TY - JOUR A1 - Beckmann, Jörg A1 - Marchetti, B. A1 - von Chrzanowski, Lars S. A1 - Ritter, E. A1 - Puskar, L. A1 - Aziz, E. F. A1 - Schade, U. T1 - Optical constants of harmful and highly energetic liquids for application to THz screening systems N2 - The far-infrared (IR) optical constants of a set of hazardous and flammable liquids have been obtained by means of spectroscopic ellipsometry in attenuated total reflection configuration over a broad spectral range. Such liquids recently became of considerable concern for transportation security measures worldwide. Their optical identification at check-in gates can only become possible if the characteristic spectra are already known. The refractive indices and the extinction coefficients reported here contribute to a spectroscopic data base in the far-IR and terahertz (THz) spectral regions and may support modeling the performance of THz screening systems on liquids for airports and other security sensitive areas. Examples of several container material/liquid systems are discussed. From the measured optical constants typical THz waveforms are calculated and discussed. KW - liquids material characterization KW - Ellipsometry KW - FT-IR spectroscopy KW - THz time-domain spectroscopy (THz-TDS) PY - 2016 DO - https://doi.org/10.1109/TTHZ.2016.2547319 SN - 2156-342X VL - 2016 / Vol. PP IS - 99 SP - 1 EP - 12 PB - IEEE - Inst. Electrical Electronics Engineers Inc CY - New York, NY, USA AN - OPUS4-36366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Ritter, E. A1 - Aziz, E. F. A1 - Puskar, L. A1 - Beckmann, Jörg T1 - Spectroscopic ellipsometry on liquids in the far infrared N2 - The far infrared refractive indices and the extinction coefficients of liquids can be obtained by means of spectroscopic ellipsometry in attenuated total reflection configuration. Such optical constants will contribute to a spectroscopic data base in the far infrared and terahertz spectral regions. The experimental implementation and the calibration procedure of the method are described in detail. The temperature dependency of the optical constants for water over a broad spectral range is exemplarily presented. T2 - 42nd International Conference on Infrared, Millimeter and THz Waves CY - Cancun, Mexico DA - 27.08.2017 KW - Ellipsometry KW - Far Infrared KW - ATR KW - Attenuated total reflection KW - Calibration KW - Extinction coefficients KW - Refractive index measurement KW - Spectroscopic ellipsometry KW - Far infrared refractive index KW - Terahertz spectral region KW - Optical constant KW - Attenuated total reflection configuration KW - Liquid extinction coefficient KW - Optical refraction KW - Optical variables control KW - Optical reflection KW - Liquids KW - Optical films KW - Optical polarization KW - Optical variables measurement PY - 2017 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=8066931&isnumber=8066832 DO - https://doi.org/10.1109/IRMMW-THz.2017.8066931 SN - 2162-2035 SP - MD.1.5-1 EP - MD.1.5-2 PB - IEEE CY - Danvers AN - OPUS4-42028 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Ritter, E. A1 - Bawagan, A.D.O. A1 - Beckmann, Jörg A1 - Aziz, E. F. T1 - Far-infrared absorption measurements on thin polymer films N2 - Interference fringes in the far-infrared spectra of thin films are the result of the coherent adding up of waves and can influence the spectral interpretation by concealing smaller features. A number of methods have been developed in order to eliminate such oscillating features from the transmittance spectrum. The paper critically evaluates the total transmission-reflection technique and applies the method to quantify the spectra of different polymer films. T2 - IRMMW-THz 2014 - 39th International conference on infrared, millimeter, and terahertz waves CY - Tucson, Arizona, USA DA - 14.09.2014 KW - Far-infrared spectra KW - Thin films KW - Total transmission reflection technique KW - Infrared spectroscopy KW - Light absorption KW - Light reflection KW - Polymer films KW - Far-infrared absorption measurements KW - Thin polymer films KW - Interference fringes KW - Spectral interpretation KW - Transmittance spectrum KW - Oscillating features KW - Total transmission-reflection technique KW - Interference KW - Absorption KW - Finite impulse response filters KW - Optical films KW - Optical reflection PY - 2014 UR - http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6956145&isnumber=6955975 SN - 978-1-4799-3877-3 DO - https://doi.org/10.1109/IRMMW-THz.2014.6956145 IS - IEEE Catalog No.: CFP14IMM-ART SP - 1 EP - 2 AN - OPUS4-32700 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ahmed, A. A. A. A1 - Alegret, N. A1 - Almeida, B. A1 - Alvarez-Puebla, R. A1 - Andrews, A. M. A1 - Ballerini, L. A1 - Barrios-Capuchino, J. J. A1 - Becker, C. A1 - Blick, R. H. A1 - Bonakdar, S. A1 - Chakraborty, I. A1 - Chen, X. A1 - Cheon, J. A1 - Chilla, G. A1 - Conceicao, A. L. C. A1 - Delehanty, J. A1 - Dulle, M. A1 - Efros, A. L. A1 - Epple, M. A1 - Fedyk, M. A1 - Feliu, N. A1 - Feng, M. A1 - Fernandez-Chacon, R. A1 - Fernandez-Cuesta, I. A1 - Fertig, N. A1 - Förster, S. A1 - Garrido, J. A. A1 - George, M. A1 - Guse, A. H. A1 - Hampp, N. A1 - Harberts, J. A1 - Han, J. A1 - Heekeren, H. R. A1 - Hofmann, U. G. A1 - Holzapfel, M. A1 - Hosseinkazemi, H. A1 - Huang, Y. A1 - Huber, P. A1 - Hyeon, T. A1 - Ingebrandt, S. A1 - Ienca, M. A1 - Iske, A. A1 - Kang, Y. A1 - Kasieczka, G. A1 - Kim, D.-H. A1 - Kostarelos, K. A1 - Lee, J.-H. A1 - Lin, K.-W. A1 - Liu, S. A1 - Liu, X. A1 - Liu, Y. A1 - Lohr, C. A1 - Mailänder, V. A1 - Maffongelli, L. A1 - Megahed, S. A1 - Mews, A. A1 - Mutas, M. A1 - Nack, L. A1 - Nakatsuka, N. A1 - Oertner, T. G. A1 - Offenhäusser, A. A1 - Oheim, M. A1 - Otange, B. A1 - Otto, F. A1 - Patrono, E. A1 - Peng, B. A1 - Picchiotti, A. A1 - Pierini, F. A1 - Pötter-Nerger, M. A1 - Pozzi, M. A1 - Pralle, A. A1 - Prato, M. A1 - Qi, B. A1 - Ramos-Cabrer, P. A1 - Resch-Genger, Ute A1 - Ritter, N. A1 - Rittner, M. A1 - Roy, S. A1 - Santoro, F. A1 - Schuck, N. W. A1 - Schulz, F. A1 - Seker, E. A1 - Skiba, M. A1 - Sosniok, M. A1 - Stephan, H. A1 - Wang, R. A1 - Wang, T. A1 - Wegner, Karl David A1 - Weiss, P. S. A1 - Xu, M. A1 - Yang, C. A1 - Zargarin, S. S. A1 - Zeng, Y. A1 - Zhou, Y. A1 - Zhu, D. A1 - Zierold, R. A1 - Parak, W. J. T1 - Interfacing with the Brain: How Nanotechnology Can Contribute N2 - Interfacing artificial devices with the human brain is the central goal of neurotechnology. Yet, our imaginations are often limited by currently available paradigms and technologies. Suggestions for brain−machine interfaces have changed over time, along with the available technology. Mechanical levers and cable winches were used to move parts of the brain during the mechanical age. Sophisticated electronic wiring and remote control have arisen during the electronic age, ultimately leading to plug-and-play computer interfaces. Nonetheless, our brains are so complex that these visions, until recently, largely remained unreachable dreams. The general problem, thus far, is that most of our technology is mechanically and/or electrically engineered, whereas the brain is a living, dynamic entity. As a result, these worlds are difficult to interface with one another. Nanotechnology, which encompasses engineered solid-state objects and integrated circuits, excels at small length scales of single to a few hundred nanometers and, thus, matches the sizes of biomolecules, biomolecular assemblies, and parts of cells. Consequently, we envision nanomaterials and nanotools as opportunities to interface with the brain in alternative ways. Here, we review the existing literature on the use of nanotechnology in brain−machine interfaces and look forward in discussing perspectives and limitations based on the authors’ expertise across a range of complementary disciplines from neuroscience, engineering, physics, and chemistry to biology and medicine, computer science and mathematics, and social science and jurisprudence. We focus on nanotechnology but also include information from related fields when useful and complementary. KW - Nanoneuro interface KW - Brain-on-a-chip KW - Nanostructured interface KW - Electrode arrays KW - Neuro-implants KW - Advanced nanomaterials KW - Quality assurance PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-634893 DO - https://doi.org/10.1021/acsnano.4c10525 SN - 1936-086X VL - 19 IS - 11 SP - 10630 EP - 10717 PB - ACS Publications AN - OPUS4-63489 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bender, R. A1 - Féron, D. A1 - Mills, D. A1 - Ritter, S. A1 - Bäßler, Ralph A1 - Bettge, Dirk A1 - de Graeve, I. A1 - Dugstad, A. A1 - Grassini, S. A1 - Hack, T. A1 - Halama, M. A1 - Han, E.-H. A1 - Harder, T. A1 - Hinds, G. A1 - Kittel, J. A1 - Krieg, R. A1 - Leygraf, C. A1 - Martinelli, L. A1 - Mol, A. A1 - Neff, D. A1 - Nilsson, J.-O. A1 - Odnevall, I. A1 - Paterson, S. A1 - Paul, S. A1 - Prošek, T. A1 - Raupach, M. A1 - Revilla, R. I. A1 - Ropital, F. A1 - Schweigart, H. A1 - Szala, E. A1 - Terryn, H. A1 - Tidblad, J. A1 - Virtanen, S. A1 - Volovitch, P. A1 - Watkinson, D. A1 - Wilms, M. A1 - Winning, G. A1 - Zheludkevich, M. T1 - Corrosion challenges towards a sustainable society N2 - A global transition towards more sustainable, affordable and reliable energy systems is being stimulated by the Paris Agreement and the United Nation's 2030 Agenda for Sustainable Development. This poses a challenge for the corrosion industry, as building climate‐resilient energy systems and infrastructures brings with it a long‐term direction, so as a result the long‐term behaviour of structural materials (mainly metals and alloys) becomes a major prospect. With this in mind “Corrosion Challenges Towards a Sustainable Society” presents a series of cases showing the importance of corrosion protection of metals and alloys in the development of energy production to further understand the science of corrosion, and bring the need for research and the consequences of corrosion into public and political focus. This includes emphasis on the limitation of greenhouse gas emissions, on the lifetime of infrastructures, implants, cultural heritage artefacts, and a variety of other topics. KW - Corrosion KW - Corrosion costs KW - Corrosion protection KW - Preventive strategies PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-554801 DO - https://doi.org/10.1002/maco.202213140 SN - 1521-4176 VL - 73 IS - 11 SP - 1730 EP - 1751 PB - Wiley-VCH CY - Weinheim AN - OPUS4-55480 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bäßler, Ralph A1 - Bettge, Dirk A1 - Bender, R. A1 - Féron, D. A1 - Mills, D. A1 - Ritter, S. A1 - de Graeve, I. A1 - Dugstad, A. A1 - Grassini, S. A1 - Hack, T. A1 - Halama, M. A1 - Han, E.-H. A1 - Harder, T. A1 - Hinds, G. A1 - Kittel, J. A1 - Krieg, R. A1 - Leygraf, C. A1 - Martinelli, L. A1 - Mol, A. A1 - Neff, D. A1 - Nilsson, J.-O. A1 - Odnevall, I. A1 - Paterson, S. A1 - Paul, S. A1 - Prosek, T. A1 - Raupach, M. A1 - Revilla, R. I. A1 - Ropital, F. A1 - Schweigart, H. A1 - Szala, E. A1 - Therryn, H. A1 - Tidblad, J. A1 - Virtanen, S. A1 - Volovitch, P. A1 - Watkinson, D. A1 - Wilms, M. A1 - Winning, G. A1 - Zheludkevich, M. T1 - La corrosion: un défi pour une société durable N2 - Une transition mondiale vers des systèmes énergétiques plus durables, abordables et fiables a été initiée par l’accord de Paris et l’Agenda 2030 des Nations unies pour un développement durable. Il s’agit là d’un défi industriel majeur car les systèmes et infrastructures énergétiques résilients au changement climatique exigent de se positionner pour le long terme. Se pencher sur le comportement dans la durée des matériaux structurels - principalement des métaux et des alliages - s’impose alors comme une nécessité. Dans cette optique, « La corrosion : un défi pour une société durable »présente une série de cas montrant l’importance de la tenue à la corrosion et de la protection anticorrosion des métaux et des alliages pour le développement de systèmes durables, économiques et fiables de production d’énergie. KW - Corrosion KW - Coûts de la corrosion KW - Protection KW - Anticorrosion KW - Stratégies deprévention PY - 2023 DO - https://doi.org/10.51257/a-v1-cor2000 SN - 2555-5383 VL - 2023 IS - Avril SP - 1 EP - 23 CY - Saint-Denis, France AN - OPUS4-57927 LA - fra AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Blüml, P. A1 - Hosp, E. A1 - Ritter, R. A1 - Simon, B. T1 - Optische Verfahren in der experimentellen Spannungsanalyse PY - 1982 SN - 0083-5560 IS - 439 SP - 97 EP - 121 PB - VDI-Verl. CY - Düsseldorf AN - OPUS4-36387 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schade, U. A1 - Dawei, C. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Removal of Etalon Features in the Far-Infrared–Terahertz Transmittance Spectra of Thin Polymer Films N2 - Etalon features in infrared spectra of stratified samples, their influence on the interpretation and methods to circumvent their presence in infrared spectra have been in discussion for decades. This paper focuses on the application of a method originally developed to remove interference fringes in the mid-infrared spectra for far-infrared Fourier transform spectroscopy on thin polymer films. We show that the total transmittance-reflectance technique, commonly used for mid-infrared, also works successfully in the far infrared spectral range where other approaches fail. Experimental spectra obtained by such technique are supported by model calculations and reveal the possibility and limits to obtain almost undisturbed far-infrared spectra which are suitable to determine low energy vibrations of ionomer salts under certain sample conditions. KW - Far-infrared spectroscopy KW - Absorption KW - Etalon feature KW - Total transmittance reflectance PY - 2020 DO - https://doi.org/10.1177/0003702820922295 VL - 74 IS - 12 SP - 1530 EP - 1539 PB - Sage journals AN - OPUS4-51367 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Beckmann, Jörg A1 - Puskar, L. A1 - Ritter, E. A1 - Schade, U. T1 - Novel Technique for On-Line Monitoring of the Curing Process of Fiber Reinforced Polymer Composites N2 - A specially developed experimental set up has been integrated into a commercially available FT IR Spectrometer to study the curing of Epoxy Systems. MIR and FIR spectra measured during the curing process at different temperatures of an epoxy system will be presented in dependency of the curing time. The experiments and the selected set up are discussed to demonstrate its potential for future monitoring and ageing control applications during a manufacturing process of polymer composites. T2 - 45. International conference on infrared, millimeter, and terahertz waves CY - Online meeting DA - 08.11.2020 KW - Far-infrared spectroscopy KW - Online Curing Monitoring PY - 2021 SN - 978-1-7281-6620-9 DO - https://doi.org/10.1109/irmmw-thz46771.2020.9370646 SP - 1 PB - IEEE AN - OPUS4-53059 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Schade, U. A1 - Puskar, L. A1 - Ritter, E. A1 - Beckmann, Jörg T1 - Etalon effects in THz film measurements N2 - Etalon effects in THz transmittance spectra, either taken in time- domain or frequency-domain, often hamper or even hinder the interpretation of film properties. In this paper we discuss the transferability and applicability of spectroscopic methods typically employed in the near and mid infrared spectral range to eliminate the fringes in the transmittance spectra in the THz spectral range. T2 - 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz) CY - Buffalo, NY, USA DA - 08.11.2020 KW - THz radiation KW - Total transmittance reflection technique KW - Etalon effects PY - 2020 SN - 978-1-7281-6620-9 DO - https://doi.org/10.1109/IRMMW-THz46771.2020.9370451 SN - 2162-2035 SN - 2162-2027 SP - 1 PB - IEEE CY - Buffalo, NY AN - OPUS4-56943 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -