TY - JOUR A1 - Hodoroaba, Vasile-Dan A1 - Benemann, Sigrid A1 - Motzkus, C. A1 - Macé, T. A1 - Palmas, P. A1 - Vaslin-Reimann, S. T1 - Advanced analysis of spherical SiO2 aerosol nanoparticles with a high-resolution SEM JF - Microscopy and microanalysis KW - Spherical nanoparticles KW - SiO2 KW - SEM KW - Transmission-SEM KW - VAMAS PY - 2012 DO - https://doi.org/10.1017/S1431927612010604 SN - 1431-9276 SN - 1435-8115 VL - 18 IS - Suppl. 2 SP - 1750 EP - 1751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-26749 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -