TY - JOUR A1 - Schmid, Thomas A1 - Schäfer, N. A1 - Levcenko, S. A1 - Rissom, T. A1 - Abou-Ras, D. T1 - Orientation-distribution mapping of polycrystalline materials by Raman microspectroscopy N2 - Raman microspectroscopy provides the means to obtain local orientations on polycrystalline materials at the submicrometer level. The present work demonstrates how orientation-distribution maps composed of Raman intensity distributions can be acquired on large areas of several hundreds of square micrometers. A polycrystalline CuInSe2 thin film was used as a model system. The orientation distributions are evidenced by corresponding measurements using electron backscatter diffraction (EBSD) on the same identical specimen positions. The quantitative, local orientation information obtained by means of EBSD was used to calculate the theoretical Raman intensities for specific grain orientations, which agree well with the experimental values. The presented approach establishes new horizons for Raman microspectroscopy as a tool for quantitative, microstructural analysis at submicrometer resolution. PY - 2015 DO - https://doi.org/10.1038/srep18410 SN - 2045-2322 VL - 5 SP - Article 18410, 1 EP - 7 PB - Nature Publishing Group CY - London AN - OPUS4-35224 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schäfer, N. A1 - Wilkinson, A. J. A1 - Schmid, Thomas A1 - Winkelmann, Aimo A1 - Chahine, G. A. A1 - Schülli, T. U. A1 - Rissom, T. A1 - Marquardt, J. A1 - Schorr, S. A1 - Abou-Ras, D. T1 - Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy N2 - The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure–property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of the device. These defects are closely related to strain distributions. The present work compares electron and X-ray diffraction as well as Raman microspectroscopy, which provide access to microstrain distributions within individual grains. CuInSe₂ thin films or solar cells are used as a modelsystem. High-resolution electron backscatter diffraction and X-ray microdiffraction as well as Ramanmicrospectroscopy were applied for this comparison. Consistently, microstrain values were determined of the order of 10⁻⁴ by these three techniques. However,only electron backscatter diffraction, X-ray microdiffraction exhibit sensitivities appropriate for mapping local strain changes at the submicrometer level within individual grains in polycrystalline materials. KW - Microstrain KW - Thin film KW - X-ray microdiffraction KW - EBSD KW - Raman microspectroscopy PY - 2016 DO - https://doi.org/10.1016/j.ultramic.2016.07.001 SN - 0304-3991 SN - 1879-2723 VL - 169 SP - 89 EP - 97 PB - Elsevier B.V. AN - OPUS4-37453 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schmid, Thomas A1 - Schäfer, N. A1 - Abou-Ras, D. T1 - Raman microspectroscopy provides access to compositional and microstructural details of polycrystalline materials N2 - This overview article provides insight into how to apply Raman spectroscopy in combination with a confocal, optical microscope setup on polycrystalline material systems, in order to obtain quantitative information on phase distribution, grain sizes, crystal orientations and microstrain. Although the present work uses Cu(In,Ga)(S,Se)₂ absorber layers in corresponding thin-film solar cells as a model system to demonstrate the capabilities of Raman microspectroscopy, the approaches discussed may be applied to any organic or inorganic, polycrystalline materials system. KW - Raman microscopy KW - Microstructure KW - Microspectroscopic imaging KW - Polycrystalline materials PY - 2016 SN - 0966-0941 VL - 28 IS - 5 SP - 16 EP - 20 PB - Wiley AN - OPUS4-37929 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Manke, I. A1 - Kardjilov, N. A1 - Schäfer, R. A1 - Hilger, A. A1 - Strobl, M. A1 - Dawson, M. A1 - Grünzweig, C. A1 - Behr, G. A1 - Hentschel, Manfred P. A1 - David, C. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Banhart, J. T1 - Three-dimensional imaging of magnetic domains N2 - Magnetic domains have been the subject of much scientific investigation since their theoretical existence was first postulated by P.-E. Weiss over a century ago. Up to now, the three-dimensional (3D) domain structure of bulk magnets has never been observed owing to the lack of appropriate experimental methods. Domain analysis in bulk matter thus remains one of the most challenging tasks in research on magnetic materials. All current domain observation methods are limited to studying surface domains or thin magnetic films. As the properties of magnetic materials are strongly affected by their domain structure, the development of a technique capable of investigating the shape, size and distribution of individual domains in three dimensions is of great importance. Here, we show that the novel technique of Talbot-Lau neutron tomography with inverted geometry enables direct imaging of the 3D network of magnetic domains within the bulk of FeSi crystals. KW - Computed tomography KW - Reconstruction algorithm KW - Talbot-Lau neutron tomography KW - Magnetic domains PY - 2010 DO - https://doi.org/10.1038/ncomms1125 SN - 2041-1723 SP - 1 EP - 6 PB - Nature Publishing Group CY - London, UK AN - OPUS4-22609 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schäfer, N. A1 - Chahine, G. A. A1 - Wilkinson, A. J. A1 - Schmid, Thomas A1 - Rissom, T. A1 - Schülli, T. U. A1 - Abou-Ras, D. T1 - Microstrain distributions in polycrystalline thin films measured by X-ray microdiffraction N2 - Microstrain distributions were acquired in functional thin films by high-resolution X-ray microdiffraction measurements, using polycrystalline CuInSe2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar-cell stack. The microstrain values within individual CuInSe2 grains were determined to be of the order of 10^-4. These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe2 layer by electron backscatter diffraction and Raman microspectroscopy. KW - Microstrain distribution KW - X-ray microdiffraction KW - Polycrystalline thin films KW - Raman microscopy PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-366592 DO - https://doi.org/10.1107/S1600576716003204 SN - 1600-5767 VL - 49 SP - 632 EP - 635 AN - OPUS4-36659 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Manke, I. A1 - Kardjilov, N. A1 - Schäfer, R. A1 - Hilger, A. A1 - Grothausmann, R. A1 - Strobl, M. A1 - Dawson, M. A1 - Grünzweig, C. A1 - Tötzke, C. A1 - David, C. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Banhart, J. T1 - Three-dimensional imaging of magnetic domains with neutron grating interferometry N2 - This paper gives a brief overview on3D imaging of magnetic domains with shearing grating neutron tomography. We investigated the three-dimensional distribution of magnetic domain walls in the bulk of a wedge-shaped FeSi single crystal. The width of the magnetic domains wasanalyzed at different locations within the crystal. Magnetic domains close to the tip of the wedge are much smaller than in the bulk. Furthermore, the three-dimensional shape of individual domains wasinvestigated. We discuss prospects and limitations of the applied measurement technique. KW - Neutron imaging KW - Tomography KW - Magnetic domains KW - Grating interferometry KW - Darkfield imaging KW - Shearing gratings KW - Talbot-Lau KW - Three-dimensional data quantification KW - Tomographic reconstruction PY - 2015 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-341919 DO - https://doi.org/10.1016/j.phpro.2015.07.057 SN - 1875-3892 VL - 69 SP - 404 EP - 412 PB - Elsevier B.V. CY - Amsterdam AN - OPUS4-34191 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -