TY - JOUR A1 - Meyer, S. A1 - Richter, S. A1 - Balski, Matthias A1 - Hagendorf, C. T1 - Trace element analysis in crystalline silicon PY - 2011 SN - 1757-1197 VL - 14th Edition IS - 4th Quarter, November SP - 34 EP - 39 PB - Semiconductor Media CY - London AN - OPUS4-25284 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -