TY - JOUR A1 - Lay, Vera A1 - Buske, S. A1 - Townend, J. A1 - Kellett, R. A1 - Savage, M. A1 - Schmitt, D. R. A1 - Constantinou, A. A1 - Eccles, J. D. A1 - Gorman, A. A1 - Bertram, M. A1 - Hall, K. A1 - Lawton, D. A1 - Kofman, R. T1 - 3D Active Source Seismic Imaging of the Alpine Fault Zone and the Whataroa Glacial Valley in New Zealand N2 - The Alpine Fault zone in New Zealand marks a major transpressional plate boundary that is late in its typical earthquake cycle. Understanding the subsurface structures is crucial to understand the tectonic processes taking place. A unique seismic survey including 2D lines, a 3D array, and borehole recordings, has been performed in the Whataroa Valley and provides new insights into the Alpine Fault zone down to ∼2 km depth at the location of the Deep Fault Drilling Project (DFDP)-2 drill site. Seismic images are obtained by focusing prestack depth migration approaches. Despite the challenging conditions for seismic imaging within a sediment filled glacial valley and steeply dipping valley flanks, several structures related to the valley itself as well as the tectonic fault system are imaged. A set of several reflectors dipping 40°–56° to the southeast are identified in a ∼600 m wide zone that is interpreted to be the minimum extent of the damage zone. Different approaches image one distinct reflector dipping at ∼40°, which is interpreted to be the main Alpine Fault reflector located only ∼100 m beneath the maximum drilled depth of the DFDP-2B borehole. At shallower depths (z < 0.5 km), additional reflectors are identified as fault segments with generally steeper dips up to 56°. Additionally, a glacially over-deepened trough with nearly horizontally layered sediments and a major fault (z < 0.5 km) are identified 0.5–1 km south of the DFDP-2B borehole. Thus, a complex structural environment is seismically imaged and shows the complexity of the Alpine Fault at Whataroa. KW - Imaging KW - Signal processing KW - Seismic KW - Borehole KW - DAS PY - 2021 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-539163 DO - https://doi.org/10.1029/2021JB023013 VL - 126 IS - 12 SP - 1 EP - 21 PB - American Geophysical Union AN - OPUS4-53916 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 DO - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bertram, R. A1 - Reck, Günter A1 - Uecker, R. T1 - Growth and correlation between composition and structure of (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 crystals near the morphotropic phase boundary N2 - The correlation between composition and structure of unpoled relaxor ferroelectric (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 (PZN-PT) solid solutions around the morphotropic phase boundary was studied by Rietveld refinement of X-ray powder diffraction patterns of crystals with x=0.06–0.13 grown by a solution technique. It was found that PZN-PT exists with the rhombohedral structure only below x=0.06. The rhombohedral R3 m phase coexists with the tetragonal P4 mm phase between x=0.08 and 0.11 and above x=0.11 PZN-PT is purely tetragonal. In addition a metastable monoclinic phase (Pm) forms during cooling after crystal growth in the composition range x=0.06–0.11. The volume fraction of this monoclinic phase is a maximum in the most interesting composition range, i.e. x=0.08–0.09. The amount of monoclinic phase is enhanced further by mechanical treatment as the pulverization of the crystals for X-ray powder diffraction analysis which induces a tetragonal-to-monoclinic phase transition. KW - A1. Crystal structure KW - A1. Solid solutions KW - A1. X-ray diffraction KW - A2. Growth from high temperature solutions KW - B1. Perovskites KW - B2. Piezoelectric materials PY - 2003 DO - https://doi.org/10.1016/S0022-0248(03)00972-2 SN - 0022-0248 SN - 1873-5002 VL - 253 SP - 212 EP - 220 PB - North-Holland Publ. Co. CY - Amsterdam AN - OPUS4-2538 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bertram, R. A1 - Reck, Günter A1 - Alex, V. A1 - Uecker, R. T1 - Growth and domain structure of PZN-PT crystals T2 - 2nd French-German Crystal Growth Meeting (FGCGM - 2003) CY - Nancy, France DA - 2003-03-10 PY - 2003 AN - OPUS4-2129 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Bertram, R. A1 - Stephanowitz, H. A1 - Heinrich, Hans-Joachim A1 - Rost, H.-J. A1 - Lüdke, C. A1 - Hassler, J. ED - Möller, H. J. ED - Roewer, G. T1 - Spurenelementverteilung in Siliciumcarbid-Einkristallen - Vergleich analytischer Feststoffmethoden T2 - Freiberger Siliziumtage 2005 ; Freiberger Forschungsforum ; 56. Berg- und Hüttenmännischer Tag CY - Freiberg, Deutschland DA - 2005-06-15 KW - Einkristall KW - Siliciumcarbid KW - Halbleitereigenschaft KW - Leistungselektronik KW - Feststoffbestimmung KW - Chemische Analyse KW - Nachweisgrenze KW - Kristalldefekt KW - Spurenelement KW - Feststoffanalytik KW - ETV ICP OES KW - SS ET AAS KW - LA-ICP-MS KW - Elektrothermische Verdampfung KW - Laserablation PY - 2006 SN - 978-3-86012-295-2 SN - 0071-9420 N1 - Serientitel: Freiberger Forschungshefte / B – Series title: Freiberger Forschungshefte / B IS - 337 SP - 122 EP - 138 PB - Techn. Univ. Bergakad. CY - Freiberg AN - OPUS4-15834 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -