TY - CONF A1 - Vila-Comamala, J. A1 - Diaz, A. A1 - Guizar-Sicairos, M. A1 - Gorelick, S. A1 - Guzenko, V.A. A1 - Karvinen, P. A1 - Kewish, C.M. A1 - Färm, E. A1 - Ritala, M. A1 - Mantion, Alexandre A1 - Bunk, O. A1 - Menzel, A. A1 - David, C. ED - Morawe, C. ED - Khounsary, A.M. ED - Goto, S. T1 - Characterization of a 20-nm hard X-ray focus by ptychographic coherent diffractive imaging N2 - Recent advances in the fabrication of diffractive X-ray optics have boosted hard X-ray microscopy into spatial resolutions of 30 nm and below. Here, we demonstrate the fabrication of zone-doubled Fresnel zone plates for multi-keV photon energies (4-12 keV) with outermost zone widths down to 20 nm. However, the characterization of such elements is not straightforward using conventional methods such as knife edge scans on well-characterized test objects. To overcome this limitation, we have used ptychographic coherent diffractive imaging to characterize a 20 nm-wide X-ray focus produced by a zone-doubled Fresnel zone plate at a photon energy of 6.2 keV. An ordinary scanning transmission X-ray microscope was modified to acquire the ptychographic data from a strongly scattering test object. The ptychographic algorithms allowed for the reconstruction of the image of the test object as well as for the reconstruction of the focused hard X-ray beam waist, with high spatial resolution and dynamic range. This method yields a full description of the focusing performance of the Fresnel zone plate and we demonstrate the usefulness ptychographic coherent diffractive imaging for metrology and alignment of nanofocusing diffractive X-ray lenses. T2 - SPIE Optics and photonics CY - San Diego, USA DA - 20.08.2011 KW - X-ray imaging KW - Diffractive X-ray optics KW - Electron beam lithography KW - Ptychographic coherent diffractive imaging PY - 2011 DO - https://doi.org/10.1117/12.893235 SN - 0277-786X N1 - Serientitel: Proceedings of SPIE – Series title: Proceedings of SPIE VL - 8139 SP - 81390E-1 EP - 81390E-7 AN - OPUS4-24613 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Vila-Comamala, J. A1 - Diaz, A. A1 - Guizar-Sicairos, M. A1 - Mantion, Alexandre A1 - Kewish, C.M. A1 - Menzel, A. A1 - Bunk, O. A1 - David, C. T1 - Characterization of high-resolution diffractive X-ray optics by ptychographic coherent diffractive imaging N2 - We have employed ptychographic coherent diffractive imaging to completely characterize the focal spot wavefield and wavefront aberrations of a high-resolution diffractive X-ray lens. The ptychographic data from a strongly scattering object was acquired using the radiation cone emanating from a coherently illuminated Fresnel zone plate at a photon energy of 6.2 keV. Reconstructed images of the object were retrieved with a spatial resolution of 8 nm by combining the difference-map phase retrieval algorithm with a non-linear optimization refinement. By numerically propagating the reconstructed illumination function, we have obtained the X-ray wavefield profile of the 23 nm round focus of the Fresnel zone plate (outermost zone width, Δr = 20 nm) as well as the X-ray wavefront at the exit pupil of the lens. The measurements of the wavefront aberrations were repeatable to within a root mean square error of 0.006 waves, and we demonstrate that they can be related to manufacturing aspects of the diffractive optical element and to errors on the incident X-ray wavefront introduced by the upstream beamline optics. KW - Fourier zone plate KW - Coherent diffraction imaging KW - Ptychography PY - 2011 DO - https://doi.org/10.1364/OE.19.021333 SN - 1094-4087 VL - 19 IS - 22 SP - 21333 EP - 21344 PB - Optical Society of America CY - Washington, DC AN - OPUS4-24615 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Stößer, R. A1 - Feist, M. A1 - Patzwaldt, K. A1 - Menzel, Michael A1 - Emmerling, Franziska ED - Brooks, H. T1 - Redox reactions of K3[Fe(CN)6] during mechanochemically stimulated phase transitions of AlOOH N2 - Thermally induced redox reactions of K3[Fe(CN)6] (1) were investigated for a broad temperature range by thermal methods and structure analytical methods (ESR and Mößbauer spectroscopy, X-ray Powder diffraction and XANES). Based on the influence of the mechanically activated and transforming matrices 2 and 3, redox processes can be tuned to form doped Al2O3 systems which contain either isolated Fe3+ centres or redox active phases and precursors like (Al1-xFex)2O3 (4), (Al3-xFex)O4 (5), Fe3O4, Fe2O3 and Fe0. The phase Fe3C and the chemically reactive C-species were detected during the reaction of 1. The final composition of the doped products of α-Al2O3 is mainly influenced by the chemical nature of the Fe doping component, the applied temperature and time regime, and the composition of the gas phase (N2, N2/O2 or N2/H2). From the solid state chemistry point of view it is interesting that the transforming matrix (2 and 3) possesses both oxidative and protective properties and that the incorporation of the Fe species can be performed systematically. KW - A. Inorganic compounds KW - C. Mössbauer spectroscopy KW - C. Thermogravimetric analysis KW - D. Electron paramagnetic resonance KW - ESR-Spektroskopie KW - Kaliumhexacyanoferrat(III) KW - Mechanische Aktivierung KW - Mößbauer-Spektroskopie KW - Redoxreaktionen KW - TA-MS-Messungen PY - 2011 DO - https://doi.org/10.1016/j.jpcs.2011.03.016 SN - 0022-3697 VL - 72 IS - 6 SP - 794 EP - 799 PB - Pergamon Press CY - New York, NY AN - OPUS4-23685 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -