TY - JOUR A1 - Winkelmann, D. T1 - Die elektrochemische Messung der Oxydationsgeschwindigkeit von Na2SO3 durch gelösten Sauerstoff PY - 1955 SN - 0372-8382 SN - 0005-9021 VL - 59 SP - 891 EP - 895 PB - Deutsche Bunsen-Gesellschaft für Physikalische Chemie CY - Weinheim, Bergstr. AN - OPUS4-9816 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Winkelmann, D. T1 - Der Einfluss der Reaktionsgeschwindigkeit auf die Stromdichte beim Verfolgen von Reaktionsverläufen durch den Diffusionsgrenzstrom PY - 1955 SN - 0372-8382 SN - 0005-9021 VL - 59 SP - 895 EP - 897 PB - Deutsche Bunsen-Gesellschaft für Physikalische Chemie CY - Weinheim, Bergstr. AN - OPUS4-9817 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Damaschke, Kurt A1 - Winkelmann, D. T1 - Elektrochemische H2O2-Messung und ihre Anwendung beim Zerfall von H2O2 durch Katalase PY - 1956 SN - 0932-0776 SN - 0340-5087 SN - 0044-3174 VL - 11 IS - 2 SP - 85 EP - 89 PB - Verl. d. Zeitschrift für Naturforschung CY - Tübingen AN - OPUS4-9891 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lühr, T. A1 - Winkelmann, Aimo A1 - Nolze, Gert A1 - Krull, D. A1 - Westphal, C. T1 - Direct Atom Imaging by Chemical-Sensitive Holography N2 - In order to understand the physical and chemical properties of advanced materials, functional molecular adsorbates, and protein structures, a detailed knowledge of the atomic arrangement is essential. Up to now, if subsurface structures are under investigation, only indirect methods revealed reliable results of the atoms’ spatial arrangement. An alternative and direct method is three-dimensional imaging by means of holography. Holography was in fact proposed for electron waves, because of the electrons’ short wavelength at easily accessible energies. Further, electron waves are ideal structure probes on an atomic length scale, because electrons have a high scattering probability even for light elements. However, holographic reconstructions of electron diffraction patterns have in the past contained severe image artifacts and were limited to at most a few tens of atoms. Here, we present a general reconstruction algorithm that leads to high-quality atomic images showing thousands of atoms. Additionally, we show that different elements can be identified by electron holography for the example of FeS₂ . KW - holography KW - electron diffraction KW - atomic imaging KW - photoemission KW - electron backscattering PY - 2016 DO - https://doi.org/10.1021/acs.nanolett.6b00524 VL - 16 IS - 5 SP - 3195 EP - 3201 PB - American Chemical Society AN - OPUS4-37739 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schäfer, N. A1 - Wilkinson, A. J. A1 - Schmid, Thomas A1 - Winkelmann, Aimo A1 - Chahine, G. A. A1 - Schülli, T. U. A1 - Rissom, T. A1 - Marquardt, J. A1 - Schorr, S. A1 - Abou-Ras, D. T1 - Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy N2 - The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure–property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman microspectroscopy, which provide access to microstrain distributions within individual grains. CuInSe₂ thin films or solar cells are used as a modelsystem. High-resolution electron backscatter diffraction and X-ray microdiffraction as well as Ramanmicrospectroscopy were applied for this comparison. Consistently, microstrain values were determined of the order of 10⁻⁴ by these three techniques. However,only electron backscatter diffraction, X-ray microdiffraction exhibit sensitivities appropriate for mapping local strain changes at the submicrometer level within individual grains in polycrystalline materials. KW - Microstrain KW - Thin film KW - X-ray microdiffraction KW - EBSD KW - Raman microspectroscopy PY - 2016 DO - https://doi.org/10.1016/j.ultramic.2016.07.001 SN - 0304-3991 SN - 1879-2723 VL - 169 SP - 89 EP - 97 PB - Elsevier B.V. AN - OPUS4-37453 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -