TY - JOUR A1 - Katsikini, M. A1 - Filintoglou, K. A1 - Pinakidou, F. A1 - Pilatsikas, N. A1 - Arvanitidis, J. A1 - Christofilos, D. A1 - Paloura, E.C. A1 - Ves, S. A1 - Reinholz, Uwe A1 - Papadomanolaki, E. A1 - Lliopoulos, E. T1 - Scaling of phonon frequencies and electron binding energies with interatomic distances in InxGa1−xN N2 - In-K-edge x-ray absorption fine structure (EXAFS), x-ray photoelectron, and Raman spectroscopy results are combined for a comprehensive study of InxGa1−xN layers with energy gaps extending over nearly the whole visible spectrum. The In–N and In–(In,Ga) distances determind by EXAFS are used for the derivation of the In–N bond ionicity as well as for the phonon frequency dependence of the LO and B21 modes, assessed by Raman, and the N 1s, In 3d5/2, Ga 3s, and Ga 2p1/2 electron binding energies on those distances. Phonon confinement due to perturbation of the periodic potential caused by the alloying is also quantified. KW - Band gap KW - Phonons KW - Epitaxy KW - Electronic structure KW - X-ray photoelectron KW - Nitrides PY - 2021 DO - https://doi.org/10.1063/5.0069359 VL - 130 IS - 20 SP - 205706 - 1 EP - 205706 - 9 PB - AIP Publishing AN - OPUS4-53956 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reinholz, Uwe A1 - Bremser, Wolfram A1 - Brzezinka, Klaus-Werner A1 - Strub, Erik A1 - Weise, Hans-Peter A1 - Merchel, Silke T1 - A thin-layer reference material for hydrogen analysis N2 - In many areas of material sciences, hydrogen analysis is of particular importance. For example, hydrogen is most abundant as impurity in thin film materials – depending on the deposition process – and has great influence on the chemical, physical and electrical properties of many materials. Existing bulk reference materials (RMs) are not suited for surface sensitive analytical methods like elastic recoil detection analysis (ERDA) or nuclear reaction analysis (NRA). To overcome this serious lack of (certified) thin-layer reference materials for the determination of hydrogen in the near-surface region (1–2 µm depth), we produced stable, homogeneous amorphous silicon layers on Si-wafers (aSi:H–Si) by means of chemical vapour deposition (CVD), while about 10% of hydrogen was incorporated in the Si-layer. Homogeneity and stability were proved by NRA whereas traceability of reference values has been assured by an international interlaboratory comparison. KW - Hydrogen KW - Nuclear reaction analysis KW - Depth profiling KW - Reference material KW - Ion beam analysis PY - 2008 DO - https://doi.org/10.1016/j.nimb.2008.03.015 SN - 0168-583X SN - 1872-9584 VL - 266 IS - 10 SP - 2418 EP - 2423 PB - Elsevier CY - Amsterdam AN - OPUS4-17553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Peuker, Christel A1 - Bessau, Waltraud A1 - Brzezinka, Klaus-Werner A1 - Kohl, Anka A1 - Reinholz, Uwe A1 - Geißler, Heinz T1 - IR and Raman study of calcium aluminosilicate glasses of the composition xCaO.xAl2O3.(100-2x)SiO2 PY - 2002 SN - 0927-4472 VL - 75 IS - 6 SP - 313 EP - 322 PB - Elsevier CY - Amsterdam AN - OPUS4-2304 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Leschik, M. A1 - Heide, G. A1 - Frischat, G.H. A1 - Behrens, H. A1 - Wiedenbeck, M. A1 - Wagner, N. A1 - Heide, K. A1 - Geißler, Heinz A1 - Reinholz, Uwe T1 - Determination of H2O and D2O contents in rhyolitic glasses N2 - Five distinct analytical techniques were compared for the quantification of the H2O (0·1-7·4 wt%) and D2O (up to 5·5 wt% D2O) contents in rhyolitic glasses. The hydrogen concentration in obsidians was measured using nuclear reaction analysis (NRA) and converted into H2O concentration. The bulk water content (H2O+D2O) of synthesised glasses was determined using thermal extraction in conjunction with Karl–Fischer titration (KFT). Unextracted H2O was measured by infrared (IR) spectroscopy after remelting the KFT products at high pressure. These well characterised glasses were subsequently used to calibrate secondary ion mass spectrometry (SIMS), infrared and evolved gas analysis (EGA). The calibrations of SIMS for H2O and D2O show a significant matrix effect at H2O and D2O concentrations larger than ~3 mol/l with the relative sensitivity factor (RSF) decreasing with bulk water content. Molar absorption coefficients for the OH stretching vibration band at 3570 cm-1 and the OD stretching vibration band at 2650 cm-1 in the infrared absorption spectra were reinvestigated. In the range 0·1-6 wt% the H2O content of glasses could be reproduced within analytical error using a constant linear molar absorption coefficient. However, it appears that the absorption coefficients for the 3570 cm-1 band as well as for the 2650 cm-1 band both decrease systematically with concentration of dissolved H2O and D2O (epsi3570=80 (±1) - 1·36(±0·23)CH2Ot and epsi2650=61·2(±1) - 2·52(± 0·30)CD2Ot). EGA allows quantification of the H2O content as well as the study of dehydration kinetics. It is shown that H2O is released under vacuum already at room temperature from glasses containing >7 wt% H2O. PY - 2004 UR - http://www.ingentaconnect.com/content/sgt/pcg/2004/00000045/00000004/art00003 SN - 0031-9090 VL - 45 IS - 4 SP - 238 EP - 251 PB - Thornton CY - Sheffield AN - OPUS4-6279 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Görner, Wolf A1 - Reinholz, Uwe T1 - Wasserstoffanalytik mit hochenergetischen Ionen KW - Wasserstoff KW - Ionenstrahlanalytik KW - Kernreaktionsanalyse PY - 2005 UR - http://archiv.aktuelle-wochenschau.de/2005/woche15/woche15.html IS - 15 SP - 1 EP - 11 PB - Gesellschaft Deutscher Chemiker CY - Frankfurt am Main AN - OPUS4-7324 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Reiche, I. A1 - Britzke, Ralf A1 - Bukalis, Gregor A1 - Reinholz, Uwe A1 - Weise, Hans-Peter A1 - Gadebusch, R.D. T1 - An external PIXE study: Mughal painting pigments KW - PIXE KW - Mughal painting KW - Pigments KW - Archaeometry PY - 2005 SN - 0049-8246 VL - 34 SP - 42 EP - 45 PB - Wiley CY - Chichester AN - OPUS4-6846 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe T1 - Farbrekonstreuktion eines altägyptischen Tempelreliefs T2 - IGAS Jahreskolloqium, Adlershof CY - Berlin, Germany DA - 2004-11-17 PY - 2004 AN - OPUS4-7181 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe T1 - Farbrekonstreuktion eines altägyptischen Tempelreliefs T2 - Jahrestagung "Archäometrie und Denkmalpflege 2004" CY - Mannheim, Germany DA - 2004-10-06 PY - 2004 AN - OPUS4-7182 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe T1 - Referenzmaterial Wasser in Natrium-Calcium-Silicatglas - Bestimmung durch Kernreaktionsanalyse und Infrarotspektroskopie T2 - Präsentation im Rahmen einer Arbeitsgruppensitzung zum HVG/AiF-Forschungsvorhaben: "Entwicklung eines Analysesystems zur simultanen quantitativen Analyse von H2O;CO2;SO2 und N2 in silicatischen Gläsern" AiF- Forschungsvorhaben Nr. 12852 BR CY - Berlin, Germany DA - 2005-05-02 PY - 2005 AN - OPUS4-7459 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe T1 - Darstellung eines Referenzmaterials für die ortsaufgelöste Wasserstoffanalytik in oberflächennahen Schichten T2 - Workshop "Ioenstrahlphysik und - technologie", Leipzig Leibnitz-Institut für Oberflächenmodifizierung e.V. CY - Leipzig, Germany DA - 2005-04-11 PY - 2005 AN - OPUS4-7461 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Reinholz, Uwe T1 - Zerstörungsfreie Elementanalytik mit externen Protonenstrahlen T2 - Arbeitskolloquium CY - Berlin, Germany DA - 2003-03-17 PY - 2003 AN - OPUS4-3815 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -