispersing nanomaterials in water and report on round robin test. N2 - This report describes a standard operation procedure for dispersion of nanomaterials in liquids prior to toxicological or ecotoxicological testing. Main factors, who determine the state of agglomeration and aggregation of ENMs after dispersion are specific energy input, particle concentration and fluid composition. The method was validated in two round robin tests, where two typical nanomaterials (a nanopowder and a nanodispersion) were investigated. One main result arising out of the data comparison was that only those participants, who were able to follow the instructions in the SOPs completely, received similar results regarding particle size and zeta potential. The SOP is easy to adapt for other types of nanomaterials. The results provide the standardization process and were presented at DIN working group. KW - Dispersion of nano materials KW - AEROSIL® OX50 KW - LEVASIL 50/50 PY - 2019 UR - http://publica.fraunhofer.de/documents/N-541033.html DO - https://doi.org/10.24406/ikts-n-541033 SP - 1 EP - 24 AN - OPUS4-48022 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Röhsler, Andreas A1 - Sobol, Oded A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Comprehensive study of deuterium-induced effects in in austenitic stainless steel AISI 304L N2 - The damaging impact of hydrogen on the austenitic stainless steel AISI 304 L was analysed. To this aim, samples were charged electrochemically with the hydrogen isotope deuterium (2H, D) and examined with time-of-flight secondary ion mass spectrometry (ToF-SIMS) and electron backscatter diffraction (EBSD). The fusion of the obtained chemical and structural information revealed local enrichment of deuterium in austenite, transformation into martensite, crack formation and severe roughening of the specimen surface. The results indicated that martensite was not only formed during charging but also during Desorption and ToF-SIMS examinations. Furthermore, cross-sections of deuterium-charged samples revealed that in preferred deformation bands a g/ε/a 0 evolution is taking place. By means of microscopic analyses and carrier gas hot extraction (CGHE), it was found that the use of NaAsO2 as recombination poison decreased the uptake of hydrogen significantly and resulted in severe precipitation on the specimen surfaces. This is in contrast to the popular presumption that NaAsO2 enhances the uptake of hydrogen (and deuterium) during electrochemical charging by hampering its recombination from Atoms to molecules. KW - AISI 304L KW - Hydrogen KW - ToF-SIMS KW - Deuterium KW - Martensite PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-477540 DO - https://doi.org/10.1016/j.ijhydene.2019.03.058 SN - 0360-3199 SN - 1879-3487 VL - 44 IS - 23 SP - 12228 EP - 12238 PB - Elsevier Ltd. AN - OPUS4-47754 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan ED - Czichos, Horst T1 - Surface chemical analysis at the micro- and nanoscale N2 - This chapter describes relevant methods of micro- and nanosurface chemical analysis used in technical diagnostics. Informative case studies in diagnostics applied in a wide range of industrial technology are presented, too. PY - 2013 SN - 978-3-642-25849-7 SN - 978-3-642-25850-3 DO - https://doi.org/10.1007/978-3-642-25850-3_15 IS - Chapter 15 SP - 301 EP - 322 PB - Springer CY - Berlin Heidelberg AN - OPUS4-27691 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Straub, Franka A1 - Wirth, Thomas A1 - Hertwig, Andreas A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Böllinghaus, Thomas T1 - Imaging the microstructure of duplex stainless steel samples with TOF-SIMS N2 - Time-of-flight secondary ion mass spectrometry (TOF-SIMS) mappings provide a visualization of the distribution of chemical elements and phases on polished duplex steel surfaces as element and fragment secondary ion signals. The advantage of TOF-SIMS, compared to optical microscopy, is its potential to analyze the chemical composition with a lateral resolution at a submicrometer scale. TOF-SIMS mappings allow distinguishing between ferritic and austenitic phases because of the phase selective detection method without any requirement of etching or other processing. KW - TOF-SIMS mappings KW - Duplex stainless steel KW - Surface analysis KW - Ferritic phase KW - Austenitic phase PY - 2010 UR - http://onlinelibrary.wiley.com/doi/10.1002/sia.3385/pdf DO - https://doi.org/10.1002/sia.3385 SN - 0142-2421 SN - 1096-9918 VL - 42 IS - 6-7 SP - 739 EP - 742 PB - Wiley CY - Chichester AN - OPUS4-21818 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Kim, K.J. A1 - Unger, Wolfgang T1 - Energy dispersive electron probe microanalysis (ED-EPMA) of elemental composition and thickness of Fe-Ni alloy films N2 - The elemental composition of thin Fe-Ni alloy films deposited on silicon substrates were determined by electron probe microanalysis with an energy dispersive spectrometer using the STRATAGem software. The work was part of ample inter-laboratory comparisons organized in the frame of CCQM/SAWG (Consultative Committee for Amount of Substance/Surface Analysis Working Group). Therefore, the evaluation of the measurement uncertainties is treated in detail. By having the mass coverage and estimating a layer density, the layer thickness could be derived. KW - Thin films KW - Fe-Ni KW - Energy dispersive electron probe microanalysis (ED-EPMA) KW - STRATAGem KW - k-values KW - Mass coverage KW - Elemental composition KW - Thickness KW - CCQM PY - 2012 DO - https://doi.org/10.1002/sia.4975 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 11-12 SP - 1459 EP - 1461 PB - Wiley CY - Chichester AN - OPUS4-27139 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sattari, S. A1 - Beyranvand, S. A1 - Soleimani, K. A1 - Rassoli, K. A1 - Salahi, P. A1 - Donskyi, Ievgen A1 - Shams, A. A1 - Unger, Wolfgang A1 - Yari, A. A1 - Farjanikish, G. A1 - Nayebzadeh, H. A1 - Adeli, M. T1 - Boronic Acid-Functionalized Two-Dimensional MoS2 at Biointerfaces N2 - While noncovalent interactions at two-dimensional nanobiointerfaces are extensively investigated, less knowledge about covalent interactions at this interface is available. In this work, boronic acid-functionalized 2D MoS2 was synthesized and its covalent multivalent interactions with bacteria and nematodes were investigated. Polymerization of glycidol by freshly exfoliated MoS2 and condensation of 2,5-thiophenediylbisboronic acid on the produced platform resulted in boronic acid-functionalized 2D MoS2. The destructive interactions between 2D MoS2 and bacteria as well as nematodes were significantly amplified by boronic acid functional groups. Because of the high antibacterial and antinematodal activities of boronic acid-functionalized 2D MoS2, its therapeutic efficacy for diabetic wound healing was investigated. The infected diabetic wounds were completely healed 10 days after treatment with boronic acid-functionalized 2D MoS2, and a normal structure for recovered tissues including different layers of skin, collagen, and blood vessels was detected. KW - XPS KW - Boronic acid-functionalized 2D MoS2 KW - Covalent interactions KW - Bacteria KW - Nanobiointerfaces PY - 2020 DO - https://doi.org/10.1021/acs.langmuir.0c00776 VL - 36 IS - 24 SP - 6706 EP - 6715 PB - ACS American Chemical Society AN - OPUS4-51024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Holzweber, Markus A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang T1 - What about ionic liquids as a 'hot' certified reference material candidate to check your EDS below 1 keV? N2 - Energy-dispersive X-ray spectrometry (EDX) is one of the most applied methods used for the analysis of the chemical composition of solids and thin films. Recent progress in EDS (Energy Dispersive X-ray Spectrometer) technology has increased the general performance also in the energy range < 1 keV addressing low Z elements. Suitable test materials to be employed especially to check the low-energy EDS performance – also in line with ISO 15632 - are rather limited and mainly based on C K and F K lines. In order to obtain valid results in laboratories accredited in compliance with ISO/IEC 17025 it is necessary to periodically check the instrument performance. T2 - M&M 2015 - Microscopy & Microanalysis CY - Portland, Oregon, USA DA - 02.08.2015 KW - Reference material KW - EDX KW - Ionic liquids PY - 2015 DO - https://doi.org/10.1017/S1431927615009356 VL - 21 SP - Suppl. 3, Paper 0856 AN - OPUS4-34211 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Beyranvand, S. A1 - Pourghobadi, Z. A1 - Sattari, S. A1 - Soleymani, K. A1 - Donskyi, Ievgen A1 - Gharabaghi, M. A1 - Unger, Wolfgang A1 - Farjanikish, G. A1 - Nayebzadeh, H. A1 - Adeli, M. T1 - Boronic acid functionalized graphene platforms for diabetic wound N2 - While noncovalent interactions between graphene derivatives and biosystems are extensively studied, less knowledge about their covalent multivalent interactions at biointerfaces is available. Due to the affinity of boronic acids towards cis-diol bearing biosystems, graphene sheets with this functionality were synthesized and their covalent interactions with the bacteria and nematode were investigated. As expected, graphene platforms with boronic acid functionality were able to wrap bacteria and destroy it in a short time. Surprisingly, body of nematodes was ruptured and their viability decreased to 30% after 24 h incubation with the functionalized graphene sheets. Because of their antibacterial and antiparasitic activities as well as their ability for wound dressing, graphene platforms with the boronic acid functionality were further investigated for diabetic wound healing. In vivo experiments showed that graphene platforms are more efficient than the commercially available drug, phenytoin, and restore both infected and non-infected diabetic wounds in ten days. Taking advantage of their straightforward synthesis, strong interactions with different biosystems as well as their ability to heal diabetic wounds, the boronic Acid functionalized graphene sheets are promising candidates for a broad range of future biomedical applications. KW - Graphene KW - Boronic acid KW - Functionalized graphene KW - XPS PY - 2020 UR - https://www.sciencedirect.com/science/article/abs/pii/S0008622319310954 DO - https://doi.org/doi.org/10.1016/j.carbon.2019.10.077 VL - 158 SP - 327 EP - 336 PB - Elsevier Ltd. AN - OPUS4-50559 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang T1 - International standardization and metrology as tools to address the comparability and reproducibility challenges in XPS measurements N2 - The status of standardization related to x-ray photoelectron spectroscopy (XPS, ESCA) at ASTM International (Subcommittee E42.03) and ISO (TC 201) is presented and commented upon in a structured manner. The survey also identifies other active bodies, here VAMAS Technical Working Area 2 and the Surface Analysis Working Group at the International Meter Convention, contributing to prestandardization Research and metrology of XPS and reports their specific activities. It is concluded that existing standardization is delivering good practices in the use of XPS and has a high potential to avoid the recently observed erroneous use, misapplications, and misinterpretation by new and inexperienced users of the method—which seems to be the main reason for the “reproducibility crisis” in the field of XPS applications. A need for a more proactive publicizing of international documentary standards by experienced XPS users, specifically those who are involved in standardization, is identified. Because the existing portfolio of standards addressing the use of XPS is not complete, future standardization projects planned or already ongoing are mentioned. The way the standardization bodies are identifying future needs is shortly explained. KW - Standardisation KW - Comparability KW - Reproducibility KW - XPS KW - VAMAS KW - Metrology PY - 2020 DO - https://doi.org/10.1116/1.5131074 VL - 38 IS - 2 SP - 021201-1 EP - 021201-8 PB - AVS AN - OPUS4-50560 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Maaßdorf, A. A1 - Rooch, Heidemarie A1 - Österle, Werner A1 - Malcher, M. A1 - Schmidt, M. A1 - Kollmer, F. A1 - Paul, D. A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1–xAs and InxGa1–xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface-analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - AES KW - BAM-L200 KW - CRM KW - EDX KW - Imaging KW - Lateral resolution KW - Sharpness KW - Standardisation KW - STXM KW - ToF-SIMS KW - XPEEM KW - XPS KW - Certified reference material KW - Imaging surface analysis PY - 2015 DO - https://doi.org/10.1007/s00216-014-8135-7 SN - 1618-2642 SN - 1618-2650 VL - 407 IS - 11 SP - 3211 EP - 3217 PB - Springer CY - Berlin AN - OPUS4-33033 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K. J. A1 - Kim, A. S. A1 - Jang, J. S. A1 - Suh, J. K. A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Araujo, J. R. A1 - Archanjo, B. S. A1 - Galhardo, C. E. A1 - Damasceno, J. A1 - Achete, C. A. A1 - Wang, H. A1 - Wang, M. A1 - Bennett, J. A1 - Simons, D. A1 - Kurokawa, A. A1 - Terauchi, S. A1 - Fujimoto, T. A1 - Streeck, C. A1 - Beckhoff, B. A1 - Spencer, S. A1 - Shard, A. T1 - Measurement of mole fractions of Cu, In, Ga and Se in Cu(In,Ga)Se2 films N2 - CCQM key comparison K-129 for the quantitative analysis of Cu(In,Ga)Se2 (CIGS) films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The objective of this key comparison is to compare the equivalency of the National Metrology Institutes (NMIs) and Designated Institutes (DIs) for the measurement of mole fractions of Cu, In, Ga and Se in a thin CIGS film. The measurand of this key comparison is the average mole fractions of Cu, In, Ga and Se of a test CIGS alloy film in the unit of mole fraction (mol/mol). Mole fraction with the metrological unit of mol/mol can be practically converted to atomic fraction with the unit of at%. In this key comparison, a CIGS film with certified mole fractions was supplied as a reference specimen to determine the relative sensitivity factors (RSFs) of Cu, In, Ga and Se. The mole fractions of the reference specimen were certified by isotope dilution - inductively coupled plasma/mass spectrometry (ID-ICP/MS) and are traceable to the SI. A total number counting (TNC) method was recommended as a method to determine the signal intensities of the constituent elements acquired in the depth profiles by Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES). Seven NMIs and one DI participated in this key comparison. The mole fractions of the CIGS films were measured by depth profiling based-SIMS, AES and XPS. The mole fractions were also measured by non-destructive X-Ray Fluorescence (XRF) Analysis and Electron Probe Micro Analysis (EPMA) with Energy Dispersive X-ray Spectrometry (EDX). In this key comparison, the average degrees of equivalence uncertainties for Cu, In, Ga and Se are 0.0093 mol/mol, 0.0123 mol/mol, 0.0047 mol/mol and 0.0228 mol/mol, respectively. These values are much smaller than that of Fe in a Fe-Ni alloy film in CCQM K-67 (0.0330 mol/mol). This means that the quantification of multi-element alloy films is possible by depth profiling analysis using the TNC method. KW - CIGS KW - Key comparison KW - CCQM KW - SIMS KW - XPS KW - AES KW - XRF KW - EPMA PY - 2016 UR - http://iopscience.iop.org/article/10.1088/0026-1394/53/1A/08011 DO - https://doi.org/10.1088/0026-1394/53/1A/08011 SN - 0026-1394 SN - 1681-7575 VL - 53, Technical Supplement SP - Article 08011, 1 EP - 19 PB - IOP Publishing AN - OPUS4-38110 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Fujimoto, T. T1 - The Surface Analysis Working Group at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology: A successful initiative by Martin Seah N2 - Dr Martin Seah, NPL, was the initiator, founder, and first chairman of the Surface Analysis Working Group (SAWG) at the Consultative Committee for Amount of Substance, Metrology in Chemistry and Biology (CCQM) at the Bureau International des Poids et Mesures (BIPM), the international organization established by the Metre Convention. This tribute letter summarizes his achievements during his chairmanship and his long-running impact on the successful work of the group after his retirement. KW - CCQM (Consultative Committee for Amount of Substance) KW - Metrology in Chemistry and Biology KW - Martin Seah KW - Metrology KW - Quantitative surface chemical analysis KW - Surface Analysis Working Group PY - 2021 DO - https://doi.org/10.1002/sia.7033 SN - 0142-2421 VL - 54 IS - 4 SP - 314 EP - 319 PB - John Wiley & Sons Ltd AN - OPUS4-53714 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R.B. A1 - Rackwitz, Vanessa A1 - Bremser, Wolfram A1 - Unger, Wolfgang T1 - Determination of the k-values of copper-gold alloys with ED- and WD-EPMA - Results of an inter-laboratory comparison N2 - An inter-laboratory comparison organized as a pilot study (PS) has been performed under the umbrella of the Consultative Committee for Amount of Substance – Metrology in Chemistry (CCQM) / Surface Analysis Working Group (SAWG) with the objective to compare k-values measured with Electron Probe X-ray Microanalysis (EPMA) for copper-gold alloys. The k-value, defined as the ratio of the Xray photon intensity of an X-ray characteristic line of the unknown sample to the corresponding one in the reference material, is a rough estimate of the mass fraction of the respective element. Basically, the mass fractions can be calculated from the k-values after applying a matrix correction procedure, which includes empirical approaches, so that traceability gets lost. Due to its physical, measurable nature, the k-value has been selected in the present PS as the primary measurand. The mass fraction has been set as the secondary (derived) measurand. Both EDX and WDX have been employed. The WDX results and the overall comparability between the k-values obtained by EDX and WDX are still in progress. KW - Interlaboratory comparison KW - EDX KW - WDX KW - EPMA KW - K-values KW - Cu-Au alloy KW - CCQM PY - 2014 DO - https://doi.org/10.1017/S1431927614005376 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 730 EP - 731 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31338 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Terborg, R. A1 - Kim, K.J. A1 - Unger, Wolfgang T1 - Measurement of atomic fractions in Cu(In,Ga)Se2 films by Auger Electron Spectroscopy (AES) and Energy Dispersive Electron Probe Microanalysis (ED-EPMA) N2 - A pilot study (PS) has been performed under the Consultative Committee for Amount of Substance (CCQM) / Surface Analysis Working Group (SAWG) with the objective to compare the atomic fractions of Cu, In, Ga and Se in CIGS alloy films. Four polycrystalline CIGS films with different atomic fractions were fabricated by variation of the relative atomic fraction of Ga on 100 mm x 100 mm soda-lime glass (SLG) substrates. Similar to real solar cells the atomic fractions of the four elements (Cu, In, Ga, Se) are not homogeneous with depth. For the analysis of the CIGS layers of about 2 μm thickness depth profiling with surface analysis techniques such as XPS, AES and SIMS was recommended. A CIGS alloy reference sample with atomic fractions certified by isotope dilution ICP-MS at KRISS has been also put at disposal by the coordinator of the comparison. The certified values were close to the atomic fractions of the samples to be analyzed. Hence, the atomic fractions of Cu, In, Ga and Se in the CIGS films could be determined by the relative sensitivity factors (RSF) derived from the reference CIGS film. The total ion intensities of the constituent elements were obtained by the total number counting (TNC) method. KW - Interlaboratory comparison KW - Auger Electron Spectroscopy (AES) KW - EDX KW - EPMA KW - CIGS KW - CCQM PY - 2014 DO - https://doi.org/10.1017/S1431927614003730 SN - 1431-9276 SN - 1435-8115 VL - 20 IS - Suppl. S 3 SP - 402 EP - 403 PB - Cambridge University Press CY - New York, NY AN - OPUS4-31339 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Schichtanalyse mit dem GD-OES-Verfahren PY - 2001 SN - 1662-3096 SN - 0040-1498 SN - 0040-148X SN - 1023-0823 VL - 7 SP - 44 EP - 45 PB - Binkert Medien CY - Laufenburg AN - OPUS4-6881 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Low pressure plasma, UV photo and wet chemical modification of graphite, graphene and carbon nano tubes N2 - Graphene is a two-dimensional carbon network with unique properties, including high mechanical stiffness, strength, and elasticity, outstanding electrical and thermal conductivity, and many others. Despite these advantages, its low solubility, poor reactivity and the limited accessibility of a well-defined basal plane are major challenges for applications. An ideal method to overcome these problems is the covalent attachment of functional molecules to its surface which enables further reactive modifications for specific applications. There is a number of different technologies for surface functionalization of graphene and related CNT materials. However, to get control on the functionalization process and to optimize the performance of the modified surfaces analytical tools for surface chemical characterization are required. X-ray absorption (NEXAFS) and photoelectron spectroscopy (XPS) have been identified to be rather powerful here. Specifically NEXAFS spectroscopy underpinned by quantum chemical spectrum simulations is unique in a way to address changes of aromaticity and defect formation at the graphene surface during functionalization. For relevant surface modification technologies, we present examples on how NEXAFS and XPS can perform well. All presented modifications aim on the production of platforms for defined functional 2D nanomaterials, as for example multifunctional hybrid architectures. In detail, we investigated: • Graphene and carbon nanotube functionalized by a Vacuum-Ultraviolet (VUV) induced photochemical process in NH3 or O2 atmospheres in order to introduce amino or hydroxy functionalities, respectively. • Br bonding on r.f. cw low pressure plasma brominated graphite surfaces by using Br2 and bromoform as plasma gases. • A wet chemical method for covalent functionalization of graphene sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. Here a reaction between 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized graphene sheets. T2 - The 17th European Conference on Applications of Surface and Interface Analysis CY - Montpellier, France DA - 24.09.2017 KW - Graphene KW - XPS KW - NEXAFS PY - 2017 AN - OPUS4-42787 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cant, D. J. H. A1 - Minelli, C. A1 - Sparnacci, K. A1 - Müller, Anja A1 - Kalbe, H. A1 - Stoger-Pollach, M. A1 - Unger, Wolfgang A1 - Werner, W. S. M. A1 - Shard, A. G. T1 - Surface-Energy Control and Characterization of Nanoparticle Coatings N2 - Accurate and reproducible measurement of the structure and properties of high-value nanoparticles is extremely important for their commercialization. A significant proportion of engineered nanoparticle systems consist of some form of nominally core-shell structure, whether by design or unintentionally. Often, these do not form an ideal core-shell structure, with typical deviations including polydispersity of the core or shell, uneven or incomplete shells, noncentral cores, and others. Such systems may be created with or without intent, and in either case an understanding of the conditions for formation of such particles is desirable. Precise determination of the structure, composition, size, and shell thickness of such particles can prove challenging without the use of a suitable range of characterization techniques. Here, the authors present two such polymer core-shell nanoparticle systems, consisting of polytetrafluoroethylene cores coated with a range of thicknesses of either polymethylmethacrylate or polystyrene. By consideration of surface energy, it is shown that these particles are expected to possess distinctly differing coating structures, with the polystyrene coating being incomplete. A comprehensive characterization of these systems is demonstrated, using a selection of complementary techniques including scanning electron microscopy, scanning transmission electron microscopy, thermogravimetric analysis, dynamic light scattering, differential centrifugal sedimentation, and X-ray photoelectron spectroscopy. By combining the results provided by these techniques, it is possible to achieve superior characterization and understanding of the particle structure than could be obtained by considering results separately. KW - Nanoparticles KW - Core-shell KW - XPS KW - Size KW - Thickness KW - Damage PY - 2020 DO - https://doi.org/10.1021/acs.jpcc.0c02161 VL - 124 IS - 20 SP - 11200 EP - 11211 PB - ACS CY - Washington DC AN - OPUS4-50899 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Sparnacci, K. A1 - Unger, Wolfgang A1 - Tougaard, S. T1 - Determining nonuniformities of core-shell nanoparticle coatings by analysis of the inelastic background of X-ray photoelectron spectroscopy survey spectra N2 - Most real core-shell nanoparticle (CSNP) samples deviate from an ideal core-shell structure potentially having significant impact on the particle properties. An ideal structure displays a spherical core fully encapsulated by a shell of homogeneous thickness, and all particles in the sample exhibit the same shell thickness. Therefore, analytical techniques are required that can identify and characterize such deviations. This study demonstrates that by analysis of the inelastic background in X-ray photoelectron spectroscopy (XPS) survey spectra, the following types of deviations can be identified and quantified: the nonuniformity of the shell thickness within a nanoparticle sample and the incomplete encapsulation of the cores by the shell material. Furthermore, CSNP shell thicknesses and relative coverages can be obtained. These results allow for a quick and straightforward comparison between several batches of a specific CSNP, different coating approaches, and so forth. The presented XPS methodology requires a submonolayer distribution of CSNPs on a substrate. Poly(tetrafluoroethylene)-poly(methyl methacrylate) and poly(tetrafluoroethylene)-polystyrene polymer CSNPs serve as model systems to demonstrate the applicability of the approach. KW - Core-shell KW - Nanoparticles KW - Inelastic background KW - Polymers KW - QUASES KW - XPS PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-511315 DO - https://doi.org/10.1002/sia.6865 SN - 0142-2421 SN - 1096-9918 VL - 52 SP - 1 EP - 8 PB - Wiley CY - Chichester AN - OPUS4-51131 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Chemical characterization of nanoparticles by PCA-assisted ToF-SIMS: a) Core-shell character, b) transformation and c) grouping studies N2 - This talk was given within the scope of the SIMS-22 conference in October 2019 in Kyoto (Japan). It deals with the surface analytical investigation of nanoparticles by PCS-assisted ToF-SIMS. This technique is applicable to core-shell nanoparticles, in order to distinguish a complete encapsulation from an incomplete encapsulation of the core by the shell material. Furthermore, the depletion process of organic nanoparticle coatings caused by UV-weathering is investigated. Finally, the significance of grouping studies for nanomaterials research and risk assessment is demonstrated. T2 - The 22nd International Conference on Secondary Ion Mass Spectrometry (SIMS-22) CY - Kyoto, Japan DA - 20.10.2019 KW - Nanoparticles KW - ToF-SIMS KW - Principal component analysis (PCA) PY - 2019 AN - OPUS4-50075 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Li, M. A1 - Schlaich, C. A1 - Kulka, M. W. A1 - Donskyi, Ievgen A1 - Schwerdtle, T. A1 - Unger, Wolfgang A1 - Haag, R. T1 - Mussel-inspired coatings with tunable wettability, for enhanced antibacterial efficiency and reduced bacterial adhesion N2 - Over the last few decades, there has been a tremendous increase in research on antibacterial surface coatings as an alternative strategy against bacterial infections. Although there are several examples of effective strategies to prevent bacterial adhesion, the effect of the wetting properties on the coating was rarely considered as a crucial factor. Here we report an in-depth study on the effect of extreme wettability on the antibacterial efficiency of a silver nanoparticles (AgNPs)-based coating. By Controlling surface polymerization of mussel-inspired dendritic polyglycerol (MI-dPG) and post-functionalization, surfaces with wetting properties ranging from superhydrophilic to superhydrophobic were fabricated. Subsequently, AgNPs were embedded into the coatings by applying in situ reduction using the free catechols-moieties present in the MI-dPG coating. The resulting polymer coatings exhibited excellent antibacterial ability against planktonic Escherichia coli (E. coli) DH5a and Staphylococcus aureus (S. aureus) SH1000. The antibacterial efficiency of the coatings was analyzed by using inductively coupled plasma mass spectrometry (ICP-MS) and bacterial viability tests. Furthermore, the Antifouling properties of the coatings in relation to the antibacterial properties were evaluated. KW - Antibacterial surface coatings KW - Silver nanoparticles KW - XPS KW - Mussel-inspired dendritic polyglycerol (MI-dPG) PY - 2019 DO - https://doi.org/10.1039/c9tb00534j SN - 2050-750X SN - 2050-7518 VL - 7 IS - 21 SP - 3438 EP - 3445 PB - The Royal Society of Chemistry AN - OPUS4-48520 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Cant, D. J. H. A1 - Müller, Anja A1 - Clifford, C. A. A1 - Unger, Wolfgang A1 - Shard, A. G. T1 - Summary of ISO/TC 201 Technical Report 23173—Surface chemical analysis—Electron spectroscopies—Measurement of the thickness and composition of nanoparticle coatings N2 - ISO Technical Report 23173 describes methods by which electron spectroscopies, including X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES) and synchrotron techniques, can be employed to calculate the Coating thicknesses and compositions of nanoparticles. The document has been developed to review and outline the current state-of-the-art for such measurements. Such analyses of core–shell nanoparticles are common within the literature, however the methods employed are varied; the relative advantages and disadvantages of These methods, and the optimal usage of each may not be clear to the general analyst. ISO Technical Report 23173 aims to clarify the methods that are available, describe them in clear terms, exhibit examples of their use, and highlight potential issues users may face. The information provided should allow analysts of electron spectroscopy data to make clear choices regarding the appropriate analysis of electron spectroscopy data from coated nanoparticle systems and provide a basis for understanding and comparing results from different methods and systems. KW - Electron spectroscopy KW - Core-shell KW - Nanoparticles KW - ISO 23173 KW - XPS KW - Thickness KW - Composition PY - 2021 DO - https://doi.org/10.1002/sia.6987 SN - 0142-2421 VL - 53 IS - 10 SP - 893 EP - 899 PB - John Wiley & Sons Ltd AN - OPUS4-52976 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, P. M. A1 - Kjærvik, Marit A1 - Willneff, E. A. A1 - Unger, Wolfgang T1 - In-depth analysis of iodine in artificial biofilm model layers by variable excitation energy XPS and argon gas cluster ion sputtering XPS N2 - Here, we present a study on agarose thin-film samples that represent a model system for the exopolysaccharide matrix of biofilms. Povidone-iodide (PVP-I) was selected as an antibacterial agent to evaluate our x-ray photoelectron spectroscopy (XPS)-based methodology to trace specific marker elements, here iodine, commonly found in organic matrices of antibiotics. The in-depth distribution of iodine was determined by XPS analyses with variable excitation energies and in combination with argon gas cluster ion beam sputter cycles. On mixed agarose/PVP-I nanometer-thin films, both methods were found to solve the analytical task and deliver independently comparable results. In the mixed agarose/PVP-I thin film, we found the outermost surface layer depleted in iodine, whereas the iodine is homogeneously distributed in the depth region between this outermost surface layer and the interface between the thin film and the substrate. Depletion of iodine from the uppermost surface in the thin-film samples is assumed to be caused by ultrahigh vacuum exposure resulting in a loss of molecular iodine (I2) as reported earlier for other iodine-doped polymers. KW - Biofilm KW - XPS KW - Argon gas cluster ion sputtering KW - Variable excitation KW - Iodine PY - 2022 DO - https://doi.org/10.1116/6.0001812 SN - 1934-8630 VL - 17 IS - 3 SP - 1 EP - 8 PB - AVS AN - OPUS4-54973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Natte, Kishore A1 - Orts Gil, Guillermo A1 - Unger, Wolfgang T1 - Morphology of nanoparticles - A characterization using high-resolution SEM N2 - Potential candidates of reference nano-materials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution) in the frame of the running large European project NanoValid. By exploiting the transmission operation mode in a SEM, known as T-SEM, it is demonstrated by means of three representative examples of nanoparticles how a quick morphological inspection up to a complete, metrological characterization is feasible. KW - Nanoparticles KW - SEM KW - TEM KW - T-SEM KW - NanoValid PY - 2013 SN - 1439-4243 SN - 1863-7809 VL - 15 IS - 1 SP - 54 EP - 56 PB - GIT-Verl. CY - Darmstadt AN - OPUS4-27925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ahmed, R. A1 - Vaishampayan, A. A1 - Cuellar-Camacho, J. L. A1 - Wight, D. J. A1 - Donskyi, Ievgen A1 - Unger, Wolfgang A1 - Grohmann, E. A1 - Haag, R. A1 - Wagner, O. T1 - Multivalent Bacteria Binding by Flexible Polycationic Microsheets Matching Their Surface Charge Density N2 - Aiming at the overall negative surface charge of bacteria, a new strategy of antibacterial agents based on large polymer-modified graphene oxide (GO) sheets is assessed. The presented flexible, polycationic Sheets match the size and charge density of the Escherichia coli surface charge density (2 × 1014 cm−2). These matching parameters create an unspecific but very strong bacteria adsorber by multivalent, electrostatic attraction. Their interaction with bacteria is visualized via atomic force and confocal microscopy and shows that they effectively bind and wrap around E. coli cells, and thereby immobilize them. The incubation of Gram-negative and -positive bacteria (E. coli and methicillin-resistant Staphylococcus aureus, MRSA) with these polycationic sheets leads to the inhibition of proliferation and a reduction of the colony forming bacteria over time. This new type of antibacterial agent acts in a different mode of Action than classical biocides and could potentially be employed in medicinal, technical, or agriculture applications. The presented microsheets and their unspecific binding of cell interfaces could further be employed as adsorber material for bacterial filtration or immobilization for imaging, analysis, or sensor technologies. KW - Surface charge KW - Bacteria KW - Graphene oxide KW - Escherichia coli KW - XPS PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509651 DO - https://doi.org/10.1002/admi.201902066 VL - 7 IS - 15 SP - 1902066 PB - WILEY-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-50965 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Traceable Size Characterization of Nanoparticles at BAM with a Zeiss Supra 40 Scanning Electron Mircroscope and a Transmission Setup T2 - Eight International Conference on the Environmental Effects of Nanoparticles and Nanomaterials (nano 2013) CY - Aix-en-Provence, France DA - 2013-07-03 PY - 2013 AN - OPUS4-28801 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Faghani, A. A1 - Gholami, M. F. A1 - Trunk, M. A1 - Müller, J. A1 - Pachfule, P. A1 - Vogl, S. A1 - Donskyi, Ievgen A1 - Li, M. A1 - Nickl, Philip A1 - Shao, J. A1 - Huang, M. R. S. A1 - Unger, Wolfgang A1 - Arenal, R. A1 - Koch, C. T. A1 - Paulus, B. A1 - Rabe, J. P. A1 - Thomas, A. A1 - Haag, R. A1 - Adeli, M. T1 - Metal-Assisted and Solvent-Mediated Synthesis of Two-Dimensional Triazine Structures on Gram Scale N2 - Covalent triazine frameworks are an emerging material class that have shown promising performance for a range of applications. In this work, we report on a metal-assisted and solvent-mediated reaction between calcium carbide and cyanuric chloride, as cheap and commercially available precursors, to synthesize two-dimensional triazine structures (2DTSs). The reaction between the solvent, dimethylformamide, and cyanuric chloride was promoted by calcium carbide and resulted in dimethylamino-s-triazine intermediates, which in turn undergo nucleophilic substitutions. This reaction was directed into two dimensions by calcium ions derived from calcium carbide and induced the formation of 2DTSs. The role of calcium ions to direct the two-dimensionality of the final structure was simulated using DFT and further proven by synthesizing molecular intermediates. The water content of the reaction medium was found to be a crucial factor that affected the structure of the products dramatically. While 2DTSs were obtained under anhydrous conditions, a mixture of graphitic material/2DTSs or only graphitic material (GM) was obtained in aqueous solutions. Due to the straightforward and gram-scale synthesis of 2DTSs, as well as their photothermal and photodynamic properties, they are promising materials for a wide range of future applications, including bacteria and virus incapacitation. KW - XPS KW - Triazine KW - 2D PY - 2020 DO - https://doi.org/10.1021/jacs.0c02399 VL - 142 IS - 30 SP - 12976 EP - 12986 PB - ACS American Chemical Society AN - OPUS4-51203 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Tougaard, S. A1 - Werner, W. S. M. A1 - Hronek, M. A1 - Kunz, Valentin A1 - Radnik, Jörg A1 - Stockmann, Jörg M. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Nirmalananthan-Budau, Nithiya A1 - Geißler, Daniel A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy N2 - Core–shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core–shell structure. To control how the particles perform with regard to their specific applications, characterization techniques are required that can distinguish an ideal from a nonideal morphology. In this work, we investigated poly(tetrafluoroethylene)–poly(methyl methacrylate) (PTFE–PMMA) and poly(tetrafluoroethylene)–polystyrene (PTFE–PS) polymer CSNPs with a constant core diameter (45 nm) but varying shell thicknesses (4–50 nm). As confirmed by transmission scanning electron microscopy (T-SEM), the shell completely covers the core for the PTFE–PMMA nanoparticles, while the encapsulation of the core by the shell material is incomplete for the PTFE–PS nanoparticles. X-ray photoelectron spectroscopy (XPS) was applied to determine the shell thickness of the nanoparticles. The software SESSA v2.0 was used to analyze the intensities of the elastic peaks, and the QUASES software package was employed to evaluate the shape of the inelastic background in the XPS survey spectra. For the first time, nanoparticle shell thicknesses are presented, which are exclusively based on the analysis of the XPS inelastic background. Furthermore, principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS) of the PTFE–PS nanoparticle sample set revealed a systematic variation among the samples and, thus, confirmed the incomplete encapsulation of the core by the shell material. As opposed to that, no variation is observed in the PCA score plots of the PTFE–PMMA nanoparticle sample set. Consequently, the complete coverage of the core by the shell material is proved by ToF-SIMS with a certainty that cannot be achieved by XPS and T-SEM. KW - XPS KW - T-SEM KW - ToF-SIMS KW - Core-shell nanoparticles PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-499165 DO - https://doi.org/10.1021/acs.jpcc.9b09258 VL - 123 IS - 49 SP - 29765 EP - 29775 PB - American Chemical Society CY - Washington, DC AN - OPUS4-49916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ortel, Erik A1 - Häusler, Ines A1 - Österle, Werner A1 - Narbey, S. A1 - Oswald, F. A1 - Andersen, I. H. A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - In-depth structural and chemical characterization of engineered TiO2 films N2 - Analytical routines for a comprehensive in-depth morphological, structural, and chemical characterization of functionalized TiO2 films by using different state-of-the-art analytical techniques are presented and discussed with the main objective to identify potential reference TiO2 coating parameters able to be certified at a later stage. TiO2 films fabricated by two different synthetic procedures as representative for two main large-scale applications were selected: (i) pulsed d.c. magnetron sputtering for photocatalytic applications and (ii) screen printing from preformed anatase nanoparticles. The screen-printed films were further loaded with a sensitizing dye for application as a dye-sensitized solar cell. Film properties such as microstructure and crystallographic texture of pulsed d.c. magnetron sputtering synthesized films were systematically studied by means of scanning nanobeam electron diffraction in a transmission electron microscope and the surface and inner morphology by scanning electron microscopy. The dye distribution over the depth of screen-printed TiO2 layers was analyzed before and after dye-loading by means of energy dispersive X-ray spectroscopy at scanning electronmicroscope, Auger electron spectroscopy and time-of-flight secondary ion mass spectrometry. The long-term goal of the present study is the improvement of quality of the TiO2 film parameters as measured by using different types of reference TiO2 coatings having specific parameters certified. T2 - 16th European Conference on Applications of Surface and Interface Analysis ECASIA'15 CY - Granada, Spain DA - 28.09.2015 KW - Mapping KW - Line scan KW - Depth profiling KW - TiO2 films KW - Crystallinity KW - Ru dye sensitizer PY - 2016 DO - https://doi.org/10.1002/sia.5966 SN - 0142-2421 SN - 1096-9918 VL - 48 SP - 664 EP - 669 PB - John Wiley & Sons, Ltd. AN - OPUS4-36791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Ionic liquids as a reference material candidate for the quick performance check of energy dispersive X-ray spectrometers for the low energy range below 1 keV N2 - Ionic liquids (ILs) are proposed as simple and efficient test materials to evaluate the performance of energy dispersive X-ray spectrometers (EDS) in the low energy range below 1 keV. By only one measurement, C Kα, N Kα, O Kα, and F Kα X-ray lines can be excited. Additionally, the S Kα line at 2.3 keV and, particularly, the S L series at 149 eV complete the picture with X-ray lines offered by the selected ILs. The well-known (certifiable) elemental composition of the ILs selected in the present study can be used to check the accuracy of results produced with the available EDS quantification routines in the low energy range, simultaneously, for several low atomic number elements. A comparison with other reference materials in use for testing the performance of EDS in the low energy range is included. KW - Ionic liquids KW - EDX KW - CRM KW - Reference material KW - Low energy KW - X-rays PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-369120 DO - https://doi.org/10.1021/acs.analchem.6b01444 SN - 0003-2700 SN - 1520-6882 VL - 88 IS - 14 SP - 6967 EP - 6970 PB - ACS Publications CY - Columbus, Ohio AN - OPUS4-36912 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kovacevic, E. A1 - Strunskus, T. A1 - Santhosh, N. M. A1 - Zavasnik, Z. A1 - Unger, Wolfgang A1 - Sauvage, T. A1 - Ammar, M.-R. A1 - Cvelbar, U. A1 - Berndt, J. T1 - Thermal stability studies of plasma deposited hydrogenated carbon nitride nanostructures N2 - Thermally stable carbon nitride nanostructures have potential applications in surface coatings and automotive fields. In this work, hydrogenated nitrogen-rich carbon nitride nanoparticles have been synthesised via low-pressure low-power plasma vapour deposition technique from methane/Nitrogen gas mixture in a dry process. Thermal stability of the initially prepared hydrogenated carbon Nitride structures has been analysed by near-edge X-ray absorption fine-structure spectroscopy (NEXAFS, insitu), Raman spectroscopy, scanning and transmission electron microscopy and nuclear reaction Analysis (NRA). Thermal studies reveal the excellent stability of the material and nitrogen-rich characteristics (N/C ratio 0.5e0.2 ± 0.01). The obtained results suggest transformation of sp3-rich as-deposited carbon Nitride into sp2-carbon phase with more graphitic features upon thermal annealing. Such in-situ thermal studies of plasma deposited carbon nitrides confirm the conversion of sp3-rich phase to sp2-rich carbon phase at the critical temperature (about 450 K), without a huge loss in nitrogen content. The analysis revealed that the material is a stable plasma deposit after this critical temperature up to >1100 K. Additionally, super hydrophilic carbon nitride nanostructure transforms into a hydrophobic surface after thermal annealing. These thermally stable hydrophobic carbon nitride nanoparticles could be used as a promising material for the hydrophobic coatings for various applications, especially for harsh conditions. KW - Carbon nanoparticles KW - Hydrogenated nanostructures KW - Plasma deposition KW - NEXAFS KW - Thermal annealing PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-536163 DO - https://doi.org/10.1016/j.carbon.2021.08.008 SN - 0008-6223 VL - 184 SP - 82 EP - 90 PB - Elsevier Ltd. AN - OPUS4-53616 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Auger electron spectroscopy N2 - An introduction in the application of Auger Electron Spectroscopy to surface chemical analysis of nanoparticles is given. Auger Electron Spectroscopy is a mature method in the field of surface chemical analysis. The chapter addresses the physical basis of the method, the principal design of recent instruments together with modes of operation and options for the presentation of spectra, as well as different approaches for qualitative (including identification of chemical species) and quantitative surface analysis of elements. An application paragraph on surface chemical analysis of nanoparticles by AES or SAM introduces the different measurement approaches and sample preparation strategies applied by analysts. The analysis of nanoparticle ensembles, the so-called selected point analysis where a narrow primary electron beam is centered on an individual nanoparticle, and chemical mapping of individual nanoparticles (or a line scan across) are addressed. Existing literature is reviewed and informative case studies presented. Limitations and pitfalls in the application of AES in surface chemical analysis of nanoparticles are also addressed. KW - Auger Electron Spectroscopy KW - Surface chemical analysis KW - Imaging surface chemical analysis KW - Nanoparticles KW - Nanotechnology PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00020-1 SP - 373 EP - 395 PB - Elsevier CY - Amsterdam AN - OPUS4-50119 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Clifford, C. A1 - Stintz, M. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Fujimoto, T. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - International standards in nanotechnologies N2 - This chapter provides an overview of what standards are, why they are important, and how they are developed. There is a focus on the work of standards committees relevant to nanotechnology measurement and characterization with tables detailing the standards that are currently available for a large number of different techniques, materials, and applications at the nanoscale. KW - Standards KW - Nanotechnology KW - Reproducibility KW - ISO KW - CEN KW - VAMAS PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00026-2 SP - 511 EP - 525 PB - Elsevier CY - Amsterdam AN - OPUS4-50165 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Shard, A. G. ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Conclusions and perspectives N2 - This chapter briefly summarizes the methods selected within this book for the characterization of nanoparticles with regard to commonly accessible properties: nanoparticle size and size distribution, shape, surface area, surface charge, aggregation state, structure, chemical composition, surface chemistry, and nanoparticle number concentration. Current progress of measurement and analysis, as far as possible according to standard operation procedures, has been the focus of this work. A number of new and less commonly used methods have not been covered, and we outline some of these in this chapter. Future challenges such as automated measurement and analysis, read-across approaches for the prediction of properties, knowledge of measurement uncertainties, the need for certified reference materials, and the necessity to complement measurements methods to obtain more reliable results are covered, and the unmet measurement requirements for real-world nanoparticles are described. KW - Physicochemical characterization KW - Standard operation procedures KW - Data correlation KW - Method development KW - Trends PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00006-7 SP - 527 EP - 534 PB - Elsevier CY - Amsterdam AN - OPUS4-50167 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Shard, A. G. A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Introduction N2 - The purpose of this book is to provide a comprehensive collection of analytical methods that are commonly used to measure nanoparticles, providing information on one, or more, property of importance. The chapters provide up-to-date information and guidance on the use of these techniques, detailing the manner in which they may be reliably employed. Within this chapter, we detail the rationale and context of the whole book, which is driven by the observation of a low level of reproducibility in nanoparticle research. The aim of the book is to encourage awareness of both the strengths and weaknesses of the various methods used to measure nanoparticles and raise awareness of the range of methods that are available. The editors of the book have, for many years, been engaged in European projects and standardization activities concerned with nanoparticle analysis and have identified authors who are experts in the various methods included within the book. This has produced a book that can be used as a definitive guide to current best practice in nanoparticle measurement. KW - Nanoparticles KW - Size distribution KW - Shape KW - Chemistry KW - Coating KW - Concentration KW - Standards KW - Charge KW - Characterisation PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00001-8 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-50166 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Donskyi, Ievgen A1 - Chen, Y. A1 - Nickl, Philip A1 - Guday, G. A1 - Qiao, H. A1 - Achasi, K. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Böttcher, C. A1 - Chen, W. A1 - Adeli, M. A1 - Haag, R. T1 - Self-degrading graphene sheets for tumor therapy N2 - Low biodegradability of graphene derivatives and related health risks are the main limiting factors for their in vivo biomedical applications. Here, we present the synthesis of enzyme-functionalized graphene sheets with self-degrading properties under physiological conditions and their applications in Tumor therapy. The synergistic enzyme cascade glucose oxidase and myeloperoxidase are covalently conjugated to the surface of graphene sheets and two-dimensional (2D) platforms are obtained that can produce sodium hypochlorite from glucose. The enzyme-functionalized graphene sheets with up to 289 nm average size are degraded into small pieces (≤40 nm) by incubation under physiological conditions for 24 h. Biodegradable graphene sheets are further loaded with doxorubicin and their ability for Tumor therapy is evaluated in vitro and in vivo. The laser-triggered release of doxorubicin in combination with the enzymatic activity of the functionalized graphene sheets results in a synergistic antitumor activity. Taking advantage of their neutrophil-like activity, fast biodegradability, high photo- and chemotherapeutic effects, the novel two-dimensional nanoplatforms can be used for tumor therapeutic applications. KW - Graphene KW - Self-degrading KW - Thumor therapy KW - XPS KW - NEXAFS PY - 2020 DO - https://doi.org/10.1039/d0nr02159h SP - 1 EP - 12 PB - The Royal Society of Chemistry AN - OPUS4-50978 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - Inspection of morphology and elemental imaging of single nanoparticles by high-resolution SEM/EDX in transmission mode N2 - In the frame of the European project NanoValid, potential candidates of reference nanomaterials are manufactured and systematically characterized in particular with respect to their morphology (shape, size and size distribution). In this study, by exploiting the transmission operation mode in a high-resolution SEM, known as transmission SEM, the potential of this methodical approach is demonstrated by means of representative examples of nanoparticles. The method enables quick and accurate morphological inspection and systematic characterization. Energy dispersive X-ray spectroscopy imaging of single nanoparticles by using the transmission mode is demonstrated as feasible, too. KW - Single nanoparticles KW - SEM KW - TEM KW - T-SEM KW - EDX KW - Imaging KW - Transmission KW - NanoValid KW - Scanning electron microscopy (SEM) KW - High-resolution KW - Transmission in SEM KW - Energy dispersive KW - X-ray spectroscopy KW - Nanoparticles KW - Characterization PY - 2014 DO - https://doi.org/10.1002/sia.5426 SN - 0142-2421 SN - 1096-9918 VL - 46 IS - 10-11 SP - 945 EP - 948 PB - Wiley CY - Chichester AN - OPUS4-31577 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Marcoulaki, E. A1 - M. López de Ipina, J. A1 - Vercauteren, S. A1 - Bouillard, J. A1 - Himly, M. A1 - Lynch, I. A1 - Witters, H. A1 - Shandilya, N. A1 - van Duuren-Stuurman, B. A1 - Kunz, Valentin A1 - Unger, Wolfgang A1 - Hodoroaba, Vasile-Dan A1 - Bard, D. A1 - Evans, G. A1 - Jensen, K. A. A1 - Pilou, M. A1 - Viitanen, A.-K. A1 - Bochon, A. A1 - Duschl, A. A1 - Geppert, M. A1 - Persson, K. A1 - Votgreave, I. A1 - Niga, P. A1 - Gini, M. A1 - Eleftheriadis, K. A1 - Scalbi, S. A1 - Caillard, B. A1 - Arevalillo, A. A1 - Frejafon, E. A1 - Aguerre-Chariol, O. A1 - Dulio, V. T1 - Blueprint for a self-sustained European Centre for service provision in safe and sustainable innovation for nanotechnology N2 - The coming years are expected to bring rapid changes in the nanotechnology regulatory landscape, with the establishment of a new framework for nano-risk governance, in silico approaches for characterisation and Risk assessment of nanomaterials, and novel procedures for the early identification and management of nanomaterial risks. In this context, Safe(r)-by-Design (SbD) emerges as a powerful preventive approach to support the development of safe and sustainable (SSbD) nanotechnology-based products and processes throughout the life cycle. This paper summarises the work undertaken to develop a blueprint for the deployment and operation of a permanent European Centre of collaborating laboratories and research organisations supporting safe Innovation in nanotechnologies. The proposed entity, referred to as “the Centre”, will establish a ‘one-stop shop’ for nanosafety-related services and a central contact point for addressing stakeholder questions about nanosafety. Its operation will rely on significant business, legal and market knowledge, as well as other tools developed and acquired through the EU-funded EC4SafeNano project and subsequent ongoing activities. The proposed blueprint adopts a demand-driven service update scheme to allow the necessary vigilance and flexibility to identify opportunities and adjust its activities and services in the rapidly evolving regulatory and nano risk governance landscape. The proposed Centre will play a major role as a conduit to transfer scientific knowledge between the Research and commercial laboratories or consultants able to provide high quality nanosafety services, and the end-users of such services (e.g., industry, SMEs, consultancy firms, and regulatory authorities). The Centre will harmonise service provision, and bring novel risk assessment and management approaches, e.g. in silico methodologies, closer to practice, notably through SbD/SSbD, and decisively support safe and sustainable innovation of industrial production in the nanotechnology industry according to the European Chemicals Strategy for Sustainability. KW - Nanotechnology KW - European Centre KW - Nano-safety KW - Nanomaterials KW - analytical service PY - 2021 DO - https://doi.org/10.1016/j.impact.2021.100337 VL - 23 SP - 100337 PB - Elsevier B.V. AN - OPUS4-52942 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Schaepe, Kaija A1 - Jungnickel, H. A1 - Heinrich, Thomas A1 - Tentschert, J. A1 - Luch, A. A1 - Unger, Wolfgang ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Secondary ion mass spectrometry N2 - This chapter provides an introduction in secondary ion mass spectrometry as one of the leading surface chemical analysis and imaging techniques with molecular specificity in the field of material sciences. The physical basics of the technique are explained along with a description of the typical instrumental setups and their modes of operation. The application paragraph specifically focuses on nanoparticle analysis by SIMS in terms of surface spectrometry, imaging, analysis in organic and complex media, and depth profiling. A review of the existing literature is provided, and selected studies are showcased. Limitations and pitfalls as well as current technical developments of SIMS application in nanoparticle surface chemical analysis are equally discussed. KW - Time-of-flight secondary ion mass spectrometry KW - Surface chemical analysis KW - Imaging KW - Nanomaterials KW - Nanoparticles KW - Core-shell PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00025-0 SP - 481 EP - 509 PB - Elsevier CY - Amsterdam AN - OPUS4-50187 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Heinrich, Thomas A1 - Darlatt, Erik A1 - Lippitz, Andreas A1 - Müller, S. A1 - Schalley, C. A1 - Unger, Wolfgang T1 - Systematic XP and NEXAFS spectroscopy studies of (ter-)pyridineterminated self-assembled monolayers and their addressability for functional molecules N2 - The chemical composition of surfaces functionalized with self-assembled monolayers (SAMs) is an important parameter that determines their performance in a broad range of applications, from immobilizing molecular machines to initiation and growth control of MOFs (Metal-Organic Frameworks). In this article, a critical Survey of XPS (X-ray photoelectron spectroscopy) and NEXAFS (near edge X-ray absorption fine structure) spectroscopy data for pyridine-functionalized monolayers on gold surfaces is presented to compile correlations that have been indiscernible before. Monolayers with aromatic backbones are compared to monolayers with aliphatic backbones. Monolayers with pyridine end-groups are compared to mixed monolayers formed terpyridine-functionalized by molecules end-groups and non-functionalized molecules. Thiol-oxidation during ageing of the SAMs in air is addressed. And finally, the addressability of the SAMs for the deposition of metal-ions and organic molecules is investigated and compared. This work consequently delivers a comprehensive set of spectroscopic data of (ter-)pyridine-terminated SAMs and their performance as template for the preparation of functional multilayers of macrocycles exhibiting a preferential orientation. KW - (ter-)pyridineterminated self-assembled monolayer KW - X-ray Photoelectron Spectroscopy (XPS) KW - NEXAFS PY - 2019 DO - https://doi.org/10.1016/j.elspec.2019.03.011 VL - 233 SP - 28 EP - 37 PB - Elsevier B.V. AN - OPUS4-48018 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Hesse, R. A1 - Denecke, R. A1 - Werner, W. A1 - Unger, Wolfgang T1 - The use of ionic liquids for the determination of the spectrometer transmission function in X-ray photoelectron spectroscopy (XPS) N2 - The uncertainty of measurement in quantitative XPS analysis can be reduced by using a calibrated spectrometer transmission function T (E), which is usually determined by taking spectra from Au, Ag, Cu and Ge elemental reference materials. However, this approach is quite time-consuming due to required sample preparation steps like sputter cleaning etc., and the relatively big number of samples to be measured. This contribution proposes the use of the ionic liquids [C2C1im][NTf2] and [C3C1im][NTf2] as reference materials for a determination of T(E). These multi-elemental samples deliver five intensive photoemission peaks, F 1s, O 1s, N 1s, C 1s and S 2p, in an energy window from 160 eV to 700 eV which is of specific interest for applications of quantitative XPS for surface chemical analysis of soft matter, one of the major applications of XPS. KW - Quantitative XPS KW - Ionic liquid KW - Transmission function PY - 2019 DO - https://doi.org/10.1016/j.elspec.2019.03.008 VL - 233 SP - 51 EP - 56 PB - Elsevier B.V. AN - OPUS4-48019 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Metrology for spatially resolved chemical analysis at the micro and nanometre scales Surface Analysis Working Group (SAWG) - Report for 17th Meeting (2018/19) N2 - The SAWG was established as an ad-hoc working group in 2003 before being established as a permanent working group. The first comparison was in 2007. Dr Unger recalled the terms of reference for the group, which paralleled those of the CCQM itself, with a focus on spatially resolved chemical surface analysis at the micro- and nano-scale. The group also had a remit to act as a forum for exchange of information on research and development of surface analysis, establish contact with relevant stakeholders and promote the development of SI traceable chemical surface measurements. The group currently had participants from 18 institutes, although five had not sent participants to recent meetings. Reporting progress on studies, Dr Unger said that P-190CCQM-K-157 (measurement of HfO2 in thin film) had been completed, and the subsequent K-157 approved is ongoing and that for CCQM-K153 (Measurement of Specific Adsorption of N2 and Kr on nonporous SiO2 at liquid nitrogen temperature by BET) was at the draft B was completed stageand distributed to CCQM WG chairpersons for approval. Dr Unger reported that CCQM-K-153 had covered measurement of specific absorption of nitrogen or krypton on nonporous silica at liquid nitrogen [ambient] temperature. This included an application of the BET method, a standard method for determination of surface area. This fitted into the ‘nonporous’ region of the SAWG measurement space, which included microporous, mesoporous and microporous regions. Of these regions, CCQM-K136 and CCQM-K153 demonstrated capability in meso- and microporous media respectively. CCQM-K153 involved two measurands; amount of absorbed gas at liquid nitrogen temperature, expressed as specific absorption, and the BET surface area. Specific absorption could in principle be traceable to the SI; BET was operationally defined. Five institutes participated. A detailed uncertainty budget was available for both measurands. Results had been excellent, with all laboratories agreeing well within their uncertainties and all in agreement with the reference value. Reporting on CCQM P190, Dr Unger described the study objective measurand (amount of substance of HfO2 in a thin film), samples and methods. After showing transmission electron microscope images obtained in the study, he briefly reviewed the conclusions. The study identified a need to handle carbon contamination, harmonise the XPS measurement protocol, determine emission angle and identify a consensus value for attenuation length. These conclusions had informed the design of the proposed ongoing K157 study approved at the 24th Meeting of te CCQM. The group planned a number of comparisons for the next three years: 2019: A pilot study on the amount of substance in a thin organic layer (previously approved). 2020: CCQMK-157, Measurement of the amount of substance of HfO2; A Key comparison on specific gas adsorption on microporous samples and a Pilot study on Homogeneous surface composition of an ionic liquid. 2021: A key comparison measuring the amount of substance in a thin organic layer. Dr Unger additionally described a recently proposed pilot study to examine chemical composition in a deep nanoscale layer. This was important for the electronics industry. Four participants had expressed interest. The measurand will be the amount of Ir(ppy)2(acac) in a thin organic layer within an organic layer stack on a silicon substrate. He also reported that SAWG had started work on characterisation of graphene material grown by chemical vapour decomposition (CVD). The work would examine coverage on the substrate, number of layers, level of disorder, uncertainty budgets associated with the measurement, and data analysis. A link to VAMAS Technical Work Area 41 “Graphene and Related 2D Materials“ would also be established. Looking forward, Dr Unger said the group had established a task group on application of Raman spectroscopy. This had important applications but was currently seen as qualitative. He presented the terms of reference for the task group for approval by the CCQM. Dr Unger reviewed the SAWG activities that have progressed the state of the art in measurement science. He listed the past and ongoing comparisons that had addressed new and challenging measurement problems, and drew attention to a number of key publications in surface analysis. He additionally described stakeholder engagement activities, including collaboration with VAMAS, input to ISO TC 201, contributions to Euramet projects, and contributions to two recent stakeholder workshops. T2 - 25th meeting of the Consultative Committee for Amount of Substance: Metrology in Chemistry and Biology (CCQM) CY - Paris, France DA - 11.04.2019 KW - Surface chemical analysis KW - Metrology KW - International Meter Convention PY - 2019 AN - OPUS4-48020 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Park, J. A1 - Kim, G. B. A1 - Lippitz, Andreas A1 - Kim, Y. M. A1 - Jung, D. A1 - Unger, Wolfgang A1 - Kim, Y.-P. A1 - Lee, T. G. T1 - Plasma-polymerized antifouling biochips for label-free measurement of protease activity in cell culture media N2 - We report polyethylene glycol (PEG)-grafting antifouling surfaces using a plasma copolymerized (PcP) technique to monitor protease activity in complex media. By varying the mixing ratio of the PEG and ethylenediamine (EDA) precursors, the PcP-PEG-EDA (PcP-PE) film was able to easily control surface amine density with good preservation of the internal PEG structure. We found that nonspecific protein adsorption was dramatically reduced in serum-containing media on the PcP-PE films, as opposed to that on plasma polymerized-EDA (PP-E) films without PEG. When SPR sensor chips coated with PcP-PE film were employed to detect protease activity, biotinylated luciferase probes (luciferase-peptide-biotin) on streptavidin-conjugated SPR chips enabled real-time and label-free measurement of matrix metalloproteinase activity in cell culture media. Owing to its excellent antifouling ability, this newly developed method boasts minimal nonspecific binding and can serve as a biochip platform to promote a wide range of applications in the biological field. KW - Polyethylene glycol (PEG)-grafting antifouling surface KW - Biochip KW - ATR-FTIR spectroscopy KW - XPS KW - NEXAFS KW - Plasma PY - 2019 DO - https://doi.org/10.1016/j.snb.2018.10.123 SN - 0925-4005 VL - 281 SP - 527 EP - 534 PB - Elsevier B.V. AN - OPUS4-46463 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Natte, Kishore A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 1, Inter-laboratory comparison on measurand particle size/particle size distribution - Report of the results N2 - An inter-laboratory comparison on the particle size, expressed as mean diameter d, of nanoscaled SiO2 (#14 BAM Silica (see NanoValid DoW, D.5.41/5.42)) has been performed. The majority of participants used Dynamic Light Scattering (DLS). A few used Electron Microscopy as method. Following methods had been applied by only one partner, respectively: Small Angle X-ray Scattering, Analytical Ultracentrifugation, Atomic Force Microscopy and Atomizer with electric mobility spectrometer. KW - Nanoparticle size measurement KW - Silica nanoparticles KW - Inter-laboratory comparison KW - EU FP7 project NanoValid PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-488117 DO - https://doi.org/10.5281/zenodo.3380570 SP - 1 EP - 23 PB - Zenodo CY - Geneva AN - OPUS4-48811 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Donskyi, Ievgen A1 - Azab, W. A1 - Cuellar-Camach, J. L. A1 - Guday, G. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Osterrieder, K. A1 - Adeli, M. A1 - Haag, R. T1 - Functionalized nanographene sheets with high antiviral activity through synergistic electrostatic and hydrophobic interactions N2 - As resistance to traditional drugs emerges for treatment of Virus infections, the need for new methods for virus inhibition increases. Graphene derivatives with large surface areas have shown strong activity against different viruses. However, the inability of current synthetic protocols to accurately manipulate the structure of graphene sheets in order to control their antiviral activity remains a major challenge. In this work, a series of graphene derivatives with defined polyglycerol sulfate and fatty amine functionalities have been synthesized and their interactions with herpes simplex Virus type 1 (HSV-1) are investigated. While electrostatic interactions between polyglycerol sulfate and virus particles trigger the binding of graphene to virus, alkyl chains induce a high antiviral activity by secondary hydrophobic interactions. Among graphene sheets with a broad range of alkyl chains, (C3–C18), the C12-functionalized sheets showed the highest antiviral activity, indicating the optimum synergistic effect between electrostatic and hydrophobic interactions, but this derivative was toxic against the Vero cell line. In contrast, sheets functionalized with C6- and C9-alkyl chains showed low toxicity against Vero cells and a synergistic Inhibition of HSV-1. This study shows that antiviral agents against HSV-1 can be obtained by controlled and stepwise functionalization of graphene sheets and may be developed into antiviral agents for future biomedical applications. KW - Functionalized nanographene KW - X-ray Photoelectron Spectroscopy (XPS) KW - NEXAFS KW - Antiviral activity PY - 2019 DO - https://doi.org/10.1039/c9nr05273a SN - 2040-3364 VL - 11 IS - 34 SP - 15804 EP - 15809 PB - The Royal Society of Chemistry AN - OPUS4-48807 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 3 Inter-laboratory comparison on measurand specific surface area (BET) of nanoparticular Titania (#15 BAM Titania): Report of the results N2 - This Report describes an inter-laboratory comparison aiming on the establishment of the used method (BET) as a reference method. Another purpose was the certification of the porous reference material #15 BAM Titania as CRM BAM-P110 (cf. D 5.41/42). The certified values determined by nitrogen ad-sorption at 77.3 K according to the international standards ISO 15901-2 and ISO 9277 are summarized in the Table below. KW - Inter-laboratory comparison KW - Specific Surface Area (BET) KW - Nanoparticular TiO2 (Anatase) KW - EU FP7 project NanoValid PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-488491 DO - https://doi.org/10.5281/zenodo.3379612 SP - 1 EP - 22 PB - Zenodo CY - Geneva AN - OPUS4-48849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Rades, Steffi A1 - Natte, Kishore A1 - Unger, Wolfgang T1 - NanoValid D.5.47 Annex 2 Inter-laboratory comparison on measurand surface charge (Zeta Potential) of silica particles: Report of the results N2 - An inter-laboratory comparison on the surface charge, expressed as zeta potential ζ, of nanoscaled SiO2 has been performed using #14 BAM Silica (see D.5.41/5.42) nanoparticles. The comparability of results delivered by participants has been tested. The Task 5.4 of NanoValid is designed to test, compare and validate current methods to measure and characterize physicochemical properties of selected engineered nanoparticles. The measurand is Surface charge expressed as zeta-Potential. The measurements are to be accompanied by estimates of the uncertainties at a confidence level of 95%, deduced from the standard uncertainties. Therefore an uncertainty budget comprising statistical (Type A) and systematic (Type B) errors has to be established and delivered for the measurand. The protocol comprises two Annexes addressing the establishment of uncertainty budgets following GUM. The final goal of the comparison is to identify those methods of measurement which have potential as reference methods in pc characterization of nanoparticles for the determination of a given measurand. KW - Inter-laborator comparison KW - Surface charge KW - Zeta potential KW - Uncertainty budget KW - Silica nanoparticles KW - NanoValid PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-488483 DO - https://doi.org/10.5281/zenodo.3379815 SP - 1 EP - 10 PB - Zenodo CY - Geneva AN - OPUS4-48848 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Daneshnia, S. A1 - Adeli, M. A1 - Yari, A. A1 - Shams, A. A1 - Donskyi, Ievgen A1 - Unger, Wolfgang T1 - Low temperature functionalization of two-dimensional boron nitride for electrochemical sensing N2 - Two-dimensional hexagonal boron nitride(h-BN)as an emerging nanomaterial exhibits uniquephysicochemical properties, making it suitable candidate for a wide spectrum of applications.However, due to its poor functionality, the processability of this nanomaterial is low. In this work, wereport on a straightforward and scalable approach for the functionalization of h-BN by nitrene[2+1]cycloaddition at room temperature. The triazine-functionalized h-BN(Trz-BNs)showed ahigh reactivity toward nucleophiles, through which post-modifications are performable. The post-modification of Trz-BNs by L-cysteine was studied using cyclic voltammetry and differential pulsevoltammetry. Taking advantage of the scalable and straightforward functionalization as well as abilityof triazine functional groups for the controlled post-modifications, Trz-BNs is a promisingnanoplatform for a wide range of future applications. KW - Two-dimensional hexagonal boron nitride(h-BN) KW - Nitrene[2+1]cycloaddition KW - Post-modification by L-cysteine KW - Electrochemical sensing KW - XPS PY - 2019 DO - https://doi.org/10.1088/2053-1591/ab317b SN - 2053-1591 VL - 6 IS - 9 SP - 095076, 1 EP - 11 PB - IOP Publishing Ltd AN - OPUS4-48635 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vlajića, M. A1 - Unger, Wolfgang A1 - Bruns, J. A1 - Rueck-Braun, K. T1 - Photoswitching of fulgimides in different environments on silicon surfaces N2 - Reversible light-modulation of fulgimide based monolayers on Si(1 1 1) and Si(1 0 0) was investigated using ATR-FTIR spectroscopy. Fulgimide monolayers were prepared from neat COOH-terminated SAMs on Si(1 1 1) obtained from methyl undec-10-enoate, (1:1)-diluted COOH-terminated monolayers on Si(1 1 1), and GPTMS monolayers on Si(1 0 0). The epoxy-terminated monolayer on oxidized Si(1 0 0) was characterized with ellipsometry, XPS, as well as contact angle measurements, and ATR-FTIR spectroscopy revealed a strong influence of toluene water content on reproducible high-quality monolayer formation. The results of this study show that environmental polarity has a strong influence on fulgimide imide IR band locations and read-out options for the two photostationary states PSS(365 nm), containing E/Z- and C-isomers, and PSS(545 nm), with solely the E/Zisomers. Neat COOH-terminated monolayers on flat Si(1 1 1) have the Advantage of high functional Group concentration, orientation and stability, and an upright arrangement of fulgimide head groups. KW - Surface functionalization KW - Photoswitchable monolayers KW - ATR-FTIR spectroscopy KW - XPS PY - 2019 DO - https://doi.org/10.1016/j.apsusc.2018.09.159 SN - 0169-4332 SN - 1873-5584 VL - 465 SP - 686 EP - 692 PB - Elsevier B.V. AN - OPUS4-46276 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dietrich, Paul M. A1 - Lange, Nele A1 - Lippitz, Andreas A1 - Holzweber, Markus A1 - Kulak, N. A1 - Unger, Wolfgang T1 - Click chemistry on silicon nitride for biosensor fabrication N2 - Biosensors are of essential importance in medical and biological diagnostics. Often, they are produced using silane chemistry on glass or silicon oxide surfaces. However, controlling that silane chemistry is challenging. Here, we present an alternative strategy to form functional organic layers and biosensors on silicon Nitride (Si3N4). H-terminated Si3N4 films are used to generate reactive azide groups by various azidation methods. Biomolecular probes can then be immobilized using click chemistry reactions with the azide groups and due to its high sensitivity in XPS a fluorine-substituted test alkyne was utilized to optimize click chemistry conditions. After that a biotinylated alkyne was clicked to Si3N4 surfaces followed by immobilization of streptavidin as analyte in a model assay. The functionalized surfaces were thoroughly characterized by surface chemical analysis using X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS)spectroscopy. KW - Biosensors KW - H-terminated Si3N4 films KW - Click chemistry KW - X-ray photoelectron spectroscopy KW - Near edge X-ray absorption fine structure KW - Streptavidin binding PY - 2019 DO - https://doi.org/10.1016/j.apsusc.2019.03.002 SN - 0169-4332 VL - 481 SP - 10 EP - 15 PB - Elsevier B.V. AN - OPUS4-48634 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Jang, J. S. A1 - Kim, A. S. A1 - Suh, J.K. A1 - Chung, Y.-D. A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Kang, H. J. A1 - Popov, O. A1 - Popov, I. A1 - Kuselman, I. A1 - Lee, Y. H. A1 - Sykes, D. E. A1 - Wang, M. A1 - Wang, H. A1 - Ogiwara, T. A1 - Nishio, M. A1 - Tanuma, S. A1 - Simons, D. A1 - Szakal, C. A1 - Osborn, W. A1 - Terauchi, S. A1 - Ito, M. A1 - Kurokawa, A. A1 - Fujiimoto, T. A1 - Jordaan, W. A1 - Jeong, C. S. A1 - Havelund, R. A1 - Spencer, S. A1 - Shard, A. A1 - Streeck, C. A1 - Beckhoff, B. A1 - Eicke, A. A1 - Terborg, R. T1 - CCQM pilot study P-140: Quantitative surface analysis of multi-element alloy films N2 - A pilot study for the quantitative surface analysis of multi-element alloy films has been performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study is to ensure the equivalency in the measurement capability of national metrology institutes for the quantification of multi-element alloy films. A Cu(In,Ga)Se2 (CIGS) film with non-uniform depth distribution was chosen as a representative multi-element alloy film. The atomic fractions of the reference and the test CIGS films were certified by isotope dilution - inductively coupled plasma/mass spectrometry. A total number counting (TNC) method was used as a method to determine the signal intensities of the constituent elements, which are compared with their certified atomic fractions. The atomic fractions of the CIGS films were measured by various methods, such as Secondary Ion Mass Spectrometry (SIMS), Auger Electron Spectroscopy (AES), X-ray Photoelectron Spectroscopy (XPS), X-Ray Fluorescence (XRF) analysis and Electron Probe Micro Analysis (EPMA) with Energy Dispersive X-ray Spectrometry (EDX). Fifteen laboratories from eight National Metrology Institutes (NMIs), one Designated Institute (DI) and six non-NMIs participated in this pilot study. Although the average atomic fractions of 18 data sets showed rather poor relative standard deviations of about 5.5 % to 6.8 %, they were greatly improved to about 1.5 % to 2.2 % by excluding 5 strongly deviating data sets from the average atomic fractions. In this pilot study, the average expanded uncertainties of SIMS, XPS, AES, XRF and EPMA were 3.84%, 3.68%, 3.81%, 2.88% and 2.90%, respectively. These values are much better than those in the key comparison K-67 for composition of a Fe-Ni alloy film. As a result, the quantification of CIGS films using the TNC method was found to be a good candidate as a subject for a CCQM key comparison. KW - CCQM KW - Pilot study KW - Surface analysis KW - Alloy films KW - CIGS PY - 2015 DO - https://doi.org/10.1088/0026-1394/52/1A/08017 SN - 0026-1394 SN - 1681-7575 VL - 52 IS - Technical Supplement SP - Article 08017 PB - Inst. of Physics Publ. CY - Bristol AN - OPUS4-35306 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Hodoroaba, Vasile-Dan A1 - Salge, T. A1 - Wirth, Thomas A1 - Lobera, M.P. A1 - Labrador, R.H. A1 - Natte, Kishore A1 - Behnke, Thomas A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles N2 - The combination of complementary characterization techniques such as SEM (Scanning Electron Microscopy), T-SEM (Scanning Electron Microscopy in Transmission Mode), EDX (Energy Dispersive X-ray Spectroscopy) and SAM (Scanning Auger Microscopy) has been proven to be a powerful and relatively quick characterization strategy for comprehensive morphological and chemical characterization of individual silica and titania nanoparticles. The selected “real life” test materials, silica and titania, are listed in the OECD guidance manual as representative examples because they are often used as commercial nanomaterials. Imaging by high resolution SEM and in the transmission mode by T-SEM allows almost simultaneous surface and in-depth inspection of the same particle using the same instrument. EDX and SAM enable the chemical characterization of bulk and surface of individual nanoparticles. The core–shell properties of silica based materials are addressed as well. Titania nominally coated by silane purchased from an industrial source has been found to be inhomogeneous in terms of chemical composition. KW - surface and in-depth inspection KW - silica nanoparticles KW - titania nanoparticles PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-316296 DO - https://doi.org/10.1039/c4ra05092d SN - 2046-2069 VL - 4 IS - 91 SP - 49577 EP - 49587 PB - RSC Publishing CY - London AN - OPUS4-31629 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Kim, J.W. A1 - Moon, D.W. A1 - Wirth, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Jordaan, W. A1 - Staden, M.v. A1 - Prins, S. A1 - Wang, H. A1 - Song, X. A1 - Zhang, L. A1 - Fujimoto, T. A1 - Kojima, I. T1 - Final report on key comparison K67 and parallel pilot study P108: measurement of composition of a thin Fe-Ni alloy film N2 - The Key Comparison K67 and the parallel Pilot Study P108 on quantitative analysis of thin alloy films have been completed in the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of these inter-laboratory comparisons is to determine the degree of equivalence in the measurement capability of national metrology institutes (NMIs) and designated institutes (DIs) for the determination of the composition of thin alloy films. The measurand is expressed in atomic percent. A Fe-Ni alloy film with a certified composition was available for the participants of the inter-laboratory comparison. It has been used as a reference specimen to determine the relative sensitivity factors (RSF) of Fe and Ni for the different analytical methods used by the participants to determine the composition of the test sample. As was shown in the preceding Pilot Study P98, the degrees of equivalence in the measurement capabilities of the participants can be improved in that way. The composition of the reference specimen was certified by inductively coupled plasma mass spectrometry (ICP-MS) using the isotope dilution method. The in-depth and lateral homogeneity, determined in terms of elemental composition, of the certified reference sample and the unknown test sample were confirmed by secondary ion mass spectrometry (SIMS) using C60 primary ions by the leading laboratory. Five laboratories participated in the key comparison. Four of them used x-ray photoelectron spectroscopy (XPS) and one Auger electron spectroscopy (AES). One laboratory participated in the parallel P108 pilot study using electron probe micro analysis with an energy-dispersive spectrometer (ED EPMA) and XPS. KW - XPS KW - AES KW - EDX KW - Fe-Ni alloy film KW - Key comparison KW - CCQM PY - 2010 DO - https://doi.org/10.1088/0026-1394/47/1A/08011 SN - 0026-1394 SN - 1681-7575 VL - 47 IS - 1A SP - 08011-1 - 08011-15 PB - Inst. of Physics Publ. CY - Bristol AN - OPUS4-21045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Unger, Wolfgang A1 - Kim, J.W. A1 - Moon, D.W. A1 - Gross, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Schmidt, Dieter A1 - Wirth, Thomas A1 - Jordaan, W. A1 - van Staden, M. A1 - Prins, S. A1 - Zhang, L. A1 - Fujimoto, T. A1 - Song, X.P. A1 - Wang, H. T1 - Inter-laboratory comparison: quantitative surface analysis of thin Fe-Ni alloy films N2 - An international interlaboratory comparison of the measurement capabilities of four National Metrology Institutes (NMIs) and one Designated Institute (DI) in the determination of the chemical composition of thin Fe-Ni alloy films was conducted via a key comparison (K-67) of the Surface Analysis Working Group of the Consultative Committee for Amount of Substance. This comparison was made using XPS (four laboratories) and AES (one laboratory) measurements. The uncertainty budget of the measured chemical composition of a thin alloy film was dominated by the uncertainty of the certified composition of a reference specimen which had been determined by inductively coupled plasma mass spectrometry using the isotope dilution method. Pilot study P-98 showed that the quantification using relative sensitivity factors (RSFs) of Fe and Ni derived from an alloy reference sample results in much more accurate result in comparison to an approach using RSFs derived from pure Fe and Ni films. The individual expanded uncertainties of the participants in the K-67 comparison were found to be between 2.88 and 3.40 atomic %. The uncertainty of the key comparison reference value (KCRV) calculated from individual standard deviations and a coverage factor (k) of 2 was 1.23 atomic %. KW - Quantification KW - Fe-Ni alloy KW - Uncertainty KW - Key comparison KW - Traceability PY - 2012 DO - https://doi.org/10.1002/sia.3795 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 2 SP - 192 EP - 199 PB - Wiley CY - Chichester AN - OPUS4-24505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bresch, Harald A1 - Unger, Wolfgang A1 - Schulte, Petra T1 - Nanotechnologie Aktivitäten der BAM N2 - Die Präsentation gibt einen Überblick über die verschiedenen Aktivitäten der BAM im Bereich der Nanotechnologie mit den Schwerpunkten Nanopartikel und Nanosicherheit. Es wird sowohl die Transportsicherheit, als auch die Sicherheit von Batterien mit Nanopartikeln angesprochen. Verschiedene BAM-Projekte zum Thema Nano werden vorgestellt, beginnend mit relevanten REFOPlanprojekten über die Erstellung der OECD nanoTG110 bis hin zu EU-Projekten zur Standardisierung von Messungen an Nanomaterialien, hier insbesondere AEROMET, NanoDefine, NanoValid und EC4SafeNano. T2 - Nano-Behördenklausur der Bundesoberbehörden CY - Berlin, Germany DA - 02.11.2017 KW - Nano KW - Nanotechnologie KW - Nanopartikel KW - Nanosicherheit KW - Nanoanalytik PY - 2017 AN - OPUS4-42793 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - NEXAFS and XPS analysis of functionalized graphene surfaces for bio applications N2 - Graphene prepared from Graphene oxide (GO) is used as a platform for functional 2D nanomaterials with diverse applications ranging from bios ensors to antimicrobial surfaces. C and N K-edge NEXAFS and XPS spectroscopies at BESSY’s HE-SGM beamline have been used to prove and control covalent functionalization of graphenic materials at ambient conditions for the synthesis of functional 2D-surfaces. T2 - 8th Jouint BER II and BESSY II User Meeting CY - Berlin, Germany DA - 7.12.2016 KW - XPS KW - NEXAFS KW - Graphene PY - 2016 AN - OPUS4-38683 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Marinenko, R.B. A1 - Small, J.A. A1 - Unger, Wolfgang T1 - EPMA on copper-gold alloys - a CCQM/SAWG pilot study N2 - CCQM (Consultative Committee for Amount of Substance - Metrology in Chemistry) is an international body of the Meter Convention (BIPM) established as a framework of National Metrology Institutes running inter-laboratory of comparisons to demonstrate the international comparability of chemical measurements, with traceability to international or national reference standards. In 2003 the surface analysis working group (SAWG) was established at CCQM and since then several inter-laboratory comparisons in the field of EPMA have been carried out. In many cases the EPMA results deviated significantly from each other and the expanded uncertainties were greater than expected. Both methods EDS and WDS were employed. However, light elements such as carbon and nitrogen were the major elements analyzed and it is known that the corresponding lowenergy characteristic X-ray lines are more challenging to quantify by EPMA than the higher energy lines of elements with higher atomic numbers. Moreover, the standards selected and their qualities were variable, the quantification models were different, and the acquisition parameters were not specified sufficiently in the analysis instructions. KW - EPMA KW - EDX KW - WDX KW - CCQM KW - Pilot study PY - 2011 DO - https://doi.org/10.1017/S1431927611005150 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - Suppl. 2 SP - 856 EP - 857 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26752 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Unger, Wolfgang A1 - Jenett, H. A1 - Hoffmann, V. A1 - Hagenhoff, B. A1 - Kayser, S. A1 - Wetzig, K. T1 - Depth profiling of electrically non-conductive layered samples by RF-GDOES and HFM plasma SNMS N2 - The work is intended to compare the capabilities of two similar depth profiling techniques to analyse electrically non-conductive samples. In order to get a better evaluation of the depth resolution, various multilayer sandwiches, such as SiO2/TiO2 and Si3N4/SiO2 deposited on glass substrates have been investigated. Optimised depth profiles are presented for both methods, glow discharge optical emission spectrometry (GDOES) and radiofrequency mode (known as “HFM” in the SNMS literature) of plasma secondary neutral mass spectrometry (SNMS). The optimisation procedure, necessary to get the best set of plasma parameters, which result in the optimal depth resolution, is also described for one selected sample. Additionally, sputtering crater profilometry was carried out in order to check out the flatness of the sputtered crater. The influence of the thickness of the sample substrate on the sputtering rate is discussed. Finally, advantages and disadvantages of the use of these two depth profiling methods, especially for the non-conductive samples, are concluded from this comparative study. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of a cross-sectioned sample was carried out in order to get supplementary information. KW - rf-Glow discharge KW - HFM plasma SNMS KW - Non-conductive layered samples KW - Depth resolution KW - Crater shape KW - ToF-SIMS PY - 2001 DO - https://doi.org/10.1016/S0169-4332(01)00259-8 SN - 0169-4332 SN - 1873-5584 VL - 179 IS - 1-4 SP - 30 EP - 37 PB - North-Holland CY - Amsterdam AN - OPUS4-6882 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Schichtanalyse mit der optischen Glimmentladungsspektroskopie (GD-OES) PY - 2000 SN - 1662-3096 SN - 0040-1498 SN - 0040-148X SN - 1023-0823 PB - Binkert Medien CY - Laufenburg AN - OPUS4-1055 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Swaraj, S. A1 - Dietrich, Paul A1 - Unger, Wolfgang T1 - Simultaneous surface and bulk sensitive XAS measurements of magnetic particle clusters N2 - Magnetic iron oxide nanoparticle clusters (mnpc) coated with organic stabilizers were investigated using scanning transmission x-ray microscopy (STXM). Simultaneous surface and bulk sensitive Fe L3 edge absorption spectra, obtained using a photomultiplier tube and a channeltron, were used to detect subtle changes in the oxidation state in the surface and bulk of Iron Oxide mnpc. The effectiveness of this mode of STXM operation is demonstrated for These nanoparticle clusters. T2 - X-Ray Microscopy Conference 2016 (XRM 2016) CY - Oxford, UK DA - 15.08.2016 KW - Scanning transmission x-ray microscopy (STXM) KW - Magnetic nanoparticles KW - Fe L3 edge absorption spectra PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-435907 UR - http://iopscience.iop.org/article/10.1088/1742-6596/849/1/012014/meta DO - https://doi.org/10.1088/1742-6596/849/1/012014 VL - 849 SP - 012014, 1 EP - 012014, 4 PB - IOP Publishing AN - OPUS4-43590 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kaur, I. A1 - Ellis, L.-J. A1 - Romer, I. A1 - Tantra, R. A1 - Carriere, M. A1 - Allard, S. A1 - Mayne-L'Hermite, M. A1 - Minelli, C. A1 - Unger, Wolfgang A1 - Potthoff, A. A1 - Rades, Steffi A1 - Valsami-Jones, E. T1 - Dispersion of nanomaterials in aqueous media: Towards protocol optimization N2 - The sonication process is commonly used for de-agglomerating and dispersing nanomaterials in aqueous based media, necessary to improve homogeneity and stability of the suspension. In this study, a systematic step-wise approach is carried out to identify optimal sonication conditions in order to achieve a stable dispersion. This approach has been adopted and shown to be suitable for several nanomaterials (cerium oxide, zinc oxide, and carbon nanotubes) dispersed in deionized (DI) water. However, with any change in either the nanomaterial type or dispersing medium, there needs to be optimization of the basic protocol by adjusting various factors such as sonication time, power, and sonicator type as well as temperature rise during the process. The approach records the dispersion process in detail. This is necessary to identify the time Points as well as other above-mentioned conditions during the sonication process in which there may be undesirable changes, such as damage to the particle surface thus affecting surface properties. Our goal is to offer a harmonized approach that can control the Quality of the final, produced dispersion. Such a guideline is instrumental in ensuring dispersion quality repeatability in the nanoscience community, particularly in the field of nanotoxicology. KW - Dispersion of nanomaterials KW - Aqueous media KW - Protocol development PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-435886 UR - https://www.jove.com/video/56074 DO - https://doi.org/10.3791/56074 SN - 1940-087X IS - 130 SP - e560741, 1 EP - e560741, 23 PB - MyJove Corp. CY - Cambridge, MA, USA AN - OPUS4-43588 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Heinrich, Thomas A1 - Traulsen, Christoph Hans-Henning A1 - Darlatt, Erik A1 - Richter, S. A1 - Poppenberg, J. A1 - Traulsen, N.L. A1 - Linder, I. A1 - Lippitz, Andreas A1 - Dietrich, Paul A1 - Dib, B. A1 - Unger, Wolfgang A1 - Schalley, C.A. T1 - The versatility of 'Click' reactions at surfaces: Molecular recognition at interfaces N2 - In order to investigate molecular recognition on surfaces, an azide-functionalized monolayer was deposited on gold. The monolayer was characterized by X-ray photoelectron spectroscopy (XPS) and angle-resolved near-edge X-ray absorption fine structure (NEXAFS) experiments and the decomposition of the azide upon irradiation with X-ray beams was investigated. Subsequently, various alkyne-functionalized host and guest molecules were attached to the azide by 1,3-dipolar cycloaddition. These modified surfaces and their host–guest chemistry were analysed by XPS and angle-resolved NEXAFS. The reversibility of guest binding was shown for one example as a proof of principle. KW - 'Click' reaction KW - Azide-terminated surfaces KW - SAMs KW - Host guest molecules KW - Molecular recognition at interfaces PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-306463 DO - https://doi.org/10.1039/C4RA01730G SN - 2046-2069 VL - 4 IS - 34 SP - 17694 EP - 17702 PB - RSC Publishing CY - London AN - OPUS4-30646 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schwarz, F. A1 - Heinrich, Thomas A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Schalley, C. T1 - A photoswitchable rotaxane operating in monolayers on solid support N2 - A novel photoswitchable rotaxane was synthesised and its switching behaviour in solution was analysed with NMR and UV-Vis. A monolayer of rotaxanes was deposited on glass surfaces and the on-surface photoswitching was investigated. Angle-resolved NEXAFS spectra revealed a preferential orientation that reversibly changes upon switching. KW - XPS KW - NEXAFS KW - Photoswitchable rotaxane KW - Self assembly PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-386814 DO - https://doi.org/10.1039/c6cc08586e SN - 0022-4936 SN - 1364-548X SN - 0009-241x SN - 1359-7345 VL - 52 IS - 100 SP - 14458 EP - 14461 PB - Royal Society of Chemistry (RSC) AN - OPUS4-38681 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ehlert, Christopher A1 - Holzweber, Markus A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Saalfrank, Peter T1 - A detailed assignment of NEXAFS resonances of imidazolium based ionic liquids N2 - In Near Edge X-Ray Absorption Fine Structure (NEXAFS) spectroscopy X-Ray photons are used to excite tightly bound core electrons to low-lying unoccupied orbitals of the system. This technique offers insight into the electronic structure of the system as well as useful structural information. In this work, we apply NEXAFS to two kinds of imidazolium based ionic liquids ([CnC₁im]⁺[NTf₂]⁻ and [C₄C₁im]⁺[I]⁻). A combination of measurements and quantum chemical calculations of C K and N K NEXAFS resonances is presented. The simulations, based on the transition potential density functional theory method (TP-DFT), reproduce all characteristic features observed by the experiment. Furthermore, a detailed assignment of resonance features to excitation centers (carbon or nitrogen atoms) leads to a consistent interpretation of the spectra. KW - Ionic liquids KW - NEXAFS KW - DFT spectrum simulations PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-367223 DO - https://doi.org/10.1039/c5cp07434g SN - 1463-9076 SN - 1463-9084 VL - 18 IS - 12 SP - 8654 EP - 8661 PB - Royal Society of Chemistry CY - Cambridge, UK AN - OPUS4-36722 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Straub, F. A1 - Wirth, Thomas A1 - Holzlechner, G. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Real Time Imaging of Deuterium in a Duplex Stainless Steel Microstructure by Time-of-Flight SIMS N2 - For more than one century, hydrogen assisted degradation of metallic microstructures has been identified as origin for severe technical component failures but the mechanisms behind have not yet been completely understood so far. Any in-situ observation of hydrogen transport phenomena in microstructures will provide more details for further elucidation of these degradation mechanisms. A novel experiment is presented which is designed to elucidate the permeation behaviour of deuterium in a microstructure of duplex stainless steel (DSS). A hydrogen permeation cell within a TOF-SIMS instrument enables electrochemical charging with deuterium through the inner surface of the cell made from DSS. The outer surface of the DSS permeation cell exposed to the vacuum has been imaged by TOF-SIMS vs. increasing time of charging with subsequent chemometric treatment of image data. This in-situ experiment showed evidently that deuterium is permeating much faster through the ferrite phase than through the austenite phase. Moreover, a direct proof for deuterium enrichment at the austenite-ferrite interface has been found. KW - Characterization and analytical techniques KW - Corrosion KW - Imaging technique KW - Mass spectrometry PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-353872 UR - http://www.nature.com/articles/srep19929 DO - https://doi.org/10.1038/srep19929 SN - 2045-2322 VL - 6 IS - 19929 SP - 1 EP - 7 PB - nature publishing group CY - London, United Kingdom AN - OPUS4-35387 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobol, Oded A1 - Holzlechner, Gerald A1 - Nolze, Gert A1 - Wirth, Thomas A1 - Eliezer, D. A1 - Böllinghaus, Thomas A1 - Unger, Wolfgang T1 - Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) imaging of deuterium assisted cracking in a 2205 duplex stainless steel microstructure N2 - In the present work, the influence of deuterium on the microstructure of a duplex stainless steel type EN 1.4462 has been characterized by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) supported by scanning electron microscopy (SEM), focused ion beam (FIB), electron back scattered diffraction(EBSD) and energy dispersive x-ray (EDX) investigations. Characterization has been carried out before and after electrochemical charging with deuterium which has been used as a tracer, due to its similar behavior to hydrogen in the steel microstructure. In a first approach, the distribution of the deuterium occurring at temperatures above 58 °C has been visualized. Further it turned out that sub-surface micro blisters are formed in the ferrite-austenite interface, followed by the formation of needle shaped plates and subsequent cracking at the ferrite surface. In the austenite phase, parallel cracking alongside twins and hexagonal close packed (martensitic) regions has been observed. In both phases and even in the apparent interface, cracking has been associated with high deuterium concentrations, as compared to the surrounding undamaged microstructure. Sub-surface blistering in the ferrite has to be attributed to the accumulation and recombination of deuterium at the ferrite-austenite interface underneath the respective ferrite grains and after fast diffusing through this phase. Generally, the present application of chemometric imaging and structural analyses allows characterization of hydrogen assisted degradation at a sub-micron lateral resolution. KW - ToF-SIMS KW - Hydrogen assisted cracking KW - Hydrogen embrittlement KW - SEM KW - FIB KW - EBSD PY - 2016 UR - http://www.sciencedirect.com/science/article/pii/S0921509316310334 DO - https://doi.org/10.1016/j.msea.2016.08.107 SN - 0921-5093 VL - 676 SP - 271 EP - 277 PB - Elsevier B.V. AN - OPUS4-37298 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Steiner, S. A1 - Heldt, J. A1 - Sobol, Oded A1 - Unger, Wolfgang A1 - Frömeling, T. T1 - Influence of oxygen vacancies on core-shell formation in solid solutions of (Na,Bi)TiO3 and SrTiO3 N2 - Solid solutions of (Na,Bi)TiO3 (NBT) and SrTiO3 (ST) are materials of interest for high-strain or high-energy density capacitor applications. Often, they exhibit chemical heterogeneity and develop core-shell structures during regular solid-state synthesis with an NBT-rich core. In this case, the NBT forms first so that the strontium needs to diffuse into the material to reach chemical homogeneity. Depending on the presence of core-shell structures, the electrical properties can vary drastically. In this work, we rationalize the effect of variations in oxygen vacancy concentration by Fe-acceptor and Nb-donor doping. It can be shown that a diffusion couple of strontium and oxygen is responsible for chemical homogenization and that the oxygen vacancy content can control the formation of a core-shell structure. KW - Lead-free ceramics KW - Bismuth titanates KW - Core-shell structures KW - Diffusion/diffusivity KW - Ferroelectricity/ferroelectric materials PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-525988 DO - https://doi.org/10.1111/jace.17845 SP - 1 EP - 10 PB - Wiley Periodicals LLC, John Wiley & Sons, Inc. AN - OPUS4-52598 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Afantitis, A. A1 - Melagraki, G. A1 - Isigonis, P. A1 - Tsoumanis, A. A1 - Varsou, D. D. A1 - Valsami-Jones, E. A1 - Papadiamantis, A. A1 - Ellis, L.-J. A. A1 - Sarimveis, H. A1 - Doganis, P. A1 - Karatzas, P. A1 - Tsiros, P. A1 - Liampa, I. A1 - Lobaskin, V. A1 - Greco, D. A1 - Serra, A. A1 - Kinaret, P. A. S. A1 - Saarimäki, L. A. A1 - Grafström, R. A1 - Kohonen, P. A1 - Nymark, P. A1 - Willighagen, E. A1 - Puzyn, T. A1 - Rybinska-Fryca, A. A1 - Lyubartsev, A. A1 - Jensen, K. A. A1 - Brandenburg, J. G. A1 - Lofts, S. A1 - Svendsen, C. A1 - Harrison, S. A1 - Maier, D. A1 - Tamm, K. A1 - Jänes, J. A1 - Sikk, L. A1 - Dusinska, M. A1 - Longhin, E. A1 - Rundén-Pran, E. A1 - Mariussen, E. A1 - El Yamani, N. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Tropsha, A. A1 - Cohen, Y. A1 - Lesczynski, J. A1 - Hendren, C. O. A1 - Wiesner, M. A1 - Winkler, D. A1 - Suzuki, N. A1 - Yoon, T. H. A1 - Choi, J.-S. A1 - Sanabria, N. A1 - Gulumian, M. A1 - Lynch, I. T1 - NanoSolveIT Project: Driving nanoinformatics research to develop innovative and integrated tools for in silico nanosafety assessment N2 - Nanotechnology has enabled the discovery of a multitude of novel materials exhibiting unique physicochemical (PChem) properties compared to their bulk analogues. These properties have led to a rapidly increasing range of commercial applications; this, however, may come at a cost, if an association to long-term health and environmental risks is discovered or even just perceived. Many nanomaterials (NMs) have not yet had their potential adverse biological effects fully assessed, due to costs and time constraints associated with the experimental assessment, frequently involving animals. Here, the available NM libraries are analyzed for their suitability for integration with novel nanoinformatics approaches and for the development of NM specific Integrated Approaches to Testing and Assessment (IATA) for human and environmental risk assessment, all within the NanoSolveIT cloud-platform. These established and well-characterized NM libraries (e.g. NanoMILE, NanoSolutions, NANoREG, NanoFASE, caLIBRAte, NanoTEST and the Nanomaterial Registry (>2000 NMs)) contain physicochemical characterization data as well as data for several relevant biological endpoints, assessed in part using harmonized Organisation for Economic Co-operation and Development (OECD) methods and test guidelines. Integration of such extensive NM information sources with the latest nanoinformatics methods will allow NanoSolveIT to model the relationships between NM structure (morphology), properties and their adverse effects and to predict the effects of other NMs for which less data is available. The project specifically addresses the needs of regulatory agencies and industry to effectively and rapidly evaluate the exposure, NM hazard and risk from nanomaterials and nano-enabled products, enabling implementation of computational ‘safe-by-design’ approaches to facilitate NM commercialization. KW - Nanoinformatics KW - Hazard assessment KW - (Quantitative) Structure-Active Relationships KW - Safe-by-design KW - Predictive modelling PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505952 DO - https://doi.org/10.1016/j.csbj.2020.02.023 VL - 18 SP - 583 EP - 602 PB - Elsevier B.V. AN - OPUS4-50595 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Kim, C.S. A1 - Ruh, S. W. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Mata-Salazar, J. A1 - Juarez-Garcia, J.M. A1 - Cortazar-Martinez, O. A1 - Herrera-Gomez, A. A1 - Hansen, P.E. A1 - Madesen, J.S. A1 - Senna, C.A. A1 - Archanjo, B.S. A1 - Damasceno, J.C. A1 - Achete, C.A. A1 - Wang, H. A1 - Wang, M. A1 - Windover, D. A1 - Steel, E. A1 - Kurokawa, A. A1 - Fujimoto, T. A1 - Azuma, Y. A1 - Terauchi, S. A1 - Zhang, L. A1 - Jordaan, W.A. A1 - Spencer, S.J. A1 - Shard, A.G. A1 - Koenders, L. A1 - Krumrey, M. A1 - Busch, I. A1 - Jeynes, C. T1 - Thickness measurement of nm HfO2 films N2 - A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of Substance (CCQM). The aim of this pilot study was to ensure the equivalency in the measurement capability of national metrology institutes for the thickness measurement of HfO2 films. In this pilot study, the thicknesses of six HfO2 films with nominal thickness from 1 nm to 4 nm were measured by X-ray Photoelectron Spectroscopy (XPS), X-ray Reflectometry(XRR), X-ray Fluorescence Analysis (XRF), Transmission Electron Spectroscopy (TEM), Spectroscopic Ellipsometry (SE) and Rutherford Backscattering Spectrometry (RBS). The reference thicknesses were determined by mutual calibration of a zero-offset method (Medium Energy Ion Scattering Spectroscopy (MEIS) of KRISS) and a method traceable to the length unit (the average thicknesses of three XRR data except the thinnest film). These reference thicknesses are traceable to the length unit because they are based on the traceability of XRR. For the thickness measurement by XPS, the effective attenuation length of Hf 4f electrons was determined. In the cases of XRR and TEM, the offset values were determined from a linear fitting between the reference thicknesses and the individual data by XRR and TEM. The amount of substance of HfO2, expressed as thickness of HfO2 films (in both linear and areal density units), was found to be a good subject for a CCQM key comparison. To reach the main text of this paper, click on Final Report. The final report has been peer-reviewed and approved for publication by the CCQM. KW - Thickness measurements KW - nm films KW - X-ray Photoelectron Spectroscopy KW - Mutual calibration PY - 2021 DO - https://doi.org/10.1088/0026-1394/58/1A/08016 SN - 0026-1394 VL - 58 IS - 1a SP - 08016 PB - IOP Publishing Lt. CY - Bristol AN - OPUS4-54175 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Chemical modification of graphene and carbon nano tubes as viewed by xps and nexafs spectroscopies with dft spectra simulation N2 - Graphene is a two-dimensional carbon network with unique properties. However, its low solubility, poor reactivity and the limited accessibility of a well-defined basal plane are major challenges for applications. An ideal method to overcome these problems is the covalent attachment of functional molecules to its surface which enable further reactive modifications for specific applications. There are several technologies for surface functionalization of graphene and related CNT materials. To get control on the functionalization process and to optimize the performance of the modified surfaces analytical tools for surface chemical characterization are required. X-ray absorption (NEXAFS) and photoelectron spectroscopy (XPS) have been identified to be rather powerful here [1-3]. Specifically, NEXAFS spectroscopy underpinned by quantum chemical spectrum simulations [4] is unique in a way to address changes of aromaticity and defect formation at the graphene surface during functionalization. For relevant surface modification technologies, we present examples on how NEXAFS and XPS can do a good job. All presented modifications aim on the production of platforms for defined functional 2D nanomaterials, as for example multifunctional hybrid architectures. In detail, we investigated: • A wet chemical method for covalent functionalization of graphene sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. Here a reaction between 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized graphene sheets. • Graphene and carbon nanotube functionalized by Vacuum-Ultraviolet (VUV) induced photochemical or r.f. cw low pressure plasma processes to introduce amino, hydroxy or brominated functionalities. To underpin finger-print information delivered by C K-edge NEXAFS we studied the effects of selected point and line defects as well as chemical modifications for a single graphene layer model by density functional theory based spectrum simulations. References [1] P.-L. Girard-Lauriault et al., Appl. Surf. Sci., 258 2012 8448-8454, DOI: 10.1016/j.apsusc.2012.03.012 [2] A. Lippitz et al., Surf. Sci., 611 2013 L1-L7, DOI: 10.1016/j.susc.2013.01.020 [3] A. Faghani et al., Angew. Chemie (International ed.), 56 2017 2675-2679, DOI:10.1002/anie.201612422 [4] C. Ehlert, et al., Phys.Chem.Chem.Phys., 16 2014 14083-14095, DOI: 10.1039/c4cp01106f T2 - AVS 65th INTERNATIONAL SYMPOSIUM CY - Long Beach, CA, USA DA - 21.10.2018 KW - Graphene KW - Plasma KW - Nitrene [2+1] cycloaddition KW - XPS KW - NEXAFS PY - 2018 AN - OPUS4-46468 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Khani, M. A1 - Mehdipour, E. A1 - Faghani, A. A1 - Guday, G. A1 - Donskyi, Ievgen A1 - Haag, R. A1 - Adeli, M. T1 - Preparation of graphene oxide by cyanuric chloride as an effective and non-corrosive oxidizing agent N2 - In this work, we report a new method for the synthesis of graphene oxide (GO) using cyanuric chloride as a non-corrosive oxidizing agent. The mild conditions, simple purification, and scalability of this method are significant advantages over common approaches in which harsh oxidizing agents are used. Moreover, a major drawback with the Hummers' method, the production of toxic gases, is not an issue with this process. This method is a safe and large-scale alternative for the production of GO under mild conditions. KW - Graphene oxide KW - Synthesis KW - XPS KW - AFM KW - IR KW - TGA PY - 2016 DO - https://doi.org/10.1039/c6ra23702a SN - 2046-2069 VL - 6 IS - 116 SP - 115055 EP - 115057 PB - The Royal Society of Chemistry AN - OPUS4-39111 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kjaervik, Marit A1 - Dietrich, P. M. A1 - Thissen, A. A1 - Radnik, Jörg A1 - Nefedov, A. A1 - Natzeck, C. A1 - Wöll, C. A1 - Unger, Wolfgang T1 - Application of near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS) in an in-situ analysis of the stability of the surface-supported metal-organic framework HKUST-1 in water, methanol and pyridine atmospheres N2 - Surface-supported metal-organic frameworks HKUST-1 (Hong Kong University of Science and Technology) were used as a model system for a development of a near ambient pressure (NAP) XPS based approach to investigate interaction with atmospheres of water, methanol or pyridine at pressures ranging from 1 to 4 mbar. The films were grown on a gold substrate functionalized with a COOH-terminated self-assembled monolayer using liquidphase epitaxy in a step-by-step fashion. Measurement protocols were developed and optimised for different gases in order to obtain spectra of similar quality in terms of signal intensity, noise and shape. Peak shapes were found to depend on the efficiency of charge compensation. Reference measurements in argon proved to be a useful strategy not only for the evaluation of the Cu(II)-fraction in pristine samples, but also to identify the contributions by the respective gas atmosphere to the C 1s and O 1s photoelectron spectra. Reduced copper was found during the exposition of HKUST-1 to water vapour and pyridine, but this effect was not observed in case of methanol. Additionally, it was established that there are no changes in relative Cu(II) percentage with increasing exposure time. This indicates that saturation was reached already at the lowest time of gas exposure. A detailed elucidation of the mechanism of Cu(II) reduction to Cu(I) in HKUST-1 mediated by water and pyridine is part of ongoing work and not in the scope of the present paper. KW - HKUST-1 KW - Near-ambient pressure X-ray photoelectron spectroscopy KW - Metal-organic frameworks KW - Interaction with atmospheres KW - Water PY - 2021 DO - https://doi.org/10.1016/j.elspec.2020.147042 SN - 0368-2048 IS - 247 SP - 147042 PB - Elsevier B.V. CY - Amsterdam, Netherlands AN - OPUS4-52098 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Neukammer, J. A1 - Hussels, M. A1 - Kummrow, A. A1 - Devonshire, A. A1 - Foy, C. A1 - Huggett, J. A1 - Parkes, H. A1 - Zel, J. A1 - Milavec, M. A1 - Schimmel, H. A1 - Unger, Wolfgang A1 - Akgoz, M. A1 - McHugh, V. A1 - Grunert, H.-P. A1 - Zeichhardt, H. T1 - Survey results on nucleic acid tests of infectious diseases: present status and need for rapid and patient near diagnostics N2 - This survey will discuss current and emerging isothermal and rapid polymerase chain reaction (PCR) based nucleic acid amplification methods for patient near diagnostics. To assess the clinical need of rapid diagnostics for infectious diseases based on nucleic acid tests (NATs) we performed and analysed a questionnaire among laboratories participating in corresponding INSTAND ring trials for external quality assurance. The questions concerning new amplification technologies like isothermal nucleic acid amplification, potentially suited to significantly decrease turnaround times, were complemented by questions to evaluate the present status of NATs. Besides end-users, companies were also addressed by sending out a manufacturer specific questionnaire. Analysis of the answers from 48 laboratories in 14 European countries revealed that a much shorter turnaround time is requested for selected pathogens compared to about 2 h or longer when applying temperature cycling amplification, i.e. PCR. In this context, most frequently mentioned were MRSA, norovirus, influenza A and B viruses, cytomegalovirus (CMV) as well as hepatitis B virus (HBV) and hepatitis C virus (HCV). At present, 8% of the laboratories having participated in this survey apply isothermal amplification of nucleic acid to identify infectious pathogens. KW - Nucleic acid tests KW - Infectious diseases KW - Virus detection KW - Bacteria detection KW - Isothermal nucleic acid amplification KW - Status report KW - Questionnaire KW - NAT KW - PCR PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:0183-lab0000160 UR - http://www.egms.de/static/en/journals/lab/2015-6/lab000016.shtml DO - https://doi.org/10.3205/lab000016 SN - 1869-4241 VL - 6 SP - 1 EP - 11 PB - GMS CY - Düsseldorf AN - OPUS4-36133 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ehlert, Christopher A1 - Unger, Wolfgang A1 - Saalfrank, P. T1 - C K-edge NEXAFS spectra of graphene with physical and chemical defects: a study based on density functional theory N2 - Recently, C K-edge Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of graphite (HOPG) surfaces have been measured for the pristine material, and for HOPG treated with either bromine or krypton plasmas (Lippitz et al., Surf. Sci., 2013, 611, L1). Changes of the NEXAFS spectra characteristic for physical (krypton) and/or chemical/physical modifications of the surface (bromine) upon plasma treatment were observed. Their molecular origin, however, remained elusive. In this work we study by density functional theory, the effects of selected point and line defects as well as chemical modifications on NEXAFS carbon K-edge spectra of single graphene layers. For Br-treated surfaces, also Br 3d X-ray Photoelectron Spectra (XPS) are simulated by a cluster approach, to identify possible chemical modifications. We observe that some of the defects related to plasma treatment lead to characteristic changes of NEXAFS spectra, similar to those in experiment. Theory provides possible microscopic origins for these changes. KW - Graphene KW - NEXAFS KW - Spectrum simulation KW - Density functional theory PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-309658 DO - https://doi.org/10.1039/c4cp01106f SN - 1463-9076 SN - 1463-9084 VL - 16 IS - 27 SP - 14083 EP - 14095 PB - The Royal Soc. of Chemistry CY - Cambridge AN - OPUS4-30965 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Heinen, S. A1 - Rackow, S. A1 - Cuellar-Camacho, J. L. A1 - Donskyi, Ievgen A1 - Unger, Wolfgang A1 - Weinhart, M. T1 - Transfer of functional thermoresponsive poly(glycidyl ether) coatings for cell sheet fabrication from gold to glass surfaces N2 - Thermoresponsive polymer coatings can facilitate cell sheet fabrication under mild conditions by promoting cell adhesion and proliferation at 37 1C. At lower temperatures the detachment of confluent cell sheets is triggered without enzymatic treatment. Thus, confluent cell sheets with intact extracellular matrix for regenerative medicine or tissue engineering applications become available. Herein, we applied the previously identified structural design parameters of functional, thermoresponsive poly(glycidyl ether) brushes on gold to the more application-relevant substrate glass via the self-assembly of a corresponding block copolymer (PGE-AA) with a short surface-reactive, amine-presenting anchor block. Both, physical and covalent immobilization on glass via either multivalent ionic interactions of the anchor block with bare glass or the coupling of the anchor block to a polydopamine (PDA) adhesion layer on glass resulted in stable coatings. Atomic force microscopy revealed a high degree of roughness of covalently attached coatings on the PDA adhesion layer, while physically attached coatings on bare glass were smooth and in the brush-like regime. Cell sheets of primary human dermal fibroblasts detached reliably (86%) and within 20 ± 10 min from physically tethered PGE-AA coatings on glass when prepared under cloud point grafting conditions. The presence of the laterally inhomogeneous PDA adhesion layer, however, hindered the spontaneous temperature-triggered cell detachment from covalently grafted PGE-AA, decreasing both detachment rate and reliability. Despite being only physically attached, self-assembled monolayer brushes of PGE-AA block copolymers on glass are functional and stable thermoresponsive coatings for application in cell sheet fabrication of human fibroblasts as determined by X-ray photoelectron spectroscopy. KW - X-ray photoelectron spectroscopy KW - Thermoresponsive poly(glycidyl ether) coatings KW - Cell sheet fabrication KW - Nm film thickness PY - 2018 DO - https://doi.org/10.1039/c7tb03263c SN - 2050-750X SN - 2050-7518 VL - 6 IS - 10 SP - 1489 EP - 1500 PB - The Royal Society of Chemistry AN - OPUS4-44600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Donskyi, Ievgen A1 - Drüke, M. A1 - Silberreis, K. A1 - Lauster, D. A1 - Ludwig, K. A1 - Kühne, C. A1 - Unger, Wolfgang A1 - Böttcher, C. A1 - Herrmann, A. A1 - Dernedde, J. A1 - Adeli, M. A1 - Haag, R. T1 - Interactions of fullerene-polyglycerol sulfates at viral and cellular interfaces N2 - Understanding the mechanism of interactions of nanomaterials at biointerfaces is a crucial issue to develop new antimicrobial vectors. In this work, a series of water-soluble fullerene-polyglycerol sulfates (FPS) with different fullerene/polymer weight ratios and varying numbers of polyglycerol sulfate branches are synthesized, characterized, and their interactions with two distinct surfaces displaying proteins involved in target cell recognition are investigated. The combination of polyanionic branches with a solvent exposed variable hydrophobic core in FPS proves to be superior to analogs possessing only one of these features in preventing interaction of vesicular Stomatitis virus coat glycoprotein (VSV-G) with baby hamster kidney cells serving as a model of host cell. Interference with L-selectin-ligand binding is dominated by the negative charge, which is studied by two assays: a competitive surface plasmon resonance (SPR)-based inhibition assay and the leukocyte cell (NALM-6) rolling on ligands under flow conditions. Due to possible intrinsic hydrophobic and electrostatic effects of synthesized compounds, pico- to nanomolar half maximal inhibitory concentrations (IC50) are achieved. With their highly antiviral and anti-inflammatory properties, together with good biocompatibility, FPS are promising candidates for the future development towards biomedical applications. KW - Fullerene-Polyglycerol Sulfates KW - Fullerene KW - Biointerfaces KW - XPS PY - 2018 DO - https://doi.org/10.1002/smll.201800189 SN - 1613-6829 SN - 1613-6810 VL - 14 IS - 17 SP - 1800189, 1 EP - 7 PB - WILEY-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-44573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Tu, Z. A1 - Donskyi, Ievgen A1 - Qiao, H. A1 - Zhu, Z. A1 - Unger, Wolfgang A1 - Hackenberger, C. P. R. A1 - Chen, W. A1 - Adeli, M. A1 - Haag, R. T1 - Graphene Oxide-Cyclic R10 Peptide Nuclear Translocation Nanoplatforms for the Surmounting of Multiple-Drug Resistance N2 - Multidrug resistance resulting from a variety of defensive pathways in Cancer has become a global concern with a considerable impact on the mortality associated with the failure of traditional chemotherapy. Therefore, further research and new therapies are required to overcome this challenge. In this work, a cyclic R10 peptide (cR10) is conjugated to polyglycerol-covered nanographene oxide to engineer a nanoplatform for the surmounting of multidrug resistance. The nuclear translocation of the nanoplatform, facilitated by cR10 peptide, and subsequently, a laser-triggered release of the loaded doxorubicin result in efficient anticancer activity confirmed by both in vitro and in vivo experiments. The synthesized nanoplatform with a combination of different features, including active nucleus-targeting, highloading capacity, controlled release of cargo, and photothermal property, provides a new strategy for circumventing multidrug resistant cancers. KW - Graphen Oxide KW - Nanoplatform KW - Cancer PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-510061 DO - https://doi.org/10.1002/adfm.202000933 VL - 30 IS - 35 SP - 2000933 PB - Wiley VCH AN - OPUS4-51006 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weigert, Florian A1 - Müller, A. A1 - Häusler, I. A1 - Geißler, Daniel A1 - Skroblin, D. A1 - Unger, Wolfgang A1 - Radnik, Jörg A1 - Resch-Genger, Ute T1 - Combining HR‑TEM and XPS to elucidate the core–shell structure of ultrabright CdSe/CdS semiconductor quantum dots N2 - Controlling thickness and tightness of surface passivation shells is crucial for many applications of core–shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the applicationrelevant functionality like a high photoluminescence (PL) quantum yield, calling for a whole nanoobject approach. By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. In addition to demonstrating the potential of this novel whole nanoobject approach for determining architectures of small nanoparticles, the presented results also highlight challenges faced by different sizing and structural analysis methods and method-inherent uncertainties. KW - Photoluminescence KW - Single particle KW - Microscopy KW - Particle architecture KW - Thickness KW - SAXS KW - Shell KW - XPS KW - TEM KW - Semiconductor KW - Quantum dot KW - Photophysics KW - Quantum yield PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-517911 DO - https://doi.org/10.1038/s41598-020-77530-z VL - 10 IS - 1 SP - 20712 PB - Springer Nature AN - OPUS4-51791 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Krahl, T. A1 - Radnik, Jörg A1 - Wagner, Andreas A1 - Werner, W. S. M. A1 - Ritter, B. A1 - Kemnitz, E. A1 - Unger, Wolfgang T1 - Chemical in-depth analysis of (Ca/Sr)F2 core–shell like nanoparticles by X-ray photoelectron spectroscopy with tunable excitation energy N2 - The fluorolytic sol–gel synthesis is applied with the intention to obtain two different types of core–shell nanoparticles, namely, SrF2–CaF2 and CaF2–SrF2. In two separate fluorination steps for core and shell formation, the corresponding metal lactates are reacted with anhydrous HF in ethylene glycol. Scanning transmission electron microscopy (STEM) and dynamic light scattering (DLS) confirm the formation of particles with mean dimensions between 6.4 and 11.5 nm. The overall chemical composition of the particles during the different reaction steps is monitored by quantitative Al Kα excitation X-ray photoelectron spectroscopy (XPS). Here, the formation of stoichiometric metal fluorides (MF2) is confirmed, both for the core and the final core–shell particles. Furthermore, an in-depth analysis by synchrotron radiation XPS (SR-XPS) with tunable excitation energy is performed to confirm the core–Shell character of the nanoparticles. Additionally, Ca2p/Sr3d XPS intensity ratio in-Depth profiles are simulated using the software Simulation of Electron Spectra for Surface Analysis (SESSA). In principle, core–shell like particle morphologies are formed but without a sharp interface between calcium and strontium containing phases. Surprisingly, the in-depth chemical distribution of the two types of nanoparticles is equal within the error of the experiment. Both comprise a SrF2-rich core domain and CaF2-rich shell domain with an intermixing zone between them. Consequently, the internal morphology of the final nanoparticles seems to be independent from the synthesis chronology. KW - Metal fluorides KW - Sol-gel synthesis KW - Synchrotron radiation KW - X-ray photoelectron spectroscopy PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-522284 DO - https://doi.org/10.1002/sia.6937 SN - 0142-2421 VL - 53 IS - 5 SP - 494 EP - 508 PB - Wiley VCH AN - OPUS4-52228 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abbas, F. A1 - Donskyi, Ievgen A1 - Gholami, M. A1 - Ziem, B. A1 - Lippitz, Andreas A1 - Unger, Wolfgang A1 - Böttcher, C. A1 - Rabe, J. A1 - Haag, R. A1 - Adeli, M. T1 - Controlled covalent functionalization of thermally reduced graphene oxide to generate defined bifunctional 2D nanomaterials N2 - A controlled, reproducible, gram-scale method is reported for the covalent functionalization of graphene Sheets by a one-pot nitrene [2+1] cycloaddition reaction under mild conditions. The reaction between commercially available 2,4,6-trichloro-1,3,5-triazine and sodium azide with thermally reduced graphene oxide (TRGO) results in defined dichlorotriazine-functionalized sheets. The different reactivities of the chlorine substituents on the functionalized graphene allow stepwise post-modification by manipulating the temperature. This new method provides unique access to defined bifunctional 2D nanomaterials, as exemplified by chiral surfaces and multifunctional hybrid architectures. KW - Graphene oxide KW - Bifunctional 2D nanomaterials KW - XPS KW - NEXAFS KW - AFM PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-394789 DO - https://doi.org/10.1002/ange.201612422 SN - 1433-7851 VL - 56 IS - 10 SP - 2675 EP - 2679 PB - Wiley-VCH Verlag GmbH & Co. KGaA CY - Weinheim AN - OPUS4-39478 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Unger, Wolfgang A1 - Beiranvand, Z. A1 - Kakanejadifard, A. A1 - Donskyi, Ievgen A1 - Faghani, A. A1 - Tu, Z. A1 - Lippitz, Andreas A1 - Sasanpour, P. A1 - Maschietto, F. A1 - Paulus, B. A1 - Haag, R. A1 - Adeli, M. T1 - Functionalization of fullerene at room temperature: toward new carbon vectors with improved physicochemical properties N2 - In this work, fullerene has been functionalized with cyanuric Chloride at room temperature by a nitrene mediated [2 + 1] cycloaddition reaction. The adduct after functionalization is inherently in the form of azafulleroid and shows broad UV absorption in the wavelength range of 200–800 nm, as well as photothermal conversion and fluorescence with a high quantum yield. KW - Functionalization of fullerenes KW - XPS KW - NEXAFS PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-387076 DO - https://doi.org/10.1039/c6ra23419d SN - 2046-2069 VL - 6 IS - 114 SP - 112771 EP - 112775 PB - Royal Society of Chemistry (RSC) AN - OPUS4-38707 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Stockmann, Jörg M. A1 - Radnik, Jörg A1 - Bütefisch, S. A1 - Busch, I. A1 - Weimann, T. A1 - Passiu, C. A1 - Rossi, A. A1 - Unger, Wolfgang T1 - A new test specimen for the determination of the field of view of small-area X-ray photoelectron spectrometers N2 - Small-area/spot photoelectron spectroscopy (SAXPS) is a powerful tool for the investigation of small surface features like microstructures of electronic devices, sensors or other functional surfaces, and so forth. For evaluating the quality of such microstructures, it is often crucial to know whether a small signal in a spectrum is an unwanted contamination of the field of view (FoV), defined by the instrument settings, or it originated from outside. To address this issue, the d80/20 parameter of a line scan across a chemical edge is often used. However, the typical d80/20 parameter does not give information on contributions from the long tails of the X-ray beam intensity distribution or the electron-optical system as defined by apertures. In the VAMAS TWA2 A22 project “Applying planar, patterned, multi-metallic samples to assess the impact of analysis area in surface-chemical analysis,” new test specimen was developed and tested. The here presented testing material consists of a silicon wafer substrate with an Au-film and embedded Cr circular and square spots with decreasing dimensions from 200 μm down to 5 μm. The spot sizes are traceable to the length unit due to size measurements with a metrological SEM. For the evaluation of the FoV, we determined the Au4f intensities measured with the center of the FoV aligned with the center of the spot and normalized to the Au4f intensity determined on the Au-film. With this test specimen, it was possible to characterize, as an example, the FoV of a Kratos AXIS Ultra DLD XPS instrument. T2 - ECASIA 2019 CY - Dresden, Germany DA - 15.09.2019 KW - Field of view KW - Reference material KW - Selected area XPS KW - Small-area XPS KW - Small-spot XPS PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509902 DO - https://doi.org/10.1002/sia.6831 SN - 1096-9918 VL - 52 IS - 12 SP - 890 EP - 894 PB - John Wiley & Sons Ltd AN - OPUS4-50990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Tougaard, S. A1 - Werner, W. S. M. A1 - Hronek, M. A1 - Kunz, Valentin A1 - Radnik, Jörg A1 - Stockmann, Jörg M. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Nirmalananthan-Budau, Nithiya A1 - Geißler, Daniel A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Correction to "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" N2 - This is a corrigendum to the original article "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" that was published in "The journal of physical chemistry C", vol. 123 (2019), no. 49 pp. 29765-29775. PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505451 DO - https://doi.org/10.1021/acs.jpcc.0c00027 SN - 1932-7447 SN - 1932-7455 VL - 124 IS - 6 SP - 3923 PB - American Chemical Society CY - Washington, DC AN - OPUS4-50545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sobina, E. A1 - Zimathis, Anett A1 - Prinz, Carsten A1 - Emmerling, Franziska A1 - de Santis Neves, R. A1 - Galhardo, C. E. A1 - De Robertis, E. A1 - WANG, H. A1 - Mizuno, K. A1 - Kurokawa, A. A1 - Unger, Wolfgang T1 - Final report of CCQM-K136 measurement of porosity properties (specific adsorption, BET specific surface area, specific pore volume and pore diameter) of nanoporous Al2O3 N2 - The CCQM-K136 key comparison for determination of the porosity properties of aluminum oxide has been organized jointly by the surface and micro/nano analysis working groups of CCQM to test the abilities of the metrology institutes to measure the porosity properties (specific adsorption, BET specific surface area, specific pore volume and pore diameter) of nanoporous Al2O3. Ural Scientific Research Institute for Metrology (UNIIM) acted as the coordinating laboratory for this comparison with BAM Federal Institute for Materials Research and Testing (BAM) as co-coordinating laboratory. Five NMIs and one DI participated in this key comparison. All participants used a gas adsorption method, here nitrogen adsorption at 77.3 K, for analysis according to the international standards ISO 15901-2 and 9277. KW - BET specific surface area KW - Specific adsorption KW - Pore diameter KW - Specific pore volume KW - Nanoporous Al2O3 PY - 2016 UR - http://iopscience.iop.org/article/10.1088/0026-1394/53/1A/08014 DO - https://doi.org/10.1088/0026-1394/53/1A/08014 SN - 0026-1394 SN - 1681-7575 VL - 2016 IS - 53 Technical Supplement SP - Article 08014, 1 EP - 39 PB - IOPscience AN - OPUS4-38282 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Unger, Wolfgang T1 - Comprehensive morphological and chemical characterization of thin engineered TiO2films T2 - 16th European Conference on Applications of Surface and Interface Analysis (ECASIA 15) CY - Granada, Spain DA - 2015-09-28 PY - 2015 AN - OPUS4-34814 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Nowack, H. T1 - Wechselwirkungen zwischen plasmamodifizierten Polymeroberflächen und Metallen T2 - 5. Internationale Fachtagung - ND-Plasma-Technologie CY - Duisburg, Deutschland DA - 1997-09-22 PY - 1997 VL - 5 SP - 1(?) EP - 17(?) PB - Print-Service CY - Mülheim AN - OPUS4-6995 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kühn, Gerhard A1 - Ghode, Archana A1 - Weidner, Steffen A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Friedrich, Jörg Florian ED - Mittal, K. L. T1 - Chemically well-defined surface functionalization of polyethylene and polypropylene by pulsed plasma modification followed by grafting of molecules T2 - 2nd International Symposium on Polymer Surface Modification: Relevance to Adhesion CY - Newark, NJ, USA DA - 1999-05-24 KW - Plasma modification KW - Chemical conversion of functional groups KW - Spacers KW - Polypropylene KW - Polyethylene PY - 2000 SN - 90-6764-327-0 VL - 2 SP - 45 EP - 64 PB - VSP CY - Utrecht AN - OPUS4-6975 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Vogel, Lydia ED - Mittal, K. T1 - Plasma Pretreatment of Polymer Surfaces - Relevance to Adhesion of Metals T2 - 5th Symposium on Metallized Plastics ; 6th Symposium on Metallized Plastics CY - Los Angeles, CA, USA DA - 1996-05-05 PY - 1998 SN - 90-6764-290-8 SP - 271 EP - 293 PB - VSP CY - Utrecht AN - OPUS4-6987 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Giebler, Rainer A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Mittal, K. L. T1 - Significance of interfacial redox reactions and formation of metal-organic complexes for the adhesion of metals on pristine and plasma-treated polymers KW - Oxygen low-pressure plasma treatment of polymers KW - Metal-polymer interactions KW - Peel strength PY - 2000 SN - 90-6764-327-0 VL - 2 SP - 137 EP - 171 PB - VSP CY - Utrecht AN - OPUS4-6979 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gähde, J. A1 - Friedrich, Jörg Florian A1 - Fischer, T. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Falkenhagen, Jana T1 - Reactions of polymer analogous model substances with metals and oxides KW - Modellverbindung KW - Al202 KW - Chrom KW - Orientierung, molekular KW - Chemical interaction KW - Model compounds KW - Al2O3 and chromium KW - Molecular orientation KW - Formation of complexes KW - Plasma PY - 1996 SN - 0340-255x SN - 1437-8027 VL - 101 SP - 194 EP - 198 PB - Springer CY - Berlin AN - OPUS4-685 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Wigant, L. A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Geng, Sh. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Plasmavorbehandlungen von Polymeroberflächen T2 - 2. Freiberger Polymertag CY - Freiberg DA - 1995-05-30 PY - 1995 SP - 17 Seiten CY - Freiberg AN - OPUS4-7014 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Ghode, Archana A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Geng, Shiming A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Schindel-Bidinelli, E. T1 - Polymeroberflächenfunktionalisierungen im gepulsten Plasma mit nachfolgender chemischer Behandlung T2 - 14. Internationales Symposium Swissbonding ; 14. Internationaler Kongreß Swiss Bonding ; 14th Swiss Bonding 00 CY - Rapperswil, Schweiz DA - 2000-05-16 PY - 2000 SP - 31 EP - 44 PB - SWIBOTECH GmbH CY - Bülach AN - OPUS4-6980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kühn, Julius A1 - Hodoroaba, Vasile-Dan A1 - Linke, S. A1 - Moritz, W. A1 - Unger, Wolfgang T1 - Characterization of Pd-Ni-Co alloy thin films by ED-EPMA with application of the STRATAGEM software N2 - Ternary thin film alloys based on Pd, Ni and Co on silicon wafers have been characterized in order to determine elemental composition and thickness. A broad variety of alloy compositions was obtained on one and the same substrate by magnetron dc-co-sputter deposition. Energy-dispersive electron probe X-ray microanalysis of these 'multi' alloy composition samples is performed in a non-destructive, precise and, if optimized, also in a time-saving way. The local thickness of the layers under study was in between 50 nm and 250 nm. Pure element bulk materials have been employed as reference specimens. The results attained in this study are compared to those obtained by other analytical methods as Auger electron spectroscopy and X-ray photo electron spectroscopy. KW - Ternary alloys KW - Film thickness KW - Elemental composition KW - Quantification KW - K-values KW - ED-EPMA KW - STRATAGEM PY - 2012 DO - https://doi.org/10.1002/sia.4974 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 11-12 SP - 1456 EP - 1458 PB - Wiley CY - Chichester AN - OPUS4-27273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Linke, S. A1 - Kühn, Julius A1 - Nörthemann, K. A1 - Unger, Wolfgang A1 - Moritz, W. T1 - Sensor high throughput screening using photocurrent measurements in silicon N2 - A new high throughput screening method to characterise alloys used as gate metal of Metal/solid Electrolyte/Insulator/Semiconductor (MEIS) gas-sensors was developed. Samples with continuous gradients in alloy concentration for the system Pd1-x-yNiyCoy were analysed regarding H2 sensitivity. First results showed reduced poisoning effects of H2S for Ni concentrations between 4-11 at-% in Pd. T2 - Eurosensors XXVI CY - Kraków, Poland DA - 09.09.2012 KW - LAPS KW - Ternary alloy KW - MEIS sensor KW - H2 sensor KW - High throughput screening PY - 2012 DO - https://doi.org/10.1016/j.proeng.2012.09.366 SN - 1877-7058 VL - 47 SP - 1195 EP - 1198 PB - Elsevier CY - Amsterdam [u.a.] AN - OPUS4-27926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Weidner, Steffen A1 - Geng, Sh. A1 - Wigant, L. A1 - Wöll, Ch. A1 - Erdmann, J. A1 - Gorsler, H.-V. T1 - Characterization of plasma-modified organic surfaces by electron spectroscopy, SEIRA, and MALDI-TOF-MS T2 - 6th European Conference on Applications of Surface and Interface Analysis CY - Montreux, Switzerland DA - 1995-10-09 PY - 1995 SP - TC 11 PB - Wiley CY - Chichester AN - OPUS4-7001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Geng, Sh. A1 - Koprinarov, Ivaylo A1 - Kühn, Gerhard A1 - Weidner, Steffen T1 - Modelling plasma-induced reactions on polymer surfaces using aliphatic self-assembling and LB layers PY - 1998 SN - 0257-8972 VL - 98 SP - 1132 EP - 1141 PB - Elsevier Science CY - Lausanne AN - OPUS4-6999 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Kühn, Gerhard A1 - Weidner, Steffen A1 - Vogel, Lydia T1 - Chemical reactions at polymer surfaces interacting with a gas plasma or with metal atoms - their relevance to adhesion N2 - The chemical and morphological stabilities of polymer segments in the near-surface layer were investigated by spectroscopic methods such as X-ray photoelectron spectroscopy and near-edge X-ray absorption fine structure spectroscopy. Model studies were undertaken with Langmuir–Blodgett films, self-assembled monolayers and oligomer films. For thin polymer layers (30 to 500 nm), the changes in molecular-weight distributions of some polymers were investigated systematically by size exclusion chromatography, matrix-assisted laser desorption/ionization–time-of-flight mass spectrometry and thermal-field flow fractionation for oxygen- and helium-plasma exposures. The polymer surfaces were found to be relatively stable at exposure to an oxygen low-pressure plasma up to ca. 2 s. This is important information to get maximum adhesion to metals in composites. In correlation to their redox potentials, potassium, aluminium and chromium react with oxygen functional groups at the polymer/metal interface. In a dedicated study, chromium was found to attack aromatic rings and form different reaction products. PY - 1999 DO - https://doi.org/10.1016/S0257-8972(99)00229-7 SN - 0257-8972 VL - 116-119 SP - 772 EP - 782 PB - Elsevier Science CY - Lausanne AN - OPUS4-6981 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Roessner, D. A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas ED - Olefjord, I. ED - Nyborg, L. ED - Briggs, D. T1 - Changes in molecular weight distribution of polymers by plasma treatment T2 - 7th European Conference on Applications of Surface and Interface Analysis CY - Göteborg, Sweden DA - 1997-06-16 PY - 1997 SN - 0-471-97827-2 SP - 795 EP - 799 PB - Wiley CY - Chichester AN - OPUS4-6997 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Friedrich, Jörg Florian A1 - Kühn, Gerhard A1 - Mix, Renate A1 - Retzko, Iris A1 - Gerstung, Vanessa A1 - Weidner, Steffen A1 - Schulze, Rolf-Dieter A1 - Unger, Wolfgang ED - Mittal, K. L. T1 - Plasma polymer adhesion promoters for metal-polymer systems T2 - 2nd International Symposium on Polyimides and Other High Temperature Polymers: Synthesis, Characterization and Applications CY - Newark, NJ, USA DA - 2001-12-03 KW - r.f. pulsed plasma KW - Plasma polymers with functional groups KW - Copolymers KW - Adhesion promoting interlayers KW - Metal-polymer systems PY - 2003 SN - 90-6764-378-5 VL - 2 SP - 359 EP - 388 PB - VSP CY - Utrecht AN - OPUS4-6967 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Weidner, Steffen A1 - Kühn, Gerhard A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas T1 - Plasmaoxidative Degradation of Polymers Studied by Matrix-assisted Laser Desorption/Ionization Mass Spectrometry PY - 1996 SN - 0951-4198 SN - 1097-0231 VL - 10 SP - 727 EP - 732 PB - Wiley CY - Chichester AN - OPUS4-7004 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Friedrich, Jörg Florian A1 - Unger, Wolfgang A1 - Lippitz, Andreas A1 - Koprinarov, Ivaylo A1 - Weidner, Steffen A1 - Kühn, Gerhard ED - Schindel-Bidinelli, E. T1 - Umweltfreundliches Metallisieren von Kunststoffen durch Plasmavorbehandlung in einem geschlossenen Reaktor T2 - Swissbonding 97 ; 11. Internationales Symposium Klebtechnik und Umwelt ; 11th International Symposium Bonding and Sealing Technology CY - Rapperswil, Schweiz DA - 1997-05-26 PY - 1997 SP - 1(?) EP - 3(?) PB - SWIBOTECH CY - Rorbas AN - OPUS4-6994 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -