TY - JOUR A1 - Feng, Wen A1 - Schulz, Johannes A1 - Wolf, Daniel A1 - Pylypenko, Sergii A1 - Gemming, Thomas A1 - Weinel, Kristina A1 - Agudo Jácome, Leonardo A1 - Büchner, Bernd A1 - Lubk, Axel T1 - Secondary electron emission from gold microparticles in a transmission electron microscope: comparison of Monte Carlo simulations with experimental results N2 - We measure the electron beam-induced current to analyze the electron-induced secondary electron (SE) emission from micron-sized gold particles illuminated by 80 and 300 keV electrons in a transmission electron microscope. A direct comparison of the experimental and simulated SE emission (SEE) employing Monte Carlo scattering simulations based on the GEANT4 toolkit yields overall good agreement with a noticeable discrepancy arising from the shortcoming of the GEANT4 scattering cross sections in the low-loss regime. Thus, the electron beam-induced current analysis allows to quantify the inelastic scattering including SEE in the transmission electron microscope and provides further insight into the charging mechanisms. KW - Electron beam-induced current KW - Transmission electron microscopy KW - Secondary electron emission KW - Secondary electron yield KW - Gold micronoparticle PY - 2025 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-622557 DO - https://doi.org/10.1088/1361-6463/ad9840 VL - 58 IS - 8 SP - 1 EP - 7 PB - IOP Publishing CY - Bristol, GB AN - OPUS4-62255 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -