TY - CONF A1 - Resch-Genger, Ute A1 - Giovannozzi, A. A1 - Rossi, A. A1 - Kovac, J. A1 - Ekar, J. A1 - Goenaga-Infante, H. A1 - Clarkson, C. A1 - Clifford, C. A1 - Cant, D. A1 - Minelli, C. A1 - Reithofer, M. A1 - Lindner, G. A1 - Venzago, C. A1 - Bohmer, N. A1 - Drexler, C.-P. A1 - Schedler, U. A1 - Thiele, T. A1 - Lechart, F. A1 - Kästner, B. A1 - Sjövall, P. A1 - Johnston, L. A1 - Tan, Gunnar A1 - Radnik, Jörg T1 - Standardised Measurements of Surface Functionalities on Nanoparticles N2 - Engineered nanoparticles (NPs) with various chemical compositions and surface functionalities are routinely fabricated for industrial applications such as medical diagnostics, drug delivery, sensing, catalysis, energy conversion and storage, opto-electronics, and information storage which improve the quality of life and European prosperity. NP function, performance, interaction with biological species, and environmental fate are largely determined by their surface functionalities. Standardized repeatable surface characterization methods are therefore vital for quality control of NPs, and to meet increasing concerns regarding their safety. Therefore, industry, regulatory agencies, and policymakers need validated traceable measurement methods and reference materials. This calls for fit-for-purpose, validated, and standardized methods, and reference data and materials on the surface chemistry of engineered NPs. Here, we present a concept for the development of such standardized measurement protocols utilizing method cross-validation and interlaboratory comparisons (ILCs) with emphasis on both advanced measurement methods such as quantitative Nuclear Magnetic Resonance (qNMR), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) and cost-efficient, non-surface specific methods like optical assays and electrochemical titration methods. T2 - European Partnership on Metrology 2023 Review Conference CY - Amsterdam, Netherlands DA - 07.11.2023 KW - Surface chemistry KW - Quality assurance KW - Traceability PY - 2023 AN - OPUS4-59142 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -