TY - CONF A1 - Kipphardt, Heinrich A1 - Matschat, Ralf T1 - Development of SI-traceable standards of high metrological quality for chemical analysis of the elements T2 - Towards an integrated infrastructure for measurements CY - Warszawa, Poland DA - 2002-06-18 PY - 2002 SP - 66 EP - 67 AN - OPUS4-1631 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf A1 - Kipphardt, Heinrich T1 - BAM System of Primary Pure Elements - Aim and Current State T2 - CCQM Annual Meeting of Inorganic Working Group CY - Ottawa, Canada DA - 2002-10-09 PY - 2002 AN - OPUS4-1603 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kipphardt, Heinrich A1 - Dudzus, Thomas A1 - Meier, Klaus A1 - Recknagel, Sebastian A1 - Hedrich, Martina A1 - Matschat, Ralf T1 - The measurement of O and N by classical carrier gas hot extraction (HE) - Carrier gas hot extraction after activation with photons T2 - CENAM CY - Mexico City, Mexico DA - 2002-01-28 PY - 2002 AN - OPUS4-1610 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kipphardt, Heinrich A1 - Matschat, Ralf T1 - Preparation of primary calibration substances - method development for trace analysis T2 - CENAM CY - Mexico City, Mexico DA - 2002-01-28 PY - 2002 AN - OPUS4-1611 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Czerwensky, Michael A1 - Pattberg, S. A1 - Heinrich, Hans-Joachim A1 - Tutschku, S. T1 - High Purity Metals as Primary Calibration Materials for Elemental Analysis - Their Importance and Their Certification N2 - The Bundesanstalt fuer Materialforschung und -pruefung, BAM (Federal Institute for Materials Research and Testing) continues to establish a system of primary reference materials to meet the demands of metrological traceability. The materials act as national standards in the field of elemental analysis. For all elements of the periodic table -excepting those that are gases or radioactive- two different kinds of reference materials are being certified. The substances are of very high purity and of defined stoichiometry. Pure elements and metals are used as far as possible. They are certified by determining the trace contents of most elements of the periodic table at very low levels using different trace element analysis methods. Recent application of these methods is described and examples of the certification of some pure metals (copper, iron and lead) are given. (author abst.) T2 - 8th International Conference on Ultra-High Purity Base Metals (UHPM-2001) CY - Berlin, Germany DA - 2001-06-25 KW - Trace elemental analysis KW - Atomic spectrometry KW - High purity metals KW - Certification KW - Primary calibration materials KW - Reference materials KW - National standards PY - 2002 UR - https://www.researchgate.net/publication/235927297_High_purity_metals_as_primary_calibration_materials_for_elemental_analysis_-_Their_importance_and_their_certification SN - 1345-9678 SN - 1347-5320 VL - 43 IS - 2 SP - 90 EP - 97 PB - Japan Institute of Metals CY - Sendai AN - OPUS4-1600 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf A1 - Kipphardt, Heinrich A1 - Recknagel, Sebastian A1 - Noack, Siegfried ED - Abiko, K. ED - Takaki, S. T1 - Activities of Division "Inorganic Chemical Analysis; Reference Materials" of BAM in the Field of Analysis of Metals T2 - 9th international conference on ultrahigh-purity base metals CY - Sendai, Japan DA - 2002-10-14 PY - 2002 SP - 297 EP - 302 CY - Sendai AN - OPUS4-1602 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Matschat, Ralf A1 - Dudzus, Thomas A1 - Meier, Klaus A1 - Recknagel, Sebastian A1 - Kipphardt, Heinrich A1 - Hedrich, Martina ED - Hirschfeld, D. T1 - Messung von Sauerstoff und Stickstoff mit klassischer Trägergasheißextraktion und Trägergasheißextraktion nach Aktivierung mit Photonen für die nationalen primären Kalibriernormale T2 - 8. Symposium Nichtmetalle in Metallen - NIM ; 8. Tagung des Gemeinschaftsausschusses "Nichtmetalle in Metallen" der GDMB CY - Münster, Deutschland DA - 2000-03-16 PY - 2000 SN - 3-9806913-1-4 SP - 19 EP - 27 PB - GDMB, Ges. für Bergbau, Metallurgie, Rohstoff- und Umwelttechnik CY - Clausthal-Zellerfeld AN - OPUS4-915 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Gopala, Anil A1 - Kipphardt, Heinrich A1 - Matschat, Ralf A1 - Panne, Ulrich T1 - Process methodology for the small scale production of m6N5 purity zinc using a resistance heated vacuum distillation system N2 - Ultra high purity Zn (m6N5) was obtained through triple vacuum distillation using an m4N5 Zn as input material. High-volatile impurities were removed from the zinc matrix by vacuum evaporation, while traces having lower volatility than the matrix remained in the residual material after finishing of the entire purification process. The time required for the removal of the main high-volatile impurity (Cd) was monitored using a connected gas source mass spectrometer. During distillation the Zn vapor of the distillate was condensed on the cap of a glassy carbon crucible which was water cooled by a movable copper block. The temperatures were optimized for the removal of the volatiles and for the distillation process using vapor pressure data. High resolution glow discharge mass spectrometry was applied for the analysis and purity evaluation of the distilled and input zinc. The analysis confirmed the reduction of the metallic impurities from 43 mg kg-1 to 0.5 mg kg-1 (m6N5) after three consecutive vacuum distillations. An increase in the grain size and a decrease in the micro-hardness were observed for the purified Zn material. KW - Ultra high purity KW - Vacuum distillation KW - High resolution glow discharge mass KW - Spectrometry KW - Micro-hardness KW - Zinc KW - Purification PY - 2010 DO - https://doi.org/10.1016/j.matchemphys.2010.02.080 SN - 0254-0584 VL - 122 IS - 1 SP - 151 EP - 155 PB - Elsevier CY - Amsterdam AN - OPUS4-21127 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Matschat, Ralf A1 - Haßler, J. A1 - Traub, Heike A1 - Dette, Angelika T1 - Multielement trace determination in SiC powders: assessment of interlaboratory comparisons aimed at the validation and standardization of analytical procedures with direct solid sampling based on ETV ICP OES and DC arc OES N2 - The members of the committee NMP 264 Chemical analysis of non-oxidic raw and basic materials of the German Standards Institute (DIN) have organized two interlaboratory comparisons for multielement determination of trace elements in silicon carbide (SiC) powders via direct solid sampling methods. One of the interlaboratory comparisons was based on the application of inductively coupled plasma optical emission spectrometry with electrothermal vaporization (ETV ICP OES), and the other on the application of optical emission spectrometry with direct current arc (DC arc OES). The interlaboratory comparisons were organized and performed in the framework of the development of two standards related to the determination of mass fractions of metallic impurities in powders and grain sizes of ceramic raw and basic materials by both methods. SiC powders were used as typical examples of this category of material. The aim of the interlaboratory comparisons was to determine the repeatability and reproducibility of both analytical methods to be standardized. This was an important contribution to the practical applicability of both draft standards. Eight laboratories participated in the interlaboratory comparison with ETV ICP OES and nine in the interlaboratory comparison with DC arc OES. Ten analytes were investigated by ETV ICP OES and eleven by DC arc OES. Six different SiC powders were used for the calibration. The mass fractions of their relevant trace elements were determined after wet chemical digestion. All participants followed the analytical requirements described in the draft standards. In the calculation process, three of the calibration materials were used successively as analytical samples. This was managed in the following manner: the material that had just been used as the analytical sample was excluded from the calibration, so the five other materials were used to establish the calibration plot. The results from the interlaboratory comparisons were summarized and used to determine the repeatability and the reproducibility (expressed as standard deviations) of both methods. The calculation was carried out according to the related standard. The results are specified and discussed in this paper, as are the optimized analytical conditions determined and used by the authors of this paper. For both methods, the repeatability relative standard deviations were <25%, usually ~10%, and the reproducibility relative standard deviations were <35%, usually ~15%. These results were regarded as satifactory for both methods intended for rapid analysis of materials for which decomposition is difficult and time-consuming. Also described are some results from an interlaboratory comparison used to certify one of the materials that had been previously used for validation in both interlaboratory comparisons. Thirty laboratories (from eight countries) participated in this interlaboratory comparison for certification. As examples, accepted results are shown from laboratories that used ETV ICP OES or DC arc OES and had performed calibrations by using solutions or oxides, respectively. The certified mass fractions of the certified reference materials were also compared with the mass fractions determined in the interlaboratory comparisons performed within the framework of method standardization. Good agreement was found for most of the analytes. KW - Inductively coupled plasma optical emission spectrometry KW - Electrothermal vaporization KW - ETV ICP OES KW - Direct current optical emission spectrometry KW - DC arc OES KW - Direct solid sampling technique KW - Silicon carbide powder KW - Method validation KW - Method standardization KW - Direkte Feststoffanalytik KW - Normung KW - Methodenvalidierung KW - Ringversuche KW - Siliciumcarbid PY - 2005 DO - https://doi.org/10.1007/s00216-005-3415-x SN - 1618-2642 SN - 1618-2650 VL - 383 IS - 7-8 SP - 1060 EP - 1074 PB - Springer CY - Berlin AN - OPUS4-10890 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Matschat, Ralf T1 - Investigation of a transparent glass ceramics concerning the identification as a strange material in glass cullet T2 - Meeting international Commission in Glas (ICG) - Technical Committee 2 (TC-2) CY - Berlin, Germany DA - 2006-04-27 PY - 2006 AN - OPUS4-12383 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -