TY - CONF A1 - Gross, Thomas A1 - Retzko, Iris A1 - Friedrich, Jörg F. A1 - Unger, Wolfgang T1 - TIME-OF-FLIGHT SIMS AND XPS CHARACTERIZATION OF METAL DOPED POLYMERS T2 - 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics T2 - 13th International Conference on Secondary Ion Mass Spectrometry and Related Topics CY - Nara, Japan DA - 2001-11-11 PY - 2001 AN - OPUS4-6149 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -