TY - RPRT A1 - Block, S. A1 - Boß, K.-H. A1 - Frobese, D.-H. A1 - Pape, H. A1 - Gösslinghoff, L. A1 - Grossepieper, T. A1 - Kasper, R. A1 - Kirchner, W. A1 - Kollmann, P. A1 - Kröger, P. A1 - Ringlstetter, P. A1 - Kuska, T. A1 - Mattejat, K. A1 - Niehüser, H. A1 - Pfeiffer, F. A1 - Pötzsch, Klaus-Michael A1 - Jochems, Frank A1 - Schäfer, H. A1 - Vogt, W. A1 - Zankl, C. A1 - Ludzay, J. T1 - Empfehlungen zur Vermeidung von Überdrücken an Tankfahrzeugen bei Untenbefüllung T2 - DGMK-Information KW - Untenbefüllung KW - Tankfahrzeuge KW - Überdruck KW - Mineralöl KW - Sicherheitsventile PY - 2012 VL - 727 IS - 3 SP - 1-4, Anl. 1-3 AN - OPUS4-27921 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lühl, Lars A1 - Mantouvalou, I. A1 - Malzer, W. A1 - Schaumann, I. A1 - Vogt, C. A1 - Hahn, Oliver A1 - Kanngiesser, B. T1 - Reconstruction procedure for 3D micro X-ray absorption fine structure JF - Analytical chemistry N2 - A new approach for chemical speciation in stratified systems using 3D Micro-XAFS spectroscopy is developed by combining 3D Micro X-ray Fluorescence Spectroscopy (3D Micro-XRF) and conventional X-ray Absorption Fine Structure Spectroscopy (XAFS). A prominent field of application is stratified materials within which depth-resolved chemical speciation is required. Measurements are collected in fluorescence mode which in general lead to distorted spectra due to absorption effects. Developing a reliable reconstruction algorithm for obtaining undistorted spectra for superficial and in-depth layers is proposed and validated. The developed algorithm calculates the attenuation coefficients of the analyte for the successive layers facilitating a new spectroscopic tool for three-dimensionally resolved nondestructive chemical speciation. KW - X-ray absorption fine structure KW - 3D X-ray fluorescence analysis PY - 2012 DO - https://doi.org/10.1021/ac202285d SN - 0003-2700 SN - 1520-6882 VL - 84 IS - 4 SP - 1907 EP - 1914 PB - American Chemical Society CY - Washington, DC AN - OPUS4-26941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -