TY - JOUR A1 - Brzezinka, Klaus-Werner A1 - Gross, Thomas A1 - Unger, Wolfgang A1 - Ramm, M. A1 - Ata, M. T1 - Studies of amorphous carbon using X-ray photoelectron spectroscopy, near-edge X-ray-absorption fine structure and Raman spectroscopy KW - Amorphous materials KW - Carbon KW - Plasma processing and deposition KW - Structural properties PY - 1999 SN - 0040-6090 VL - 354 SP - 106 EP - 110 PB - Elsevier CY - Amsterdam AN - OPUS4-891 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shiraishi, M. A1 - Swaraj, Sufal A1 - Takenobu, T. A1 - Iwasa, Y. A1 - Ata, M. A1 - Unger, Wolfgang T1 - Spetroscopic characterization of single-walled carbon nanotubes carrier-doped by encapsulation of TCNQ N2 - etracyano-p-quinodimethane (TCNQ) molecules encapsulated single-walled carbon nanotubes (SWNTs) were investigated by using core level and valence band x-ray photoemission spectroscopy as well as near-edge x-ray-absorption fine structure spectroscopy. The pi-band and pi*-band structures in these molecular systems were investigated, and it was clearly confirmed that a charge transfer occurred in TCNQ-doped SWNTs. TCNQ molecules were negatively charged as to be expected. A depletion of the pi-band density of states of the SWNTs caused by the charge transfer to the TCNQ molecules was observed. KW - NEXAFS KW - XPS KW - SWNT KW - Modified nanotubes PY - 2005 DO - https://doi.org/10.1103/PhysRevB.71.125419 SN - 1098-0121 SN - 0163-1829 SN - 0556-2805 SN - 1095-3795 SN - 1550-235X VL - 71 SP - 125419-1-125419-7 PB - American Institute of Physics CY - Melville, NY AN - OPUS4-7418 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Unger, Wolfgang A1 - Shiraishi, M. A1 - Swaraj, Sufal A1 - Ata, M. T1 - Spectroscopic (NEXAFS, XPS) Characterization of Single-walled Carbon Nanotubes Carrier Doped by Encapsulation of Organic Molecules (TCNQ) KW - NEXAFS KW - XPS KW - Nanotubes KW - Synchrotronstrahlung PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=101 SN - 0179-4159 SP - 101 EP - 103 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7389 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Ramm, M. A1 - Ata, M. A1 - Gross, Thomas A1 - Unger, Wolfgang T1 - Plasma-Polymerized C60 Films N2 - We studied the polymerization of C60 under different Ar plasma conditions. Films were either deposited in the pressure range between 1.3 and 40 Pa applying input power of 50 W or evaporated C60 films were exposed to Ar plasma of 30 and 50 W. The films were investigated by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS) and carbon K near-edge X-ray-absorption fine structure spectroscopy (NEXAFS). The films were non-uniform and consisted of unpolymerized C60, dimers, linear chains and polymeric planes. In comparison with evaporated C60 the XPS C 1s peak is broader and asymmetric for the C60 polymer and its shake-up satellites diminished. Furthermore, the features of the valence band as well as the features of the p * antibonding orbitals of the C60 polymer are broader and reduced in intensity. PY - 2001 UR - http://www.ipme.ru/e-journals/MPM/no_1401/ramm/ramm.html SN - 1605-2730 SN - 1605-8119 VL - 4 IS - 1 SP - 8 EP - 12 PB - Advanced Study Center CY - St. Petersburg AN - OPUS4-6941 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -