TY - JOUR A1 - Puthiyaveettil, N. A1 - Thomas, K. R. A1 - Myrach, Philipp A1 - Ziegler, Mathias A1 - Rajagopal, P. A1 - Balasubramaniamam, K. T1 - Defect detection in steel bars up to 600 °C using laser line thermography N2 - Crack detection in steel bars at high surface temperatures is a critical problem in any manufacturing industry. Surface breaking cracks are the major problems during the billet casting. Many NDT techniques are proven its capability in crack detection at room temperature. Here, we are demonstrating the possibility of exposure of cracks using laser line thermography at higher surface temperatures (up to 600 °C). A continuous-wave (CW) laser is used to excite the sample kept at higher surface temperatures. The temperature distribution over the sample due to the laser line scanning is captured using a temperature calibrated infrared (IR) thermal camera. The response of the sample temperature in crack detection is investigated using a validated FE model. The impact of the oxide layer in crack detection is investigated by using two types of samples; one without any oxide layer and the second is with the oxide layer. The influence of laser power in the detection of defects at high temperatures is studied. 3D numerical models were developed for the cases; when the sample is with oxide layer and without any oxide layer for a better understanding of physics. The surface temperature rise due to laser heating is higher for the scaled sample compared to the no-scale sample. The presence of the oxide layer above the parent metal will reduce the reflectivity of the surface. Lower reflectivity will lead to increased absorption of incident energy so that the surface temperature rise will be higher than the surface with no scale. Thermal contrast linearly depends on laser power, which means higher laser power will increase the defect detectability even at a higher surface temperature. KW - Laser thermography KW - High temperature KW - Modeling KW - Surface cracks KW - Non-destructive testing PY - 2020 U6 - https://doi.org/10.1016/j.infrared.2020.103565 SN - 1350-4495 VL - 111 SP - 103565 PB - Elsevier B.V. AN - OPUS4-51573 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -