TY - CHAP A1 - Österle, Werner ED - Czichos, Horst T1 - Sub-surface microstructural analysis N2 - Many performance properties of devices or interacting machine parts are related to superficial layers which often show completely different or at least modified microstructures compared to the bulk materials. A quasi non-destructive technique will be described which enables us to obtain detailed information of a material's state at a certain site of interest down to a depth of 10 µm from the surface with nanometre or even atomistic resolution. KW - FIB-Technik KW - Zielpräparation KW - Randschichtanalyse KW - Nanocharakterisierung PY - 2013 SN - 978-3-642-25849-7 SN - 978-3-642-25850-3 U6 - https://doi.org/10.1007/978-3-642-25850-3_16 IS - Chapter 16 SP - 323 EP - 337 PB - Springer CY - Berlin Heidelberg AN - OPUS4-27644 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CHAP A1 - Orts-Gil, G. A1 - Österle, Werner ED - Tantra, R. T1 - Reference nanomaterials N2 - This chapter reviews relevant aspects of the still less explored field of RNMs. In the first part, definition of RMs according to different metrological levels was presented as well as the general strategy on their development. In the second part, the importance of RNMs in material science and nanotoxicology is explained and considerations on the use of silica nano-objects as potential future reference material was discussed. Overall, several points should be highlighted from this chapter: Definition of a reference material depends on the level of standardization. Certified reference material represents the highest level of traceability. Different types of reference materials, standard materials and certified reference materials are available, as shown in Table 3.1. The preparation of nano-objects with well-defined mechanical properties is still an unsolved issue and thus needs further R&D activities. Nevertheless, amorphous silica seems to be a promising candidate for reaching this objective. Traceable properties of nanomaterials are still limited to few cases such as primary particle size and thickness measurements of very thin films. In general, developed RMs are monoparametric thus, only one characteristic of the nano-objects is reported. In nanotoxicology, the challenge is in the development of suitable RNM that bears similarities to the measurements made on the sample analysed. KW - Reference material KW - Certified reference material KW - Nanostructure PY - 2016 SN - 9781118753590 SP - 49 EP - 61 PB - Wiley & Sons, Ltd. ET - 1 AN - OPUS4-37943 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -