TY - JOUR A1 - Serrano Munoz, Itziar A1 - Pfretzschner, Beate A1 - Kromm, Arne A1 - Nadammal, Naresh A1 - Kardjilov, N. A1 - Markötter, Henning A1 - Neuwirth, T. A1 - Schulz, M. A1 - Griesche, Axel T1 - High-resolution Bragg-edge neutron radiography detects grain morphology in PBF-LB/M IN718 JF - Materialia N2 - One of the main advantages of metal additive manufacturing (MAM) techniques is their ability to produce components with site-specific microstructural features. Nevertheless, microstructural defects and lack of repeatability are still major concerns in MAM. In this study, a laser powder bed fusion (PBF-LB/M) IN718 material, produced using two different scan length vectors, is investigated using Bragg-edge neutron 2D imaging (BENI) combined with electron backscatter diffraction (EBSD) analysis. BENI is able to detect, on a macroscopic scale, process-induced changes in texture in a large field of view covering the entire sample (20×80 mm2). In addition, high-resolution BENI (HR-BENI), with a pixel size of 12.8 µm, provides a micro-scale examination of the local variations of texture and grain morphology, otherwise undistinguishable using the standard resolution. As such, HR-BENI offers a straightforward and detailed way of screening the integrity of MAM parts at cm-length scales. KW - Bragg-edge neutron 2D imaging (BENI) KW - Metal additive manufacturing (MAM) KW - IN718 PBF-LB/M KW - Crystallographic texture control KW - Electron backscatter diffraction (EBSD) PY - 2023 DO - https://doi.org/10.1016/j.mtla.2023.101827 SN - 2589-1529 VL - 30 SP - 1 EP - 6 PB - Elsevier CY - Amsterdam AN - OPUS4-57819 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Serrano Munoz, Itziar A1 - Fernández, R. A1 - Saliwan-Neumann, Romeo A1 - González-Doncel, G. A1 - Bruno, Giovanni T1 - Dislocation structures after creep in an Al-3.85 %Mg alloy studied using EBSD-KAM technique JF - Materials Letters N2 - The electron backscatter diffraction (EBSD) technique is used to investigate the dislocation structures formed after steady-state creep deformation of an Al-3.85%Mg alloy. This material is crept at two different stress levels, corresponding to the so-called power-law and power-law breakdown regimes. The results show that, regardless of the creep stress level, the strain tends to localize, leading to the formation of intragranular bands. The thickness of such bands is larger when the material is tested at loads corresponding to the power-law breakdown. This suggests enhanced diffusion by dislocation pipes. KW - Steady-state creep KW - Al-3.85%Mg alloy KW - Power-law breakdown KW - Electron backscatter diffraction (EBSD) KW - Denoising filter PY - 2023 DO - https://doi.org/10.1016/j.matlet.2023.133978 SN - 0167-577X VL - 337 SP - 1 EP - 4 PB - Elsevier B.V. AN - OPUS4-56941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rieder, Philipp A1 - Petrich, Lukas A1 - Serrano Munoz, Itziar A1 - Fernández, Ricardo A1 - Bruno, Giovanni A1 - Schmidt, Volker T1 - Statistical Comparison of Substructures in Pure Aluminum Before and After Creep Deformation, Based on EBSD Image Data JF - Microscopy and Microanalysis N2 - Electron backscatter diffraction (EBSD) images of extruded pure aluminum were statistically analyzed to investigate creep-induced subgrain structures after applying two different levels of creep stress, corresponding to the power law (PL) and power-law breakdown (PLB) regimes. Kernel average misorientation analysis of EBSD measurements revealed 2D morphologies, which were subdivided by a multi-step segmentation procedure into subgranular arrangements. Various descriptors were employed to characterize the “subgrains” quantitatively, including their size, shape, spatial arrangement, and crystallographic orientation. In particular, the analysis of the orientations of subgrains was conducted by neglecting rotations around the loading axis. This approach facilitated the individual investigation of the {001} and {111} subgrain families with respect to the loading axis for two investigated stress levels plus a reference specimen. For the PL regime, the statistical analysis of subgrain descriptors computed from segmented image data revealed a similar degree of strain accumulation for {111} and {001} subgrains. In contrast, for the PLB regime, the analyzed descriptors indicate that {111} subgrains tend to accumulate significantly more strain than {001} ones. These observations suggest that the mechanisms leading to PLB may be associated with strain localization dependent on intergranular stress, hindering the recovery process within {111} grains. KW - Crystallographic descriptor KW - Dislocation-climb-controlled creep KW - Electron backscatter diffraction (EBSD) KW - Geometric descriptor KW - Ernel average misorientation (KAM) KW - pure aluminum KW - Qquantification and segmentation KW - Statistical image analysis KW - subgrain PY - 2023 DO - https://doi.org/10.1093/micmic/ozad121 SN - 1431-9276 SP - 1 EP - 12 PB - Oxford University Press AN - OPUS4-58730 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -