TY - RPRT A1 - Almagro, J.-F. A1 - Busch, P. A1 - Gohil, D. D. A1 - Saunders, S. R. J. A1 - Sloof, W. G. A1 - Thiot, J.-F. A1 - Schneider, H. A1 - Whitwood, M. A1 - Wirth, Thomas T1 - Electron-Probe MICROanalysis of LighT Elements - Measurement Methods and Certified Reference Materials (MICROLITE) PY - 2000 IS - 266 SP - 1 EP - 35 PB - National Physical Laboratory CY - Teddington, Middlesex AN - OPUS4-6843 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kuhmann, J. A1 - Harde, P. A1 - Pech, O. A1 - Pittroff, W. A1 - Preuß, A. A1 - Adolphi, B. A1 - Wirth, Thomas A1 - Österle, Werner ED - Reichl, H. T1 - Fluxless flip-chip bonding for the photonic assembly - comparison between evaporated SnPb (60/40) and AuSn (80/20) solder T2 - 5th International Conference on Micro-Electro-, -Opto-, -Mechanical Systems and Components CY - Potsdam, Germany DA - 1996-09-17 PY - 1996 SN - 3-8007-2200-3 VL - 5 SP - 91 EP - 97 PB - VDE-Verl. CY - Berlin AN - OPUS4-2544 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Abou-Ras, D. A1 - Caballero, R. A1 - Fischer, C.-H. A1 - Kaufmann, C.A. A1 - Lauermann, I. A1 - Mainz, R. A1 - Mönig, H. A1 - Schöpke, A. A1 - Stephan, C. A1 - Streeck, C. A1 - Schorr, S. A1 - Eicke, A. A1 - Döbeli, M. A1 - Gade, B. A1 - Hinrichs, J. A1 - Nunney, T. A1 - Dijkstra, H. A1 - Hoffmann, V. A1 - Klemm, D. A1 - Efimova, V. A1 - Bergmaier, A. A1 - Dollinger, G. A1 - Wirth, Thomas A1 - Unger, Wolfgang A1 - Rockett, A.A. A1 - Perez-Rodriguez, A. A1 - Alvarez-Garcia, J. A1 - Izquierdo-Roca, V. A1 - Schmid, T. A1 - Choi, P.-P. A1 - Müller, M. A1 - Bertram, F. A1 - Christen, J. A1 - Khatri, H. A1 - Collins, R.W. A1 - Marsillac, S. A1 - Kötschau, I. T1 - Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films N2 - The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits. KW - Elemental distributions KW - Comparison KW - Depth profiling KW - Chemical mapping KW - Thin films KW - Solar cells KW - Chalcopyrite-type KW - Cu(In,Ga)Se2 PY - 2011 DO - https://doi.org/10.1017/S1431927611000523 SN - 1431-9276 SN - 1435-8115 VL - 17 IS - 5 SP - 728 EP - 751 PB - Cambridge University Press CY - New York, NY AN - OPUS4-24506 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hieronymus, Hartmut A1 - Kasch, Thomas A1 - Fomin, P. A1 - Trotsyuk, A. ED - Doerffer, P. T1 - Modeling of film and surface detonations T2 - 5th International Symposium on Experimental and Computational Aerothermodynamics of Internal Flows ; 5th ISAIF CY - Gdansk, Poland DA - 2001-09-04 PY - 2001 SN - 83-88237-35-7 VL - 2 SP - 935 EP - 943 PB - IFFM Publ. CY - Gda´ nsk AN - OPUS4-1157 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Stadthaus, Meinhard A1 - Thomas, Hans-Martin A1 - Migoun, N. A1 - Porkhorenko, P. A1 - Gnusin, A. ED - Thompson, D. T1 - On the Reliability of the Quantitative Evaluation of Penetrant Systems Quality N2 - The market of the penetrant systems is increasing every year. A sensitivity of the penetrant systems is one of the main criteria for a customer. Therefore the importance of reliable result of the determination of penetrant systems sensitivity is increasing as well. It was established in our experiments that repeating the procedure of type testing in accordance with ISO EN 3452-2, in many cases one can obtain rather variable results for the sensitivity level. The goal of our investigations was to establish the principal factors, influencing upon the result of penetrant system type testing. Our results show that the values of the duration of such penetrant inspection technological stages as penetrant and developer applications may be considerably lower than the values recommended by ISO EN 3452-2 for the type testing. At the same time the character of the procedure's realisation of excess penetrant removal and developer application strongly influences upon the type testing results. Some recommendations for obtaining more reliable results of the determination of penetrant system sensitivity are worked out and proposed. ©2002 American Institute of Physics. T2 - 28th Annual Review of Progress in Quantitative Nondestructive Evaluation CY - Brunswick, ME, USA DA - 2001-07-29 PY - 2001 SN - 0-7354-0061-X DO - https://doi.org/10.1063/1.1473037 SN - 0743-0760 SN - 0094-243X N1 - Serientitel: AIP conference proceedings – Series title: AIP conference proceedings IS - 615 SP - 1991 EP - 1996 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-1531 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller-Rochholz, J. A1 - Bronstein, Z. A1 - Schröder, Hartmut A1 - Rybak, Thomas A1 - Zeynalov, Eldar A1 - v. Maubeuge, K. P. ED - Delmas, P. T1 - Long-term behaviour of geosynthetic drains - excavations on landfills after up to 12 years service T2 - 7th International Conference on Geosynthetics (ICG) CY - Nice, France DA - 2002-09-22 PY - 2002 SN - 90-5809-525-8 VL - 2 SP - 565 EP - 568 PB - Balkema CY - Lisse AN - OPUS4-1902 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schmid, Thomas A1 - Dariz, P. T1 - Editorial for the special issue "Modern Raman spectroscopy of minerals" N2 - Raman spectroscopy provides vibrational fingerprints of chemical compounds enabling their unambiguous identification. The assignment of Raman spectra to minerals is straightforward, if appropriate reference data is accessible. Modern couplings of Raman spectroscopy with microscopy (Raman microspectroscopy) merge the high structural specificity with down to sub-micrometre spatial resolution. This analytical tool has high potential not only in the identification of minerals from natural sources but also for studying the complex microstructure and mineral distribution of both ancient and modern man-made materials. In addition to the chemical identity of minerals, Raman spectra are affected by crystal orientations (varying relative Raman band intensities); (sub)stoichiometric compositional changes (e.g., in solid solution series), traces of foreign ions, strain (the latter three shifting Raman bands); and crystallinity (changing Raman band widths), enabling a comprehensive physico-chemical characterisation of minerals. Thus, Raman spectroscopy – including its in situ measurement capabilities – provides possibilities to study mineral paragenesis in both, natural and man-made samples at the micrometre scale. While in 1928 the first experimental evidence for inelastic light scattering was provided by C. V. Raman and K. S. Krishnan by using sunlight for excitation, filters for selecting the inelastically scattered light, and their eyes for detection (later, photographic plates for acquisition of spectra were employed), modern Raman spectrometers make use of laser excitation, dispersive spectrographs and charge coupled device (CCD) detection. This Special Issue includes technological developments and applications in the field of modern Raman spectroscopy of minerals in a broad sense, from natural mineral deposits and archaeological objects to inorganic phases in man-made materials. The studied minerals include fossil resins, typical rock-forming minerals (calcite, quartz, forsterite), iron-sulphur species (e.g., mackinawite), a range of sulphates (gypsum, bassanite, anhydrite III, anhydrite II, celestine, barite, ternesite), as well as silicate minerals like garnets (e.g., almandine). KW - Raman spectroscopy KW - Raman microspectroscopy KW - Mineral identification KW - Physico-chemical characterisation of minerals KW - Mineral paragenesis PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-515041 DO - https://doi.org/10.3390/min10100860 VL - 10 SP - 860 PB - MDPI CY - Basel AN - OPUS4-51504 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schmid, Thomas A1 - Jungnickel, Robert A1 - Dariz, P. T1 - Insights into the CaSO4–H2O System: A Raman-Spectroscopic Study N2 - Even though being the subject of natural scientific research for many decades, the system CaSO4–H2O, consisting of the five crystalline phases gypsum, bassanite, and the anhydrites III, II, and I, has left many open questions for research. Raman spectroscopy was used because of its structural sensitivity and in situ measurement capability to obtain further insight by studying phase transitions in both ex situ and in situ experiments. The findings include significant contributions to the completeness and understanding of Raman spectroscopic data of the system. The dehydration path gypsum–bassanite–anhydrite III was shown to have strong parallels to a physical drying process, which depends on many parameters beyond the burning temperature. Raman band width determination was demonstrated to enable the quantitative discrimination of α-bassanite and β-bassanite as well as the postulated three sub-forms of anhydrite II (AII), which are all based on differences in crystallinity. In the latter case, the observed continuous structural variations over increasing burning temperatures were elucidated as a combination of decreasing surface areas and healing of crystal lattice defects. We propose an only two-fold sub-division of AII into reactive “disordered AII” and much less reactive “crystalline AII” with a transition temperature of 650°C ± 50 K. KW - Gypsum KW - Bassanite KW - Hemihydrate KW - Anhydrite KW - Raman spectroscopy PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-506701 DO - https://doi.org/10.3390/min10020115 SN - 2075-163X VL - 10 IS - 2 SP - 115, 35 PB - MDPI CY - Basel AN - OPUS4-50670 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Demidov, Alexandr A1 - Eschlböck-Fuchs, S. A1 - Kazakov, Alexander Ya. A1 - Gornushkin, Igor B. A1 - Kolmhofer, P. J. A1 - Pedarnig, J. D. A1 - Huber, N. A1 - Heitz, J. A1 - Schmid, Thomas A1 - Rössler, R. A1 - Panne, Ulrich T1 - Monte Carlo standardless approach for laser induced breakdown spectroscopy based on massive parallel graphic processing unit computing N2 - The improved Monte-Carlo (MC) method for standard-less analysis in laser induced breakdown spectroscopy (LIBS) is presented. Concentrations in MC LIBS are found by fitting model-generated synthetic spectra to experimental spectra. The current version of MC LIBS is based on the graphic processing unit (GPU) computation and reduces the analysis time down to several seconds per spectrum/sample. The previous version of MC LIBS which was based on the central processing unit (CPU) computation requested unacceptably long analysis times of 10's minutes per spectrum/sample. The reduction of the computational time is achieved through the massively parallel computing on the GPU which embeds thousands of co-processors. It is shown that the number of iterations on the GPU exceeds that on the CPU by a factor > 1000 for the 5-dimentional parameter space and yet requires > 10-fold shorter computational time. The improved GPU-MC LIBS outperforms the CPU-MS LIBS in terms of accuracy, precision, and analysis time. The performance is tested on LIBS-spectra obtained from pelletized powders of metal oxides consisting of CaO, Fe2O3, MgO, and TiO2 that simulated by-products of steel industry, steel slags. It is demonstrated that GPU-based MC LIBS is capable of rapid multi-element analysis with relative error between 1 and 10's percent that is sufficient for industrial applications (e.g. steel slag analysis). The results of the improved GPU-based MC LIBS are positively compared to that of the CPU-based MC LIBS as well as to the results of the standard calibration-free (CF) LIBS based on the Boltzmann plot method. KW - Monte Carlo simulation KW - Parallel computing KW - Calibration-free laser-induced breakdown spectroscopy KW - Post-breakdown laser induced plasma KW - Quaternary oxides PY - 2016 DO - https://doi.org/10.1016/j.sab.2016.09.016 VL - 125 SP - 97 EP - 102 PB - Elsevier B.V. AN - OPUS4-38489 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Strehlow, P. A1 - Banach, Ulrich A1 - Hübert, Thomas T1 - Keramische Tieftemperatursensoren KW - Tieftemperatursensor KW - Keramik KW - Sensor PY - 1996 VL - 1995 SP - 274 EP - 275 CY - Braunschweig AN - OPUS4-691 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Czerwensky, Michael A1 - Birkholz, M. A1 - Kanschat, P. A1 - Weiss, Thomas A1 - Lips, K. T1 - Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2 KW - Electron-paramagnetic resonance KW - EPR PY - 1999 SN - 1098-0121 SN - 0163-1829 SN - 0556-2805 SN - 1095-3795 SN - 1550-235X VL - 59 IS - 19 SP - 12268 EP - 12271 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-785 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -