TY - CONF A1 - Rades, Steffi T1 - Investigation of Nanoparticles by Auger electron spectroscopy (AES) T2 - 15th European Conference on Applications of Surface and Interface Analysis (ECASIA 13) CY - Cagliari, Italy DA - 2013-10-13 PY - 2013 AN - OPUS4-30131 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rades, Steffi T1 - Surface and in-depth analysis of functionalization of TiO2 nanoparticles for self-assembly in multiple layers N2 - Parameters of TiO2 coatings can greatly influence their final performance in largescale applications such as photocatalytic measurements, orthopedic and/or dental prostheses, cell cultures, and dye-sensitized solar cells. From different film deposition procedures, self-assembly of TiO2 NPs in multiple layers was selected for systematic characterization. EDX, AES and ToF-SIMS analysis have been carried out in order to evaluate the functionalization of several types of TiO2 NPs differing in size, shape and surface area. T2 - EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting CY - Constance, Germany DA - 07.05.2017 KW - Functionalization KW - Surface analysis KW - Nanoparticles KW - Thin films PY - 2017 AN - OPUS4-40266 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Rades, Steffi T1 - Tracing fluorine at the surface and in the bulk of TiO2 nanoplatelets by means of SEM-EDX, AES and ToF-SIMS N2 - The synthesis of TiO2 nanoplatelets with fluorine-containing reactants is carried out using titanium (IV) butoxide as precursor and concentrated HF as shape controller, the final product requires a working up in order to eliminate or at least to reduce the amount of residual fluorides, which is realized here by well-defined thermal treatment of the samples. Bulk and surface sensitive methods namely scanning electron microscopy with energydispersive X-ray spectroscopy (SEM-EDX), Auger electron spectroscopy (AES) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) have been applied to trace the presence of any fluorides in dependence on different information depths and measurement sensitivities of these methods. T2 - EMAS 2017 - 15th European Workshop on MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS and IUMAS-7 Meeting CY - Konstanz, Germany DA - 07.05.2017 KW - Nanoparticles KW - Surface analysis KW - ToF-SIMS KW - AES KW - SEM-EDX PY - 2017 AN - OPUS4-40265 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -