TY - JOUR A1 - Ghata, Anupama A1 - Bernges, Tim A1 - Maus, Oliver A1 - Wankmiller, Björn A1 - Naik, Aakash A1 - Bustamante, Joana A1 - Gaultois, Michael W. A1 - Delaire, Olivier A1 - Hansen, Michael Ryan A1 - George, Janine A1 - Zeier, Wolfgang G. T1 - Exploring the Thermal and Ionic Transport of Cu+ Conducting Argyrodite Cu7PSe6 N2 - AbstractUnderstanding the origin of low thermal conductivities in ionic conductors is essential for improving their thermoelectric efficiency, although accompanying high ionic conduction may present challenges for maintaining thermoelectric device integrity. This study investigates the thermal and ionic transport in Cu7PSe6, aiming to elucidate their fundamental origins and correlation with the structural and dynamic properties. Through a comprehensive approach including various characterization techniques and computational analyses, it is demonstrated that the low thermal conductivity in Cu7PSe6 arises from structural complexity, variations in bond strengths, and high lattice anharmonicity, leading to pronounced diffuson transport of heat and fast ionic conduction. It is found that upon increasing the temperature, the ionic conductivity increases significantly in Cu7PSe6, whereas the thermal conductivity remains nearly constant, revealing no direct correlation between ionic and thermal transport. This absence of direct influence suggests innovative design strategies in thermoelectric applications to enhance stability by diminishing ionic conduction, while maintaining low thermal conductivity, thereby linking the domains of solid‐state ionics and thermoelectrics. Thus, this study attempts to clarify the fundamental principles governing thermal and ionic transport in Cu+‐superionic conductors, similar to recent findings in Ag+ argyrodites. KW - Thermoelectrics KW - Phonons KW - Chemically Complex Materials KW - DFT KW - Bonding Analysis PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-608866 DO - https://doi.org/10.1002/aenm.202402039 SP - 1 EP - 9 PB - Wiley AN - OPUS4-60886 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -