TY - JOUR A1 - Knigge, Xenia A1 - Guo, Z. A1 - Valsami-Jones, E. A1 - Hodoroaba, Vasile-Dan A1 - Radnik, Jörg T1 - Influence of Sterilization on the Surface of Nanoparticles Studied with XPS / HAXPES in Comparison to SEM / EDS N2 - Nanosafety is becoming increasingly important as nanomaterials are widely used in industrial processes and consumer products. For nanotoxicity measurements prior sterilization of the samples is necessary, but as structure activity relationships are made with properties of pristine particles, the question arises, if the sterilization process has an impact on the physico-chemical properties of nanoparticles and thus on the biological behavior. This question will be addressed in this talk. For this purpose, results from SEM and EDS measurements are combined with those of a novel lab-based HAXPES spectrometer in order to obtain a more complete picture. At the end, an influence of sterilization will be evident, which indicates a restructuring of the nanoparticles owing to sterilization. T2 - Microscopy & Microanalysis 2022 CY - Portland, USA DA - 31.07.2022 KW - XPS KW - HAXPES KW - SEM KW - EDS KW - Nanoparticles PY - 2022 DO - https://doi.org/10.1017/S1431927622004287 VL - 28 SP - 986 EP - 988 PB - Cambridge University Press AN - OPUS4-55352 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Eggert, Claudia A1 - Hodoroaba, Vasile-Dan T1 - Welcome and Introduction N2 - Nanotechnology has emerged over the past decade as a key field involving the design, characterization, production, and application of materials, structures, devices, and systems at the nanometer scale. Due to their large specific surface area and significant surface chemistry, nanomaterials offer enhanced material properties and product functionalities. However, alongside these advancements comes the potential risk to humans and the environment. The development of nanomaterials has provided new opportunities to understand matter at the nanoscale, accelerating the creation of innovative advanced materials and devices. The expertise gained in the standardization and regulation of nanomaterials, particularly in characterizing nanoparticulate matter, should be applied to other innovative advanced materials, such as (nano)composites, 2D structures, additive manufactured materials, gels, and foams. Initial guidance for the safe-and-sustainable-by-design (SSbD) development of advanced materials during the early innovation phase has been introduced by various groups and projects. Additionally, digital material passports (DMP) and digital product passports (DPP) need to be defined and implemented uniformly across Europe. In 2024, the Innovative Advanced Materials Initiative (IAM-I) was launched by European stakeholders to contribute to a "Research and Innovation ecosystem that will significantly accelerate the time-to-market of sustainable innovative advanced materials (IAMs) and associated technologies designed for a digital circular economy." Knowledge transfer is a crucial pillar of this ecosystem, and a future IAM-I Academy could be a valuable tool. Initially, it is essential to define "education & training needs to boost Europe’s competitiveness and sovereignty within the area of IAM." T2 - Nano and Beyond - What can we learn from Nano for other Innovative Advanced Materials? CY - Online meeting DA - 04.07.2025 KW - Advance Materials KW - Nanomaterials KW - IAM-I KW - SSbD KW - DMP KW - DPP PY - 2025 UR - https://www.bam-akademie.de/kursangebot/kurs/webinar-nano-and-beyond-55.html?lang=en AN - OPUS4-63690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - SETNanoMetro advances: Fabrication and measurement of TiO2 engineered nanoparticles N2 - The press conference on the results of the European Project FP7 constitutes a dissemination event dedicated to the production and characterization of "Shape-engineered TiO2 nanoparticles for metrology of functional properties: setting design rules from material synthesis to nanostructured devices" with the main large-scale applications in the three reference sectors: energy, health and environment. T2 - Press conference on the results of the European Project FP7 CY - Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, Italy DA - 31.03.2017 KW - TiO2 KW - Nanoparticles KW - Measurement KW - Metrology KW - Shape-enegineered nanoparticles PY - 2017 AN - OPUS4-39622 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Advanced physico-chemical Characterisation & Correlation of Results with different Methods for GFMs N2 - An accurate characterisation of the morphological, structural, and chemical properties of nano and advanced materials is key for the understanding of the material functionality and constitutes the basis for future optimisation or even prediction of the product performance. Further, the correlation of the physical-chemical properties with results from biological testing leads to an understanding of the potential toxicological effects so that a minimisation of the materials risks becomes possible. The presentation will highlight with examples the importance of the selection of the relevant parameters/descriptors and particularly their measurement for the reliable characterisation of the morphology, structure, and chemistry of graphene-related 2D-materials (GR2M’s) [1-3]. One crucial aspect is also one of most challenging ones in the characterisation chain: the proper sample preparation, which shall be tailored to the accurate measurement of the defined analytical parameter. Practical examples of measurement of morphological descriptors of GR2M’s, such as equivalent circular diameter (ECD), minimum and maximum Feret, and aspect ratio with electron microscopy, or of the thickness with atomic force microscopy (AFM) will be showed, together with quantitative chemical characterisation with X-ray photoelectron spectroscopy (XPS) and, newly, with energy-dispersive X-ray spectroscopy with a scanning electron microscope (SEM/EDX) [4] by evaluating accurately the elemental content as the ratio of O/C and the composition of impurities. Another relevant, but challenging part of the characterisation of GR2M’s, particularly as the final products containing mostly low amounts of GR2M’s, is the analysis of homogeneity of the chemical composition by sensitive imaging methods. Examples of successful analysis with secondary ion mass spectrometry (SIMS), even if not quantitative, will be presented. T2 - Joint online Workshop: Harmonisation & Standardisation of Test Methods for Nano- and Advanced Materials CY - Paris, France DA - 19.06.2025 KW - Physico-chemical characterisation KW - Graphene-related 2D materials KW - OECD KW - Standardisation KW - GO flakes PY - 2025 UR - https://macrame-project.eu/macrame-meetings-workshops/ws_hamonisation_standardisation_2023/ AN - OPUS4-63557 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - (Pre)Standardisation and Metrology in Microbeam Analysis – Ongoing Activities and Opportunities N2 - The presentation addresses the current ongoing projects as well as the gaps and opportunities in microbeam analysis within ISO/TC 202 Microbeam Analysis standardisation body and in-liaison Technical Working Areas (TWAs) at the pre-standardization platform of VAMAS (Versailles Project on Advanced Materials and Standards). T2 - EMAS 2023 - 17th European Workshop on Modern Developmennts and Applications in Microbeam Analysis - General Assembly CY - Krakow, Poland DA - 07.05.2023 KW - Microbeam analysis KW - EDS KW - Electron microscopy KW - Inter-laboratory comparison KW - EBSD KW - Standardisation PY - 2023 AN - OPUS4-57483 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Measurement of the Lateral Size of Graphene Oxide Flakes by SEM N2 - The progress of the VAMAS interlaboratory comparison Project P13 "Lateral size of graphene oxide flakes by SEM" within the Technical Working Area 41 "Graphene and Related 2D Materials" is presented. The challenges at sample preparation on substrates for accurate measurement and image analysis as well as two different analysis approaches, containing exact guidance how to measure the main descriptors for the lateral size measurement of the imaged graphene oxide flakes with Scanning Electron Microscopy are highlighted. The size and shape distributions as measured by 17 laboratories are showed expressed in size and shape descriptors extracted from SEM images by using two proposed measurement approaches. The implementation of the results into the corresponding ISO technical specification AWI/TS 23879 is discussed and planned, in relation with the AFM part. T2 - ISO/TC 229 Nanotechnologies Meeting Week CY - Stockholm, Sweden DA - 19.05.2025 KW - Graphene oxide KW - Interlaboratory comparison KW - SEM KW - Lateral size KW - VAMAS KW - ISO/TC 229 Nanotechnologies PY - 2025 AN - OPUS4-63189 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - ED-EPMA Measurements of elemental Composition and Thickness of Fe-Ni Alloy Films T2 - IUMAS, 5th International Union of Microbeam Analysis Societies CY - Seoul, South Korea DA - 2011-05-22 PY - 2011 AN - OPUS4-23774 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sachse, René A1 - Moor, Maëlle A1 - Kraehnert, Ralph A1 - Hodoroaba, Vasile-Dan A1 - Hertwig, Andreas T1 - Ellipsometry-based approach for the characterization of mesoporous thin films for H2 technologies N2 - Porous thin layer materials are gaining importance in different fields of technology and pose a challenge to the accurate determination of materials properties important for their function. In this work, we demonstrate a hybrid measurement technique using ellipsometry together with other independent methods for validation. Ellipsometry provides information about the porosity of different mesoporous films (PtRuNP/OMC = 45%; IrOx = 46%) as well as about the pore size (pore radius of ca. 5 nm for PtRuNP/OMC). In addition, the electronic structure of a material, such as intraband transitions of a mesoporous IrOx film, can be identified, which can be used to better understand the mechanisms of chemical processes. In addition, we show that ellipsometry can be used as a scalable imaging and visualization method for quality assurance in production. These require accurate and traceable measurements, with reference materials playing an important role that include porosity and other related properties. We show that our novel analytical methods are useful for improving analytical work in this entire field. KW - Porous materials KW - Electrolysis KW - Spectroscopic ellipsometry KW - Hybrid metrology measurement KW - Electron microscopy PY - 2021 DO - https://doi.org/10.1002/adem.202101320 SP - 1 EP - 17 PB - Wiley-VCH AN - OPUS4-53960 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - VAMAS interlaboratory comparisons on nanoparticles associated with the outcomes of the EMPIR project nPSize N2 - Following points are presented and discussed: i) nPSize as an EMPIR project on the nanoparticle size and shape distribution of (more) complex particles including sample preparation and machine learning approaches; ii) parallel development of ISO 21363 (PSSD by TEM), ISO 19749 (PSSD by SEM), ISO 22292 (3D TEM), ISO 52408 (NP Prep for AFM and EM), iii) VAMAS and pre-standardisation, TWA 34 „Nanoparticle Populations“ with two nPSize ILC projects P15 & P16 – results to be published and integrated in ISO 21363 (PSSD by TEM); iv) Remaining challenges: platelets, 2D materials (TiO2 and GR2M); v) Reference data sets as part of a complete Characterisation Workflow. T2 - How to identify Nanomaterials more effectively? Good Practices and Ways to Progress CY - Paris, France DA - 11.05.2023 KW - Nanoparticles KW - VAMAS KW - nPSize KW - Particle size distribution KW - Nanoparticle concentration KW - Interlaboratory comparison PY - 2023 UR - https://www.lne.fr/fr/service/formation/journee-technique-nanomateriaux-comment-identifier-efficacement-nanomateriaux?utm_source=Twitter&utm_medium=Tweet&utm_campaign=JT2301 AN - OPUS4-57485 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ongoing VAMAS ILC s on Nanoparticles and Graphene Oxide N2 - This contributions shows the first results of the ongoing interlaboratory comparisons under VAMAS/TWA 34 Nanoparticle populations related on the determination of pasrticle size distribution and relative concentration of nanoparticles and an example of an ILC running under VAMAS/TWA 41 Graphene and Related 2D Materials on the determination of the lateral diemsnions of graphene oxide flakes by Scanning Electron Microscopy. The link to related standardisation projects at ISO/TC Nanotechnologies are explained. T2 - Webinar Building the Foundation: Interlaboratory Comparisons and Reference Products for Advanced Materials CY - Berlin, Germany DA - 16.05.2024 KW - Nanoparticles KW - VAMAS KW - Interlaboratory comparison KW - Standardisation KW - Electron microscopy KW - AFM KW - SAXS PY - 2024 AN - OPUS4-60097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Hoffmann, V. A1 - Steers, E. B. M. A1 - Wetzig, K. T1 - Exploitation of the effect of hydrogen on an analytical glow discharge T2 - Winter Conference on Plasma Spectrochemistry 2002 CY - Scottsdale, AZ, USA DA - 2002-01-06 PY - 2002 SN - 0161-6951 SP - 261 EP - 262 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-1589 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Performance Check of EDS X-Ray spectrometers - Extensions to high Count Rates T2 - PRORA 2011 Fachtagung Prozessnahe Röntgenanalytik CY - Berlin, Germany DA - 2011-11-24 PY - 2011 AN - OPUS4-24922 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Glow discharge optical emission spectrometry (GD-OES) on samples containing hydrogen T2 - Kolloquium zur Einweihung des neuen Wasserstofflabors der BAM, CY - Berlin, Germany DA - 2001-10-18 PY - 2001 AN - OPUS4-6148 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - nPSize - Improved traceability chain of nanoparticle size measurements N2 - The overall objective of project Improved traceability chain of nanoparticle size measurements is to improve the traceability chain for nanoparticle size measurements. The main impact will be achieved by manifold contributions to standard documents for CEN/TC 352 “Nanotechnologies”, which directly addresses the research needs of CEN, CENELEC and ETSI mandated by EC to develop standards for methods and reference materials to accurately measure the size and size distribution of nanoparticles. This will take place in collaboration with ISO/TC229 ‘Nanotechnologies’, ISO/TC24/SC4 ‘Particle characterization’ and ISO/TC201 ‘Surface analysis’/ SC9 ‘Scanning probe microscopy’. T2 - 4. Sitzung des wissenschaftlichen Beirats zum Themefeld Umwelt der BAM CY - BAM, Berlin, Germany DA - 13.04.2018 KW - Nanoparticles KW - Nanoparticle size KW - Traceability KW - Standardization PY - 2018 AN - OPUS4-44695 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Hydrogen Embrittlement in Coating Technology - Measurement & Testing N2 - Pre-treatment and electroplating of especially low alloyed high tensile strength steel components (such as those used in the aircraft industry) can be followed by a delayed hydrogen-induced fracture known as hydrogen embrittlement. As estimated by the fracture behavior, atomic hydrogen being evolved during the coating process and penetrating into the base metals is mainly trapped close to the interface base metal-coating. During a baking procedure after plating the atomic hydrogen can be removed from the traps and effuse through the coating as well as being more homogeneously distributed in the bulk of the base metal, both reducing the risk of embrittlement. Up to now there has been no analytical proof. Now investigations using GD-OES show that the hydrogen distribution in the coating, at the interface and within the bulk material, can be directly measured. The results give an improved knowledge and enable to work out process parameters and test procedures for coating techniques to be more effective to avoid hydrogen embrittlement. PY - 2002 SN - 0360-3164 VL - 89 IS - 10 SP - 57 EP - 60 PB - American Electroplaters' Society CY - East Orange, NJ AN - OPUS4-1923 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Webseite, freie Software für GDS-Anwender, Leitthema - Vorstellung, Anregungen T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-4327 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Round Robin Exercise: Coated Materials - Initial Report T2 - C Network on Glow Discharge Spectroscopy for Spectrochemical Analysis CY - Vienna, Austria DA - 2003-03-04 PY - 2003 AN - OPUS4-4326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Lokale Wasserstoffkonzentration: kritisch oder harmlos? PY - 2002 SN - 0026-0797 SN - 0043-2792 VL - 56 IS - 2 SP - 41 EP - 44 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-1542 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - GDOES - Ein Verfahren zur Messung von Wasserstoffprofilen an beschichteten Bauteilen PY - 2002 SN - 0026-0797 SN - 0043-2792 VL - 56 IS - 2 SP - 41 EP - 44 PB - IGT, Informationsges. Technik CY - München AN - OPUS4-1212 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hartelt, Manfred A1 - Wäsche, Rolf A1 - Hodoroaba, Vasile-Dan T1 - Verschleißpartikel-Analyse mit Rasterelektronenmikroskopie und energiedispersiver Röntgenspektrometrie im Transmissionsmodus (TSEM/EDX) N2 - Untersucht wurden Verschleißpartikel als elektronentransparente Proben auf dünnen Trägerfolien mit einem hochauflösendem Rasterelektronenmikroskop und energiedispersiver Röntgenspektrometrie im Transmissionsmodus. Die hohe laterale Auflösung dieser modernen Methoden ermöglicht eine morphologische Charakterisierung der Verschleißpartikel bis in den nm-Bereich. Die hochauflösende Elementanalyse erlaubt eine Interpretation der Zusammensetzung und damit Rückschlüsse auf die Verschleißpartikelbildung. Die tribologischen Untersuchungen sind an einem Modell-Verschleißtribometer nach DIN 51834-2 geschmiert, aber ohne Ölkreislauf, durchgeführt worden. Die Präparation der Verschleißpartikel über eine Entnahme und Übertragung einer geringen Schmierstoffmenge mit einer Mikropipette auf eine TEM-Trägerfolie ist mit einem geringen Aufwand möglich. Der präparative Aufwand ist relativ gering. Das benötigte Schmierstoffvolumen beträgt wenige Mikroliter (0,001 ml). Die Untersuchung zeigt die geringe geometrische Größe der Verschleißpartikel und bestätigt indirekt die These der Reaktionsschichtbildung mit einer geringen Schichtdicke, die ständig verschleißt und sich stetig neu bildet. Die beschriebenen Verschleißprozesse sind in der Modell-Verschleiß-Prüfung mit sehr hohen Pressungen am Versuchsbeginn nachweisbar. KW - Modellverschleißprüfung KW - Verschleißpartikel-Analyse KW - TSEM PY - 2015 SN - 0724-3472 VL - 62 IS - 6 SP - 5 EP - 11 PB - Expert Verlag CY - Renningen AN - OPUS4-35043 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Verbesserung analytischer GD-OES-Parameter durch Zumischen von Wasserstoff sowie Untersuchungen von Beschichungen als Kandidaten für H-ZRM T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-4328 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Verbesserung analytischer GD-OES-Parameter durch Zumischen von Wasserstoff sowie Untersuchungen von Beschichtungen als Kandidaten für H-ZRM T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5006 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Results of a Round Robin Exercise "Coated Materials" for Glow Discharge Spectrometry (GDS) T2 - 10th European Conference on Applications of Surface and Interface Analysis (ECASIA '03) CY - Berlin, Germany DA - 2003-09-05 PY - 2003 AN - OPUS4-5009 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Website, freie Software für GDS-Anwender, Leitthema-Vorstellung, Anregungen T2 - 10. Deutsches Anwenndertreffen "Analytische Glimmladungs-Spektrometrie" CY - Lüdenscheid, Germany DA - 2003-09-15 PY - 2003 AN - OPUS4-5007 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Quantitative and localized Hydrogen Analysis of electroplated Material T2 - AESF SUR/FIN® 2004 & INTERFINISH 2004 World Congress CY - Chicago, IL, USA DA - 2004-06-28 PY - 2004 SP - 556 EP - 564 PB - American Electroplaters and Surface Finishers Society (AESF) CY - Orlando AN - OPUS4-4695 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Ortsaufgelöste Elementaranalytik mit GD-OES und ortsaufgelöste Röntgenanalytik im REM T2 - veranstaltung Siemens - BAM CY - Berlin, Germany DA - 2003-09-17 PY - 2003 AN - OPUS4-4329 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - µ-RFA am REM T2 - TU-Kolloquium "Ausgewählte analytische Methoden der Physik" CY - Berlin, Germany DA - 2004-01-20 PY - 2004 AN - OPUS4-4611 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Wirth, Thomas A1 - Unger, Wolfgang T1 - Schichtanalyse mit der optischen Glimmentladungsspektroskopie (GD-OES) PY - 2000 SN - 1662-3096 SN - 0040-1498 SN - 0040-148X SN - 1023-0823 PB - Binkert Medien CY - Laufenburg AN - OPUS4-1055 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Erste Ergebnisse bei der Suche nach geeigneten Kandidaten für die Herstellung von CRM für die Bestimmung von Wasserstoff in Festkörpern T2 - 11. Deutsches Anwendertreffen "Analytische Glimmladungs-Spektrometrie" CY - Dresden, Germany DA - 2004-09-13 PY - 2004 AN - OPUS4-5980 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss des Wasserstoffs auf die analytischen Linien in der GD-OES - Temperaturmsessungen an der Oberfläche der Probe T2 - Doktoranden-Seminar des IFW-Dresden CY - Jetrichovice, Czech Republic DA - 1999-04-13 PY - 1999 AN - OPUS4-6029 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Emissionsprozesse in der Ar und Ne GD-OES, HF-GD-OES und HF-SNMS Tiefenprofilanalyse von beschichteten Gläsern/Glaskeramiken T2 - Doktorandenseminar CY - Jetrichovice, Czech Republic DA - 2000-04-17 PY - 2000 AN - OPUS4-6090 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Pressure Influence on the Depth Resolution of RF-Glow Discharge Depth Profiling Multilayer Coatings T2 - European Winter Conference on Plasma Spectrochemistry CY - Pau, France DA - 1999-01-10 PY - 1999 AN - OPUS4-6063 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss von H in der analytischen Glimmentladung T2 - GDS-Anwendertreffen CY - Dresden, Germany DA - 2000-10-17 PY - 2000 AN - OPUS4-6115 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluss von Wasserstoff auf die Quantifizierung in der GD-OES T2 - IFW-Seminar CY - Dresden, Germany DA - 2000-03-17 PY - 2000 AN - OPUS4-6088 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profile measurements of electrically non-conductive layered samples by RF-GDOES, HFM plasma SNMS and TOF-SIMS T2 - 11. Arbeitstagung Angewandte Oberflächenanalytik AOFA11 CY - Leipzig, Germany DA - 2000-09-24 PY - 2000 AN - OPUS4-6138 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - Gemeinsame Doktoranden-Klausur des IFS/IFW Dresden und der TU Szczecin CY - Szklarska Poreba, Poland DA - 2002-05-22 PY - 2002 AN - OPUS4-6212 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Exploitation of the hydrogen effect on GDS T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-04 PY - 2002 AN - OPUS4-6209 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Einfluß von Wasserstoff in der GDOES, Grundlagen T2 - Gemeinsames Seminar IFW-Dresden und TU Szczecin CY - Lukecin, Poland DA - 2001-04-18 PY - 2001 AN - OPUS4-6158 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Report on the RR exercise: Coated Materials T2 - Final General Meeting EU-GDS Network CY - Wiener Neustadt, Austria DA - 2002-03-02 PY - 2002 AN - OPUS4-6208 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Analyse von Wasserstoff in der GDOES, Anwendungen T2 - IFW Dresden Seminar CY - Dresden, Germany DA - 2001-07-11 PY - 2001 AN - OPUS4-6159 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Depth profiling of layered samples by Glow Discharge Optical Emission Spectroscopy (GD-OES) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 71 EP - 73 AN - OPUS4-6926 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GDS-Forum Website T2 - 9. Deutsches Anwendertreffen "Analytische GDS" CY - Berlin, Germany DA - 2002-09-09 PY - 2002 AN - OPUS4-6239 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - Promotionsverteidigung an der Technischen Universität Dresden CY - Dresden, Germany DA - 2002-10-15 PY - 2002 AN - OPUS4-6247 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Hydrogen effect in GDS - Foe or friend? T2 - BNASS11 CY - Loughborough, England DA - 2002-07-08 PY - 2002 AN - OPUS4-6215 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Wasserstoffeffekt und -analyse in der GDS - Anwendungen in der Werkstoffforschung T2 - BAM - Fachgruppenseminar VIII.2 CY - Berlin, Germany DA - 2002-11-05 PY - 2002 AN - OPUS4-6250 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Coating technology of high strength steels without hydrogen embrittlement T2 - Super-high strength steels : 1st international conference CY - Milan, Italy DA - 2005-11-02 KW - High strength steel KW - Electroplating KW - Corrosion protection KW - Hydrogen embrittlement KW - Glow discharge optical emission spectroscopy KW - GDOES PY - 2005 SN - 88-85298-56-7 SP - 1 EP - 6(?) PB - AIM CY - Mailand AN - OPUS4-11974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement T2 - 2006 Winter Conference on Plasma Spectrochemistry CY - Tucson, AZ, USA DA - 2006-01-08 PY - 2006 AN - OPUS4-11990 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Paatsch, Wolfgang A1 - Hodoroaba, Vasile-Dan T1 - Quantitative and localized Hydrogen Analysis of electroplated Material KW - Hydrogen KW - GD-OES depth profiling KW - Electroplating KW - Certified reference materials (CRM) KW - Certified reference coatings (CRC) KW - Quantification KW - Embrittlement PY - 2004 SP - 63 EP - 70 PB - American Electroplaters and Surface Finishers Society (AESF) CY - Orlando AN - OPUS4-6977 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Riedel, J.-U. A1 - Paatsch, Wolfgang T1 - GD-OES as an analytical tool for electroplated components susceptible to hydrogen embrittlement KW - GD-OES KW - GDS KW - Hydrogen KW - Embrittlement PY - 2006 SN - 0161-6951 VL - 31 SP - 354 EP - 356 PB - ICP Information Newsletter, Inc. CY - Amherst, Mass. AN - OPUS4-11935 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Berechnung von Röntgenröhrenspektren auf der Grundlage experimenteller Röntgenausbeuten T2 - Forschungsseminar "Ausgewählte analytische Methoden der Physik" CY - Berlin, Germany DA - 2006-05-30 PY - 2006 AN - OPUS4-12453 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Simulation der Spektren von Röntgenröhren des Typs MCBM 50 im REM T2 - Fachtagung Prozessnahe Röntgenanalytik (PRORA 2005) CY - Berlin, Germany DA - 2005-11-24 PY - 2005 AN - OPUS4-11325 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hodoroaba, Vasile-Dan T1 - Liaison report from VAMAS with ISO/TC 202 Microbeam Analysis N2 - The progress in the activities on Microbeam Analysis under VAMAS/TWA 37 is reviewed. Particularly the liaison with the new projects within the ISO technical committee TC 202 is presented and discussed with respect to the possibility of identifying and launching related VAMAS projects/inter-laboratory comparisons. The recently started project FIB sample processing for TEM is presented. Next projects in the pipeline involving EBSD and TKD are shortly announced. The need of more promotion for the engagement of more experts from industry and academia at national, European and international level is highlighted. Also, the competition with the other technical working areas (on 'nano' or materials-related) is critically discussed. T2 - 29th Annual Meeting of ISO/TC 202 Microbeam Analysis CY - Online meeting DA - 28.11.2022 KW - VAMAS KW - ISO/TC 202 KW - Microbeam Analysis KW - EBSD KW - Electron microscopy KW - Thin films PY - 2022 AN - OPUS4-56424 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -