TY - JOUR A1 - Akatsuka, C. A1 - Honma, T. A1 - Müller, Ralf A1 - Reinsch, Stefan A1 - Tanaka, S. A1 - Komatsu, T. T1 - Surface crystallization and gas bubble formation during conventional heat treatment in Na2MnP2O7 glass JF - Journal of Non-Crystalline Solids N2 - The crystallization behavior of sodium ion conductive Na2MnP2O7 glass was examined to clarify the crystallization mechanism. The formation of thermodynamically metastable phase, layered Na2MnP2O7, at the surface of the glass occurred. Heat treatment at 430 °C for 3 h lead to surface crystals of Na2MnP2O7 oriented with the (101) direction perpendicular to the sample surface. As the heat treatment temperature increased, the glass-ceramic samples deformed, and the presence numerous micro bubbles due to dissolved water was detected. KW - Glass-ceramic KW - Crystallization KW - Sodium ion batteries KW - Bubble formation KW - Phosphate PY - 2019 DO - https://doi.org/10.1016/j.jnoncrysol.2019.01.030 VL - 510 SP - 36 EP - 41 PB - Elsevier B.V. AN - OPUS4-49618 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rudolphi, Reinald A1 - Caemmerer, Winfrid A1 - Tanaka, T. T1 - Zur Berechnung einseitiger Toleranzgrenzen bei empirisch ermittelten, funktionalen Zusammenhängen am Beispiel der Ermittlung des Zuschlages Z auf die Wärmeleitfähigkeit für Betone nach DIN 52612 JF - Gesundheits-Ingenieur PY - 1974 SN - 0932-6200 SN - 0016-9277 SN - 0720-9312 VL - 95 IS - 1 SP - 11 EP - 20 PB - Oldenbourg CY - München AN - OPUS4-1274 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling of plasma polymers by variable excitation energy XPS T2 - Photon factory activity report 2002, Part B - Users' report PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b197.pdf SN - 1344-6339 VL - 20 SP - 197 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2798 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive XPS depth-profiling of ta:C-films by variable excitation energy T2 - Photon factory activity report 2002, Part B - Users' report PY - 2003 UR - http://pfwww.kek.jp/acr2002pdf/part_b/pf02b198.pdf SN - 1344-6339 VL - 20 SP - 198 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-2799 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rudolphi, Reinald A1 - Caemmerer, Winfrid A1 - Tanaka, T. T1 - Zur Berechnung einseitiger Toleranzgrenzen bei empirisch ermittelten funktionalen Zusammenhängen am Beispiel der Ermittlung des Zuschlages Z auf die Wärmeleitfähigkeit lambda 1O,tr für Betone nach DIN52612 JF - Gesundheits-Ingenieur PY - 1974 SN - 0932-6200 SN - 0016-9277 SN - 0720-9312 VL - 95 IS - 1 SP - 11 EP - 20 PB - Oldenbourg CY - München AN - OPUS4-7995 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Retzko, Iris A1 - Mix, Renate A1 - Swaraj, Sufal A1 - Unger, Wolfgang A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. T1 - Non-destructive chemical depth-profiling by variable excitation energy XPS: TFAA derivatized allyl alcohol - ethylene plasma polymer films T2 - Photon factory activity report 2003, Part B - Users' report KW - Oberflächenanalytik KW - Plasmapolymerisation PY - 2004 UR - http://pfwww.kek.jp/acr2003pdf/part_b/pf03b076.pdf SN - 1344-6339 VL - 21 SP - 76 PB - KEK - High Energy Accelerator Research Organization CY - Tsukuba AN - OPUS4-5849 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Shimada, H. A1 - Retzko, Iris A1 - Unger, Wolfgang T1 - Surface Analysis by XPS and XAS Using a High-Rsolution and High-Flux Soft X-ray from Synchrotron T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 KW - XPS KW - XAS KW - DLC KW - Synchrotron Radiation PY - 2003 SP - 67 EP - 69 AN - OPUS4-6927 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Retzko, Iris A1 - Treu, Dieter A1 - Matsubayashi, N. A1 - Imamura, M. A1 - Tanaka, T. A1 - Schulz, H. A1 - Lippitz, Andreas A1 - Unger, Wolfgang T1 - Analysis of carbon materials and plasma polymers by X-ray photoelectron spectroscopy and X-ray absorption spectroscopy (XPS, XAS) T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme T2 - AIST-BAM Symposium on Materials Surface Technology in Twin Institute Programme CY - Tsukuba, Japan DA - 2003-02-18 PY - 2003 SP - 59 EP - 65 AN - OPUS4-6928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -