TY - CONF A1 - Beck, Uwe T1 - Plasma cleaning, activation and modification of surfaces for improved adhesive and bonding strength T2 - PSE-Conference CY - Garmisch-Partenkirchen, Germany DA - 2014-09-15 PY - 2014 AN - OPUS4-30132 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Haft- und Klebefestigkeit modifizierter Kunststoffoberflächen - Zentrifugentechnologie vs. konventionelle Prüfverfahren T2 - NEMO-Netzwerksymposium CY - Wildau, Germany DA - 2014-03-04 PY - 2014 AN - OPUS4-30118 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Mehr-Proben-Konzept zum Kleben und Prüfen: Validierung von Klebeverbunden im OKTETT T2 - 10. Thementage Grenz- und Oberflächentechnik CY - Leipzig, Germany DA - 2014-09-02 PY - 2014 AN - OPUS4-31064 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Advanced Layer-based Sensor Principles: Surface Plasmon Resonance, Air-coupled Ultra Sonics, Magneto-optical Coupling T2 - PSE CY - Garmisch-Partenkirchen, Germany DA - 2016-09-12 PY - 2016 AN - OPUS4-35277 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Optisches Mapping und Imaging zur Qualitätssicherung von dünnen Schichten und Oberflächen T2 - Universitätsseminar CY - TU Wien, Österreich DA - 2016-03-18 PY - 2016 AN - OPUS4-35279 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Multiple-sample Approach for Bonding and Testing: Validation of Bonding and Adhesive Strength of Adhesive bondet Joints and Adhesive Tapes T2 - EURADH CY - Glasgow, GB DA - 2016-09-21 PY - 2016 AN - OPUS4-35280 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kormunda, M. A1 - Fischer, Daniel A1 - Hertwig, Andreas A1 - Beck, Uwe A1 - Sebik, M. A1 - Pavlik, J. A1 - Esser, N. T1 - Deposition and characterization of single magnetron deposited Fe:SnOx coatings N2 - Coatings deposited by magnetron co-sputtering from a single RF magnetron with a ceramic SnO2 target with iron inset in argon plasma were studied. The mass spectra of the process identified Sn+ and SnO+ species as the dominant species sputtered from the target, but no SnO2+ species were detected. The dominant positive ions in argon plasma are Ar+ species. The only detected negative ions were O-. Sputtered neutral tin related species were not detected. Iron related species were also not detected because their concentration is below the detection limit. The concentration of iron dopant in the tin oxide coatings was controlled by the RF bias applied on the substrate holder while the discharge pressure also has some influence. The iron concentration was in the range from 0.9 at.% up to 19 at.% increasing with the substrate bias while the sheet resistivity decreases. The stoichiometry ratio of O/(Sn + Fe) in the coatings increased from 1.7 up to 2 in dependence on the substrate bias from floating bias (- 5 V) up to - 120 V of RF self-bias, respectively. The tin in the coatings was mainly bonded in Sn4 + state and iron was mainly in Fe2 + state when other tin bonding states were detected only in a small amounts. Iron bonding states in contrary to elemental compositions of the coatings were not influenced by the RF bias applied on the substrate. The coatings showed high transparency in the visible spectral range. However, an increased metallic behavior could be detected by using a higher RF bias for the deposition. The X-ray diffraction patterns and electron microscopy pictures made on the coatings confirmed the presence of an amorphous phase. KW - Metal oxides KW - Transparent conductive oxides (TCO) KW - Magnetron KW - Optical properties KW - Ellipsometry KW - XPS characterzation PY - 2015 DO - https://doi.org/10.1016/j.tsf.2015.11.009 SN - 0040-6090 VL - 595 IS - Part A SP - 200 EP - 208 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-35281 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beck, Uwe T1 - Multiple-sample Strength Testing: Reliable Ranking and Validated Statistics of Bonding and Adhesive Strength T2 - AB2015 CY - Porto, Portugal DA - 2015-06-02 PY - 2015 AN - OPUS4-33891 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rietz, U. A1 - Lerche, D. A1 - Hielscher, Stefan A1 - Beck, Uwe T1 - Centrifugal adhesion testing technology (CATT) - A valuable tool for strength determination N2 - A new technology for strength determination of adhesive-bonded joints based on analytical centrifugatioon is introduced. Tensile as well as shear strength can be measured for multiple test specimens simultaneously within a very short time. The experimental procedure is described from sample preparation, application of adhesives, sample mounting within the centrifuge to testing parameters and sequences. All requirements of DIN EN 15870 are fulfilled and, in addition, a higher throughput and a better reproducibility can be obtained. The experimental results are discussed regarding bonding strength development over time, comparison of tensile and shear strength and various testing conditions. Furthermore, an additional application field of centrifuge technology is described with respect to the determination of the adhesive strength of coatings. The novel centrifuge based technology provides the determination of bonding, adhesive and shear strength on a statistical basis under identical testing conditions for up to eight samples. Moreover, sophisticated two-sided sample clamping, necessary for a tensile testing machine, is replaced by a simple plug-in procedure. KW - Centrifuge technology KW - Adhesive strength KW - Interface strength KW - Bonding strength KW - Adhesion KW - Tensile strength KW - Shear strength KW - Centrifuge KW - Multiple sample testing PY - 2015 SN - 0916-4812 SN - 0001-8201 VL - 51 IS - S1 (Special Issue on WCARP-V) SP - 293 EP - 297 PB - Kyokai CY - Osaka AN - OPUS4-33994 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Baier, Jennifa A1 - Beck, Uwe T1 - Plasma-kompatible Partikel für add-on Funktionen in Beschichtungen N2 - Die Plasma-Kompatibilität von Partikeln ist eine Voraussetzung für die Anwendung in Plasmadispersionsschichten. Das Ziel ist die Realisierung von add-on Funktionen auf Oberflächen, in Folien und in Beschichtungen. Obwohl primär Nanopartikel für die beabsichtigten Anwendungen verwendet werden, wurden die Kompatibilitättests zuerst mit Partikeln im unteren Mikrometerbereich durchgeführt, um auf einfache Weise Degradationseffektes des Materials, der Fluoreszenzmarkierung oder der Oberfläche zu untersuchen. T2 - 11. ThGOT - Thementage Grenz- und Oberflächentechnik CY - Zeulenroda-Triebes, Germany DA - 15.09.2015 KW - Plasmatechnik KW - Partikel KW - Kombinationsverfahren PVD-ESI PY - 2015 SN - 978-3-00-046056-2 SP - 16.9.2015, Block A, 1 EP - 3 AN - OPUS4-34279 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -