TY - JOUR A1 - Schade, U. A1 - Dawei, C. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Removal of Etalon Features in the Far-Infrared–Terahertz Transmittance Spectra of Thin Polymer Films N2 - Etalon features in infrared spectra of stratified samples, their influence on the interpretation and methods to circumvent their presence in infrared spectra have been in discussion for decades. This paper focuses on the application of a method originally developed to remove interference fringes in the mid-infrared spectra for far-infrared Fourier transform spectroscopy on thin polymer films. We show that the total transmittance-reflectance technique, commonly used for mid-infrared, also works successfully in the far infrared spectral range where other approaches fail. Experimental spectra obtained by such technique are supported by model calculations and reveal the possibility and limits to obtain almost undisturbed far-infrared spectra which are suitable to determine low energy vibrations of ionomer salts under certain sample conditions. KW - Far-infrared spectroscopy KW - Absorption KW - Etalon feature KW - Total transmittance reflectance PY - 2020 DO - https://doi.org/10.1177/0003702820922295 VL - 74 IS - 12 SP - 1530 EP - 1539 PB - Sage journals AN - OPUS4-51367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. T1 - Etalon Effects in THz Film Measurements N2 - Etalon effects in THz transmittance spectra, either taken in time-domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods usually employed in the near and mid infrared spectral range and exemplarily present the application field. T2 - 45. International Confercene on infrared, milimeter and terahertz waves CY - Online meeting DA - 08.11.2020 KW - Far-infrared spectroscopy KW - Etalon Effects PY - 2020 UR - https://live-irmmwthz.pantheonsite.io/technical-program AN - OPUS4-51652 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Etalon effects in THz film measurements N2 - Etalon effects in THz transmittance spectra, either taken in time- domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods typically employed in the near and mid infrared spectral range to eliminate the fringes in the transmittance spectra in the THz spectral range. T2 - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Buffalo, NY, USA DA - 08.11.2020 KW - THz radiation KW - Total transmittance reflection technique KW - Etalon effects PY - 2020 SN - 978-1-7281-6620-9 DO - https://doi.org/10.1109/IRMMW-THz46771.2020.9370451 SN - 2162-2035 SN - 2162-2027 SP - 1 PB - IEEE CY - Buffalo, NY AN - OPUS4-56943 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. T1 - Etalon effects in THz film measurements N2 - Etalon features in transmittance spectra of films arise due to the coherent superposition of waves caused by reflections multiple times at the inner film boundaries. The fringe maxima occur at i𝜆 = 2nd cos 𝜑 with i - being an integer, 𝜆 - the wavelength, d - the film thickness, 𝜑 - the angle of incidence in respect to the film normal and n - the refractive index of the film. It is obvious that such features can hinder the interpretation of absorption bands when fringe amplitude and period are in the same range as the expected bands. This poster discusses the suitability of two optical methods for the THz spectral range applied to Fourier Transform Spectroscopy. T2 - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Buffalo, NY, USA DA - 08.11.2020 KW - THz radiation KW - Total transmittance reflection technique PY - 2020 AN - OPUS4-56945 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -