TY - GEN A1 - Kautek, Wolfgang A1 - Oltra, R. A1 - Arenholz, E. A1 - Leiderer, P. A1 - Fotakis, C. A1 - Autric, M. A1 - Afonso, C. A1 - Wazen, P. ED - Phipps, C. T1 - Modelling and diagnostic of pulsed laser-solid interactions - Applications to laser cleaning N2 - The present study concerns the cleaning of matenats using pulsed laser irradiarton and it summarises the most recent results obtalned by the collaborative research of different European groups, within the kamework of a European program for tralnlng and mobillrv of researchers. A series of pulsed lasers, which emit at various wavelengths (liom UV to IR) wit11 short duration of pulse (few nano-, pico- or fernto-seconds), is used for the removal of metallic, ceramic and organic pollutants kom contaminated solid surfaces of different natures. The scientific results obtained so far are focused on the laser cleaning of silicon wafers from sub-micrometer particles, tile theoretical modelling of particles removal mechanism during dry laser cleaning, the removal of oxide layers from oxidised metals and alloys, as well as on the development of laser imaging as a diagnostrc tool for the estimation of the efficiency of the proposed cleaning technique. T2 - Osaka High-Power Laser Ablation Conference ; AHPLA '99 Symposium CY - Osaka, Japan DA - 1999-11-01 KW - Laser cleaning KW - Decontamination KW - Surface treatment KW - Particles removal KW - Oxide removal KW - Modelling KW - Laser imaging PY - 2000 UR - http://www.ub.uni-konstanz.de/kops/volltexte/2007/2863/pdf/259_spie_2000.pdf SN - 0-8194-3483-3 SN - 1605-7422 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 3885 SP - 499 EP - 508 PB - SPIE CY - Bellingham, Wash. AN - OPUS4-971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Kautek, Wolfgang A1 - Daminelli-Widany, Grazia A1 - Meja, P. A1 - Cortona, Anna A1 - Krüger, Jörg A1 - Autric, M. ED - Phipps, C. R. T1 - Femtosecond and nanosecond laser removal of anodic oxide layers from aluminium T2 - 4th SPIE's International Conference on High-Power Laser Ablation CY - Taos, NM, USA DA - 2002-04-22 KW - Laser ablation KW - Laser spallation KW - Microphone KW - Acoustical measurement KW - Aluminium oxide PY - 2002 SN - 0-8194-4524-X SN - 1605-7422 N1 - Serientitel: SPIE proceedings series – Series title: SPIE proceedings series IS - 4760 SP - 239 EP - 246 PB - SPIE CY - Bellingham, Wash. AN - OPUS4-1551 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Krüger, Jörg A1 - Meja, P. A1 - Autric, M. A1 - Kautek, Wolfgang T1 - Femtosecond pulse laser ablation of anodic oxide coatings on aluminium alloys with on-line acoustic observation N2 - The 125-fs laser ablation behaviour (800 nm) of aluminium and anodic oxide coatings on an AlMgSi1 alloy was investigated. The multi-pulse ablation threshold of aluminium at 1.2 J cm-2 was less than that of the oxides of 2–3 J cm-2. Aluminium exhibited a single pulse modification (melting) threshold of 0.3 J cm-2. These values derived from an evaluation of the crater geometry coincided with on-line acoustic measurements. The detected microphone voltage amplitude increased linearly with the laser fluence. The morphology of the ablation craters on aluminium indicated melt formation and displacement of a homogeneous melt phase due to the recoil action of the expanding metal vapour. The laser-processed ceramic oxide phases, on the other hand, showed a spongy resolidified melt layer, which denotes a collocated in-depth formation both of a melt and a gas phase. These phenomena are discussed in terms of the relative dominance of penetration depth of laser light and heat affected zones in the investigated materials with strongly varying optical and thermodynamical properties. KW - Laser ablation KW - Acoustic measurement KW - Microphone KW - Aluminium KW - Aluminium oxide PY - 2002 SN - 0169-4332 SN - 1873-5584 VL - 186 IS - 1-4 SP - 374 EP - 380 PB - North-Holland CY - Amsterdam AN - OPUS4-6324 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -