TY - RPRT A1 - Munz, Martin T1 - Zur nanomechanischen Charakterisierung der Interphase verstärkter Polymere N2 - In der vorliegenden Arbeit wurden mittels eines Rasterkraftmikroskopes (Scanning Force Microscope, SFM) nanomechanische Experimente zur Charakterisierung des Grenzbereiches (Interphase) zwischen einer polymeren Matrix und anorganischen Verstärkungskomponenten durchgeführt. Ziel der Untersuchungen war es, mit Hilfe einer sinusförmigen Modulation der Auflagekraft zwischen SFM-Spitze und Probe innerhalb der polymerseitigen Interphase vorhandene Steifigkeitsgradienten zu detektieren sowie ihren Verlauf zu charakterisieren. Es konnte gezeigt werden, dass die Steifigkeitsmessung im SFM die Möglichkeit bietet, Grenzphasen über die lokalen Änderungen im Elastizitätsmodul quantitativ zu charakterisieren. T3 - BAM Forschungsberichtreihe - 241 PY - 2003 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-2094 SN - 978-3-89701-524-2 SN - 0938-5533 VL - 241 SP - 1 EP - 80 PB - Wirtschaftsverlag NW CY - Bremerhaven AN - OPUS4-209 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Sturm, Heinz A1 - Schulz, Eckhard A1 - Munz, Martin T1 - Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques - II. Investigations of heterogeneous systems N2 - Applying a high-frequency lateral vibration between tip and sample in a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. Harmonically modulated lateral force microscopy (HM-LFM) offers several advantages compared with standard lateral force microscopy (LFM). After a brief investigation of the scan velocity dependence of LFM and HM-LFM, two samples were investigated. First, the surface of a poly(acrylonitrile-co-styrene)/polybutadiene blend (ABS) was used to demonstrate the ability of the new technique to decrease the stick effects of the SFM tip. Second, an interface between two chemically very similar polymers was prepared by melting polypropylene (PP) and poly(propene-block-ethene) (PP-block-PE) films on each other. After cutting, the surface roughness of this sample was very high. It is shown that only HM-LFM clearly resolves the local micromechanical properties without artefacts. KW - Scale PY - 1999 DO - https://doi.org/10.1002/masy.19991470125 SN - 1022-1360 SN - 0258-0322 SN - 1521-3900 VL - 147 SP - 259 EP - 267 PB - Wiley-VCH Verl. CY - Weinheim, Germany AN - OPUS4-6856 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kaczmarek, D. A1 - Albert, T. J. A1 - Munz, Martin A1 - Sturm, Heinz A1 - Bonse, Jörn T1 - Erratum: “Structure formation on the surface of indium phosphide irradiated by femtosecond laser pulses” [J. Appl. Phys. 97, 013538 (2005)] N2 - This erratum publishes some corrections to the article “Structure formation on the surface of indium phosphide irradiated by femtosecond laser pulses” [J. Appl. Phys. 97, 013538 (2005)]. PY - 2024 DO - https://doi.org/10.1063/5.0222903 SN - 0021-8979 SN - 1089-7550 VL - 136 IS - 4 SP - 1 EP - 2 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-60690 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Scanning force microscopic investigations of the femtosecond pulse laser ablation of indium phosphide in air T2 - Tagung "Microtechnologies for the New Millennium 2003", SPIE conference no.5118 "Nanotechnology" CY - San Agustín (Gran Canaria), Spain DA - 2003-05-19 PY - 2003 AN - OPUS4-2918 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Wegvermittelte Normalkraftmodulation mit lokal angepasster Modulationsamplitude T2 - Digital Instruments User Meeting an der LMU CY - Munich, Germany DA - 1998-03-04 PY - 1998 AN - OPUS4-6450 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - On the nanomechanical characterisation of the interphase of reinforced polymers T2 - Workshop Rastersondenmikroskopie in Forschung und Industrie CY - Berlin, Germany DA - 2001-03-08 PY - 2001 AN - OPUS4-6523 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Harmonically modulated friction measurements in Scanning Force Microscopy (SFM) - A valuable tool for testing surface properties of micro- and nanomechanical systems T2 - Workshop Nanotribology: Critical Assessment and Research Needs - National Istitute of Standards and Technology (NIST) CY - Gaithersburg, MD, USA DA - 2000-03-13 PY - 2000 AN - OPUS4-6511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Reliability of polymer materials - the nanoscopic view on interphases T2 - Kick-off Meeting zu einem gemeinsamen DAAD-Projekt mit der Universidad Pais Vasco (UVP), Dept. of Chemical and Environmental Engineering, Industrial Engineering School (EITI), Materials and Technologies Group CY - San Sebastián, Spain DA - 2002-08-08 PY - 2002 SP - 1(?) EP - 12(?) AN - OPUS4-1832 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Der Kompilanz-Modus als Methode zur Charakterisierung der Interphase faserverstärkter Polymere T2 - 2. Workshop Raster-Sonden-Mikroskopie an Polymeren im Rahmen des Jahreskolloquiums des SFB 239 CY - Ulm, Germany DA - 1996-11-22 PY - 1996 AN - OPUS4-6401 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Arbeitsprogramm des Teilprojektes B5 des Sfb 605 - Begutachtung des Sfb 605 durch die DFG T2 - Sfb 605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6520 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Interphase Characterization via the Stiffness Contrast of a Scanning Force Microscope in Displacement Modulation Mode N2 - The physical properties as well as the thickness of the interphase between polymer and reinforcing phase are generally expected to show a strong influence on the macroscopic mechanical properties of composite materials. In this study the scanning force microscope (SFM) has been applied for detecting stiffness gradients near the interface between copper and epoxide. In displacement modulation mode the load exerted by the tip is modulated sinusoidally by vibrating the normal position of the cantilever or the sample. The corresponding amplitude of dynamic cantilever bending is related to local surface stiffness. Thus, using the SFM, the local mechanical properties of the surface under investigation can be probed. When scanning the tip across the reinforcement/polymer interface, the polymeric interphasial zone can be identified with the observed stiffness gradient. For a commercial epoxide based on diglycidyl ether of bisphenol A (DGEBA) cured with an amine-containing hardener, a stiffness gradient was detected that could be fitted by a Gaussian profile typical for diffusional processes. The width of the stiffness gradient was 280 nm. The observation is discussed in terms of interface-induced segregation processes between resin and hardener, as well as heat conduction mechanisms that can occur during the exothermic curing reaction. Both mechanisms are diffusional in nature and, via the local network structure, are expected to show some influence on the local stiffness of the cured epoxy. Copyright © 2000 John Wiley & Sons, Ltd. T2 - ECASIA 99 CY - Sevilla, Spain DA - 1999-10-04 KW - Scanning Force Microscopy KW - Surface properties KW - Nanomechanics KW - Interface/Interphase KW - Polymer-matrix composites (PMCs) KW - Adherends PY - 2000 DO - https://doi.org/10.1002/1096-9918(200008)30:1<410::AID-SIA846>3.0.CO;2-G SN - 0142-2421 SN - 1096-9918 VL - 30 IS - 1 SP - 410 EP - 414 PB - Wiley CY - Chichester AN - OPUS4-873 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Arbeitsprogramm des Teilprojektes A1 des Sfb 605 - Begutachtung des Sfb605 durch die DFG T2 - Sfb605 "Elementarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6519 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Munz, Martin A1 - Schulz, Eckhard A1 - Sturm, Heinz T1 - Use of scanning force microscopy studies with combined friction, stiffness and thermal diffusivity contrasts for microscopic characterization of automotive brake pads KW - Antimony sulphide KW - Polybutadiene KW - Phenolic resin KW - SFM/AFM KW - Friction KW - Thermal diffusivity PY - 2002 DO - https://doi.org/10.1002/sia.1171 SN - 0142-2421 SN - 1096-9918 VL - 33 IS - 2 SP - 100 EP - 107 PB - Wiley CY - Chichester AN - OPUS4-1293 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Bericht des Teilprojektes A1 des Sfb 605 - Begutachtung des Sfb 605 durch die DFG T2 - Sfb 605 "Elemantarreibereignisse" CY - Berlin, Germany DA - 2001-05-07 PY - 2001 AN - OPUS4-6521 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chung, Jae Un A1 - Munz, Martin A1 - Sturm, Heinz T1 - Stiffness variation in the interphase of amine-cured epoxy adjacent to copper microstructures N2 - In an effort to expand the understanding of the mechanical properties of the polymeric interphase on a metal surface, a composite consisting of epoxy and copper was prepared and analyzed. Scanning force microscopy-based force modulation microscopy (SFM-FMM) was employed along with dynamic mechanical analysis (DMA) and energy dispersive X-ray analysis (EDX). Diglycidyl ether of bisphenol A (DGEBA)-based epoxy resins were applied with amine curing agents. The samples were made taking advantage of electron beam lithography (EBL) in order to produce sharp edges of copper structures and a flat surface suitable for the SFM-FMM analysis, which was able to depict the stiffness within the interphase. It is considered significant information because the mechanical characteristic within the narrow interphase was revealed. Comparing with DMA and EDX, the stiffness information of SFM-FMM demonstrated a matching correlation and agreement in terms of preferential adsorption of the curing agent in the vicinity of the interface. The stiffness profiles of the two epoxy systems turned out to be different, and it shows the material dependence of the interphase characteristics. KW - Polymer-metal KW - Interphase KW - Stiffness KW - SFM/AFM KW - DMA KW - EDX KW - Epoxy KW - Copper PY - 2007 SN - 0142-2421 SN - 1096-9918 VL - 39 IS - 7 SP - 624 EP - 633 PB - Wiley CY - Chichester AN - OPUS4-14973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin A1 - Sturm, Heinz T1 - The Normal Force Modulation as a method for Studying the Interphase of Fibre Reinforced Polymer T2 - 24th Intern. TopoMetrix-Workshop: Aktuelle Entwicklungen in der Nanotechnologie und Rastersondenmikroskopie, Humboldt-Universität CY - Berlin, Germany DA - 1998-03-12 PY - 1998 AN - OPUS4-6457 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - On the use of harmonically modulated lateral force microscopy (HM-LFM) and force modulation microscopy (FMM) for the study of reinforced polymers T2 - 4th International Conference on the Development and Technical Application of Scanning Probe Methods (SXM4) CY - Münster, Germany DA - 2000-09-26 PY - 2000 AN - OPUS4-6507 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Zur nanoskopischen Charakterisierung der Interphase verstärkter Polymere T2 - Berliner Polymerentage 2000 CY - Berlin, Germany DA - 2000-10-09 PY - 2000 AN - OPUS4-6508 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Chung, Jae Un A1 - Eltanany, Gehan A1 - Sturm, Heinz A1 - Schulz, Eckhard ED - Degischer, H.-P. T1 - Interphasial stiffness gradients in polymer materials T2 - Symposium Verbundwerkstoffe und Werkstoffverbunde CY - Wien, Österreich DA - 2003-07-02 PY - 2003 SN - 3-527-30762-1 PB - Wiley-VCH CY - Weinheim AN - OPUS4-2525 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Influence of copper electrode on xring of epoxy-anime systems T2 - STM'03, Abstractband TU-POS-11 CY - Eindhoven, Netherlands DA - 2003-07-21 PY - 2003 AN - OPUS4-4651 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Messung lokaler mechanischer Eigenschaften von Faser-Verbunden mit dem Rasterkraftmikroskop T2 - Diskussionstagung: Raster-Sonden-Mikroskopien und organische Materialien V CY - Münster, Germany DA - 1996-10-07 PY - 1996 AN - OPUS4-6402 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Messung lokaler mechanischer Eigenschaften heterogener Polymerproben T2 - Topo-Metrix Workshop CY - Dresden, Germany DA - 1997-03-13 PY - 1997 AN - OPUS4-6430 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -