TY - RPRT A1 - Ebert, H.-P. A1 - Reichenauer, G. A1 - Brandt, R. A1 - Braxmeier, S. A1 - Bauer, T. A1 - Tamme, R. A1 - Langer, W. A1 - Hudler, B. A1 - Christ, M. A1 - Sextl, G. A1 - Müller, G. A1 - Helbig, U. A1 - Houbertz, R. A1 - Voigt, W. A1 - Schmidt, H. A1 - Zehl, T. A1 - Mach, Reinhard A1 - Maneck, Heinz-Eberhard A1 - Meyer-Plath, Asmus A1 - Oleszak, Franz A1 - Keuper, M. A1 - Reisert, M. A1 - Burkhardt, H. A1 - Günther, E. A1 - Mehling, H. T1 - Netzwerk zur Überwindung grundlegender Probleme bei der Entwicklung hocheffizienter Latentwärmespeicher auf Basis anorganischer Speichermaterialien KW - Latentwärmespeicher KW - Materialforschung KW - Plasmaverfahren KW - Graphit PY - 2008 SN - 978-3-00-024699-9 SP - 1 EP - 217 CY - Würzburg AN - OPUS4-18273 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Critical review of the current status of thickness measurements for ultrathin SiO2 on Si - Part V: Results of a CCQM pilot study N2 - Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters. The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy. KW - Calibration KW - Ellipsometry KW - GIXRR KW - Interlaboratory study KW - MEIS KW - Neutron reflectometry KW - NRA KW - RBS KW - Silicon dioxide KW - SIMS KW - XPS PY - 2004 DO - https://doi.org/10.1002/sia.1909 SN - 0142-2421 SN - 1096-9918 VL - 36 IS - 9 SP - 1269 EP - 1303 PB - Wiley CY - Chichester AN - OPUS4-5549 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - RPRT A1 - Seah, M.P. A1 - Spencer, S.J. A1 - Bensebaa, F. A1 - Vickridge, I. A1 - Danzebrink, H. A1 - Krumrey, M. A1 - Gross, Thomas A1 - Österle, Werner A1 - Wendler, E. A1 - Rheinländer, B. A1 - Azuma, Y. A1 - Kojima, I. A1 - Suzuki, N. A1 - Suzuki, M. A1 - Tanuma, S. A1 - Moon, D.W. A1 - Lee, H.J. A1 - Cho, H.M. A1 - Chen, H.Y. A1 - Wee, A. T. S. A1 - Osipowicz, T. A1 - Pan, J.S. A1 - Jordaan, W.A. A1 - Hauert, R. A1 - Klotz, U. A1 - van der Marel, C. A1 - Verheijen, M. A1 - Tamminga, Y. A1 - Jeynes, C. A1 - Bailey, P. A1 - Biswas, S. A1 - Falke, U. A1 - Nguyen, N.V. A1 - Chandler-Horowitz, D. A1 - Ehrstein, J.R. A1 - Muller, D. A1 - Dura, J.A. T1 - Ultra-thin SiO2 on Si, Part V: Results of a CCQM Pilot Study of Thickness Measurements KW - SiO2 KW - Thin films KW - Thickness KW - XPS KW - Ellipsometry KW - TEM PY - 2003 SN - 1473-2734 SP - 57 pages AN - OPUS4-4118 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Stephan, H. A1 - Gloe, K. A1 - Kraus, Werner A1 - Spies, H. A1 - Johannsen, B. A1 - Wichmann, K. A1 - Reck, Günter A1 - Chand, D. K. A1 - Bharadwaj, P. K. A1 - Müller, U. A1 - Müller, W. M. A1 - Vögtle, F. ED - Moyer, B. A. T1 - Binding and extraction of pertechnetate and perrhenate by azacages T2 - Symposium Fundamentals and Applications of Anion Separations ; American Chemical Society national meeting CY - Chicago, IL, USA DA - 2001-08-25 PY - 2004 SN - 0-306-47911-7 SP - 151 EP - 168 PB - Kluwer Acad./Plenum Publ. CY - New York, NY AN - OPUS4-3667 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Horn, Wolfgang A1 - Jann, Oliver A1 - Müller, B. A1 - Danielak, M. A1 - Müller, D. A1 - Plehn, W. T1 - Bauproduktprüfung und Geruch - Neue Entwicklungen im Rahmen von Label-Systemen T2 - 11. Workshop - Geruch und Emissionen bei Kunststoffen CY - Kassel, Deutschland DA - 2009-03-30 KW - AgBB-Schema KW - VOC KW - Emissionen KW - Geruch KW - Bauprodukte KW - Bewertung Emissionen PY - 2009 SP - 8-1 - 8-9 AN - OPUS4-19224 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Birgit A1 - Danielak, M. A1 - Horn, Wolfgang A1 - Jann, Oliver A1 - Müller, D. A1 - Panaskova, J. A1 - Plehn, W. T1 - Sensorische Bewertung der Emissionen aus Bauprodukten N2 - Die Bewertung von VOC-Emissionen aus Bauprodukten soll durch das AgBB-Schema vereinheitlicht werden und eine gesundheitsrelevante Komponente enthalten. Das Deutsche Institut für Bautechnik (DIBt) hat das AgBB-Schema in weiten Teilen für seine „Grundsätze zur gesundheitlichen Bewertung von Bauprodukten in Innenräumen“ implementiert. Neben der üblichen chemischen Emissionsmessung soll auch der Geruch für die Bewertung des Produkts herangezogen werden. Um den Geruch als festen Bestandteil in die Produktprüfung zu integrieren, wurden vom Umweltbundesamt zwei Vorhaben initiiert. Erste Ergebnisse des zweiten Vorhabens (FKZ 37 07 62 300; Sensorische Bewertung der Emissionen aus Bauprodukten – Integration in die Vergabegrundlagen für den Blauen Engel und das Bewertungsschema des Ausschusses zur gesundheitlichen Bewertung von Bauprodukten) werden hier dargestellt. KW - AgBB-Schema KW - VOC KW - Emissionen KW - Geruch KW - Bauprodukte KW - Bewertung Emissionen PY - 2009 SN - 0949-8036 SN - 0039-0771 SN - 1436-4891 VL - 69 IS - 6 SP - 246 EP - 250 PB - Springer-VDI-Verl. CY - Düsseldorf AN - OPUS4-19658 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, B. A1 - Danielak, M. A1 - Zeidler, O. A1 - Jann, Oliver A1 - Horn, Wolfgang A1 - Müller, D. A1 - Panaskova, J. A1 - Plehn, W. T1 - Labelling of building materials - A combination of emission tests with odour tests T2 - Healthy buildings 2009 - 9th International conference & exhibition CY - Syracuse, NY, USA DA - 2009-09-13 KW - Labelling systems KW - VOCs KW - Odour KW - Sensory tests KW - Emission tests PY - 2009 IS - Paper 323 SP - 1 EP - 4 CY - Syracuse, NY, USA AN - OPUS4-19927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Horn, Wolfgang A1 - Danielak, M. A1 - Müller, B. A1 - Jann, Oliver A1 - Plehn, W. A1 - Müller, D. T1 - Implentation of odour test methods into labelling procedures of flooring materials T2 - Healthy buildings 2009 - 9th International conference & exhibition CY - Syracuse, NY, USA DA - 2009-09-13 KW - AgBB-Scheme KW - Labelling KW - Flooring material KW - VOC emission KW - Odour PY - 2009 IS - Paper 356 SP - 1 EP - 3 CY - Syracuse, NY, USA AN - OPUS4-19926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Tougaard, S. A1 - Werner, W. S. M. A1 - Hronek, M. A1 - Kunz, Valentin A1 - Radnik, Jörg A1 - Stockmann, Jörg M. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Nirmalananthan-Budau, Nithiya A1 - Geißler, Daniel A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Correction to "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" N2 - This is a corrigendum to the original article "Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy" that was published in "The journal of physical chemistry C", vol. 123 (2019), no. 49 pp. 29765-29775. PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-505451 DO - https://doi.org/10.1021/acs.jpcc.0c00027 SN - 1932-7447 SN - 1932-7455 VL - 124 IS - 6 SP - 3923 PB - American Chemical Society CY - Washington, DC AN - OPUS4-50545 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Anja A1 - Heinrich, Thomas A1 - Tougaard, S. A1 - Werner, W. S. M. A1 - Hronek, M. A1 - Kunz, Valentin A1 - Radnik, Jörg A1 - Stockmann, Jörg M. A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Nirmalananthan-Budau, Nithiya A1 - Geißler, Daniel A1 - Sparnacci, K. A1 - Unger, Wolfgang T1 - Determining the thickness and completeness of the shell of polymer core-shell nanoparticles by X-ray photoelectron spectroscopy, secondary ion mass spectrometry, and transmission scanning electron microscopy N2 - Core–shell nanoparticles (CSNPs) have become indispensable in various industrial applications. However, their real internal structure usually deviates from an ideal core–shell structure. To control how the particles perform with regard to their specific applications, characterization techniques are required that can distinguish an ideal from a nonideal morphology. In this work, we investigated poly(tetrafluoroethylene)–poly(methyl methacrylate) (PTFE–PMMA) and poly(tetrafluoroethylene)–polystyrene (PTFE–PS) polymer CSNPs with a constant core diameter (45 nm) but varying shell thicknesses (4–50 nm). As confirmed by transmission scanning electron microscopy (T-SEM), the shell completely covers the core for the PTFE–PMMA nanoparticles, while the encapsulation of the core by the shell material is incomplete for the PTFE–PS nanoparticles. X-ray photoelectron spectroscopy (XPS) was applied to determine the shell thickness of the nanoparticles. The software SESSA v2.0 was used to analyze the intensities of the elastic peaks, and the QUASES software package was employed to evaluate the shape of the inelastic background in the XPS survey spectra. For the first time, nanoparticle shell thicknesses are presented, which are exclusively based on the analysis of the XPS inelastic background. Furthermore, principal component analysis (PCA)-assisted time-of-flight secondary-ion mass spectrometry (ToF-SIMS) of the PTFE–PS nanoparticle sample set revealed a systematic variation among the samples and, thus, confirmed the incomplete encapsulation of the core by the shell material. As opposed to that, no variation is observed in the PCA score plots of the PTFE–PMMA nanoparticle sample set. Consequently, the complete coverage of the core by the shell material is proved by ToF-SIMS with a certainty that cannot be achieved by XPS and T-SEM. KW - XPS KW - T-SEM KW - ToF-SIMS KW - Core-shell nanoparticles PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-499165 DO - https://doi.org/10.1021/acs.jpcc.9b09258 VL - 123 IS - 49 SP - 29765 EP - 29775 PB - American Chemical Society CY - Washington, DC AN - OPUS4-49916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -