TY - JOUR A1 - Gopala, Anil A1 - Kipphardt, Heinrich A1 - Matschat, Ralf A1 - Panne, Ulrich T1 - Mass spectrometry insight of the process mechanism during the vacuum distillation of zinc N2 - Detection and monitoring of volatile elements released during the preparation of ultra high purity zinc by vacuum distillation (VD) is reported using online quadrupole gas source mass spectrometry (QMS). The theoretically calculated vapour pressures (pv) for the volatile impurity elements using Dushman constants and the practically observed mass spectra were found to be consistent (S. Dushman and J. M. Lafferty, Scienific Foundations of Vacuum Technique, 2nd ed., Wiley, New York, 1962). This is the first time that the potential ability of an online mass spectrometer was used for monitoring and understanding the process mechanism during the purification of metals (Zn) using VD. We here also illustrate our findings with the results from high resolution glow discharge mass spectrometer (HR-GDMS) analysis before and after the purification of Zn. PY - 2009 DO - https://doi.org/10.1039/b904133h SN - 0267-9477 SN - 1364-5544 VL - 24 SP - 887 EP - 890 PB - Royal Society of Chemistry CY - London AN - OPUS4-19595 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kipphardt, Heinrich A1 - Matschat, Ralf A1 - Panne, Ulrich T1 - Development of SI traceable standards for element determination N2 - In Germany a system of primary amount of substance standards for elemental analysis is being developed, which forms the material´s basis for the National Standards for element determination. The metrological concept and technical approach is briefly described. The objective of traceability in chemistry, in this case for elemental determination, is illustrated on the example of copper. KW - Copper KW - Element determination KW - Metrology KW - Primary standards KW - Traceability PY - 2009 DO - https://doi.org/10.2533/chimia.2009.637 SN - 0009-4293 VL - 63 IS - 10 SP - 637 EP - 639 PB - Schweizerische Chemische Gesellschaft CY - Basel AN - OPUS4-20727 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rudtsch, S. A1 - Gusarova, Tamara A1 - Aulich, A. A1 - Fahr, M. A1 - Fischer, J. A1 - Kipphardt, Heinrich A1 - Matschat, Ralf A1 - Panne, Ulrich T1 - Procedure for the impurity-related correction at the indium fixed-point N2 - Determining the influence of impurities on the fixed-point emperatures of the ITS-90 requires the completion of several tasks. In this paper, the Progress made at Physikalisch-Technische Bundesanstalt (PTB) and BAMFederal Institute for Materials Research and Testing is presented and remaining questions are discussed. The projected characterization procedure at PTB, which is based on the established SIE method (sum of the individual estimates), using a new indium fixed-point cell is described as an example. This procedure includes an SI-traceable chemical Analysis of the material in the fixed-point cell with sufficiently low uncertainties, the individual experimental determination of the influence of the quantified impurities on the fixed-point temperature, and the establishment of direct links to the phase-transition temperatures of the national standard and of an assumed material of ideal purity. A characteristic difference to the common practice is the chemical analysis of the fixed-point metal being done after determining the cell’s freezing temperature. This allows for the detection and consideration of contamination and purification effects due to the filling process, or due to the contact with the carbon crucible and other parts of the fixed-point cell. A chemical analysis of an indium fixed-point was carried out by BAM with relative measurement uncertainties below 30 % which have not been previously achieved. The results provide evidence for the precipitation of some impurities, which is apparently inconsistent with the corresponding binary phase diagrams, but was explained in a recent publication. Implications for the use of the SIE method shall be described briefly at the end. KW - Chemical analysis KW - Fixed-points KW - Impurities KW - ITS-90 PY - 2011 DO - https://doi.org/10.1007/s10765-011-0915-0 SN - 0195-928X SN - 1572-9567 VL - 32 IS - 1-2 SP - 293 EP - 302 PB - Springer CY - Dordrecht AN - OPUS4-23373 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Hassler, J. A1 - Richter, Silke A1 - Kleve, M. A1 - Dette, A. T1 - Multielement trace analysis of pure graphite powders using optical emission spectrometry coupled to a magnetically stabilized DC arc supplied with halogenating gases as chemical modifiers – a rapid and robust methodology N2 - A magnetically stabilized DC arc device, designed for operation with OES spectrometers was used to determine the elements Ag, Al, B, Ba, Be, Ca, Co, Cr, Cu, Fe, Ga, In, K, Li, Mg, Mn, Mo, Na, Nb, Ni, Si, Sn, Sr, Ti, V, Zr at trace levels of some μg kg−1 up to some 10 mg kg−1 in graphite powders. The coil for the generation of the homogeneous magnetic field was placed outside the closed arc chamber. The time programs of variable current strengths of the magnetic coil (up to 6 A) and of the arc (up to 17 A) which was burning in air were computer controlled. Halogenating gases (mainly CCl2F2, alternatively SF6 and NF3) were used as chemical modifiers to allow an effective release of the carbide forming trace elements. The mass flow controlled modifier gas was led through a special carrier electrode near the arc plasma. The emission radiation was guided by an optical fiber alternatively into two different ICP spectrometers in which the ICP torches were removed. The synergistic interaction of the magnetic field with the halogenating modifier gases resulted in a significant improvement in the analytical performance of the optimized analytical method. All our results for 22 trace elements were in good agreement with the means of an inter-laboratory comparison by BAM for certification of a pure graphite powder material; this holds also for our results for two other graphite materials. The optimized method showed an analytical performance suitable for comprehensive trace analysis of pure graphite. The instrumentation could be integrated into modern DC arc emission spectrometers to improve their analytical capabilities substantially. KW - Graphit KW - DC-Arc KW - High purity KW - Optical emission spectroscopy KW - Magnetically stabilized PY - 2018 DO - https://doi.org/10.1039/C7JA00387K SN - 1364-5544 SN - 0267-9477 VL - 33 IS - 3 SP - 468 EP - 480 PB - Royal Society of Chemistry AN - OPUS4-44398 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hassler, J A1 - Matschat, Ralf A1 - Richter, Silke A1 - Barth, P. A1 - Detcheva, A.K. A1 - Waarlo, H.-J. T1 - Determination of 22 trace elements in high-purity copper including Se and Te by ETV-ICP OES using SF6, NF3, CF4 and H2 as chemical modifiers N2 - In supplementary work to the one published earlier, experiments with SF6, NF3, CF4 and H2 as new modifier gases for the matrix studied were performed. Our investigations were continued to improve the described analytical method and to achieve additional insights into the mechanism of analyte release. Our new survey is split in two parts. At first fluorinating modifiers were used to investigate the behaviour of a variety of trace elements (Ag, Al, As, Au, Bi, Cd, Co, Cr, Fe, Mg, Mn, Ni, P, Pb, Sb, Se, Si, Sn, Te, Ti, Zn and Zr). Most of them (exceptions Au, Se, and Te) could be effectively released from the copper matrix by thermo-halogenation reactions and by partial sub-sample evaporation. Using SF6 and NF3 as modifier gases, low limits of quantification (LOQs) were achieved for the 19 well released trace elements (typical ≤0.1 mg kg-1). Most elements (exceptions Ag, Mg, and Ni) could be calibrated by using aqueous calibration solutions without any sample pretreatment. For the trace determination of Se, Te, and Au, a further analytical method of ETV-ICP OES is described in the second part based on thermo-hydrogenation reactions by using a hydrogen/argon mixture as a modifier gas. The determination of Se and Te with very high analytical performance (LOQ < 0.1 mg kg-1) can either be carried out in a second analytical step succeeding the halogenation procedure, or the sub-sample is directly treated with H2 without previous halogenation procedure whereby the sub-sample can either be partially or totally evaporated. In this case some other analytes (Ag, Au, As, Bi, Cd, Fe, Mg, Ni, Pb, Sb, Sn, and Zn) can additionally be quantified simultaneously with Se and Te. KW - Pure Cu material KW - Electrothermal vaporization KW - Optical-emission spectrometry KW - Plasma-mass-spectrometry KW - Atomic-absorption spectrophotometry KW - Graphite-furnace AAS KW - Pure copper KW - Spectrochemical analysis KW - Precise determination KW - Sample introduction KW - Silicon-carbide PY - 2016 DO - https://doi.org/10.1039/C5JA00240K SN - 0267-9477 SN - 1364-5544 VL - 31 IS - 3 SP - 642 EP - 657 PB - Royal Society of Chemistry CY - London AN - OPUS4-35133 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Primäre Kalibriernormale für die metrologische Rückführung in der anorganischen chemischen Analytik T2 - CANAS'03 - Colloquium Analytische Atomspektroskopie CY - Konstanz, Germany DA - 2003-03-23 PY - 2003 AN - OPUS4-3716 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Richter, Silke A1 - Meckelburg, Angela A1 - Recknagel, Sebastian A1 - Matschat, Ralf A1 - Panne, Ulrich T1 - Determination of trace elements in iron ore, cast iron and steel using the 7500cs KW - Steel KW - Iron ore KW - Cast iron KW - ICP-MS PY - 2009 IS - 38 SP - 4 EP - 5 PB - Agilent Technologies CY - Santa Clara, CA, USA AN - OPUS4-19476 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Dette, Angelika A1 - Richter, Silke A1 - Recknagel, Sebastian A1 - Barth, P. T1 - Certification of a boron carbide powder reference material for chemical analysis N2 - The certification of a boron carbide reference material for chemical composition is described. The mass fractions of 16 elements and two boron species are certified in an international interlaboratory comparison with 35 participating laboratories from six different countries. Beside chemical characterization the certification process includes homogeneity and stability testing of the candidate material boron carbide (type F360, 305M422). Details of the analytical methods used for chemical characterization and of the calculation of the uncertainties of the certified mass fractions are given. The new reference material ERM®-ED102 with certified mass fractions of 18 parameters (elements and species) and of the amount fraction of the isotope 10B is a valuable tool for laboratories working in the field of advanced ceramic materials analysis to improve their analytical results. KW - Boron carbide KW - Certified reference material KW - ERM KW - Certification PY - 2011 DO - https://doi.org/10.1111/j.1551-2916.2011.04657.x SN - 0002-7820 SN - 1551-2916 VL - 94 IS - 11 SP - 4009 EP - 4016 PB - Blackwell Publishing CY - Malden AN - OPUS4-24967 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf A1 - Kipphardt, Heinrich A1 - Czerwensky, Michael A1 - Richter, Silke A1 - Heinrich, Hans-Joachim ED - Abiko, K. ED - Takaki, S. T1 - The System of Primary Pure Metals Established at BAM - Recent Developments T2 - 9th international conference on ultrahigh-purity base metals CY - Sendai, Japan DA - 2002-10-14 PY - 2002 SP - 119 CY - Sendai AN - OPUS4-1601 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gusarova, Tamara A1 - Hodoroaba, Vasile-Dan A1 - Matschat, Ralf A1 - Kipphardt, Heinrich A1 - Panne, Ulrich T1 - Exploitation of the hollow cathode effect for sensitivity enhancement of Grimm-type DC glow discharge optical emission spectroscopy N2 - The hollow cathode (HC) effect was investigated in non-cooled 15 mm deep drilled flat metallic analytical samples that were easy to prepare. The deep cavity used ("complete HC" in contrast to "recessed HC" with 2-3 mm deep cavity) intensified the HC effect notably and therefore distinctly improved the detection power of the common GD-OES with planar cathodes. A signal enhancement of up to a factor of 150, not reported earlier, in comparison with flat conventional samples was achieved. A better separation of the analytical lines from spectral interferences was observed when the HC assembly was applied. Additionally, an effect of strongly enhanced intensities of atomic lines and somewhat decreased intensities of ionic lines was detected in the case of HC in comparison to usual planar cathodes. The investigations were carried out with samples of copper, steel and zinc matrices using both the same and individually optimised glow discharge (GD) electrical parameters. KW - Hollow cathode KW - Grimm type glow discharge KW - Emission spectroscopy KW - GD-OES KW - Sensitivity PY - 2009 DO - https://doi.org/10.1039/b814977a SN - 0267-9477 SN - 1364-5544 VL - 24 SP - 680 EP - 684 PB - Royal Society of Chemistry CY - London AN - OPUS4-19600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Richter, Silke A1 - Roethke, A. A1 - Rienitz, O. A1 - Matschat, Ralf A1 - Schiel, D. A1 - Jaehrling, R. A1 - Goerlitz, V. A1 - Kipphardt, Heinrich T1 - SI-traceable monoelemental solutions on the highest level of accuracy: 25 years from the foundation of CCQM to recent advances in the development of measurement methods N2 - Within the Working Group on Inorganic Analysis (IAWG) of the Consultative Committee for Amount of Substance: Metrology in Chemistry and Biology (CCQM) international key comparisons and pilot studies related to inorganic analysis are carried to ensure consistency in this field at the highest level. Some of these comparisons deal directly with the preparation and characterization of monoelemental solutions or with topics, closely related. The importance of monoelemental solutions lies in the fact that almost every measurement in inorganic analysis relies on the comparison with either a reference material, or references in form of solutions, usually (mono)elemental solutions. All quantitative measurement approaches, e.g. isotope dilution or standard addition, need an accurate reference solution made from a well characterized reference material, prepared under full gravimetric control. These primary (monoelemental) solutions do not only serve as arbitrary references/calibration solutions, but they also link up measurement results to the International System of units (SI), this way establishing the so-called metrological traceability to a measurement unit of the SI. Without such solutions on the highest possible level of accuracy and with the smallest possible associated uncertainties (for e.g. element content and/or impurities), an analysis itself can never be as good as it could be with appropriate reference solutions. This article highlights select key comparisons and pilot studies dealing with monoelemental solution related topics within the IAWG from the foundation of CCQM – 25 years ago – up to latest achievements in the field of inorganic analysis. KW - Metrology KW - SI Traceability KW - CCQM PY - 2019 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-496080 DO - https://doi.org/10.1088/1681-7575/ab5636 SN - 0026-1394 SN - 1681-7575 SP - 1 EP - 23 PB - IOP CY - Bristol AN - OPUS4-49608 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Görner, Wolf A1 - Eichelbaum, Maik A1 - Matschat, Ralf A1 - Rademann, K. A1 - Radtke, Martin A1 - Reinholz, Uwe A1 - Riesemeier, Heinrich T1 - Non-destructive investigation of composition, chemical properties and structure of materials by synchrotron radiation PY - 2006 SN - 0007-1137 VL - 48 IS - 9 SP - 540 EP - 544 PB - British Institute of Non-Destructive Testing CY - Northampton AN - OPUS4-14186 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Peplinski, Burkhard A1 - Fitch, A.N. A1 - Evans, A. A1 - Ibberson, R.M. A1 - Többens, D.M. A1 - Cranswick, L.M.D. A1 - Dörfel, Ilona A1 - Emmerling, Franziska A1 - Matschat, Ralf T1 - Structural characterization of a coarse-grained transparent silicon carbide powder by a combination of powder diffraction techniques N2 - Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 µm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w15R : w6H = 0.002,3(8) and w4H : w6H = 0.000,6(2). KW - Silicon carbide KW - Polytypes KW - Phase quantification KW - Reference material PY - 2009 DO - https://doi.org/10.1524/zksu.2009.0009 SN - 0930-486X VL - 30 EPDIC 2008 SP - 61 EP - 66 PB - Oldenbourg CY - München AN - OPUS4-20561 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -