TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Jaenisch, Gerd-Rüdiger A1 - Kardjilov, N. A1 - Tötzke, C. A1 - Markötter, H. A1 - Hilger, A. A1 - Manke, I. T1 - X-ray compton line scan tomography N2 - The potentials of incoherent X-ray scattering (Compton) computed tomography (CT) are investigated. The imaging of materials of very different atomic number or density at once is generally a perpetual challenge for X-ray tomography or radiography. In a basic laboratory set-up for simultaneous perpendicular Compton scattering and direct beam attenuation tomography are conducted by single channel photon counting line scans. This results in asymmetric distortions of the projection profiles of the scattering CT data set. In a first approach, corrections of Compton scattering data by taking advantage of rotational symmetry yield tomograms without major geometric artefacts. A cylindrical sample composed of PE, PA, PVC, glass and wood demonstrates similar Compton contrast for all the substances, while the conventional absorption tomogram only reveals the two high order materials. Comparison to neutron tomography reveals astonishing similarities except for the glass component (without hydrogen). Therefore, Compton CT offers the potential to replace neutron tomography, which requires much more efforts. KW - X-ray compton scattering KW - Computed tomography KW - Neutron tomography PY - 2015 DO - https://doi.org/10.3139/120.110799 SN - 0025-5300 VL - 57 IS - 11-12 SP - 985 EP - 991 PB - Hanser CY - München AN - OPUS4-34963 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Jaenisch, Gerd-Rüdiger A1 - Kardjilov, N. A1 - Tötzke, C. A1 - Markötter, H. A1 - Hilger, A. A1 - Manke, I. T1 - X-ray compton tomography N2 - The potentials of incoherent X-ray Scattering (Compton) tomography are investigated. Imaging materials of very different density or atomic number at once is a perpetual challenge for X-ray tomography or radiography, in general. In a basic laboratory set-up for simultaneous perpendicular Compton Scattering and direct beam attenuation tomographic scans are conducted by single channel photon counting. This results in asymmetric distortions of the projection profiles of the scattering CT-data set. ln a first approach corrections of Compton scattering data by taking advantage of rotational symmetry yield tomograms without major geometric artefacts. A cylindrical sample composed of PE, PA, PVC, glass and wood demonstrates similar Compton contrast for all the substances, while the conventional absorption tomogram only reveals the two high order materials. Compärison to neutron tomography reveals astonishing similarities except for the glass component (without hydrogen). Therefore, Compton CT bears the potential to replace neutron tomography, which requires much more efforts. T2 - ECNDT 2014 - 11th European Conference on Non-Destructive Testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray compton scattering KW - Computed tomography KW - Neutron tomography PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 9 PB - Brno University of Technology CY - Brno AN - OPUS4-31972 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - X-ray dark field imaging N2 - A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented. Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they yield enhanced contrast based on deflected X-rays. Here, we introduce a REI modification, which works with a slightly bent single crystal reflecting in Bragg geometry. The samples are placed upstream of the thin crystal within a parallel synchrotron beam. The crystal’s curvature creates a dark-field stripe in the transmission image, similar to the inverse of a Darwin-Prins rocking curve of plane crystals. The reflection condition is met better or worse as a steady function of incidence position. Refracted beam portions of sample interfaces appear bright on black stripes. The entire image is finally synthesized by multiple dark-field stripes. The technique is an alternative to the mentioned techniques. We demonstrate the technique’s advantage by examples of biological and technical microstructures. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Refraction enhanced imaging (REI) KW - Phase contrast KW - Radiology KW - Soft matter radiography PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 7 AN - OPUS4-31971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - X-ray diffraction and refraction topography of light weight materials T2 - Annual conference of the British Institute on Non-Destructive Testing ; NDT 2002 CY - Southport, England, UK DA - 2002-09-17 PY - 2002 SN - 0-903132-30-3 SP - 275 EP - 280 PB - British Institute of Non-Destructive Testing CY - Northampton AN - OPUS4-1938 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - X-Ray Diffraction and Refraction Topography of Light Weight Materials T2 - 11th International Symposium on Nondestructive Characterization of Materials CY - Berlin, Germany DA - 2002-06-24 PY - 2003 SN - 3-540-40154-7 SP - 157 EP - 166 PB - Springer CY - Berlin AN - OPUS4-2639 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. T1 - X-ray diffraction and refraction topography of light weight materials T2 - 41st Annual Conference of The British Institute of Non-Destructive Testing - NDT 2002 CY - Southport, England DA - 2002-09-17 PY - 2002 AN - OPUS4-3092 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram T1 - X-Ray Diffraction Scanning Microscopy - A new method of nondestructive Characterization of inhomogeneous materials T2 - ESA Symposium on Space Applications of Advanced Structural Materials (ESTEC) CY - Noordwijk, Netherlands DA - 1990-03-21 PY - 1990 IS - MBB-Z--0301-90-PUB SP - 447 EP - 450 PB - Zentrale Berichtsstelle, Technisch-wissenschaftliche Information, Messerschmitt-Bölkow-Blohm GmbH CY - München AN - OPUS4-3269 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver ED - Geer, R. T1 - X-Ray Diffraction Topography images materials by molecular probe T2 - Testing, Reliability, and Application of Micro- and Nano-Material Systems II CY - San Diego, CA, USA DA - 2005-03-08 KW - X-ray diffraction KW - X-ray topography KW - X-ray microscopy KW - Texture KW - Polymers KW - Composites KW - Ceramics KW - Compounds KW - Molecular probe KW - Non-metallics PY - 2005 SN - 0-8194-5747-7 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 5766 SP - 9 EP - 14 PB - SPIE CY - Bellingham AN - OPUS4-11700 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. T1 - X-Ray Diffraction Topography images materials by molecular probe T2 - 10th SPIE Intern. Symp. "Nondestructive Evaluation for Health Monitoring and Diagnostics" CY - San Diego, CA, USA DA - 2005-03-08 PY - 2005 AN - OPUS4-11753 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - van Hemelrijck, D. T1 - X-ray refraction - new methods for non-destructive evaluation of advanced materials T2 - 2nd International Conference on Emerging Technologies in NDT CY - Athens, Greece DA - 1999-05-24 KW - X-ray refraction PY - 2000 SN - 90-5809-127-9 SP - 207 EP - 212 PB - Balkema CY - Rotterdam AN - OPUS4-851 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -