TY - CONF A1 - Munz, Martin T1 - Dynamische Rasterkraftmikroskopie T2 - Graduiertenkolleg: Polymerwerkstoffe CY - Berlin, Germany DA - 1997-06-20 PY - 1997 AN - OPUS4-6432 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Reliability of Polymer Materials - the Nanoscopic View on Interphases T2 - Uni San Sebastian CY - San Sebastián, Spain DA - 2002-08-07 PY - 2002 AN - OPUS4-6533 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Detektion und Charakterisierung von Steifigkeitsgradienten im Bereich der Interphase verstärkter Polymere T2 - Berliner Polymerentage 2000 CY - Berlin, Germany DA - 2000-10-10 PY - 2000 AN - OPUS4-6509 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz ED - Bhushan, B. T1 - Nanomechanical Characterization of Structural and Pressure-Sensitive Adhesives KW - Scanning Force Microscopy KW - Modulated Lateral Force Microscopy KW - Stiffness KW - Friction KW - Interface/Interphase Interdiffusion PY - 2007 SN - 3-540-37320-9 DO - https://doi.org/10.1007/978-3-540-37321-6_8 VL - 7 SP - 301 EP - 347 PB - Springer CY - Berlin AN - OPUS4-14974 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Munz, Martin A1 - Sturm, Heinz A1 - Schulz, Eckhard T1 - Reliability of polymer based composites - interfaces and interphases from the nanomechanical point of view T2 - 15th International Congress on Electron Microscopy (ICEM) CY - Durban, South Africa DA - 2002-09-01 PY - 2002 SN - 0-620-29294-6 SP - 619 EP - 620 PB - Microscopy Society of Southern Africa CY - Onderstepoort AN - OPUS4-1833 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - The epoxy-interphase at copper microelectrodes as investigated by scanning force microscopy T2 - 7th European Adhesion Conference "EURADH2004", veranstaltet von der DECHEMA CY - Freiburg, Germany DA - 2004-09-06 PY - 2004 AN - OPUS4-4159 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Bonse, Jörn A1 - Munz, Martin A1 - Sturm, Heinz T1 - Scanning force microscopic investigations of the femtosecond laser pulse irradiation of indium phosphide in air N2 - Laser ablation of single-crystalline indium phosphide (InP) was performed in air by means of linearly polarized Ti : sapphire femtosecond pulses (800 nm, 130 fs, 10 Hz). As a result of the irradiation with a variable number of laser pulses per spot (N /spl les/ 5), several morphological changes (crater formation, rim formation, ripple structures, and cones) were observed. These effects were explored using force modulation microscopy (FMM), a technique based on scanning force microscopy, allowing the simultaneous imaging of both topography and local stiffness at a high lateral resolution. The first laser pulse induces the formation of a protruding rim (height < 20 nm, width /spl ap/ 300 nm) bordering the ablated crater. A Fourier analysis of the multipulse generated topographies reveals the formation of wavelength-sized periodic ripples (modulation depth < 100 nm) with an orientation perpendicular to that of the electric field vector of the laser radiation. Besides these morphological alterations, material modifications were also observed in the irradiated regions by means of the FMM technique. Within the ablated craters, local stiffness variations were found revealing an inhomogeneous material composition/structure as a consequence of the femtosecond pulse laser treatment. KW - Laser materials-processing applications KW - Laser radiation effects KW - Microscopy KW - Semiconductor materials KW - Ultrafast optics PY - 2004 DO - https://doi.org/10.1109/TNANO.2004.828574 SN - 1536-125X SN - 1941-0085 VL - 3 IS - 3 SP - 358 EP - 367 PB - Institute of Electrical and Electronics Engineers CY - New York, NY AN - OPUS4-4067 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - Harmonically modulated lateral force microscopy (HM-LFM) as a tool for the analysis of heterogeneous polymer systems T2 - Berliner Polymerentage 2000 CY - Berlin, Germany DA - 2000-10-09 PY - 2000 AN - OPUS4-6510 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Munz, Martin T1 - The normal force modulation as a method for studying the interphase of fibre reinforced polymers T2 - STM '97 CY - Hamburg, Germany DA - 1997-07-20 PY - 1997 AN - OPUS4-6434 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -