TY - JOUR A1 - Li, L. A1 - Han, M. A1 - Nolze, Gert T1 - The determination of lattice parameters using single EBSD patterns N2 - A typical electron backscatter diffraction (EBSD) pattern usually contains more than a hundred of Kikuchi poles that formed by intersecting dozens of visible Kikuchi bands. The poles correspond to zone axes in real space or lattice planes in reciprocal space. The band widths are inversely proportional to the interplanar spacings of diffracting lattice planes, and the angle formed by the beam source and two band center-lines approximately corresponds to angle between two lattice planes. However, EBSD patterns always suffer from gnomic distortions. In addition, the band width measurement has a relative error of 5-20% due to the complex profile. Thus, an EBSD pattern always provides abundant crystallographic information but disappointingly low accuracy. T2 - Microscopy & MicroAnalysis 2016 CY - Columbus, Ohio, USA DA - 24.07.2016 KW - Electron backscatter diffraction KW - Lattice parameter determination PY - 2016 UR - https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927616004025 SN - 1431-9276 SN - 1435-8115 VL - 22 SP - Suppl. 3, 634 EP - 635 AN - OPUS4-37742 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -