TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery by Means of SEM/EDX - Hints about the Manufacturing Process T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28509 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rackwitz, Vanessa A1 - Procop, M. A1 - Hodoroaba, Vasile-Dan T1 - Characterization of polycapillary X-ray semilenses with SEM/EDX KW - Polycapillary X-ray optics KW - Semi-lens KW - Parallelising mode KW - SEM KW - EDS KW - Acceptance area KW - FWHM KW - Transmission KW - Focal distance KW - XRF PY - 2010 DO - https://doi.org/10.1017/S1431927610054280 SN - 1431-9276 SN - 1435-8115 VL - 16 IS - Suppl 2 SP - 932 EP - 933 PB - Cambridge University Press CY - New York, NY AN - OPUS4-27219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Morphological and Compositional Features of Portuguese Polychrome Glazed Pottery Investigated by SEM/EDX - Hints about the Manufacturing Processes T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28941 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Welcoming elemental analysis of nanoparticles by EDX in combination with high-resolution electron microscopy in transmission mode T2 - 13th European Workshop on modern developments and applications in microbeam analysis (EMAS 2013) CY - Oporto, Portugal DA - 2013-05-12 PY - 2013 AN - OPUS4-28510 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM T2 - Nano-Additive CY - Berlin, Germany DA - 2012-11-19 PY - 2012 AN - OPUS4-27152 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Prediction of Detection Limits of Micro X-Ray Fluorescence (µXRF) T2 - Microscopy and Microanalysis 2012 CY - Phoenix, AZ, USA DA - 2012-07-29 PY - 2012 AN - OPUS4-26309 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Silizium-Drift-Detektoren kontra ISO 15632:2002 T2 - Kolloquium 30 Jahre EDS-Analytik in Berlin CY - Berlin, Germany DA - 2012-05-22 PY - 2012 AN - OPUS4-25970 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Akcakayiran, D. A1 - Grigoriev, D. A1 - Shchukin, D.G. T1 - High-resolution SEM with coupled transmission mode and EDX for quick characterization of micro- and nanocapsules for self-healing anti-corrosion coatings N2 - More and more sub-micro and nano-materials shall be "quickly", but accurately characterized with respect to their morphology, shape, size or size distribution, but also to the chemical composition as well by means of an SEM/EDX (Scanning Electron Microscopy / X-Ray Energy Dispersive Spectrometry) system. This undertaking is becoming successful indeed if the transmission mode at low voltages such as those at a SEM, i. e. mostly up to 30 kV, and EDX, respectively is employed. The transmission mode at conventional SEM can e "activated" firstly by re-defining the specimen to be analyzed and preparing it as a thin specimen, which is quasi-transparent to electrons and by finding a way of collecting only the transmitted electrons for analysis. The first issue can be easily realized by using the conventional TEM grids (and the respective sample preparation); the second one becomes feasible either (i) by placing a socalled STEM semiconductor detector directly under the thin specimen or (ii) by using a Special transmission set-up, which enables to the conventional Everhart-Thornley detector to collect only transmitted electrons by blocking the direct collection of secondary electrons and guiding only the transmitted electrons onto it. KW - Microcapsules KW - Nanocapsules KW - Anti-corrosion KW - SEM KW - TSEM KW - Transmission KW - EDX PY - 2013 DO - https://doi.org/10.1017/S1431927613003863 SN - 1431-9276 SN - 1435-8115 VL - 19 IS - Suppl. 2 SP - 374 EP - 375 PB - Cambridge University Press CY - New York, NY AN - OPUS4-29444 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Size characterization of airborne SiO2 nanoparticles with on-line and off-line measurements techniques: validation with an interlaboratory comparison T2 - Conference on Aerosol Technology 2014 CY - Karlsruhe, Germany DA - 2014-06-16 PY - 2014 AN - OPUS4-30110 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Quick Characterization of Micro- and Nanocapsules for self-Healing Anti-Corrosion Coatings by High-Resolution SEM with Coupled Transmission Mode and EDX T2 - ECASIA´13 (The 15th European Conference on Applications of Surface and Interface Analysis) CY - Cagliari, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-29558 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Check and Specification of the Performance of EDS Systems attached to the SEM by Means of a New Test Material EDS-TM002 and an Updated Evaluation Software Package EDS Spectrometer Test (Version 3.4) T2 - Microscopy and Microanalysis 2013 CY - Indianapolis, IN, USA DA - 2013-08-04 PY - 2013 AN - OPUS4-28952 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -