TY - JOUR A1 - Kayser, Y. A1 - Gross, A. A1 - Hönicke, P. A1 - Osan, J. A1 - Pollakowski-Herrmann, B. A1 - Seeger, Stefan A1 - Beckhoff, B. T1 - Reliable chemical analysis of aerosols by reference-free X-ray spectrometry for monitoring airborne particulate matter JF - Spectroscopy N2 - The physical and chemical analysis of aerosols using reliable and physically traceable methods is important for the thorough investigation of airborne particles to support a better understanding of their origin as well as their health and climate impacts. Within the European Metrology Research AeroMet project,the aim of hysikalisch–Technische Bundesanstalt’s (PTB) X-ray spectrometry group is to develop and establish traceable and reliable X-ray methods to measure the elemental mass deposition per unit area, the elemental composition,and the chemical binding state of particulate matter supported by a flat substrate. This approach can substantially contribute to support quantitative analytical methods during on-site measurement campaigns where portable Instrumentation is employed by qualifying suitable calibration samples for commercial analytical X-ray instruments and by investigating samples collected during the field campaign. KW - AEROMET project KW - X-Ray analysis KW - TXRF KW - Aerosols KW - Particles KW - Air pollution KW - Elemental composition PY - 2020 UR - https://www.spectroscopyonline.com/view/reliable-chemical-analysis-of-aerosols-by-reference-free-x-ray-spectrometry-for-monitoring-airborne-particulate-matter SN - 0887-6703 VL - 35 IS - 10 SP - 42 EP - 46 PB - MJH Life Sciences CY - Cranbury, NJ AN - OPUS4-53357 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Pollakowski, B. A1 - Holzlechner, Gerald A1 - Lippitz, Andreas A1 - Beckhoff, B. A1 - Unger, Wolfgang T1 - Qualifying PDMS deposited on silicon wafer surfaces as calibration standard for organic matter by X-ray spectrometry and XPS N2 - Polydimethylsiloxane (PDMS)is one of the most appearing contamination of medical devices.Dedicated analysis of PDMS on surfaces necessary, but the lack of calibration samples provides a bottle neck. There is a demand for metrological tools ensuring traceable and reliable analysis of mass deposition and of the chemical species of contaminants. Photoelectron spectroscopy (PES) and reference-free GIXRF can be used to qualify bench top instrumentation. Comparison of PES data and GIXRF data enable the establishment of a traceability chain. T2 - EXRS 2016, European Conference on X - ray Spectrometry CY - Gothenburg, Sweden DA - 19.06.2016 KW - Silicone analysis KW - XPS KW - GIXRF PY - 2016 AN - OPUS4-37295 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -