TY - JOUR A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich T1 - Synchrotron radiation induced X-ray fluorescence for the characterization of ancient gold objects KW - Gold KW - Hiddensee treasure KW - Nebra sky disc KW - Non-destructive testing KW - Silver point drawings KW - Synchrotron KW - X-ray fluorescence KW - Or KW - Trésor d´Hiddensee KW - Disque déleste de Nebra KW - Analyse non-destructive KW - Dessins à pointe d´argent KW - Synchrotron KW - Fluorescence à rayons X PY - 2009 SN - 0399-1237 VL - 33 SP - 39 EP - 44 PB - Groupe CY - Rennes AN - OPUS4-23219 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Curado, Jessica A1 - Radtke, Martin A1 - Buzanich, Günter A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Guttler, R.A.S. A1 - Rizzutto, M.A. T1 - μ-SRXRF characterization of Brazilian emeralds N2 - The aim of the present study is to characterize emeralds from different mines of Brazil by using Synchrotron Radiation X-ray Fluorescence Microanalysis (µ-SRXRF). The advantage of this technique is that we can analyze a homogeneous, inclusion free area of the stone with the microbeam to distinguish the elemental fingerprint according to the provenance of the emerald. A total of 47 samples belonging to 5 different Brazilian mines were studied in this work and 28 elements were identified. By means of Principal Component Analysis (PCA) it is possible to build different groups according to the provenance of the stones, which allows to assign samples of unknown origin to the according mine. T2 - 22nd International congress on X-ray optics and microanalysis CY - Hamburg, Germany DA - 02.09.2013 KW - µ-SRXRF KW - BAMline KW - Emeralds KW - Geoscience PY - 2014 DO - https://doi.org/10.1088/1742-6596/499/1/012016 SN - 1742-6588 SN - 1742-6596 VL - 499 SP - 012016-1 EP - 012016-5 PB - IOP Publ. CY - Bristol, UK AN - OPUS4-30541 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ordavo, I. A1 - Ihle, S. A1 - Arkadiev, V. A1 - Scharf, Oliver A1 - Soltau, H. A1 - Bjeoumikhov, A. A1 - Bjeoumikhova, S. A1 - Buzanich, Günter A1 - Gubzhokov, R. A1 - Günther, A. A1 - Hartmann, R. A1 - Holl, P. A1 - Kimmel, N. A1 - Kühbacher, M. A1 - Lang, M. A1 - Langhoff, N. A1 - Liebel, A. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Schaller, G. A1 - Schopper, F. A1 - Strüder, L. A1 - Thamm, C. A1 - Wedell, R. T1 - A new pnCCD-based color X-ray camera for fast spatial and energy-resolved measurements N2 - We present a new high resolution X-ray imager based on a pnCCD detector and a polycapillary optics. The properties of the pnCCD like high quantum efficiency, high energy resolution and radiation hardness are maintained, while color corrected polycapillary lenses are used to direct the fluorescence photons from every spot on a sample to a corresponding pixel on the detector. The camera is sensitive to photons from 3 to 40 keV with still 30% quantum efficiency at 20 keV. The pnCCD is operated in split frame mode allowing a high frame rate of 400 Hz with an energy resolution of 152 eV for Mn Kα (5.9 keV) at 450 kcps. In single-photon counting mode (SPC), the time, energy and position of every fluorescence photon is recorded for every frame. A dedicated software enables the visualization of the elements distribution in real time without the need of post-processing the data. A description of the key components including detector, X-ray optics and camera is given. First experiments show the capability of the camera to perform fast full-field X-Ray Fluorescence (FF-XRF) for element analysis. The imaging performance with a magnifying optics (3×) has also been successfully tested. KW - X-ray CCD camera KW - pnCCD KW - Fast X-ray imaging KW - XRF KW - Full-field X-ray fluorescence KW - Elemental analysis KW - High quantum efficiency KW - High energy resolution KW - Polycapillary optics PY - 2011 DO - https://doi.org/10.1016/j.nima.2011.05.080 SN - 0168-9002 SN - 0167-5087 VL - 654 SP - 250 EP - 257 PB - North-Holland CY - Amsterdam AN - OPUS4-24370 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Merchel, Silke A1 - Berger, Achim A1 - Görner, Wolf A1 - Radtke, Martin A1 - Riesemeier, Heinrich A1 - Reiche, I. A1 - Riederer, J. A1 - Duval, A. A1 - Guicharnaud, H. T1 - Non-Destructive Investigations of Dürer's Silver Point Drawings by Pixe and SY-XRF T2 - 7th International Conference on Non-destructive testing and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage ; art 2002 CY - Antwerp, Belgium DA - 2002-06-02 PY - 2002 UR - http://srs.dl.ac.uk/arch/publications/reiche/reiche_fullcorr.pdf SP - 82 AN - OPUS4-1400 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riesemeier, Heinrich A1 - Reiche, I. A1 - Riederer, J. T1 - Non-destructive investigations of Dürer's silver point drawings by Sy-XRF PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=292 SN - 0179-4159 SP - 292 EP - 293 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1324 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Radtke, Martin A1 - Berger, Achim A1 - Ecker, Klaus A1 - Merchel, Silke A1 - Procop, Mathias A1 - Riesemeier, Heinrich A1 - Görner, Wolf A1 - Reiche, I. T1 - Synchrotron induced X-ray fluorescence for trace element analysis T2 - Hamburg Workshop CY - Hamburg, Germany DA - 2002-09-16 PY - 2002 SN - 3-924330-53-0 SP - 1(?) PB - Gesellschaft Deutscher Chemiker AN - OPUS4-1525 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riesemeier, Heinrich A1 - Reiche, I. A1 - Riederer, J. T1 - A closer look at Albrecht Dürer's drawings (1471-1528) PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2001.pdf#page=32 SN - 0179-4159 SP - 32 EP - 33 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1323 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Berger, Achim A1 - Ecker, Klaus A1 - Görner, Wolf A1 - Merchel, Silke A1 - Procop, Mathias A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - X-ray fluorescence analysis at the BAMline PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=253 SN - 0179-4159 SP - 253 EP - 254 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1322 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Strub, Erik A1 - Plarre, Rüdiger A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Schoknecht, Ute A1 - Urban, Klaus A1 - Jüngel, P. T1 - Determination of Cr(VI) in wood specimen: A XANES study at the Cr K edge N2 - The content of chromium in different oxidation states in chromium-treated wood was studied with XANES (X-ray absorption near-edge structure) measurements at the Cr K absorption edge. It could be shown that wood samples treated with Cr(VI) (pine and beech) did still contain a measurable content of Cr(VI) after four weeks conditioning. If such wood samples were heat exposed for 2 h with 135 °C prior conditioning, Cr(VI) was no longer detected by XANES, indicating a complete reduction to chromium (III). KW - X-ray spectroscopy KW - XANES KW - XAS KW - XRF KW - Specifikation KW - Reduction PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.011 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2405 EP - 2407 PB - Elsevier CY - Amsterdam AN - OPUS4-17555 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Guicharnaud, H. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - Traces of Albrecht Dürer: Non-destructive analyses of Renaissance silverpoint drawings KW - Nuclear industry KW - Nuclear medicine PY - 2004 SN - 92-0-114703-1 SN - 0074-1876 IS - 1181 SP - 138 EP - 142 PB - IAEA CY - Vienna AN - OPUS4-5548 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ecker, Klaus A1 - Wätjen, U. A1 - Berger, Achim A1 - Persson, L. A1 - Pritzkow, Wolfgang A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - RBS, SY-XRF, INAA and ICP-IDMS of antimony implanted in silicon - A multi-method approach to characterize and certify a reference material N2 - A layer of Sb atoms, implanted with an energy of 400 keV and a nominal dose of 5×1016 atoms/cm2 into a high purity silicon wafer, was certified for its areal density (atoms/cm2) using Rutherford backscattering spectrometry (RBS), instrumental neutron activation analysis (INAA) and inductively coupled plasma isotope dilution mass spectrometry (ICP-IDMS) and for its isotope ratio using INAA and ICP-IDMS. Excellent agreement between the results of the different independent methods was found. In the present work, the measurements of the homogeneity of the areal density of Sb, previously determined with RBS in spots having 1 mm diameter, are improved with synchrotron X-ray fluorescence analysis: Higher precision in even smaller sample spots allows to estimate a reduced inhomogeneity of the whole batch of samples of the order of only 0.4%. Thus the uncertainty of the certified value can further be reduced. Down to fractions of a chip with 0.3×0.4 mm2 area, the areal density is now certified as (4.81±0.06)×1016 Sb atoms/cm2, where the expanded uncertainty 0.06 (coverage factor k=2) corresponds to only 1.2%. The relative merits of the different analytical methods are discussed. KW - Certified reference material KW - RBS KW - INAA KW - ICP-IDMS KW - XRF KW - SY-XRF PY - 2002 DO - https://doi.org/10.1016/S0168-583X(01)01038-2 SN - 0168-583X SN - 1872-9584 VL - 188 IS - 1-4 SP - 120 EP - 125 PB - Elsevier CY - Amsterdam AN - OPUS4-13870 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Guicharnaud, H. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. ED - Röhrs, S. T1 - Auf den Spuren Albrecht Dürers - Zerstörungsfreie Untersuchung von Silberstiftzeichnungen mittels Mikro-PIXE und Synchrotron-induzierter Mikro-RFA T2 - Jahrestagung 2003 im Ethnologischen Museum Berlin-Dahlem CY - Berlin, Deutschland DA - 2003-03-12 PY - 2003 SN - 3-00-014223-1 SN - 0949-4057 SP - 118 EP - 120 CY - [Frankfurt am Main] AN - OPUS4-2356 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - Schwefelbestimmung in Kraftstoffen mittels SYRFA N2 - Orientierende Versuche zur Schwefelbestimmung in Kraftstoffen haben gezeigt, dass die Röntgenbeamline der BAM bei BESSY II geeignet ist, Schwefel auch in kleinen Konzentrationen zu bestimmen. Da das Verfahren der synchrotronstrahlungsinduzierten Röntgenfluoreszenzanalyse (SYRFA) für den Vor-Ort-Einsatz nicht geeignet ist, ist das Ziel der Untersuchungen, durch Variation von Anregungsenergie und -geometrie mögliche Quellen für systematische Fehler zu untersuchen. Durch geeignete Korrekturfaktoren kann dann die Richtigkeit der Analyseergebnisse gewährleistet werden. Das Verfahren soll dann als Alternative bzw. Ergänzung zu zerstörenden Verfahren der Schwefelanalyse Anwendung finden. Damit wird ein Beitrag zur künftigen Herstellung zertifizierter Referenzmaterialien (ZRM) geleistet. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2003 CY - Mainz, Deutschland DA - 2003-05-26 PY - 2003 UR - http://www.ndt.net/article/dgzfp03/papers/p05/p05.htm SN - 3-931381-47-1 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 83-CD PB - DGZfP CY - Berlin AN - OPUS4-2558 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Reiche, I. A1 - Berger, Achim A1 - Buck, St. A1 - Görner, Wolf A1 - Ketelsen, Th. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - BAMline meets Dürer and van Eyck - Multi-disciplinary investigation of Renaissance silver point drawings by µ-SR-XRF N2 - - http://www.bessy.de/publications/05.annual_reports/files/AnnualReport2002.pdf - PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=416 SN - 0179-4159 SP - 416 EP - 418 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2496 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Radtke, Martin A1 - Reiche, I. A1 - Berger, Achim A1 - Merchel, Silke A1 - Riesemeier, Heinrich A1 - Görner, Wolf A1 - Riederer, J. A1 - Roth, M. ED - Simionovici, A. T1 - BAMline meets Dürer and Van Eyck - Spatially resolved SR-XRF analyses of silver point drawings and their mysterious inscriptions T2 - 17th International Conference on X-Ray Optics and Microanalysis ; 17th ICXOM CY - Chamonix, France DA - 2003-09-22 PY - 2003 N1 - Serientitel: Spectrochimica acta : Part B, Atomic spectroscopy – Series title: Spectrochimica acta : Part B, Atomic spectroscopy IS - 59.2004,10/11 SP - 48 PB - Elsevier CY - Amsterdam AN - OPUS4-2690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Merchel, Silke A1 - Berger, Achim A1 - Görner, Wolf A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Vogl, Jochen A1 - Frisch, A. A1 - Reiche, I. T1 - Kunst- und Kulturgüter unter "Beschuss" T2 - GDCh-Jahrestagung Chemie 2003 ; Jahrestagung der Fachgruppe Nuklearchemie ; 19. Seminar Aktivierungsanalyse CY - München, Deutschland DA - 2003-10-06 PY - 2003 SN - 3-936028-14-1 N1 - Serientitel: Kurzreferate / GDCh-Jahrestagung Chemie 2003 – Series title: Kurzreferate / GDCh-Jahrestagung Chemie 2003 IS - 5 SP - 68 PB - Gesellschaft Deutscher Chemiker CY - Frankfurt am Main AN - OPUS4-2686 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Frisch, A. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Vogl, Jochen ED - Röhrs, S. T1 - Synchrotron-XRF und PIXE Untersuchungen an bronzezeitlichen Fussringen T2 - Jahrestagung 2003 im Ethnologischen Museum Berlin-Dahlem CY - Berlin, Deutschland DA - 2003-03-12 PY - 2003 SN - 3-00-014223-1 SN - 0949-4057 SP - 101 EP - 103 CY - [Frankfurt am Main] AN - OPUS4-2355 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Berger, Achim A1 - Ecker, Klaus A1 - Görner, Wolf A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich A1 - Segebade, Christian T1 - Strahlenverfahren in Kombination - ein Werkzeug für Analyse und Zertifizierung von Feststoffen T2 - 12. Jahrescolloquium "Analyse von Feststoffen unterschiedlicher Materialien aus Industrie und Umwelt" CY - Berlin, Deutschland DA - 2002-11-19 PY - 2002 SP - 1(?) AN - OPUS4-2025 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Procop, Mathias A1 - Radtke, Martin A1 - Riesemeier, Heinrich T1 - SY-XRF in certification of a reference material at the BAMline PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=311 SN - 0179-4159 SP - 311 EP - 312 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2492 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Berger, Achim A1 - Görner, Wolf A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich T1 - Silberstiftzeichnungen - Zerstörungsfreie Spurenanalyse mit Synchrotronstrahlung T2 - 10. IADA-Kongress (Internationale Arbeitsgemeinschaft der Archiv-, Bibliotheks- und Graphikrestauratoren) CY - Göttingen, Deutschland DA - 2003-09-21 PY - 2003 SN - 1563-2628 VL - 4 PB - Foto Text Verl. CY - Stuttgart AN - OPUS4-2663 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lahiri, D. A1 - Sharma, S.M. A1 - Verma, A.K. A1 - Vishwanadh, B. A1 - Dey, G.K. A1 - Schumacher, G. A1 - Scherb, T. A1 - Riesemeier, Heinrich A1 - Reinholz, Uwe A1 - Radtke, Martin A1 - Banerjee, S. T1 - Investigation of short-range structural order in Zr69.5Cu12Ni11Al7.5 and Zr41.5Ti41.5Ni17 glasses, using X-ray absorption spectroscopy and ab initio molecular dynamics simulations N2 - Short-range order has been investigated in Zr69.5Cu12Ni11Al7.5 and Zr41.5Ti41.5Ni17 metallic glasses using X-ray absorption spectroscopy and ab initio molecular dynamics simulations. While both of these alloys are good glass formers, there is a difference in their glass-forming abilities (Zr41.5Ti41.5Ni17 > Zr69.5Cu12Ni11Al7.5). This difference is explained by inciting the relative importance of strong chemical order, icosahedral content, cluster symmetry and configuration diversity. KW - Multi-component alloy KW - Glass-forming ability KW - XAFS KW - Local structure KW - AIMD simulation PY - 2014 DO - https://doi.org/10.1107/S1600577514017792 SN - 0909-0495 SN - 1600-5775 VL - 21 IS - 6 SP - 1296 EP - 1304 PB - Blackwell Publishing CY - Oxford AN - OPUS4-31837 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reiche, I. A1 - Berger, Achim A1 - Duval, A. A1 - Görner, Wolf A1 - Guicharnaud, H. A1 - Merchel, Silke A1 - Radtke, Martin A1 - Riederer, J. A1 - Riesemeier, Heinrich A1 - Roth, M. ED - Marabelli, M. ED - Tabaso, M. T1 - Spatially resolved SR-XRF analyses of complex drawings of the Holbein family T2 - 8th International Conference on "Non-Destructive Investigations and Microanalysis for the Diagnostics and Conservation of the Cultural and Environmental Heritage" CY - Lecce, Italy DA - 2005-05-15 KW - X-ray spectrometry KW - XRF KW - Röntgenfluoreszenzanalyse KW - RFA KW - Silverpoint drawing KW - Silberstiftzeichnung PY - 2005 SP - 7 pages PB - Italian Society of Non Destructive Testing CY - Lecce AN - OPUS4-7677 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -