TY - JOUR A1 - Thiel, Erik A1 - Kreutzbruck, M. A1 - Ziegler, Mathias T1 - Laser-projected photothermal thermography using thermal wave field interference for subsurface defect characterization JF - Applied Physics Letters N2 - The coherent superposition of two anti-phased thermal wave fields creates a zone of destructive interference which is extremely sensitive to the presence of defects without any reference measurements. Combining a high power laser with a spatial light modulator allows modulating phase and amplitude of an illuminated surface that induces spatially and temporally controlled thermal wave fields. The position and depth of defects are reconstructed from analysis of the Amplitude and Phase of the resulting photothermal signal. The proposed concept is experimentally validated and supported by numerical modeling. KW - Thermal waves KW - Active thermography KW - DMD KW - Spatial light modulator KW - Subsurface defects PY - 2016 UR - http://scitation.aip.org/search?value1=laser+projected+photothermal&option1=all&option912=resultCategory&value912=ResearchPublicationContent&operator8=AND&option8=pub_serialIdent&value8=aip%2Fjournal%2Fapl&qs=true DO - https://doi.org/10.1063/1.4963139 SN - 0003-6951 VL - 109 IS - 12 SP - 123504-1 EP - 123504-4 PB - AIP Publishing CY - Melville, New York AN - OPUS4-37590 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Thiel, Erik A1 - Kreutzbruck, M. A1 - Ziegler, Mathias T1 - Laser projected photothermal thermography for characterizing hidden defects T2 - WCNDT 2016 Proceedings N2 - For the last 20 years active thermography has developed into a standard method in non-destructive material testing. It has become possible to detect defects such as cracks, voids, or even material inhomogeneities. Until now, it is still difficult to quantify subsurface or hidden defects in size due to the diffusive nature of heat flow within a solid. Facing this issue, lockin thermography and other photothermal techniques have been established. They are based on exciting a sample periodically (e.g. with a halogen lamp), causing a controlled periodical heat flow and thereby representing strongly damped thermal waves. These techniques make use of interference and reflection of thermal waves which allow enhancing depth resolution. So far, only the temporal component of the light source was modified to achieve a defined vertical heat flow – In contrast, we propose a novel technique in which we are able to control both: time and space. This technique enables us to exploit the possibilities of coherent thermal wave shaping. We achieve that by combining a spatial light modulator (SLM) with a high power laser. This approach allows us to launch a set of individually controlled and fully coherent high energy thermal waves into the sample volume. That means, we intentionally use wave propagation throughout the sample’s material in both - vertical and lateral direction. As one possible application, we use a thermal waves’ interference effect of two phase shifted wave patterns to detect the position of hidden defects. The wave patterns are positioned with a certain distance and a 180° phase shift to each other creating an amplitude depletion zone right in the middle of the two patterns. When a defect is brought unsymmetrically into the depletion zone, the lateral heat flow is disturbed. If the sample is now moved through the depletion zone, a defect can be easily characterized. Exciting periodically while controlling simultaneously phase and amplitude enables us to have a defined thermal wave propagation throughout the sample which means thermal waves can be controlled almost like acoustical or optical waves. This offers the opportunity to transfer known technologies from wave shaping techniques to thermography methods. T2 - 19th World Conference of Non-Destructive Testing 2016 CY - München, Germany DA - 13.06.2016 KW - Thermal waves KW - DMD KW - Active thermography KW - SLM PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-365702 SP - Th.4.I.2 - 1 EP - Th.4.I.2 - 6 AN - OPUS4-36570 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -