TY - CONF A1 - Österle, Werner A1 - Urban, Ingrid A1 - Nebauer, E. T1 - Alloying reactions of Au-Ni-Ge ohmic contacts to n-GaAs PY - 1994 SP - 781 EP - 782 CY - Les Ulis AN - OPUS4-2479 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bettge, Dirk A1 - Österle, Werner A1 - Ziebs, Josef T1 - Temperature dependence of yield strength and elongation of the nickel-base superalloy IN 738 LC and the corresponding microstructural evolution PY - 1995 SN - 0179-4841 SN - 0044-3093 VL - 86 SP - 190 EP - 197 PB - Hanser CY - München AN - OPUS4-2481 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Merkel, U. A1 - Nebauer, E. A1 - Österle, Werner A1 - Würfl, J. ED - Brueck, S. R. J. T1 - RTA-treated ohmic contacts to GaAs containing WSiN barriers T2 - MRS Spring Meeting on Rapid Thermal and Integrated Processing CY - San Francisco, CA, USA DA - 1995-04-17 PY - 1995 SN - 1-558-99290-1 SN - 0272-9172 N1 - Serientitel: Materials Research Society symposium proceedings – Series title: Materials Research Society symposium proceedings IS - 387 SP - 431 EP - 436 PB - Materials Research Soc. CY - Pittsburgh, Pa. AN - OPUS4-2504 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kuhmann, J. A1 - Harde, P. A1 - Pech, O. A1 - Pittroff, W. A1 - Preuß, A. A1 - Adolphi, B. A1 - Wirth, Thomas A1 - Österle, Werner ED - Reichl, H. T1 - Fluxless flip-chip bonding for the photonic assembly - comparison between evaporated SnPb (60/40) and AuSn (80/20) solder T2 - 5th International Conference on Micro-Electro-, -Opto-, -Mechanical Systems and Components CY - Potsdam, Germany DA - 1996-09-17 PY - 1996 SN - 3-8007-2200-3 VL - 5 SP - 91 EP - 97 PB - VDE-Verl. CY - Berlin AN - OPUS4-2544 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Österle, Werner ED - Liu, G. T1 - Alternative approaches to the microstructure-strength-relationship of LC and HSLA steels T2 - Third International Conference on HSLA Steels CY - Beijing, PR China DA - 1995-10-25 PY - 1995 SN - 7-504-62091-2 SP - 243 EP - 246 PB - China Science and Technology Press CY - Beijing AN - OPUS4-2506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Sievert, Rainer A1 - Österle, Werner A1 - Olschewski, Jürgen A1 - Ziebs, Josef T1 - Physical interpretation of a viscoplastic model applied to high temperature performance of a nickel-base superalloy T2 - 7th International Conference on Mechanical Behaviour of Materials CY - The Hague, Netherlands DA - 1995-01-01 PY - 1995 SP - 557 EP - 558 CY - Den Haag AN - OPUS4-2507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bettge, Dirk A1 - Jiao, F. A1 - Österle, Werner A1 - Ziebs, Josef ED - Lütjering, G. T1 - An extended model of the tension-compression asymmetry of single crystal nickel-base superalloys T2 - 6th International Fatigue Congress CY - Berlin, Germany DA - 1996-05-06 PY - 1996 SN - 0-08-042268-3 VL - 2 IS - 2 SP - 885 EP - 889 PB - Pergamon CY - Oxford AN - OPUS4-2508 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Urban, Ingrid A1 - Dörfel, Ilona A1 - Österle, Werner A1 - Schierhorn, Eike T1 - Interfaces between hard coating systems and substrates T2 - 11th European Conference on Electron Microscopy (EUREM-11) CY - Dublin, Ireland DA - 1996-08-26 PY - 1996 SN - 2-9600163-0-0 PB - CESM, Committee of European Societies of Microscopy CY - Brussels AN - OPUS4-2545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sievert, Rainer A1 - Österle, Werner A1 - Olschewski, Jürgen A1 - Ziebs, Josef T1 - Physical interpretation of a viscoplastic model applied to high temperature performance of a nickel-base superalloy PY - 1997 SN - 0179-4841 SN - 0044-3093 VL - 88 SP - 416 EP - 424 PB - Hanser CY - München AN - OPUS4-2547 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Ultra-thin SiO2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements KW - SiO2 KW - Thin films KW - Thickness KW - XPS KW - Ellipsometry KW - TEM PY - 2003 SN - 1473-2734 SP - 57 pages AN - OPUS4-4118 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -