TY - CONF A1 - Osterloh, Kurt A1 - Zscherpel, Uwe A1 - Rädel, Christoph A1 - Weidemann, Gerd A1 - Meinel, Dietmar A1 - Goebbels, Jürgen A1 - Ewert, Uwe A1 - Hasenstab, A. A1 - Bücherl, T. T1 - Durchstrahlungsprüfung von Holz T2 - DGZfP-Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - Digitale Radiographie KW - Tomographie KW - Spaltneutronen KW - Neutronenradiographie PY - 2007 SN - 978-3-931381-98-1 IS - DGZfP-BB 104 (Vortrag 40) SP - 1 EP - 12 AN - OPUS4-20717 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weidemann, Gerd A1 - Goebbels, Jürgen A1 - Stadie, R. A1 - Hillemeier, B. A1 - Haibel, A. T1 - Untersuchung von faserverstärktem Porenbeton mit Computertomographie KW - Porenbeton KW - Faserorientierung KW - Computertomographie PY - 2007 SN - 978-3-931381-98-1 SP - 807 EP - 819 (Poster 22) PB - DGZfP CY - Berlin AN - OPUS4-15835 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Weidemann, Gerd A1 - Goebbels, Jürgen A1 - Illerhaus, Bernhard A1 - Dittrich, R. A1 - Mangler, M. A1 - Tomandl, G. T1 - Charakterisierung von Gradientenwerkstoffen mittels hochauflösender Computertomographie T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2001 CY - Berlin, Deutschland DA - 2001-05-21 PY - 2001 UR - http://www.ndt.net/article/dgzfp01/papers/p16/p16.htm N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 75-CD PB - DGZfP CY - Berlin AN - OPUS4-1128 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hilpert, U. A1 - Bartscher, M. A1 - Neugebauer, M. A1 - Goebbels, Jürgen A1 - Weidemann, Gerd A1 - Bellon, Carsten T1 - Simulation-aided computed tomography (CT) for dimensional measurements N2 - Carrying out dimensional measurements by CT means assessing coordinates in space. CT must therefore be treated as a coordinate measuring technique similar to optical or tactile Coordinate Measuring Machines (CMMs). The well-established standards and guidelines for the acceptance- and verificationtesting of CMMs require the use of calibrated reference standards to achieve measurement machine characteristics. Hence, transferring these concepts from coordinate metrology to CT, a dedicated CT-specific reference standard was designed, manufactured and calibrated using a tactile CMM. For comparison purposes, a CAD model was created by reverse engineering using the calibration data. The calibrated model was fed into a virtual CT and the measurement process was simulated. The reference standard was measured by micro-CT. By comparing the characteristics of the measurement output of CT and the output gained from simulation, the influences of measurement artefacts can be judged, for the first time, in analogy to existing Guidelines of coordinate metrology. T2 - DIR 2007 - International Symposium on Digital industrial Radiology and Computed Tomography CY - Lyon, France DA - 25.06.2007 KW - Computed tomography KW - X-ray KW - Simulation KW - Coordinate metrology PY - 2007 UR - http://www.ndt.net/article/dir2007/papers/12.pdf SP - Paper 6, 1 EP - 15 AN - OPUS4-37045 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rack, A. A1 - Riesemeier, Heinrich A1 - Zabler, S. A1 - Weitkamp, T. A1 - Müller, Bernd R. A1 - Weidemann, Gerd A1 - Modregger, P. A1 - Banhart, J. A1 - Helfen, L. A1 - Danilewsky, A.N. A1 - Gräber, H.G. A1 - Heldele, R. A1 - Mayzel, B. A1 - Goebbels, Jürgen A1 - Baumbach, T. ED - Stuart R. Stock, T1 - The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA) N2 - The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed. KW - Microtomography KW - Non-destructive evaluation KW - Coherent imaging KW - X-ray refraction KW - X-ray phase contrast KW - Synchrotron-CT KW - Synchrotron instrumentation KW - Scintillator KW - Bragg magnification KW - Holotomography KW - X-ray topography PY - 2008 DO - https://doi.org/10.1117/12.793721 SN - 0277-786X VL - 7078 SP - 70780X-1 - 70780X-9 AN - OPUS4-18296 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -