TY - GEN A1 - Schumacher, Gerhard A1 - Chen, Weiye A1 - Frohberg, G. A1 - Wahi, R. P. ED - Chandra, T. T1 - Evolution of microstructure and its effect on creep behavior of single crystal superalloy SC16 under creep fatigue loading T2 - International Conference on Processing & Manufacturing of Advanced Materials - Processing, Fabrication, Properties, Applications ; THERMEC 2000 CY - Las Vegas, NV, USA DA - 2000-12-04 KW - Superalloy KW - Single crystal KW - SC16 KW - Creep fatigue KW - Rafting KW - Creep behavior PY - 2000 SN - 0-08-044026-6 PB - Elsevier Science AN - OPUS4-949 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -