TY - JOUR A1 - Unger, Wolfgang A1 - Kalbe, Henryk A1 - Rades, Steffi T1 - Determining shell thicknesses in stabilised CdSe@ZnS core-shell nanoparticles by quantitative XPS analysis using an infinitesimal columns model N2 - A novel Infinitesimal Columns (IC) simulation model is introduced in this study for the quantitativeanalysis of core-shell nanoparticles (CSNP) by means of XPS, which combines the advantages of exist-ing approaches. The IC model is applied to stabilised Lumidot™CdSe/ZnS 610 CSNP for an extensiveinvestigation of their internal structure, i.e. calculation of the two shell thicknesses (ZnS and stabiliser)and exploration of deviations from the idealised CSNP composition. The observed discrepancies betweendifferent model calculations can be attributed to the presence of excess stabiliser as well as synthesisresidues, demonstrating the necessity of sophisticated purification methods. An excellent agreement isfound in the comparison of the IC model with established models from the existing literature, the Shardmodel and the software SESSA. KW - XPS KW - Quantum dot KW - Core shell nano particle PY - 2016 DO - https://doi.org/10.1016/j.elspec.2016.08.002 SN - 0368-2048 VL - 212 SP - 34 EP - 43 PB - Elsevier B.V. AN - OPUS4-38273 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Oswald, F. A1 - Narbey, S. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Analytical approach for characterization of morphology and chemistry of a CH3NH3PbI3/TiO2 solar cell layered system N2 - Manufacturing of new perovskite layered solar cells with constant high light conversion Efficiency over time may be hampered by the loss of efficiency caused by structural and/or chemical alterations of the complex layered system. SEM/EDX combined with XPS were chosen as an appropriate methodical approach to characterize perovskite laboratory cells in depth and at surface, before and after light exposure. The layered perovskite system investigated here is based on glass covered with fluorine doped tin oxide, followed by thin films of TiO2, ZrO2, and a thick monolithic carbon. TiO2 film is subdivided into a dense layer covered by porous one constituted of nanoparticles of truncated bipyramidal shape. This layered system serves as the matrix for the perovskite. EDX spectral maps on cross sections of specimen have shown that Pb and I are distributed homogeneously throughout the porous layers C, ZrO2, and TiO2. SEM/EDX data show that 20 weeks of ambient daylight did not change significantly the in‐depth distribution of the elemental composition of Pb and I throughout the entire solar cell system. It was confirmed with EDX that nanoparticles identified in high‐resolution SEM micrographs contain mainly Pb and I, indicating these to be the perovskite crystals. However, a compositional and chemical altering began in the near‐surface region of the outermost ~10 nm after 2 months of illumination which was observed with XPS. T2 - ECASIA 2017 CY - Montpellier, France DA - 24.09.2017 KW - Solar Cell KW - SEM KW - EDX KW - XPS KW - layered system PY - 2018 DO - https://doi.org/10.1002/sia.6410 SN - 0142-2421 SN - 1096-9918 VL - 50 IS - 11 SP - 1234 EP - 1238 PB - John Wiley & Sons, Ltd. AN - OPUS4-46394 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Senoner, Mathias A1 - Maaßdorf, A. A1 - Rooch, Heidemarie A1 - Österle, Werner A1 - Malcher, M. A1 - Schmidt, M. A1 - Kollmer, F. A1 - Paul, D. A1 - Hodoroaba, Vasile-Dan A1 - Rades, Steffi A1 - Unger, Wolfgang T1 - Lateral resolution of nanoscaled images delivered by surface-analytical instruments: application of the BAM-L200 certified reference material and related ISO standards N2 - The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1–xAs and InxGa1–xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface-analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013. KW - AES KW - BAM-L200 KW - CRM KW - EDX KW - Imaging KW - Lateral resolution KW - Sharpness KW - Standardisation KW - STXM KW - ToF-SIMS KW - XPEEM KW - XPS KW - Certified reference material KW - Imaging surface analysis PY - 2015 DO - https://doi.org/10.1007/s00216-014-8135-7 SN - 1618-2642 SN - 1618-2650 VL - 407 IS - 11 SP - 3211 EP - 3217 PB - Springer CY - Berlin AN - OPUS4-33033 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rades, Steffi A1 - Oswald, F. A1 - Narbey, S. A1 - Radnik, Jörg A1 - Hodoroaba, Vasile-Dan T1 - Complementary methodical approach for the analysis of a perovskite solar cell layered system N2 - Loss in efficiency of perovskite solar cells may be caused by structural and/or chemical alterations of the complex layered system. SEM/EDX combined with XPS were chosen as appropriate methodical approach to characterise perovskite laboratory cells in depth and complementary on top, before and after light exposure. The layered perovskite system investigated here is based on glass covered with fluorine doped tin oxide (FTO), followed by three porous thin films of TiO2, ZrO2 and a thick monolithic carbon. This layered system serves as the matrix for the perovskite. After infiltration of perovskite solution and annealing, EDX spectral maps on cross-sections of the specimen have been measured. The distribution of relevant elements – Si, Sn, Ti, Zr and C – correlates conclusively with layers visible in the acquired SEM images. Lead and iodine are distributed throughout the porous layers C, ZrO2 and TiO2. By EDX it was found that several weeks of ambient daylight did not change significantly the qualitative elemental composition of lead and iodine throughout the solar cell system. It was confirmed with EDX that nanoparticles identified in high-resolution SEM micrographs contain mainly Pb and I, indicating these to be the perovskite crystals. However, a time-dependent compositional and chemical altering was observed with XPS for the near-surface region of the outermost ~10 nm after two months of illumination. KW - Pervskite solar cells KW - TiO2 KW - Porous layer KW - SEM/EDX KW - XPS PY - 2017 UR - https://www.cambridge.org/core/services/aop-cambridge-core/content/view/0E9E937542BC8B5535900B53B7F667E9/S1431927617010558a.pdf/complementary_methodical_approach_for_the_analysis_of_a_perovskite_solar_cell_layered_system.pdf DO - https://doi.org/10.1017/S1431927617010558 VL - 23 IS - S1 (July) SP - 1978 EP - 1979 PB - Cambridge University Press CY - New York, NY, U.S.A. AN - OPUS4-41925 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -