TY - JOUR A1 - Mero, M. A1 - Clapp, B. A1 - Jasapara, J.C. A1 - Rudolph, W. A1 - Ristau, D. A1 - Starke, K. A1 - Krüger, Jörg A1 - Martin, Sven A1 - Kautek, Wolfgang T1 - On the damage behavior of dielectric films when illuminated with multiple femtosecond laser pulses N2 - The physical effects reducing the damage threshold of dielectric films when exposed to multiple femtosecond pulses are investigated. The measured temperature increase of a Ta2O5 film scales exponentially with the pulse fluence. A polarized luminescence signal is observed that depends quadratically on the pulse fluence and is attributed to twophoton excitation of self-trapped excitons that form after band-to-band excitation. The damage fluence decreases with increasing pulse number, but is independent of the repetition rate from 1 Hz to 1 kHz at a constant pulse number. The repetition rate dependence of the breakdown threshold is also measured for TiO2 , HfO2, Al2O3, and SiO2 films. A theoretical model is presented that explains these findings. KW - Laser-induced damage KW - Laser materials KW - Ultrafast phenomena KW - Coatings PY - 2005 DO - https://doi.org/10.1117/1.1905343 SN - 0892-354X VL - 44 IS - 5 SP - 051107-1-051107-7 PB - Dekker CY - New York, NY AN - OPUS4-7406 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Starke, K. A1 - Ristau, D. A1 - Martin, Sven A1 - Hertwig, Andreas A1 - Krüger, Jörg A1 - Allenspacher, P. A1 - Riede, W. A1 - Meister, S. A1 - Theiss, C. A1 - Sabbah, A. A1 - Rudolph, W. A1 - Raab, V. A1 - Grigonis, R. A1 - Rakickas, T. A1 - Sirutkaitis, V. ED - Exarhos, G. J. T1 - Results of a round-robin experiment in multiple-pulse LIDT measurement with ultrashort pulses T2 - 35th Annual Boulder Damage Symposium ; 35th Annual Symposium on Optical Materials for High-Power Lasers CY - Boulder, CO, USA DA - 2003-09-22 KW - Multiple-pulse damage KW - ISO 11254-2 KW - S on 1-LIDT KW - Round-robin experiment KW - CHOCLAB PY - 2004 SN - 0-8194-5163-0 DO - https://doi.org/10.1117/12.525135 SN - 0038-7355 N1 - Serientitel: Proceedings of SPIE – Series title: Proceedings of SPIE IS - 5273 SP - 388 EP - 395 PB - SPIE, the International Society for Optical Engineering CY - Bellingham, Wash. AN - OPUS4-4948 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -