TY - GEN A1 - Maierhofer, Christiane A1 - Röllig, Mathias A1 - Krankenhagen, Rainer A1 - Myrach, Philipp T1 - Comparison of quantitative defect characterization using pulse-phase and lock-in thermography: Erratum N2 - Based on the results of a study on systematic errors in thermographic lock-in measurements [14th Quantitative Infrared Thermography Conference (2018)], the results and conclusions of the earlier publication [Appl. Opt. 55, D76 (2016)] were reconsidered. It turned out that the reported uncertainties for phase values from lock-in measurements were set too low according to the current state of knowledge. One of the conclusions drawn at the time can no longer be upheld, as the experimental values are too imprecise. PY - 2024 DO - https://doi.org/10.1364/AO.545147 SN - 1559-128X SN - 0003-6935 SN - 1539-4522 VL - 63 IS - 31 SP - 8295 EP - 8296 PB - Optical Society of America (OSA) CY - Washington, DC AN - OPUS4-62549 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -