TY - CONF A1 - Matschat, Ralf T1 - BAM System of Primary Pure Elements - Aim and Current State T2 - Annual Meeting of Inorganic Working Group of CCQM CY - Ottawa, Canada DA - 2002-10-09 PY - 2002 AN - OPUS4-3713 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Current State-Progress Report of the CCQM Pilot Study P34 "Aluminium Alloy" T2 - Annual Meeting of Inorganic Working Group of CCQM CY - Ottawa, Canada DA - 2002-10-09 PY - 2002 AN - OPUS4-3714 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Metrologische Aktivitäten der Fachgruppe I.1 der BAM T2 - Expertentreffen BAM-PTB CY - Braunschweig, Germany DA - 2002-11-04 PY - 2002 AN - OPUS4-3715 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Activities of Division "Inorganic Chemical Analysis; Reference Materials" of BAM in the field Analysis of Materials T2 - The International Symposium on the Progress in Metal Science CY - Tokyo, Japan DA - 2002-10-17 PY - 2002 AN - OPUS4-2938 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Multielement trace determination in high purity advanced ceramics and in high purity metals (invited talk) N2 - Multielement trace determination in high purity advanced ceramics and in high purity metals Ralf Matschat, Hans-Joachim Heinrich, Michael Czerwensky, Sandra Kuxenko and Heinrich Kipphardt Federal Institute for Materials Research and Testing (BAM), Richard-Willstaetter-Strasse 11, D-12489 Berlin, Germany Certified reference materials (CRMs) are of high importance to check the trueness of results in chemical analysis. In the field of advanced ceramics two CRMs were developed in the last years by the Federal Institute for Materials Research and Testing - (BAM), one for silicon nitride and one for silicon carbide. The certification of these materials is briefly discussed in this contribution. Both CRMs are not of extremely high purity in the classical sense, but besides their application by industry they are appropriate to be used for the validation of special methods used for trace determination in accordant high purity materials. This is demonstrated for the example of ultrapure silicon carbide which was analyzed by solid sampling electrothermal atomic absorption spectrometry (SS ET AAS). Wet chemical dissolution of this pure material typically introduces blanks which are too high for ultratrace analysis. Therefore SS ET AAS as a direct method was applied which does not need any wet chemical sample preparation. This method can be applied very effectively concerning sample throughput. But, as for all direct solid sampling methods, the calibration is a problem difficult to solve. By using the accordant CRM it could be demonstrated, that the calibration with liquid sample aliquots can be performed without affecting the trueness of the results. The analytical parameters and the performance of the method are discussed. Besides the so-called matrix CRMs, as reported for silicon nitride and silicon carbide, BAM is also certifying primary pure reference materials used as the National Standards for inorganic analysis in Germany. This work is performed in the frame of an extensive project in co?operation with the sister institute of BAM, the Physikalisch Technische Bundesanstalt (PTB). The crucial point of this project is the certification of the purity of high purity materials, each representing one element of the periodic table. Up to now more than ten primary CRMs are certified or not far from being certified. A variety of different analytical methods was necessary to determine the trace contents of metallic and non-metallic impurities from almost the whole periodic table in the high purity materials. Using high purity copper as an example the application and the results of the different methods applied are demonstrated. Another example presented is high purity iron. In this context the very good comparability of the results from two different methods, used for the determination of metallic traces is demonstrated. One of these methods was the "working horse" - the sector field high resolution ICP mass spectrometry (HR ICP-MS) mainly used in low resolution mode to exploit the good detection power and the other one was the electrothermal atomic absorption spectrometry (ET AAS), which was used to confirm the results of the HR ICP-MS. The analysis of pure molybdenum is presented as a third example. The problems of spectral matrix interference are discussed and different ways of their handling are pointed out. By this example it can also be demonstrated, how the coating of the inlet cones of the ICP mass spectrometer by matrix elements of solutions - which normally is an adverse effect - can be advantageously used to decrease the measured blank values of some analyte elements drastically. T2 - International Symposium on "Ultrapure Materials: Processing, Characterization and Applications" CY - Hyderabad, India DA - 2004-11-22 PY - 2004 AN - OPUS4-4055 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Dette, Angelika A1 - Guadagnino, E. A1 - Matschat, Ralf A1 - Sundberg, P. T1 - Certification of the mass fractions of total and hexavalent chromium in glass: a joint collaborative work in co-operation with BAM and ICG KW - Glasreferenzmaterial KW - Hexavalentes Chrom KW - Verpackungsverordnung PY - 2004 SN - 0391-4259 IS - 1 SP - 5 EP - 14 PB - Aurora Pubbl. CY - Venezia AN - OPUS4-11868 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rienitz, O. A1 - Jährling, R. A1 - Schiel, D. A1 - Matschat, Ralf A1 - Kipphardt, Heinrich A1 - Gernand, W. A1 - Oeter, D. T1 - Rückführung in der Elementanalytik PY - 2005 SN - 0030-834X VL - 115 IS - 4 SP - 295 EP - 299 PB - Wirtschaftsverl. NW CY - Bremerhaven AN - OPUS4-12056 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Netzwerk "Metrologie in der Chemie" für zuverlässige Messergebnisse in der chemischen Analytik T2 - Analytica Conference CY - Munich, Germany DA - 2006-04-25 PY - 2006 AN - OPUS4-12146 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Application of Glow Discharge Mass Spectrometry to the Multielement Ultra-Trace Determination in Ultrahigh Purity Copper and Iron - a Way of Calibration to Achieve Qualification and Traceability T2 - International Conference on Ultrahigh Purity Base Metals, UHPM 2005 CY - Nagasaki, Japan DA - 2005-11-07 PY - 2005 AN - OPUS4-10953 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Guadagnino, E. A1 - Matschat, Ralf A1 - Dette, Angelika A1 - Sundberg, P. T1 - Certification of the mass fractions of trace elements in glass to be used for multi-element determination by XRF: a joint collaborative work in cooperation between BAM and ICG KW - Glasreferenzmaterial KW - Röntgenfluoreszenzanalyse KW - Multielementspurenbestimmung PY - 2005 SN - 0391-4259 IS - 4 SP - 5 EP - 16 PB - Aurora Pubbl. CY - Venezia AN - OPUS4-11665 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -