TY - GEN A1 - Blazek, M. A1 - Deilmann, M. A1 - Gasch, A. A1 - Gerlach, M. A1 - Grümbel, F. A1 - Kaiser, U. A1 - Kloska, M. A1 - Löbbecke, S. A1 - Maiwald, Michael A1 - Pötter, T. A1 - Rebner, K. A1 - Roos, E. A1 - Stieler, S. A1 - Stolz, D. A1 - Theuer, M. A1 - Berthold, J. A1 - Engelhard, H. T1 - Technologie-Roadmap "Prozesssensoren 4.0" N2 - Mit den Technologie-Roadmaps „Prozesssensoren 2005–2015“ [1] (2006) und „Prozesssensoren 2015+“ [2] und [3] (2009) wurden Grundlagen für alle Unternehmen der Prozessindustrie geschaffen, um zielgerichtet auf Kundenbedürfnisse der Prozessindustrie zugeschnittene Produktentwicklungen, technologische Weiterentwicklungen und Forschungsprojekte zum Erfolg zu bringen. Die Roadmap „Prozesssensoren 2015+“ fand große Akzeptanz aufgrund der soliden Betrachtung der Prozesse und der daraus abgeleiteten Thesen. Diese Aussagen haben in vollem Umfang weiterhin Gültigkeit. Im Rückblick auf die damals formulierten Entwicklungsziele wurden viele dieser Ziele im prognostizierten Zeithorizont auf den Weg gebracht und teilweise bereits umgesetzt. In dieser Technologie-Roadmap werden einige Beispiele dazu aufgezeigt. KW - Roadmap KW - Industrie 4.0 KW - Prozess-Sensoren KW - Prozessanalytik KW - Sensoren PY - 2015 UR - http://www.namur.net/fileadmin/media_www/Roadmap_Dateien/Roadmap_Prozesssensoren_4.0.pdf SP - 1 EP - 36 AN - OPUS4-34947 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Baer, D. R. A1 - Cant, D. J. H. A1 - Castner, D. G. A1 - Ceccone, G. A1 - Engelhard, M. H. A1 - Karakoti, A. S. A1 - Müller, Anja ED - Hodoroaba, Vasile-Dan ED - Unger, Wolfgang ED - Shard, A. G. T1 - Preparation of nanoparticles for surface analysis N2 - A variety of methods used to prepare nano-objects for surface analysis are described along with information about when they might be best applied. Intrinsic properties of NPs which complicate their characterization and need to be considered when planning for surface or other analyses of NPs are identified, including challenges associated with reproducible synthesis and functionalization of the particles as well as their dynamic nature. The relevant information about the sample preparation processes, along with analysis details and data that need to be added to the collection of material provenance information is identified. Examples of protocols that have been successfully used for preparation of nano-objects for surface analysis are included in an annex. KW - Sample preparation KW - Nanoparticles KW - Surface chemistry KW - XPS KW - Dynamic behavior KW - Nano-object KW - Surface analysis PY - 2020 SN - 978-0-12-814182-3 DO - https://doi.org/10.1016/B978-0-12-814182-3.00018-3 SP - 295 EP - 347 PB - Elsevier CY - Amsterdam AN - OPUS4-50186 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Chan, George C.-Y. A1 - Hieftje, Gary M. A1 - Omenetto, Nicoló A1 - Axner, Ove A1 - Bengtson, Arne A1 - Bings, Nicolas H. A1 - Blades, Michael W. A1 - Bogaerts, Annemie A1 - Bolshov, Mikhail A. A1 - Broekaert, José A.C. A1 - Chan, WingTat A1 - Costa-Fernández, José M. A1 - Crouch, Stanley R. A1 - De Giacomo, Alessandro A1 - D’Ulivo, Alessandro A1 - Engelhard, Carsten A1 - Falk, Heinz A1 - Farnsworth, Paul B. A1 - Florek, Stefan A1 - Gamez, Gerardo A1 - Gornushkin, Igor B. A1 - Günther, Detlef A1 - Hahn, David W. A1 - Hang, Wei A1 - Hoffmann, Volker A1 - Jakubowski, Norbert A1 - Karanassios, Vassili A1 - Koppenaal, David W. A1 - Kenneth Marcus, R. A1 - Noll, Reinhard A1 - Olesik, John W. A1 - Palleschi, Vincenzo A1 - Panne, Ulrich A1 - Pisonero, Jorge A1 - Ray, Steven J. A1 - Resano, Martín A1 - Russo, Richard E. A1 - Scheeline, Alexander A1 - Smith, Benjamin W. A1 - Sturgeon, Ralph E. A1 - Todolí, José-Luis A1 - Tognoni, Elisabetta A1 - Vanhaecke, Frank A1 - Webb, Michael R. A1 - Winefordner, James D. A1 - Yang, Lu A1 - Yu, Jin A1 - Zhang, Zhanxia T1 - Landmark Publications in Analytical Atomic Spectrometry: Fundamentals and Instrumentation Development N2 - The almost-two-centuries history of spectrochemical analysis has generated a body of literature so vast that it has become nearly intractable for experts, much less for those wishing to enter the field. Authoritative, focused reviews help to address this problem but become so granular that the overall directions of the field are lost. This broader perspective can be provided partially by general overviews but then the thinking, experimental details, theoretical underpinnings and instrumental innovations of the original work must be sacrificed. In the present compilation, this dilemma is overcome by assembling the most impactful publications in the area of analytical atomic spectrometry. Each entry was proposed by at least one current expert in the field and supported by a narrative that justifies its inclusion. The entries were then assembled into a coherent sequence and returned to contributors for a round-robin review. KW - Analytical atomic spectrometry KW - Spectroscopy KW - Instrumental analysis PY - 2024 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-621588 DO - https://doi.org/10.1177/00037028241263567 SN - 1943-3530 VL - 78 SP - 1 EP - 456 PB - Sage CY - London AN - OPUS4-62158 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -