TY - JOUR A1 - Reiche, I. A1 - Britzke, Ralf A1 - Bukalis, Gregor A1 - Reinholz, Uwe A1 - Weise, Hans-Peter A1 - Gadebusch, R.D. T1 - An external PIXE study: Mughal painting pigments KW - PIXE KW - Mughal painting KW - Pigments KW - Archaeometry PY - 2005 SN - 0049-8246 VL - 34 SP - 42 EP - 45 PB - Wiley CY - Chichester AN - OPUS4-6846 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Markötter, Henning A1 - Sintschuk, Michael A1 - Britzke, Ralf A1 - Dayani, Shahabeddin A1 - Bruno, Giovanni T1 - Upgraded imaging capabilities at the BAMline (BESSY II) N2 - The BAMline at the BESSY II synchrotron X-ray source has enabled research for more than 20 years in widely spread research fields such as materials science, biology, cultural heritage and medicine. As a nondestructive characterization method, synchrotron X-ray imaging, especially tomography, plays a particularly important role in structural characterization. A recent upgrade of key equipment of the BAMline widens its imaging capabilities: shorter scan acquisition times are now possible, in situ and operando studies can now be routinely performed, and different energy spectra can easily be set up. In fact, the upgraded double-multilayer monochromator brings full flexibility by yielding different energy spectra to optimize flux and energy resolution as desired. The upgraded detector (based on an sCMOS camera) also allows exploiting the higher flux with reduced readout times. Furthermore, an installed slip ring allows the sample stage to continuously rotate. The latter feature enables tomographic observation of processes occurring in the time scale of a few seconds. KW - Synchrotron radiation KW - Computed tomography KW - Double-multilayer monochromators KW - Pink beams KW - X-ray optics PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-556907 DO - https://doi.org/10.1107/S1600577522007342 SN - 1600-5775 VL - 29 IS - Pt 5 SP - 1292 EP - 1298 PB - International Union of Crystallography CY - Chester AN - OPUS4-55690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - de Oliveira Guilherme Buzanich, Ana A1 - Radtke, Martin A1 - Yusenko, Kirill A1 - Stawski, Tomasz A1 - Kulow, Anicó A1 - Cakir, Cafer Tufan A1 - Röder, Bettina A1 - Naese, Christoph A1 - Britzke, Ralf A1 - Sintschuk, Michael A1 - Emmerling, Franziska T1 - BAMline - A real-life sample materials research beamline N2 - With increasing demand and environmental concerns, researchers are exploring new materials that can perform as well or better than traditional materials while reducing environmental impact. The BAMline, a real-life sample materials research beamline, provides unique insights into materials’ electronic and chemical structure at different time and length scales. The beamline specializes in x-ray absorption spectroscopy, x-ray fluorescence spectroscopy, and tomography experiments. This enables real-time optimization of material properties and performance for various applications, such as energy transfer, energy storage, catalysis, and corrosion resistance. This paper gives an overview of the analytical methods and sample environments of the BAMline, which cover non-destructive testing experiments in materials science, chemistry, biology, medicine, and cultural heritage. We also present our own synthesis methods, processes, and equipment developed specifically for the BAMline, and we give examples of synthesized materials and their potential applications. Finally, this article discusses the future perspectives of the BAMline and its potential for further advances in sustainable materials research. KW - Extended X-ray absorption fine structure KW - Energy storage KW - Environmental impacts KW - Nondestructive testing techniques KW - X-ray fluorescence spectroscopy KW - Corrosion KW - Near edge X-ray absorption fine structure spectroscopy KW - X-ray absorption spectroscopy PY - 2023 DO - https://doi.org/10.1063/5.0157194 VL - 158 IS - 24 SP - 1 EP - 22 PB - AIP Publishing AN - OPUS4-57824 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -