TY - JOUR A1 - Fuhrmann, A. A1 - Göstl, R. A1 - Wendt, R. A1 - Kötteritzsch, J. A1 - Hager, M. D. A1 - Schubert, U. S. A1 - Brademann-Jock, Kerstin A1 - Thünemann, Andreas A1 - Nöchel, U. A1 - Behl, M. A1 - Hecht, S. T1 - Conditional repair by locally switching the thermal healing capability of dynamic covalent polymers with light N2 - Healable materials could play an important role in reducing the environmental footprint of our modern technological society through extending the life cycles of consumer products and constructions. However, as most healing processes are carried out by heat alone, the ability to heal damage generally kills the parent material’s thermal and mechanical properties. Here we present a dynamic covalent polymer network whose thermal healing ability can be switched ‘on’ and ‘off’ on demand by light, thereby providing local control over repair while retaining the advantageous macroscopic properties of static polymer networks. We employ a photoswitchable furan-based crosslinker, which reacts with short and mobile maleimidesubstituted poly(lauryl methacrylate) chains forming strong covalent bonds while simultaneously allowing the reversible, spatiotemporally resolved control over thermally induced de- and re-crosslinking. We reason that our system can be adapted to more complex materials and has the potential to impact applications in responsive coatings, photolithography and microfabrication. KW - Small-angle X-ray scattering KW - SAXS KW - Polymer PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-386689 DO - https://doi.org/10.1038/ncomms13623 SN - 2041-1723 VL - 7 SP - Article 13623, 1 EP - 7 PB - NATURE PUBLISHING GROUP CY - MACMILLAN BUILDING, 4 CRINAN ST, LONDON N1 9XW, ENGLAND AN - OPUS4-38668 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Merchel, Silke A1 - Geppert, Ch. A1 - Herpers, U. A1 - Müller, P. A1 - Schmitt, A. A1 - Schnabel, Ch. A1 - Synal, H.-A. A1 - Wendt, K. T1 - Bestimmung von 41Ca mittels resonanter Laserionisations-Massenspektrometrie und deren Anwendungsmöglichkeiten T2 - Frühjahrstagung. Deutsche Physikalische Gesellschaft PY - 2002 SN - 0420-0195 N1 - Serientitel: Verhandlungen der Deutschen Physikalischen Gesellschaft – Series title: Verhandlungen der Deutschen Physikalischen Gesellschaft IS - 37.2002,2 PB - Physik-Verl. CY - Weinheim AN - OPUS4-1321 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert T1 - Correlation between crystal orientation, channeling contrast and topography during FIB milling of Cu studied by FIB, EBSD, SEM, and AFM KW - TEM-Präparation KW - Abtragsrate PY - 2007 SN - 0032-678X VL - 44 IS - 5 SP - 236 EP - 238 PB - Hanser CY - München AN - OPUS4-14970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert T1 - FIB Milling and Canneling KW - Topography KW - Etching rate KW - EBSD KW - AFM PY - 2007 SN - 1439-4243 SN - 1863-7809 VL - 9 IS - 3 SP - 34 EP - 36 PB - GIT-Verl. CY - Darmstadt AN - OPUS4-15749 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert T1 - FIB-Ätzen und Ionen-Channeling - Der Materialabtrag hängt von der kristallographischen Orientierung ab KW - FIB KW - Ionenätzen KW - Kristall PY - 2007 SN - 0016-3538 VL - 51 IS - 10 SP - 848 EP - 851 PB - GIT-Verlag CY - Darmstadt AN - OPUS4-16155 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert T1 - Correlation between Crystal Orientation, Channeling Contrast and Topography during FIB Milling of Cu Studied by FIB, EBSD, SEM, and AFM N2 - We have studied the anisotropic milling of Cu with respect to the milling rate and the milling topography, as well. The background is twofold: i) anisotropic milling has to be taken into account during the preparation of TEM specimens and in the manufacturing of micro parts from crystalline materials, and ii) the orientation depending milling behaviour can be used to generate topographies with specific properties with respect to, for example, adsorption, wear, and corrosion. KW - FIB KW - AFM KW - Crystal orientation KW - SEM PY - 2007 VL - 44 IS - 5 SP - 236 EP - 238 PB - Carl Hanser Verlag AN - OPUS4-38026 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Wendt, U. A1 - Nolze, Gert A1 - Heyse, H. T1 - Effect of crystal orientation on imaging contrast and sputter results during focused ion beam milling of Cu studied by FIB, EBSD, SEM, and AFM N2 - During focused ion beam microscopy (FIB) of crystalline materials imaging contrast and milling result are effected by orientation of the crystals with respect to the incident ion beam. This is due to the possibility of ion channeling along preferred crystal directions which effects the depth at which interaction between ions and specimen atoms takes place. As a result of channeling emission of ion induced secondary electrons (iiSE) and secondary ions (SI) as well as the sputter rate decreases. Theoretical channeling orientations and critical angles can be calculated. These effects have been studied quantitatively for polycrystalline recrystallized Cu as a typical model case. KW - Electron backscatter diffraction KW - FIB KW - AFM KW - Crystal orientation PY - 2006 DO - https://doi.org/10.1017/S1431927606061812 SN - 1431-9276 SN - 1435-8115 VL - 12 IS - Suppl. 2 SP - 1302 EP - 1303 AN - OPUS4-38027 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -