TY - GEN A1 - Rücker, Werner A1 - Rohrmann, Rolf A1 - Said, Samir A1 - Schmidt, Wolfgang ED - Feltrin, G. ED - Wenk, T. T1 - Dynamische Verfahren zur Sicherheitsüberwachung von Brückenbauwerken T2 - Aktuelle Probleme der Brückendynamik (SIA-Dokumentation : D 198) N2 - Referat: Nach dem gegenwärtigen Stand der Prognosen wird in den nächsten 10 bis 15 Jahren eine Zunahme des Güterverkehrs in Deutschland um 50 % angenommen. Im Jahre 2001 wurden 85 % aller transportierten Güter auf der Straße bewegt. Dies bedeutet, daß die vorhandenen Ingenieurbauwerke innerhalb der Verkehrsinfrastruktur mit zunehmendem Alter immer höhere Belastungen ertragen müssen. Zum anderen werden die zur Verfügung stehenden Mittel zum Ersatz dieser Infrastrukturbauwerke immer geringer. Eine aktuelle Bewertung dieser Bauwerke bezüglich ihrer Sicherheit und Gebrauchsfähigkeit erfordert deshalb zusätzliche Informationen hinsichtlich Art und Umfang eventuell vorhandener Schäden, deren Auswirkung auf die aktuelle Tragwirkung und Tragfähigkeit sowie Information über die vergangenen, gegenwärtigen und zukünftigen Lasteinwirkungen. T2 - D-A-CH-Tagung 2003 CY - Zürich, Schweiz DA - 2003-09-18 KW - Tragfähigkeit von Brücken KW - Dynamische Untersuchungen KW - Dauerüberwachung KW - Verkehrslasten KW - baulicher Zustand PY - 2003 UR - http://www.baufachinformation.de/aufsatz.jsp?ul=05029003231 SN - 3-908483-74-3 SP - 35 EP - 42 PB - SIA CY - Zürich AN - OPUS4-2850 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Boeck, T. A1 - Schmidt, K. A1 - Lorenz, M. A1 - Rosenfeld, A. A1 - Rudolph, Pascale A1 - Krüger, Jörg A1 - Kautek, Wolfgang ED - Gobrecht, J. T1 - Ultra-short pulse laser seeding techniques for silicon crystallite growth on amorphous substrates T2 - Proceedings of the 11th Workshop on Quantum Solar Energy Conversion T2 - QUANTSOL 99 CY - Wildhaus, Switzerland DA - 1999-03-14 PY - 1999 SP - 1(?) EP - 3(?) AN - OPUS4-12041 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kim, K.J. A1 - Unger, Wolfgang A1 - Kim, J.W. A1 - Moon, D.W. A1 - Gross, Thomas A1 - Hodoroaba, Vasile-Dan A1 - Schmidt, Dieter A1 - Wirth, Thomas A1 - Jordaan, W. A1 - van Staden, M. A1 - Prins, S. A1 - Zhang, L. A1 - Fujimoto, T. A1 - Song, X.P. A1 - Wang, H. T1 - Inter-laboratory comparison: quantitative surface analysis of thin Fe-Ni alloy films JF - Surface and interface analysis N2 - An international interlaboratory comparison of the measurement capabilities of four National Metrology Institutes (NMIs) and one Designated Institute (DI) in the determination of the chemical composition of thin Fe-Ni alloy films was conducted via a key comparison (K-67) of the Surface Analysis Working Group of the Consultative Committee for Amount of Substance. This comparison was made using XPS (four laboratories) and AES (one laboratory) measurements. The uncertainty budget of the measured chemical composition of a thin alloy film was dominated by the uncertainty of the certified composition of a reference specimen which had been determined by inductively coupled plasma mass spectrometry using the isotope dilution method. Pilot study P-98 showed that the quantification using relative sensitivity factors (RSFs) of Fe and Ni derived from an alloy reference sample results in much more accurate result in comparison to an approach using RSFs derived from pure Fe and Ni films. The individual expanded uncertainties of the participants in the K-67 comparison were found to be between 2.88 and 3.40 atomic %. The uncertainty of the key comparison reference value (KCRV) calculated from individual standard deviations and a coverage factor (k) of 2 was 1.23 atomic %. KW - Quantification KW - Fe-Ni alloy KW - Uncertainty KW - Key comparison KW - Traceability PY - 2012 DO - https://doi.org/10.1002/sia.3795 SN - 0142-2421 SN - 1096-9918 VL - 44 IS - 2 SP - 192 EP - 199 PB - Wiley CY - Chichester AN - OPUS4-24505 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Baytekin, H. Tarik A1 - Oran, Umut A1 - Theisen, J. A1 - Schmidt, Martin A1 - Unger, Wolfgang ED - Weckenmann, A. T1 - Validierte Messverfahren für die nichtgeometrische Größe Hydrophilie - Anwendung in der Mikrofluidik T2 - Abschlussbericht DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen T2 - Abschlusskolloquium DFG Schwerpunktprogramm 1159 - Neue Strategien der Mess- und Prüftechnik für die Produktion von Mikrosystemen und Nanostrukturen CY - Erlangen, Deutschland DA - 2010-10-06 PY - 2011 SN - 978-3-8440-0358-1 SN - 0945-0769 SP - 163 EP - 172 PB - Shaker Verlag GmbH AN - OPUS4-24827 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Oran, Umut A1 - Senoner, Mathias A1 - Schmidt, M. T1 - Chemische Charakterisierung von mikro- und nanotechnologischen Bauteilen: Verfahrensentwicklung und Referenzmaterialien T2 - Messtechnik für Mikro- und Nano-Engineering T2 - VDI/VDE-Tagung "Messtechnik für Mikro- und Nano-Engineering" CY - Erlangen, Germany DA - 2006-11-29 KW - Referenzmaterial KW - Mikrofluidik KW - Nanoanalytik PY - 2006 N1 - Serientitel: VDI-Berichte – Series title: VDI-Berichte IS - 1950 SP - 197 EP - 206 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-14110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Erhard, Anton A1 - Völzke, Holger A1 - Noack, Volker A1 - Weber, Wolfgang A1 - Wolff, Dietmar A1 - Rittscher, D. A1 - Schmidt, H. T1 - Long term interim storage facility for nuclear reactor compartments of submarines - German support for utilization of nuclear submarines in Russia T2 - PATRAM 2007 - 15th International symposium on the packaging and transportation of radioactive materials (Proceedings) T2 - PATRAM 2007, 15th International Symposium on the Packaging and Transportation of Radioactive Materials CY - Miami, Florida, USA DA - 2007-10-21 PY - 2007 SP - 155 PB - Institute of Nuclear Materials Management AN - OPUS4-16157 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baytekin, H.T. A1 - Wirth, Thomas A1 - Gross, Thomas A1 - Treu, Dieter A1 - Sahre, Mario A1 - Theisen, J. A1 - Schmidt, M. A1 - Unger, Wolfgang T1 - Determination of wettability of surface-modified hot-embossed polycarbonate wafers used in microfluidic device fabrication via XPS and ToF-SIMS JF - Surface and interface analysis N2 - The wettability of the surfaces inside the microchannels of a microfluidic device is an important property considering a liquid flows through them. Contact angle measurements usually applied to test the wettability of surfaces cannot be used for an analysis of microchannel walls within microfluidic devices. A workaround is the use of surface analytical methods, which are able to reach points of interest in microchannels and may provide information on the surface chemistry established there. In calibrating these methods by using flat polymer wafers, where the contact angle can be measured as usual, data measured in real microchannels can be evaluated in terms of wetting properties. Reference wafers of bisphenol-A polycarbonate, a polymeric material that is often used in fluidic microdevice fabrication, were treated under different oxygen plasma conditions. The modified surfaces were characterized by using XPS, time of flight (ToF)-SIMS and atomic force microscope (AFM). Surface chemistry and surface topography have been correlated with contact angle measurements. In addition, effects of ageing or rinsing after plasma treatment have also been investigated. KW - Oxygen plasma KW - Polycarbonate KW - XPS KW - ToF-SIMS KW - Principal component analysis PY - 2008 DO - https://doi.org/10.1002/sia.2724 SN - 0142-2421 SN - 1096-9918 VL - 40 IS - 3-4 SP - 358 EP - 363 PB - Wiley CY - Chichester AN - OPUS4-17340 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Baytekin, H. Tarik A1 - Wirth, Thomas A1 - Gross, Thomas A1 - Sahre, Mario A1 - Unger, Wolfgang A1 - Theisen, J. A1 - Schmidt, M. T1 - Surface analytical characterization of micro-fluidic devices hot embossed in polymer wafers: Surface chemistry and wettability JF - Surface and interface analysis N2 - Recently, time-of-flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS) instrumentation has been used to address areas of interest within micro-fluidic devices providing full access to the surface chemistry established at the bottom of micro-channels therein. After careful calibration, information on surface chemistry as obtained by ToF-SIMS or XPS can be interpreted in terms of wettability expressed as contact angles which are then characteristic for the inner walls of micro-channels. Standard contact angle measurement is not applicable in micro-channels. The approach has been demonstrated to be successful with two different micro-fluidic devices hot embossed into high-end quality poly(methyl methacrylate) (PMMA) or Polycarbonate wafers. A pre-selected surface chemistry at micro-channel walls can be established by plasma technologies but ageing and rinsing effects have to be under control. A combination of ToF-SIMS, XPS and contact angle measurement techniques has been demonstrated to provide the required information. Finally, it is shown by ToF-SIMS and XPS analysis that in the production of micro-fluidic parts during practical processing using hot embossing technologies, material originating from cover foils will reside on the polymer wafer's surface. Moreover, residues of releasing agents as silicone oil used during processing can be detected by ToF-SIMS. Both cover foil residues and silicones are issues of trouble shooting in micro-fluidics because they will change contact angles efficiently. KW - Micro-fluidic device KW - PMMA KW - Polycarbonate KW - Plasma treatment KW - Wettability KW - ToF-SIMS KW - XPS PY - 2010 DO - https://doi.org/10.1002/sia.3149 SN - 0142-2421 SN - 1096-9918 VL - 42 IS - 8 SP - 1417 EP - 1431 PB - Wiley CY - Chichester AN - OPUS4-21712 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Maaßdorf, A. A1 - Rooch, Heidemarie A1 - Österle, Werner A1 - Malcher, M. A1 - Schmidt, M. A1 - Kollmer, F. A1 - Paul, D. A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards JF - Analytical and bioanalytical chemistry N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1–xAs and InxGa1–xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface-analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - AES KW - BAM-L200 KW - CRM KW - EDX KW - Imaging KW - Lateral resolution KW - Sharpness KW - Standardisation KW - STXM KW - ToF-SIMS KW - XPEEM KW - XPS KW - Certified reference material KW - Imaging surface analysis PY - 2015 DO - https://doi.org/10.1007/s00216-014-8135-7 SN - 1618-2642 SN - 1618-2650 VL - 407 IS - 11 SP - 3211 EP - 3217 PB - Springer CY - Berlin AN - OPUS4-33033 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Eiben, Mario A1 - Schmidt, Anita A1 - Menrad, Andreas A1 - Jahnke, Wolfgang A1 - Goedecke, Thomas T1 - Validation of an alternative method for testing the chemical compatibility of liquids with polyethylene packagings for dangerous goods JF - Packaging technology & science N2 - Safety risks may ensue when the chemicals contained in polyethylene packagingsa age and damage them. To prevent subsequent accidents, the European Dangerous Goods Regulations have laid down requirements for testing the chemical compatibility of liquid dangerous goods transported in polyethylene packagings. The test procedures include 6 months in which the chemical is prestored in the packaging. After this time, the respective design-type tests are performed. Alternative methods with so-called standard liquids, simulating the different types of damaging effects, are also possible. If a packaging has successfully passed the design type tests with a standard liquid, other dangerous goods may also be transported in this packaging, as long as it is demonstrated that they have a less damaging effect than the standard liquid. However, in this area there is only little information and research available. A new potentially effective and time-saving method for comparing the stress crack damaging influence of liquids with standard liquids was proposed by a major German chemical company. The validation of this method, which was carried out on two polyethylene materials, showed the general applicability of the method. Two kinds of wetting solutions were applied to simulate cracking under stress. The influence of prestorage, test temperatures, wetting agents and material was examined. FEM calculations were carried out to ascertain the influence of the sample shape. KW - Dangerous goods packagings KW - Chemical compatibility testing KW - HDPE KW - Environmental stress cracking KW - ESCR PY - 2013 DO - https://doi.org/10.1002/pts.1989 SN - 0894-3214 VL - 26 IS - 7 SP - 385 EP - 398 PB - Wiley CY - Chichester, UK AN - OPUS4-29400 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Erhard, Anton A1 - Völzke, Holger A1 - Noack, Volker A1 - Weber, Wolfgang A1 - Wolff, Dietmar A1 - Rittscher, D. A1 - Schmidt, H. T1 - Construction of long term interim storage facility for nuclear reactor compartments of submarines: German support for utilisation of nuclear submarines in Russia JF - Packaging, transport, storage & security of radioactive materials (RAMTRANS) KW - Interim storage facility KW - Nuclear reactor compartments of submarines KW - Building of the storage facility KW - Transportation of heavy compartments PY - 2008 SN - 1746-5095 SN - 1746-5109 SN - 0957-476X VL - 19 IS - 2 SP - 117 EP - 121 PB - Ramtrans Publ. CY - Ashford AN - OPUS4-17708 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Sturm, Heinz A1 - Schmidt, Dieter A1 - Kautek, Wolfgang T1 - Chemical, morphological and accumulation phenomena in ultrashort-pulse laser ablation of TiN in air JF - Applied physics A N2 - Ultrashort-pulse laser ablation (F=130 fs, 5=800 nm, repetition rate 2-20 Hz) of titanium nitride was investigated for laser fluences between 0.3 and 4.5 J/cm2 using the direct focusing technique in air. The influence of the laser pulse number and the peak fluence was investigated by means of several surface analytical techniques (optical microscopy, dynamic friction atomic force microscopy, scanning Auger electron microscopy and small-spot electron spectroscopy for chemical analysis). The correlation of the results about optical, physical and chemical properties of the irradiated areas allows us to propose a simple oxidation model, which explains different observed phenomena associated with surface damage such as mound formation and crater widening and clarifies the incubation behavior reported earlier for this material. PY - 2000 DO - https://doi.org/10.1007/s003390000585 SN - 0947-8396 VL - 71 IS - 6 SP - 657 EP - 665 PB - Springer CY - Berlin AN - OPUS4-1067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -