TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Kannengießer, Thomas A1 - Bruno, Giovanni T1 - 3D Crack analysis in hydrogen charged lean duplex stainless steel with synchrotron refraction CT N2 - Hydrogen in metals can cause a degradation of the mechanical properties, the so-called hydrogen embrittlement. In combination with internal stresses, hydrogen assisted cracking (HAC) can occur. This phenomenon is not completely understood yet. To better characterise the cracking behaviour, it is important to gain information about the evolution of the 3D crack network. For this purpose samples of lean duplex stainless steel were loaded with hydrogen by means of electrochemical charging and investigated by means of synchrotron refraction CT and SEM fractography after uniaxial tensile loading. Synchrotron refraction CT is an analyser-based imaging (ABI) technique. It uses a Si (111) single crystal as analyser, which is placed into the beam path between sample and detector. According to Bragg’s law only incident x-rays within a narrow range around the Bragg-angle are diffracted from the analyser into the detector. Hence, the analyser acts as an angular filter for the transmitted beam. This filtering allows to turn the refraction and scattering of x-rays into image contrast. Refraction occurs at all interfaces, where the density of the material changes and is more sensitive to density changes than the attenuation. Therefore, it is possible to detect smaller cracks than with classical x-ray imaging techniques, like CT, with comparable spacial resolution. It also visualises the 3D structure of the cracks and gains quantitative information about their morphology and distribution. Since cracks introduced by HAC are usually very small and have a small opening displacement, synchrotron refraction CT is expected to be well suited for imaging this cracking mechanism and can be a valuable tool to characterise the formation and the evolution of a 3D crack network. T2 - WCNDT 2016 CY - München, Germany DA - 13.06.2016 KW - X-ray refraction KW - Computed tomography KW - Hydrogen assisted cracking KW - Duplex stainless steel PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-366481 SN - 978-3-940283-78-8 VL - BB 158 SP - Tu.4.B.3, 1 EP - 9 AN - OPUS4-36648 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Ewers, Benjamin A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Hoehl, a. A1 - Müller, R. A1 - Ulm, G. T1 - Terahertz spectral computed tomography N2 - The novel technique of spectral THz computed tomography is demonstrated at an example of a small plastic figure. The data are reconstructed by conventional filtered back-projection. The reconstruction are discussed. T2 - IRMMW-THz 2009 - 34th International conference on infrared, millimeter, and terahertz waves CY - Busan, Korea DA - 2009-09-21 KW - THz KW - Computed tomography PY - 2009 SN - 978-1-4244-2120-6 SP - 1 EP - 2(?) AN - OPUS4-20546 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harbich, Karl-Wolfram A1 - Schors, Jörg A1 - Wald, Oliver T1 - New Developments in X-ray-Topography of Advanced Non-Metallic Materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn258/idn258.htm SN - 1435-4934 VL - 5 IS - 11 PB - NDT.net CY - Kirchwald AN - OPUS4-928 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - Charakterisierung von Mikroschäden in polymeren Faserkompositen mittels Röntgen-Refraktions-Topography T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2001 CY - Berlin, Deutschland DA - 2001-05-21 PY - 2001 UR - http://www.ndt.net/article/dgzfp01/papers/p49/p49.htm N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 75-CD PB - DGZfP CY - Berlin AN - OPUS4-1298 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - Non-destructive evaluation of advanced materials by synchrotron radiation refraction topography PY - 2002 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2001.pdf#page=233 SN - 0179-4159 SP - 233 EP - 234 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-1326 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel T1 - SYRTOPO - Materialcharakterisierung an der BAMline N2 - Einleitung Die Bundesanstalt für Materialforschung und -prüfung (BAM) hat im Synchrotronstrahlungslabor BESSY (im Wissenschafts- und Technologiezentrum Berlin-Adlershof) ein Röntgen-Strahlrohr (BAMline) sowie einen Messplatz für die zerstörungsfreie Materialcharakterisierung aufgebaut. Der Messplatz erlaubt die Untersuchung mit monochromatischer Röntgenstrahlung im Energiebereich von 5keV bis 60keV mit hohem Photonenfluß. Seit Anfang 2001 läuft der Probebetrieb zur Optimierung der Strahlungsquelle sowie des experimentellen Aufbaus. Die Besonderheiten der BAMline im Vergleich zu Laboröntgenquellen sind der hohe Photonenfluss bei freier Wahl der Photonenenergie sowie die Polarisationseigenschaften und die außerordentliche Parallelität der Strahlung bei großem Strahlungsquerschnitt. Dies ermöglicht Refraktionstopogramme für Metall-Matrix-Komposite (MMC) in relativ kurzer Zeit, mit einer lateralen Ortsauflösung von 10µm, zu messen. Das neuartige ZfP-Verfahren der Röntgen-Refraktions-Topograhy wurde an anderer Stelle ausführlich beschrieben [1,2]. Es nutzt die Messtechnik der traditionellen Kleinwinkelstreuung auf unkonventionelle Weise, und wurde in den letzten zehn Jahren in unserem Labor entwickelte und an die fortgeschrittenen Anforderungen für die zerstörungsfreie Charakterisierung von neuartigen Werkstoffen wie faserverstärkten Kompositen und Keramiken angepasst. Das Verfahren basiert auf dem Brechungseffekt von Röntgenstrahlen. Auf Grund der kurzen Wellenlänge der Röntgenstrahlen (l » 0.1nm) können innere Oberflächen sowie Grenzflächenkonzentrationen von Nanometer Große detektiert werden, so dass mit Hilfe dieser Technik sehr leicht Partikel, Risse und Porengrößen im Sub-Mikrometer-Bereich gemessen werden können, ohne dabei die Proben zu zerstören, wie es bei mikroskopischen Techniken notwendig ist. Anwendungsfelder dieser Untersuchungsmethode sind z.B. die Erkennung von Faser-Matrix-Enthaftung nach Schlageinwirkung sowie Rissbildung durch Alterung und Herstellung bei faserverstärkten Kompositen. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2002 CY - Weimar, Deutschland DA - 2002-05-06 PY - 2002 UR - http://www.ndt.net/article/dgzfp02/papers/v16/v16.htm SN - 3-931381-39-0 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 80-CD SP - 1(?) EP - 6(?) PB - DGZfP CY - Berlin AN - OPUS4-2793 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg A1 - Harbich, Karl-Wolfram T1 - Röntgen-Refraktions-Computer-Tomographie N2 - Für die Charakterisierung Neuer Werkstoffe, vornehmlich Nichtmetalle, hat sich das Verfahren der Röntgen-Refraktions-Topographie bewährt. Es handelt sich phänomenologisch um eine Technik der Röntgen-Kleinwinkel-Streuung mit Probekörper-Abtastung bei fest vorgewähltem Streuwinkel. Gegenüber der klassischen Beugungstheorie dominieren jedoch bei der Streuung an Strukturen oberhalb von 0.3 µm Größe röntgenoptische Brechungseffekte. Detektierbar sind damit innere Ober- und Grenzflächen, insbesondere Mikrorisse unterhalb der lichtmikroskopischen Erkennbarkeit. Da es sich hierbei um eine Durchstrahlungs-Technik handelt, überlagern jedoch die Strukturen zu einer Projektion, analog zu den radiographischen Verfahren. Um auch Informationen entlang der Durchstrahlungs-Richtung in der Tiefe des Probekörpers zu erhalten, wird unter kleinen Streuwinkeln die Computer-Tomographie durchgeführt, im ersten Ansatz mit nur zwei Meßkanälen, jeweils für die Messung der Absorptions- und der Refraktions-Intensität. Dazu werden nacheinander 360 Linear-Scans nach Drehung von jeweils 1° aufgenommen. Die Intensitätswerte werden nach den Regeln der fouriergefilterten Rückprojektion zu Computer-Tomogrammen verarbeitet. Die Ergebnisse visualisieren die Anordnung von Grenzflächen und innere Oberflächen, die sich für zahlreiche nichtmetallische Werkstoffe, vor alllem im Transportmittel-Leichtbau als relevante Mikrostrukturen für das Versagens-Verhalten und die Werkstoff-Optimierung eignen. Zum Vergleich entstehen aus den simultanen Absorptionsmessungen gleichzeitig die klassischen Computer-Tomogramme, die ausschließlich Dichteänderungen anzeigen. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 1999 CY - Celle, Deutschland DA - 1999-05-10 KW - Röntgentomographie KW - Röntgen-Refraktions-Computer-Tomographie PY - 1999 UR - http://www.ndt.net/abstract/dgzfp99/data/40.htm SN - 3-931381-27-7 VL - 1 IS - 68 SP - 361 EP - 369 PB - DGZfP CY - Berlin AN - OPUS4-715 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of fibre reinforced metals by X-ray refraction CT PY - 2003 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2002.pdf#page=336 SN - 0179-4159 SP - 336 EP - 337 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-2493 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-ray refraction topography for non-destructive evaluation of advanced materials T2 - 15th World Conference on Non-Destructive Testing (WCNDT) CY - Roma, Italy DA - 2000-10-15 KW - X-ray refraction PY - 2000 UR - http://www.ndt.net/article/wcndt00/papers/idn257/idn257.htm SN - 1435-4934 VL - 5 IS - 11 SP - 1 EP - 7(?) PB - NDT.net CY - Kirchwald AN - OPUS4-871 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg A1 - Müller, Bernd R. T1 - Röntgen-Topographie mit Klein- und Weitwinkel-Streuung N2 - Röntgen-Topographische Verfahren sind dadurch gekennzeichnet, daß die Streueigenschaften eines Probekörpers ortskorreliert erfaßt werden. Somit vereinigen sie die Vorzüge der bildgebenden Eigenschaft der Radiographie mit der Strukturselektivität der Röntgenanalyse. Sowohl die Röntgen-Weitwinkel-Streuung als auch die Röntgen-Kleinwinkel-Streuung (-Beugung und -Refraktion) werden topographisch für die Materialcharakterisierung eingesetzt. Die Topographie-Verfahren und Untersuchungsbeispiele an nichtmetallischen Werkstoffen werden dargestellt. T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2002 CY - Weimar, Deutschland DA - 2002-05-06 KW - Röntgen-Streuung KW - Materialcharakterisierung KW - Komposite KW - Keramik PY - 2002 UR - http://www.ndt.net/article/dgzfp02/papers/v15/v15.htm SN - 3-931381-39-0 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 80-CD PB - DGZfP CY - Berlin AN - OPUS4-2027 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - First refraction enhanced 3D computed tomography T2 - International Symposium on Computed Tomography and Image Processing for Industrial Radiology CY - Berlin, Germany DA - 2003-06-23 PY - 2003 SN - 3-931381-48-X N1 - Serientitel: DGZfP-Proceedings BB – Series title: DGZfP-Proceedings BB IS - 84-CD PB - DGZfP CY - Berlin AN - OPUS4-2519 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Cohen, L. J. T1 - Non-Destructive Characterization of High Performance Composites by use of X-Ray Refraction Topography T2 - 48th International SAMPE symposium and exhibition CY - Long Beach, CA, USA DA - 2003-05-11 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Advanced Composite PY - 2003 SN - 0-938994-94-8 VL - 1 SP - 1203 EP - 1211 PB - SAMPE International Business Office CY - Covina, Calif. AN - OPUS4-2542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Schors, Jörg A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Röntgen-Topographie mit Klein- und Weitwinkel-Streuung und Röntgenrefraktions-Computertomographie KW - Röntgen-Streuung KW - Materialcharakterisierung KW - Komposite KW - Keramik KW - Risse KW - Computertomographie PY - 2003 SN - 0948-5112 IS - 86 SP - 11 Seiten PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung CY - Berlin AN - OPUS4-2652 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Sub-micrometer computed tomography at BAMline PY - 2004 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2003.pdf#page=321 SN - 0179-4159 SP - 321 EP - 323 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-3509 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Lange, Axel A1 - Schors, Jörg T1 - X-Ray Refraction Topography for Non-Destructive Evaluation of Advanced Materials KW - X-Ray Refraction KW - Fibre Debonding KW - Topography KW - Crack Density KW - Pore Size KW - SAXS PY - 2001 SP - 1 EP - 7 PB - Society of Manufacturing Engineers CY - Dearborn, Mich. AN - OPUS4-1097 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - 3D Refraction Computed Tomography Applied to Metal Matrix Composites N2 - For the first time Metal Matrix Composites (MMC) have been investigated by 3D Computed Tomography combined with enhanced interface contrast due to X-ray refraction. X-ray refraction is a relatively new approach for the characterization of advanced materials. The related techniques of Refraction Topography and Refraction Computed Tomography have been developed and applied at our laboratory during the last decade to meet the actual demand for improved nondestructive characterization of high performance composites, ceramics and other low density materials and components. X-ray refraction occurs, when X-rays crosses interfaces of spherical or cylindrical shape (e.g. pores or fibres) in the same way as visible light is refracted by lenses. These X-ray optical effects can be observed at small scattering angles of few minutes of arc as the refractive index n of X-rays is nearly unity (n = 1 – 10-6). Due to the short X-ray wavelength of about 0.1 nm the technique determines the amount of inner surfaces and interfaces of nanometer dimensions. The technique is expected to solve many problems in understanding the meaning of micro and sub micro structures in materials science. With the results of the CT investigation, some questions could be clarified for a better understanding of fatigue failure mechanisms under cyclic loading conditions. The specimens for the test programme have been provided by MTU Aero Engines. They consist of a titanium matrix (Ti6242) reinforced by SiC fibres (SCS6). The investigations have been performed at the materials research station of BAM (BAMline) at the Synchrotron Facility BESSY in Berlin, Germany. T2 - 35th International SAMPE technical conference CY - Dayton, OH, USA DA - 2003-09-28 KW - Non-Destructive Inspection (NDI) KW - Characterization KW - Titanium Metal Matrix Composites (Ti-MMC) KW - Ti6242 KW - SCS6 PY - 2003 SN - 0-938994-95-6 PB - SAMPE CY - Covina, Calif. AN - OPUS4-2780 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. ED - Green, R. E. ED - Djordjevic, B. B. ED - Hentschel, M. P. T1 - Synchrotron Radiation Refraction Topography PY - 2003 SN - 3-540-40154-7 SP - 167 EP - 176 PB - Springer CY - Berlin AN - OPUS4-2765 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Micro Crack Characterization of Metal Matrix Composites by 3D-Refraction-Computed-Tomography T2 - 16th World Conference on Nondestructive Testing CY - Montreal, Canada DA - 2004-08-30 KW - NDE KW - X-ray refraction KW - Composites KW - MMC PY - 2004 SP - 9 pages PB - International Committee for Non-Destructive Testing CY - Montreal AN - OPUS4-5486 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - X-Ray Refraction Topography and Computed Tomography for NDE of Lightweight Materials T2 - 9th European Conference on NDT CY - Berlin, Germany DA - 2006-09-25 KW - Synchrotron Refraction CT KW - MMC KW - Bragg-Magnification PY - 2006 SN - 3-931381-86-2 SP - 1(?) EP - 9(?) PB - European Federation for Non-Destructive Testing CY - Berlin AN - OPUS4-13703 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Röntgen-Interface-Radiographie im Dunkelfeld N2 - Es wird ein Verfahren zur Röntgenabbildung schwach absorbierender Objekte vorgestellt. Als kontrastgebender Effekt wird die Röntgenrefraktion an Ober- und Grenzflächen ausgenutzt. Zur Erzeugung eines sogenannten Dunkelfeldes wird ein schwach gekrümmter Transmissionskristall eingesetzt, der lokal, d.h. in einem kleinen Ausschnitt des Einstrahlquerschnitts, die Bragg-Bedingung erfüllt. Innerhalb dieser Zone erscheinen die durch Refraktion abgelenkten Strahlkomponenten als hell leuchtende Interface-Strukturen. Die Synthese mehrerer Dunkelfeldstreifen ergibt hochaufgelöste 2D Beispiel von biologischen und technischen Mikrostrukturen. T2 - DGZfP-Jahrestagung 2013 CY - Dresden, Germany DA - 06.05.2013 KW - Refraction enhanced imaging (REI) KW - Radiographie KW - Dunkelfeldabbildung KW - Röntgenrefraktion PY - 2013 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-286900 SN - 978-3-940283-49-8 IS - Di.3.C.1 SP - 1 EP - 7 PB - Deutsche Gesellschaft für zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-28690 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Refraktions-Interface-Radiographie T2 - DGZfP-Jahrestagung 2013 CY - Dresden, Germany DA - 2013-05-06 KW - Röntgenrefraktion KW - Kleinwinkelstreuung KW - Refraktionstopographie KW - Nanostrukturen PY - 2013 SN - 978-3-940283-49-8 IS - Mo.2.A.2 SP - 1 EP - 10 AN - OPUS4-28691 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - Einfaches Korrigieren des Hinterleuchtens von Röntgendetektoren N2 - Hinterleuchten stellt eine oft unerkannte Fehlweisung in der radiographischen Abbildung mit Flächendetektoren dar, die durch diffuse Umverteilung der Intensität verursacht wird. Dieser Effekt kann die korrekte Transmissions-Intensität eines Probekörpers gemäß dem Lambert-Beer'schen Gesetz erheblich verfälschen. Hinterleuchten wird sowohl mit Bremsstrahlung von Röntgenröhren als auch mit monochromatischer Synchrotronstrahlung beobachtet. Die fehlerhaft reduzierten Schwächungskoeffizienten von einigen 10 % korrelieren mit der Strahlschwächung und dem direkt bestrahlten Detektorbereich. Für eine einfache numerische Korrektur des Hinterleuchtens werden lediglich integrale Intensitätswerte benötigt. KW - Hinterleuchten KW - Röntgendetektor KW - Fluoreszenzschirm KW - Radiographie PY - 2013 DO - https://doi.org/10.3139/120.110478 SN - 0025-5300 VL - 55 IS - 7-8 SP - 1 EP - 5 PB - Hanser CY - München AN - OPUS4-28692 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - A comfortable procedure for correcting X-ray detector backlight N2 - A novel approach is suggested to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals 'backlighting' of 2D X-ray detectors. Depending on the detector geometry the mechanism may be different. Either based on the optical scattering of the fluorescent screen materials into the optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer's law in single projections (radiographs) as a function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2013 DO - https://doi.org/10.1088/1742-6596/425/19/192015 SN - 1742-6588 SN - 1742-6596 VL - 425 IS - 19 SP - 192015-1 EP - 192015-4 PB - IOP Publ. CY - Bristol, UK AN - OPUS4-28262 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Correction of diffuse X-ray detector based background N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (“backlight”) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the sample’s aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation. Moreover, the local intensity mismatch depends on the attenuation of the sample. We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism. T2 - DIR 2011 - International symposium on digital industrial raidology and computed tomography CY - Berlin, Germany DA - 20.06.2011 KW - Backlight KW - X-ray detector KW - Fluorescence screen KW - Synchrotron radiography KW - Computed tomography PY - 2011 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-243589 SN - 978-3-940283-34-4 IS - DGZfP-BB 128 (Poster 24) SP - 1 EP - 7 PB - Deutsche Gesellscahft für Zerstörungsfreie Prüfung e.V. (DGZfP) AN - OPUS4-24358 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - Korrektur des Hinterleuchtens an CT-Synchrotrondaten N2 - In den unterschiedlichsten Methoden der Computertomographie tritt häufig ein diffuses Untergrundsignal in den Einzelprojektionen auf: im Falle der Parallelstrahl-CT mit Synchrotronstrahlung handelt es sich um ein Hinterleuchten durch den Fluoreszenzschirm, der vor der CCD-Kamera angeordnet ist. Dieses Hinterleuchten unterscheidet sich von dem bekannten Nachleuchten (Phosphoreszenz) durch zeitliche Konstanz. Hier äußert sich das Hinterleuchten als Modulation der projizierten Masse und somit als Funktion der Phase (Projektionswinkel) und des Aspektverhältnisses des Objektes. Der Einfluss des Hinterleuchtens ist abhängig von der Größe des von der Probe abgeschatteten Detektorbereiches und des Objektumfangs (Dynamik). Dies hat u.a. zur Folge, dass Abweichungen vom Absorptionsgesetz auftreten, die umso stärker ausgeprägt sind, je weniger Detektorfläche das Objekt abdeckt und je stärker das Objekt schwächt. Dabei können Aufhärtungseffekte wegen der monochromatischen Strahlung ausgeschlossen werden. Mit Referenzmessungen und einem isotropen, homogenen Ansatz, der diese Abweichung als Hinterleuchten beschreibt, lassen sich die auftretenden Fehler deutlich verringern. T2 - DGZfP-Jahrestagung 2011 CY - Bremen, Germany DA - 30.05.2011 KW - Hinterleuchten KW - Detektor KW - Fluoreszenzschirm KW - Synchrotron-Radiographie KW - Computer-Tomographie PY - 2011 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-250038 SN - 978-3-940283-33-7 IS - DGZfP-BB 127 (P6) SP - 1 EP - 8 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) AN - OPUS4-25003 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas T1 - Numerische Korrektur des Hinterleuchtens von Röntgendetektoren N2 - Eine neuartige Korrektur artefaktisch gemessener Intensitäten von Röntgenflachdetektoren wird vorgeschlagen. Die betrachteten Artefakte betreffen eine diffuse Umverteilung der Intensität und führen zu beträchtlichen Verfälschungen der wahren Schwächung und verletzen mithin das Lambert-Beer'sche Gesetz. Sie werden sowohl in Laborexperimenten mit Röntgenröhren (polychromatische Einstrahlung) als auch mit monochromatischer Synchrotronstrahlung bei Einsatz indirekt konvertierender Detektionssysteme (Fluoreszenzschirm, Optik, CCD-Chip) beobachtet. Dieser Effekt wird als Hinterleuchten bezeichnet. In der vorgestellten Studie werden mittels wohldefinierter Randbedingungen Gesetzmäßigkeiten des Hinterleuchtens untersucht: durch Einsatz monochromatischer Strahlung können Aufhärtungseffekte als Ursache ausgeschlossen werden. Das Hinterleuchten ist umso stärker ausgeprägt, je weniger Detektorfläche vom Objekt abdeckt wird und je stärker das Objekt schwächt. Mit Blick auf Tomographien ergibt sich eine Modulation der 'Dichte' als Funktion des Projektionswinkels, deren Amplitude mit dem Objektumfang steigt (Dynamik). Der isotrope und homogene Ansatz zur numerischen Korrektur macht lediglich Gebrauch von Intensitätsmittelwerten und stellt die Gültigkeit des Schwächungsgesetzes in modifizierter Form wieder her. T2 - DACH-Jahrestagung 2012 CY - Graz, Austria DA - 2012-09-17 KW - Röntgendetektor KW - Hinterleuchten PY - 2012 SN - 978-3-940283-44-3 IS - DGZfP-BB 136 SP - P 13 / Mo.4.B, 1 EP - 7 AN - OPUS4-27737 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Numerical correction of X-ray detector backlighting N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering by the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert–Beer's law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation phase and the sample’s aspect ratio (dynamics). The magnitude of the diffuse background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shadowed area and the stronger the total attenuation. This implies that the reconstruction suffers from additional anisotropic artifacts caused by elongated sample structures. This issue is studied simply by absorption of flat plates in a conventional laboratory radiography set-up and at a synchrotron radiation facility. In the latter case beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure requires simple integral intensity offsets as a constant (non-local) light scattering mechanism is assumed. KW - Detector backlighting KW - X-ray detector scattering KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 DO - https://doi.org/10.3139/146.110659 SN - 1862-5282 VL - 103 IS - 2 SP - 174 EP - 178 PB - Carl Hanser CY - München AN - OPUS4-25553 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - X-Ray refraction computed tomography for NDE of lightweight materials T2 - Deutsche Tagung für Forschung mit Synchrotronstrahlung, Neutronen und Ionenstrahlen an Großgeräten 2006 (SNI2006) CY - Hamburg, Germany DA - 2006-10-04 PY - 2006 AN - OPUS4-15836 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Alpern, P. A1 - Tilgner, R. T1 - Sichere Automobil Elektronik durch nanogenaues Synchrotron-Prüfverfahren T2 - DGZfP Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - Synchrotron Laue Contrast Radiography PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 8 PB - DGZfP CY - Berlin AN - OPUS4-15837 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE T2 - International Symposium on Digital industrial Radiology and Computed Tomography (DIR 2007) CY - Lyon, France DA - 2007-06-25 KW - X-ray Refraction KW - Diffraction Enhanced Imaging (DEI) KW - Bragg Magnification KW - Synchrotron Radiation KW - Computed Tomography (CT) KW - Metal Matrix Composites (MMC) KW - Lightweight Materials KW - Aerospace PY - 2007 IS - CD-ROM SP - 1 EP - 8 CY - Lyon, France AN - OPUS4-16366 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Rack, A. A1 - Zabler, S. A1 - Müller, Bernd R. A1 - Riesemeier, Heinrich A1 - Weidemann, Gerd A1 - Lange, Axel A1 - Goebbels, Jürgen A1 - Hentschel, Manfred P. A1 - Görner, Wolf T1 - High resolution synchrotron-based radiography and tomography using hard X-rays at the BAMline (BESSY II) N2 - The use of high brilliance and partial coherent synchrotron light for radiography and computed tomography (CT) allows to image micro-structured, multi-component specimens with different contrast modes and resolutions up to submicrometer range. This is of high interest for materials research, life science and non-destructive evaluation applications. An imaging setup for microtomography and radiography installed at BESSY II (a third generation synchrotron light source located in Berlin, Germany) as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast — dedicated to inhouse research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. For imaging applications the synchrotron beam transmitted by the sample is converted with a scintillator into visible light. By use of microscope optics this luminescence image is then projected onto, e.g., a CCD chip. Several scintillating materials are used in order to optimise the performance of the detector system. Different optical systems are available for imaging ranging from a larger field of view and moderate resolutions (macroscope — up to 14 mm x 14 mm field of view) to high resolution (microscope — down to 0.35 μm pixel size), offering magnifications from 1.8× to 40×. Additionally asymmetric cut Bragg crystals in front of the scintillator can be used for a further magnification in one dimension by a factor of about 20. Slow and fast cameras are available, with up to 16 bit dynamic range. We show the suitability of the setup for numerous applications from materials research and life science. KW - Microtomography KW - Non-destructive evaluation KW - Synchrotron instrumentation KW - Coherent imaging KW - X-ray refraction KW - Phase contrast KW - Holotomography KW - Synchrotron-CT KW - Scintillator KW - Bragg magnification PY - 2008 DO - https://doi.org/10.1016/j.nima.2007.11.020 SN - 0168-9002 SN - 0167-5087 VL - 586 IS - 2 SP - 327 EP - 344 PB - North-Holland CY - Amsterdam AN - OPUS4-17738 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Harbich, Karl-Wolfram A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Schors, Jörg A1 - Wald, Oliver ED - Gerhard Busse, ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios T1 - NDE of micro structured materials by X-ray diffraction and refraction topography T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Nondestructive testing KW - X-ray scattering KW - X-ray topography KW - Computed topography KW - Synchrotron refraction computed tomography KW - Structure property relations KW - Composite damaging KW - Ceramics KW - Foams PY - 2007 SN - 978-0-415-46476-5 SP - 15 EP - 22 PB - Taylor & Francis CY - London, UK AN - OPUS4-17561 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen T1 - Synchrotron Refraction CT and Synchrotron Bragg Magnification CT for NDE N2 - X-ray refraction topography techniques are based on ultra-small angle scattering by micro-structural elements causing phase-related effects such as refraction and total reflection at a few minutes of arc as the refractive index of X-rays is nearly unity. The refraction contrast is several times higher than “true absorption” and results in images of cracks, pores and fibre debonding separations below the spatial resolution of the detector. In most cases the investigated inner surface and interface structures correlate to mechanical properties. For the exploration of micro structured materials the refraction technique has been improved by a 3D Synchrotron Refraction Computed Tomography test station. The specimen is placed in an X-ray beam between two single crystals, which suppresses all sample scattering. In addition, an asymmetric cut second crystal can magnify the image up to 50 times revealing nano meter resolution. The technique is an alternative to other attempts on raising the spatial resolution of CT machines. KW - X-ray refraction KW - Diffraction Enhanced Imaging (DEI) KW - Bragg magnification KW - Synchrotron radiation KW - Computed Tomography (CT) KW - Metal Matrix Composites (MMC) KW - Lightweight materials KW - Aerospace PY - 2008 DO - https://doi.org/10.1784/insi.2008.50.6.316 SN - 0007-1137 VL - 50 IS - 6 SP - 316 EP - 319 PB - British Institute of Non-Destructive Testing CY - Northampton AN - OPUS4-18001 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Tilgner, R. A1 - Alpern, P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. T1 - Package induced deformation of integrated circuits KW - Synchrotron Laue Contrast Radiography SLCR KW - Synchrotron Radiation KW - Electronic Power Device IC PY - 2007 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/infos/bessy/highlights2006.pdf#page=26 SN - 1611-6127 SP - 24 EP - 25 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-15797 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Schors, Jörg T1 - Das Anwendungspotential der Röntgen-Topographie vom Mikroriss bis zur Gepäckprüfung T2 - DGZfP-Jahrestagung 2007 CY - Fürth, Deutschland DA - 2007-05-14 KW - CFK KW - Bildgebende Röntgenverfahren KW - Röntgen-Topographie und -Streuung KW - Keramik KW - Explosivstoffe KW - Ermüdungsrisse PY - 2007 SN - 978-3-931381-98-1 SP - 1 EP - 9 PB - DGZfP CY - Berlin AN - OPUS4-15799 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Hamm, B. A1 - Rogalla, P. A1 - Diederichs, G. A1 - Issever, A.S. T1 - First Synchrotron Refraction CT of Cartilage KW - X-ray Refraction KW - Computed Tomography KW - DEI KW - Cartilage PY - 2008 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annual_report_2007-v2.pdf#page=292 SN - 0179-4159 SP - 292 EP - 296 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-17661 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Issever, A.S. A1 - Diederichs, G. A1 - Majumdar, S. A1 - Rogalla, P. A1 - Hamm, B.K. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Analyser-based tomography images of cartilage N2 - Analyser-based imaging expands the performance of X-ray imaging by utilizing not only the absorption properties of X-rays but also the refraction and scatter rejection (extinction) properties. In this study, analyser-based computed tomography has been implemented on imaging an articular cartilage sample, depicting substructural variations, without overlay, at a pixel resolution of 3.6 µm. KW - Cartilage KW - Analyser-based imaging KW - Computed tomography PY - 2008 DO - https://doi.org/10.1107/S0909049508014829 SN - 0909-0495 SN - 1600-5775 VL - 15 IS - Part 5 SP - 525 EP - 527 PB - Blackwell Publishing CY - Oxford AN - OPUS4-17852 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Schors, Jörg A1 - Müller, Bernd R. A1 - Harwardt, Michael T1 - Vom Synchrotron ins Labor - Konversion von Einkristall-Techniken für Röntgenröhren KW - Einkristall KW - Röntgenbeugung KW - Synchrotron KW - Divergenz PY - 2008 SN - 0025-5300 VL - 50 IS - 10 SP - 580 EP - 587 PB - Hanser CY - München AN - OPUS4-18248 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Submikro-Computer-Tomographie an der BAMline T2 - Jahrestagung Zerstörungsfreie Materialprüfung 2004 CY - Salzburg, Österreich DA - 2004-05-17 KW - Computer Tomographie KW - Vergrößerung mit asymmetrischen Kristallen PY - 2004 UR - http://www.ndt.net/article/dgzfp04/papers/v09/v09.htm SN - 3-931381-55-2 SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-5869 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. T1 - Refraction computed tomography - Application to metal matrix composites N2 - Erstmals wurden MMCs mit Hilfe der Interface-Kontrast verstärkenden Röntgen-Refraktions-Technik in Kombination mit der 3D-CT-Technik untersucht. Die Methode der Röntgen-Refraktions-Topography sowie der Röntgen-Refraktions-Tomography wurden in den letzten Jahren speziell für die zerstörungsfreie Charakterisierung von Leichtbau-Hochleistungs-Werkstoffen wie Verbund-Werkstoffen und Keramiken entwickelt. Die Technik basiert auf der Refraktion von Röntgenlicht an Grenzflächen zwischen Bereichen unterschiedlicher Elektronendichte wie z.B. Faser- und Matrix-Werkstoff. Auf Grund der kurzen Röntgen-Wellenlänge hat der Brechungsindex einen Wert dicht bei eins, sodass der Streuwinkel nur wenige Bogenminuten beträgt. Der Vorteil der kurzen Wellenlänge besteht jedoch darin, dass Poren und Risse detektiert werden können, deren Größe im Nanometerbereich liegen. Damit kann die Refraktions-Technik zum besseren Verständnis von Mikro- und Submikro-Strukturen in der Materialwissenschaft eingesetzt werden. Mit der hier vorgestellten Refraktions-CT wurden Ermüdungsmechanismen an MMCs, bestehend aus SiC-Faser verstärktem Titan (Ti6242) untersucht. Die Messungen wurden am Röntgen-Messplatz der BAM (BAMline) am Synchrotron-Speicherring-BESSY in Berlin Adlershof durchgeführt. KW - X-ray refraction KW - Computed tomography PY - 2004 DO - https://doi.org/10.3139/120.100592 SN - 0025-5300 VL - 46 IS - 6 SP - 314 EP - 319 PB - Carl Hanser Verlag CY - München AN - OPUS4-5870 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Characterization of metal composites by synchrotron-refraction-CT KW - Synchrotron Refraction CT PY - 2005 UR - http://www.helmholtz-berlin.de/media/media/oea/web/pr_webseite/druckschriften/berichte/bessy/annualreport2004.pdf#page=483 SN - 0179-4159 SP - 483 EP - 485 PB - Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung CY - Berlin AN - OPUS4-7381 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Harwardt, Michael A1 - Lange, Axel T1 - Synchrotron-Refraktions-Computer Tomographie für die Materialforschung T2 - DGZfP Jahrestagung CY - Rostock, Deutschland DA - 2005-05-02 KW - Computer-Tomographie KW - Synchrotronstrahlung KW - Refraktionskontrast KW - Bragg-Vergrößerung PY - 2005 SN - 3-931381-64-1 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - 94-CD SP - 1(?) EP - 7(?) PB - DGZfP CY - Berlin AN - OPUS4-11698 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Wald, Oliver T1 - Quantitative X-ray Determination of CFRP Micro Structures T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - Neutronen-Radiographie KW - Neutronen-Tomographie KW - Tomographische Rekonstruktionsalgorithmen KW - Brennstoffzellen KW - In-Situ Radiologie PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (X-Ray/Lecture 13) SP - 89 EP - 98 PB - DGZfP CY - Berlin AN - OPUS4-18606 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron Based Micro-CT and Refraction Enhanced Micro-CT of MMC T2 - International Symposium on NDT in Aerospace CY - Fürth, Germany DA - 2008-12-03 KW - X-ray Refraction KW - Synchrotron Radiation KW - Computed Tomography KW - Metal Matrix Composites KW - Lightweight Materials KW - Aerospace PY - 2008 SN - 978-3-940283-12-2 N1 - Serientitel: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. – Series title: Berichtsband / Deutsche Gesellschaft für zerstörungsfreie Prüfung e. V. IS - DGZfP-BB 114 (Poster 10) SP - 295 EP - 305 PB - DGZfP CY - Berlin AN - OPUS4-18607 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael T1 - Synchrotron-Refraktions-Computertomografie - eine neue Methode zur Erkennung von Grenzflächen N2 - Röntgenstrahlung eignet sich besonders gut zur zerstörungsfreien Charakterisierung von Werkstoffen. Mit ihrer Hilfe lassen sich z. B. Risse und Poren in Werkstoffen erkennen. Die Risserkennbarkeit ist jedoch von der Rissgröße im Vergleich zum Auflösungsvermögen des Detektors abhängig. Risse, Poren oder Einschlüsse können in Radiogrammen nur dann erkannt werden, wenn sie größer sind als das Detektorelement, das die Röntgenstrahlen registriert. Das hier vorgestellte neuartige Synchrotron-Refraktions-Computertomografie-Verfahren ist jedoch in der Lage, auch Risse zu erkennen, deren Größe weit unterhalb des Auflösungsvermögens des Detektors liegt. Das Verfahren basiert auf dem bisher wenig genutzten Phänomen der Kleinwinkelstreuung durch Brechung von Röntgenstrahlen an den inneren Grenzflächen mikroskopisch strukturierter Objekte. Durch den Vergleich zwischen absorptionsbasierter und refraktionsbasierter Computertomografie-Untersuchungen mit Synchrotronstrahlung an einer geschädigten Faserverbundprobe wird das Potenzial der Synchrotron-Refraktions-Computertomografie demonstriert. KW - Synchrotronstrahlung KW - Refraktion KW - Diffraktion KW - Kleinwinkelstreuung KW - Materialcharakterisierung KW - Zerstörungsfrei PY - 2008 SN - 0025-5300 VL - 50 IS - 10 SP - 588 EP - 594 PB - Hanser CY - München AN - OPUS4-18657 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. ED - Paul Sellin, T1 - Refraction enhanced micro-CT for non-destructive materials characterization T2 - IEEE Nuclear Science Symposium CY - Dresden, Germany DA - 2008-10-19 KW - Synchrotron KW - Micro-CT KW - Refraction PY - 2008 SN - 978-1-4244-2715-4 SN - 1082-2654 SP - 541 EP - 546 AN - OPUS4-18662 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron-Refraktions-Computer-Tomographie - EIne neue Methode zur Erkennung von Grenzflächen T2 - DGZfP-Jahrestagung 2009 CY - Münster, Deutschland DA - 2009-05-18 KW - Synchrotronstrahlung KW - Refraktion KW - Diffraktion KW - Kleinwinkelstreuung KW - Materialcharakterisierung KW - Zerstörungsfrei PY - 2009 SN - 978-3-940283-16-0 IS - DGZfP-BB 115 (Di.1.A.1) SP - 1 EP - 11 AN - OPUS4-20609 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Müller, Bernd R. T1 - Rekonstruktion unvollständiger computertomografischer Modelldatensätze mit Directt-Algorithmus N2 - Modellrechnungen zur Rekonstruktion unvollständiger computertomographischer Datensätze werden zur Ermittlung der Vorteile des neuen Directt-Algorithmus gegenüber der konventionellen gefilterten Rückprojektion durchgeführt, insbesondere auch zur Vermeidung experimentell begründeter Unwägbarkeiten. Ein entsprechender Bedarf entsteht seitens erweiterter Forschungsaktivitäten und industrieller Bedürfnisse, wo die Rekonstruktion limitierter Messdatensätze von Artefakten dominiert wird. Die bekanntesten Einschränkungen betreffen das Limited-View- und Few-Angles-Problem sowie die ROI-Situation, die jeweils unabhängig voneinander untersucht werden, in der Anwendung jedoch zumeist undefiniert vermischt sind, wie etwa in der Elektronen-Tomografie. Die hochauflösende Rekonstruktion von Einzelpixeln wird durch die Wahl eines kleinen Modells von nur 1012 Pixeln visualisiert und ist ohne Filterung möglich. Rekonstruktionen von 90°-Sektoren oder 50 % -ROI-Querschnitten sind fast ohne Auflösungseinschränkungen realisierbar. Die bisher nicht bekannte Möglichkeit, auch außerhalb der ROI präzise zu rekonstruieren, wurde als "Extended ROI"-Methode erfolgreich erprobt. KW - Computed tomography KW - Reconstruction algorithm KW - Filtering KW - Limited view KW - Region of interest PY - 2010 SN - 0025-5300 VL - 52 IS - 10 SP - 668 EP - 675 PB - Hanser CY - München AN - OPUS4-22068 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Kupsch, Andreas ED - Kastner, J. T1 - A comfortable procedure for correcting X-ray detector backlight T2 - Conference on industrial computed tomography CY - Wels, Austria DA - 2012-09-19 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 SN - 978-3-8440-1281-1 SN - 1610-4773 SP - 151 EP - 157 PB - Shaker CY - Aachen AN - OPUS4-26768 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Straightforward correction of X-ray detector backlighting N2 - A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer’s law in single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray detector backlighting KW - Radiography KW - Fluorescent screen KW - Diffuse background KW - Computed tomography PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/205_wcndtfinal00205.pdf SN - 978-0-620-52872-6 SP - 1 EP - 8(?) AN - OPUS4-25835 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Hentschel, Manfred P. T1 - Edge artefacts of radiographic images by X-ray refraction N2 - The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of high intensity and may reach the level of the primary beam. We present monochromatic synchrotron measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the reliability of laboratory refraction scanners applying X-ray tubes. T2 - 18th WCNDT - World conference on nondestructive testing CY - Durban, South Africa DA - 2012-04-16 KW - X-ray refraction KW - Small angle scattering KW - Phase contrast radiography KW - Refraction topography KW - Nanostructures KW - Nanocracks PY - 2012 UR - http://www.ndt.net/article/wcndt2012/papers/274_wcndtfinal00274.pdf SN - 978-0-620-52872-6 SP - 1 EP - 11(?) AN - OPUS4-25836 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite diesel particulate filter materials, part 1 X-ray refraction N2 - Bi-continuous porous ceramics for filtration applications possess a particularly complicated microstructure, with porosity and solid matter being intermingled. Mechanical, thermal, and filtration properties can only be precisely estimated if the morphology of both solid matter and porosity can be quantitatively determined. Using x-ray absorption and refraction, we quantitatively evaluate porosity and pore orientation in cordierite diesel particulate filter ceramics. Porosity values turn out to agree with mercury intrusion measurements, while pore orientation factors agree with published crystallographic texture data. KW - Porous ceramics KW - Pore orientation KW - X-ray refraction KW - Synchrotron KW - Interface PY - 2013 DO - https://doi.org/10.4416/JCST2013-00021 SN - 2190-9385 VL - 4 IS - 4 SP - 169 EP - 176 PB - Göller CY - Baden-Baden AN - OPUS4-29939 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Laquai, René A1 - Schaupp, Thomas A1 - Griesche, Axel A1 - Müller, Bernd R. A1 - Kupsch, Andreas A1 - Hannemann, Andreas A1 - Kannengießer, Thomas A1 - Bruno, Giovanni T1 - Quantitative analysis of hydrogen-assisted microcracking in duplex stainless steel through X-ray refraction 3D imaging N2 - While the problem of the identification of mechanisms of hydrogen assisted damage has and is being thoroughly studied, the quantitative analysis of such damage still lacks suitable tools. In fact, while, for instance, electron microscopy yields excellent characterization, the quantitative analysis of damage requires at the same time large field-of-views and high spatial resolution. Synchrotron X-ray refraction techniques do possess both features. In this work, we show how synchrotron X-ray refraction computed tomography (SXRCT) can quantify damage induced by hydrogen embrittlement in a lean duplex steel, yielding results that overperform even those achievable by synchrotron X-ray absorption computed tomography. As already reported in literature, but this time using a non-destructive technique, we show that the hydrogen charge does not penetrate to the center of tensile specimens. By the comparison between virgin and hydrogen-charged specimens, we deduce that cracks in the specimen bulk are due to the rolling process rather than hydrogen-assisted. We show that (micro)cracks propagate from the surface of tensile specimens to the interior with increasing applied strain, and we deduce that a significant crack propagation can only be observed short before rupture. KW - 2101 duplex stainless steel KW - Hydrogen embrittlement KW - Synchrotron radiation KW - X-ray refraction KW - Computed tomography KW - Microcracking PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-542811 DO - https://doi.org/10.1002/adem.202101287 SN - 1438-1656 SP - 1 EP - 10 PB - Wiley-VCH CY - Weinheim AN - OPUS4-54281 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Onel, Yener A1 - Lange, Axel A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Wolk, Thomas A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite Diesel particulate filter materials, Part 2 statistical analysis of computed tomography data N2 - Complementary to Part 1 of this work, the bi-continuous microstructure of porous synthetic cordierite ceramics for filtration applications was investigated using 3D x-ray computed tomography at different resolutions. Applying both Fast Fourier Transform and a newly developed image analysis algorithm, we quantitatively evaluated porosity and pore orientation. The statistical approach allows extraction of spatially resolved or average values. Porosity values based on x-ray absorption agree with mercury intrusion measurements, while pore orientation factors agree with x-ray refraction data (Part 1 of this work), and with published crystallographic texture data. KW - Pore orientation KW - Porous ceramics KW - Computed tomography KW - 3D microstructure PY - 2013 DO - https://doi.org/10.4416/JCST2013-00022 SN - 2190-9385 VL - 05 IS - 01 SP - 13 EP - 22 PB - Göller CY - Baden-Baden AN - OPUS4-30379 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - DIRECTT-Rekonstruktionen im Vergleich zur gefilterten Rückprojektion N2 - Anhand von computertomografischen Messungen und Modellrechnungen werden DIRECTT-Rekonstruktionen im Vergleich mit gefilterten Rückprojektionen bewertet. Dazu wird die Rekonstruktionsqualität mittels einer zirkular erweiterten Modulations-Transfer-Funktion (MTF) und mit integralen Kenngrößen im Radon- und im Ortsraum verglichen. Zur Überprüfung der Rekonstruktionsgenauigkeit experimenteller Daten werden Mustermessungen einfacher Probengeometrien unter definierten physikalischen Bedingungen durchgeführt. Diese beinhalten die Monochromasie, die Unterdrückung von Kantenartefakten und die radiometrische Intensitätsbestimmung. Für die Qualität der Rekonstruktionen mittels DIRECTT erweisen sich sowohl unterschiedliche Rekonstruktionsfilter als auch der Verzicht auf jede Filterung als unerheblich, im Gegensatz zur gefilterten Rückprojektion. KW - Computertomografie KW - Gefilterte Rückprojektion KW - Rekonstruktionsalgorithmen KW - Iterative Rekonstruktion KW - DIRECTT KW - Konvergenz KW - Modulations-Transfer-Funktion (MTF) PY - 2014 UR - http://www.hanser-elibrary.com/doi/pdf/10.3139/120.110610 SN - 0025-5300 VL - 56 IS - 9 SP - 709 EP - 715 PB - Hanser CY - München AN - OPUS4-31378 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Ehrig, Karsten A1 - Haarring, Holger A1 - Harwardt, Michael A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Meinel, Dietmar A1 - Müller, Bernd R. A1 - Onel, Yener A1 - Staude, Andreas A1 - Wolk, Thomas T1 - Industrial and synchrotron X-ray CT applications for materials characterisation N2 - The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces. T2 - iCT Conference 2014 - Conference on industrial computed tomography CY - Wels, Austria DA - 25.02.2014 KW - X-ray absorption and refraction CT KW - Quantitative image analysis KW - Statistical analysis KW - Complex microstructure PY - 2014 SN - 978-3-8440-2557-6 SP - 15 EP - 31 PB - Shaker CY - Aachen AN - OPUS4-30484 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Direkte Röntgenrefraktion an Mikrostrukturen N2 - Die durch Brechung an Mikrostrukturen abgelenkte Röntgenstrahlung wird direkt zweidimensional abgebildet. Dazu werden Modellproben einfacher Geometrie (Fasern, Kapillaren, monodisperse Nano- und Mikropartikel) mit einem auf 50 µm kollimierten Synchrotronstrahl (20 keV) gescannt. Die nach den Regeln der geometrischen Optik an prismatischen und linsenartigen Grenzflächen abgelenkte Strahlung wird in etwa 3 Metern Entfernung von einem Flächendetektor mit 7 µm Ortsauflösung zusätzlich zu der ungestörten Resttransmission des Primärstrahls registriert. In der Abfolge der Radiogramme werden die lokalen Orientierungsänderungen der Probekörper-Grenzflächen bei deren Abtastung mit wenigen Mikrometern Schrittweite bildhaft verfolgt. Mit der hier erreichten Winkelauflösung von etwa 3 Bogensekunden (Streuvektor-Inkremente Δk = 10-3nm-1) kann bei 50 µm Ortsauflösung das Materialvolumen bezüglich innerer Grenzflächen mit Nanometer-Separation auch bei hohen Abtastraten unterhalb einer Sekunde pro Bild charakterisiert werden. T2 - DGZfP-Jahrestagung 2014 CY - Potsdam, Germany DA - 26.05.2014 KW - Computertomographie (CT) KW - Rekonstruktionsalgorithmus KW - DIRECTT KW - Missing wedge KW - Statistische Bewertung PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-312931 UR - http://www.ndt.net/article/dgzfp2014/papers/di1b2.pdf SN - 978-3-940283-61-0 IS - DGZfP-BB 148 SP - Di.1.B.2, 1 EP - 9 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-31293 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Bruno, Giovanni A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Bewertung von Porositätsparametern in Cordierit-Diesel-Partikelfilter-Materialien mit fortgeschrittenen Röntgenverfahren und statistischer Analyse N2 - Bikontinuierliche poröse Keramiken für Filteranwendungen weisen eine komplizierte Mikrostruktur auf, in der Poren und Festkörperphase 'vermischt' sind. Mechanische, thermische sowie Filtereigenschaften können nur präzise bestimmt werden, wenn die Morphologie beider Phasen quantitativ angegeben werden kann. Hier werden unter Anwendung von 3D Computertomographie (CT) und verschiedenen Techniken, die auf der Röntgenrefraktion basieren, die Porosität und die Porenorientierung in keramischen Cordierit-Dieselpartikelfiltern bewertet. Dabei werden zur Auswertung der Tomogramme die Fouriertransformierten sowie eine neu entwickelte richtungssensitive Bildanalyse (DIVA, directional interface variance analysis) angewandt. Sowohl die genannten Messtechniken als auch der statistische Ansatz gestatten die Extraktion optional ortsaufgelöster oder gemittelter Werte. Es ergeben sich sehr gute Übereinstimmungen der experimentell ermittelten Porositätswerte mit Ergebnissen aus Quecksilberintrusionsversuchen als auch der ermittelten Porenorientierung im Vergleich zu publizierten Angaben zur kristallographischen Textur. Dies legt den Schluss nahe, dass die Kenntnis der Grenzflächen (zwischen Poren und Materie) genügt, die morphologischen Eigenschaften solcher Materialien hinreichend zu beschreiben. T2 - DGZfP-Jahrestagung 2014 CY - Potsdam, Germany DA - 26.05.2014 KW - Cordierit KW - Poröse Keramik KW - Porenorientierung KW - Röntgenrefraktion KW - Computer-Tomographie KW - 3D-Mikrostruktur PY - 2014 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-312946 SN - 978-3-940283-61-0 VL - 148 SP - 1 EP - 8 PB - Deutsche Gesellschaft für Zerstörungsfreie Prüfung (DGZfP) CY - Berlin AN - OPUS4-31294 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods N2 - Bi-continuous porous ceramics for filtration applications possess a particularly complicated microstructure, whereby porosity and solid matter are intermingled. Mechanical, thermal, and filtration properties can only be precisely estimated if the morphology of both solid matter and porosity can be quantitatively determined. Using 3D computed tomography (CT) at different resolutions, and several X-ray refraction-based techniques, we quantitatively evaluated porosity and pore orientation in cordierite diesel particulate filter ceramics.Moreover, applying both Fast Fourier Transform (FFT) and a newly developed image analysis algorithm (directional interface variance analysis, DIVA), we quantitatively evaluated porosity and pore orientation. Both the experimental techniques and the statistical approach allow extraction of spatially resolved or average values.Porosity values from synchrotron computed tomography used turn out to agree with mercury intrusion measurements, while pore orientation factors agree with published crystallographic texture data. This latter point also implies that the study of the pore/matter interface is sufficient to describe the morphological properties of these materials. KW - Diesel particulate filters KW - DIVA Algorithm KW - Pore Orientation KW - Porous Ceramics KW - X-Ray Computed Tomography KW - X-Ray Refraction PY - 2014 DO - https://doi.org/10.4028/www.scientific.net/AST.91.64 SN - 1662-0356 VL - 91 SP - 64 EP - 69 PB - Techna CY - Faenza AN - OPUS4-32069 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni A1 - Onel, Yener A1 - Wolk, Thomas A1 - Staude, Andreas A1 - Ehrig, Karsten A1 - Müller, Bernd R. T1 - Evaluating porosity in cordierite diesel particulate filter materials: advanced X-ray techniques and new statistical analysis methods T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 2014-10-06 KW - Porous ceramics KW - Diesel particulate filters KW - Pore orientation KW - X-ray computed tomography KW - X-ray refraction KW - DIVA algorithm KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transform KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 8(?) AN - OPUS4-31973 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Direct X-ray refraction of micro structures N2 - For the first time we present direct 2D imaging of refracted X-rays without any discrimination of the Primary radiation. X-refraction works in analogy to visible light optics: X-rays are entirely deflected at interfaces where discontinuities of (electron) density occur. This is demonstrated at the example of inner and outer surfaces of model samples of well-defined geometry (fibres, capillaries, and monodisperse micro particles). The samples are scanned through a 50 μm monochromatic (20 keV) pencil beam. In order to warrant a sufficient angular resolution a 2D detector (pixel size 7 μm) is placed 3 m downstream of the sample. Scanning the sample in micron steps allows for detecting local changes of interface / surface orientation directly in two dimensions. At the actual angular resolution of about 3 seconds of arc (scattering vector increments Δk = 10-3 nm-1) and 50 μm spatial resolution (scanning) the material’s inner surfaces (with nanometer separation) can be characterized even at sampling rates below 1 second per frame. Moreover, our technique is suited to directly determine particle diameters of up to 250 nm by means of diffraction fringes. Some potential applications to technical submicron structures are discussed. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Phase contrast KW - Edge artefact KW - Soft matter radiography KW - Wavelet transformation KW - Huygens elementary waves PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 9 AN - OPUS4-31970 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Kupsch, Andreas A1 - Hentschel, Manfred P. A1 - Lange, Axel A1 - Müller, Bernd R. T1 - X-ray dark field imaging N2 - A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented. Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they yield enhanced contrast based on deflected X-rays. Here, we introduce a REI modification, which works with a slightly bent single crystal reflecting in Bragg geometry. The samples are placed upstream of the thin crystal within a parallel synchrotron beam. The crystal’s curvature creates a dark-field stripe in the transmission image, similar to the inverse of a Darwin-Prins rocking curve of plane crystals. The reflection condition is met better or worse as a steady function of incidence position. Refracted beam portions of sample interfaces appear bright on black stripes. The entire image is finally synthesized by multiple dark-field stripes. The technique is an alternative to the mentioned techniques. We demonstrate the technique’s advantage by examples of biological and technical microstructures. T2 - ECNDT 2014 - 11th European conference on non-destructive testing CY - Prague, Czech Republic DA - 06.10.2014 KW - X-ray refraction KW - Refraction enhanced imaging (REI) KW - Phase contrast KW - Radiology KW - Soft matter radiography PY - 2014 SN - 978-80-214-5018-9 SP - 1 EP - 7 AN - OPUS4-31971 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - GEN A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Marco A1 - Hentschel, Manfred P. A1 - Illerhaus, Bernhard A1 - Goebbels, Jürgen A1 - Bamberg, J. A1 - Heutling, F. ED - Danny Van Hemelrijck, ED - Igor Solodov, ED - Anastasopoulos, Athanasios ED - Gerhard Busse, T1 - Synchrotron-Refraction-Computed-Tomography for NDT and characterisation of lightweight composite materials T2 - 4th International Conference of Emerging Technologies in Non-Destructive Testing (ETNDT 4) CY - Stuttgart, Germany DA - 2007-04-02 KW - Refraction KW - Computed Tomography KW - NDE KW - Ti-MMC PY - 2008 SN - 978-0-415-46476-5 SP - 217 EP - 221 PB - Taylor & Francis CY - London, UK AN - OPUS4-18680 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Hentschel, Manfred P. A1 - Müller, Bernd R. T1 - Improved computed tomography by variable desmearing - Model reconstructions by iterative DIRECTT algorithm N2 - Die mitunter erhebliche Verschmierung von computertomograpischen Projektionen durch ausgedehnte Strahlenquellen wird durch eine neuartige Entschmierungsprozedur erheblich reduziert, um eine verbesserte Ortsauflösung der Rekonstruktion zu erreichen. Da die Breite der Verschmierungsfunktion der detektornahen und -fernen Objektelemente sich erheblich unterscheiden kann, muss die Entschmierung variabel sein. Im Gegensatz zu einer für alle Voxel-Positionen identischen Entfaltung, also einer grundsätzlich falschen Voraussetzung, wurde eine implizite Entschmierung entwickelt. Die vorab bekannte positionsabhängige Verschmierung wird auf die iterativ wiederholten Projektionen der Teilrekonstruktionen des DIRECTT-Algorithmus angewandt. Die variabel entschmierten Rekonstruktionen aus den Sinogrammen eines Pixelmodells mit Verschmierungen von 1 bis 5 Pixel erreichen eine Ortsauflösung von nahezu einem Pixel. KW - Computertomographie KW - Neutronen-Tomographie KW - Tomographische Rekonstruktionsalgorithmen PY - 2010 SN - 0025-5300 VL - 52 IS - 6 SP - 394 EP - 400 PB - Hanser CY - München AN - OPUS4-21464 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Characterization of metal matrix composites by synchrotron refraction computed topography KW - Metal matrix composites KW - Refraction KW - Synchrotron radiation KW - Computed tomography KW - Analyzer based imaging KW - Diffraction enhanced imaging PY - 2010 DO - https://doi.org/10.4028/www.scientific.net/MSF.638-642.967 SN - 0255-5476 VL - 638-642 SP - 967 EP - 972 PB - Trans Tech Publications CY - Aedermannsdorf, Switzerland AN - OPUS4-20563 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Harwardt, Michael A1 - Hentschel, Manfred P. T1 - Synchrotron-based micro-CT and refraction-enhanced micro-CT for non-destructive materials characterisation N2 - X-ray computed tomography is an important tool for non-destructively evaluating the 3-D microstructure of modern materials. To resolve material structures in the micrometer range and below, high brilliance synchrotron radiation has to be used. The Federal Institute for Materials Research and Testing (BAM) has built up an imaging setup for micro-tomography and -radiography (BAMline) at the Berliner storage ring for synchrotron radiation (BESSY). In computed tomography, the contrast at interfaces within heterogeneous materials can be strongly amplified by effects related to X-ray refraction. Such effects are especially useful for materials of low absorption or mixed phases showing similar X-ray absorption properties that produce low contrast. The technique is based on ultra-small-angle scattering by microstructural elements causing phase-related effects, such as refraction and total reflection. The extraordinary contrast of inner surfaces is far beyond absorption effects. Crack orientation and fibre/matrix debonding in plastics, polymers, ceramics and metal-matrix-composites after cyclic loading and hydro-thermal aging can be visualized. In most cases, the investigated inner surface and interface structures correlate to mechanical properties. The technique is an alternative to other attempts on raising the spatial resolution of CT machines. KW - Refraction KW - Computed tomography KW - NDE KW - Ti-MMC KW - Lightweight materials KW - Metal matrix composites KW - Synchrotron radiation KW - X-ray refraction PY - 2009 DO - https://doi.org/10.1002/adem.200800346 SN - 1438-1656 VL - 11 IS - 6 SP - 435 EP - 440 PB - Wiley-VCH Verl. CY - Weinheim AN - OPUS4-20564 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Bruno, Giovanni A1 - Kannengießer, Thomas T1 - 3D imaging of hydrogen assisted cracking using analyser-based imaging N2 - To better understand the mechanism of hydrogen assisted cracking (HAC), it is important to investigate the 3D structure of the cracks non-destructively. Since, cracks introduced by HAC are usually very small, conventional x-ray imaging methods often lack the required spatial resolution. However, the detection of those cracks can be enhanced by taking advantage of refraction at interfaces within the sample. To image this refractive deflection we employ analyser based imaging (ABI). In this work we aim at proving the enhanced crack detection of ABI by investigating an alluminum alloy weld. T2 - BESSY User Meeting 2015 CY - Berlin, Germany DA - 09.12.2015 KW - X-ray refraction KW - Synchrotron KW - Analyser-based imaging KW - Hydrogen assisted cracking KW - Welding PY - 2015 AN - OPUS4-38278 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Britzke, Ralf A1 - Bruno, Giovanni A1 - Müller, Bernd R. A1 - Hentschel, M. P. T1 - Talbot- Lau interferometry with a non- binary phase grating for non-destructive testing N2 - Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect. At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems. We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes. Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries. T2 - 19th World Conference on Non-Destructive Testing 2016 CY - Munich, Germany DA - 13.06.2016 KW - Talbot- Lau interferometry KW - Phase grating KW - Non-destructive testing PY - 2016 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-383163 SP - Tu_3_G_2, 1 EP - 9 AN - OPUS4-38316 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Müller, Bernd R. A1 - Bruno, Giovanni T1 - Improving the visibility of phase gratings for Talbot-Lau X-ray imaging N2 - Talbot-Lau interferometry provides X-ray imaging techniques with significant enhancement of the radiographic contrast of weakly absorbing objects. The grating based technique allows separation of absorption, refraction and small angle scattering effects. The different efficiency of rectangular and triangular shaped phase gratings at varying detector distances is investigated. The interference patterns (Talbot carpets) are modeled for parallel monochromatic radiation and measured by synchrotron radiation. In comparison to rectangular shapes of phase gratings much higher visibility is obtained for triangular shapes which yield enhanced contrast of a glass capillary test specimen. KW - Visibility KW - Talbot-Lau interferometry KW - Phase grating KW - Synchrotron imaging KW - X-ray reefraction PY - 2016 DO - https://doi.org/10.3139/120.110948 SN - 0025-5300 VL - 58 IS - 11-12 SP - 970 EP - 974 PB - Carl Hanser Verlag CY - München AN - OPUS4-38422 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Laquai, René A1 - Schaupp, Thomas A1 - Müller, Bernd R. A1 - Griesche, Axel A1 - Bruno, Giovanni A1 - Kannengießer, Thomas T1 - 3D imaging of hydrogen assisted cracking in metals using refraction enhanced synchrotron CT N2 - Hydrogen in metals can cause a degradation of the mechanical properties with possible subsequent hydrogen assisted cracking (HAC). Though, the mechanism of HAC is not completely understood yet and thus suitable methods for in situ investigations to characterise the crack formation are needed. X-ray computed tomography (CT) is a well-known tool for analysing these properties. However, the effective resolution of the detector system limits the detection of small defects by CT. Analyser based imaging (ABI) takes advantage of x-ray refraction at interfaces between volumes of different density, i.e. of cracks, pores, inclusions, etc., within the sample to detect defects smaller than the resolution of the detector system. In this study, measurements on an aluminium alloy weld showed that ABI allows us to resolve the 3D structure of cracks undetected by absorption based CT. Prospective investigations will analyse HAC in steels. T2 - NDT-CE 2015 - International symposium non-destructive testing in civil engineering CY - Berlin, Germany DA - 2015-09-15 KW - Wasserstoffversprödung KW - Wasserstoffunterstützte Rissbildung KW - Röntgenrefraktion KW - CT KW - Hydrogen embrittlement (HE) KW - Hydrogen assisted cracking (HAC) KW - Aluminium alloy KW - X-ray refraction KW - Analyser based imaging KW - Computed tomography (CT) KW - Synchrotron radiation PY - 2015 SN - 1435-4934 SP - 1217 EP - 1224 AN - OPUS4-34287 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Léonard, Fabien A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Bruno, Giovanni T1 - X-ray refraction techniques for fast, high-resolution microstructure characterization and non-destructive testing of lightweight composites N2 - X-ray refraction is based on optical deflection of X-rays, similar to the well-known small angle X-ray scattering, but hundreds of times more intense, thus enabling shorter measurement time. We show that X-ray refraction techniques are suitable for the detection of pores, cracks, and in general defects. Indeed, the deflected X-ray intensity is directly proportional to the internal specific surface (i.e., surface per unit volume) of the objects. Although single defects cannot be imaged, the presence of populations of those defects can be detected even if the defects have sizes in the nanometer range.We present several applications of X-ray refraction techniques to composite materials:- To visualize macro and microcracks in Ti-SiC metal matrix composites (MMC);- To correlate fatigue damage (fibre de-bonding) of carbon fibre reinforced plastics (CFRP) to X-ray refraction intensity;- To quantify the impact damage by spatially resolved single fibre de-bonding fraction as a function of impact energy in CFRP laminates.An example of classic high-resolution computer tomography of an impact-damaged CFRP will also be presented, as a benchmark to the present state-of-the-art imaging capabilities. It will be shown that while (absorption) tomography can well visualize and quantify delamination, X-ray refraction techniques directly yield (spatially resolved) quantitative information about fibre de-bonding, inaccessible to absorption tomography. KW - X-ray KW - Synchrotron radiation KW - Refraction KW - Metal matrix composites KW - Delamination KW - Fiber de-bonding PY - 2015 DO - https://doi.org/10.4028/www.scientific.net/MSF.825-826.814 SN - 0255-5476 VL - 825-826 SP - 814 EP - 821 PB - Trans Tech Publications CY - Aedermannsdorf, Switzerland AN - OPUS4-33265 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Kupsch, Andreas A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Bruno, Giovanni T1 - Microstructure Characterization of Ceramics via 2D and 3D X-Ray Refraction Techniques N2 - 3D imaging techniques are very fashionable nowadays, and allow enormous progress in understanding ceramic microstructure, its evolution, and its link to mechanical, thermal, and transport properties. In this feature article, we report the use of a powerful, yet not so wide-spread, set of X-ray techniques based on refraction effects. X-ray refraction allows determining internal specific surface (surface per unit volume) in a non-destructive fashion, position and orientation sensitive, and with a nanometric detectability. While the techniques are limited by the X-ray absorption of the material under investigation, we demonstrate showcases of ceramics and composite materials, where understanding of process parameter influence or simply of microstructural parameters could be achieved in a way unrivalled even by high-resolution techniques such as electron microscopy or computed tomography. KW - X-ray refraction KW - Porosity KW - Specific surface KW - Crack detection KW - Composites PY - 2017 DO - https://doi.org/10.1016/j.jeurceramsoc.2016.12.031 SN - 0955-2219 SN - 1873-619X VL - 37 IS - 5 SP - 1879 EP - 1889 PB - Elsevier CY - Amsterdam AN - OPUS4-39094 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Axel A1 - Vogler, M. A1 - Grathwohl, P. A1 - Kocher, B. A1 - Braun, Ulrike T1 - Analysis of tire wear particles in soil samples from roadside using TED-GC/MS N2 - Tire wear particles (TW) are generated by the abrasions of tires on the road surface through traffic. These particles can be transported by air and surface runoff and might also infiltrate the soil and consequently affect terrestrial ecosystems. The estimated tire wear (TW) emissions are immense, with 1.33 106 t a-1 in Europe. Despite this, only little is known about the environmental contents or the fate of TW. One reason for this knowledge gap is the challenging analysis of TW in environmental samples. Detection of TW with spectroscopic methods is problematic due to high fluorescence interferences caused by contained black carbon. One analytical approach is to use zinc (Zn), a typical additive in tires, as a specific marker for the quantification of tire wear. However, any Zn originating from the sample matrix must be separated beforehand and requires elaborate sample preparation. Car tires consist partly of synthetic rubbers, such as styrene-butadiene-rubber (SBR). This SBR could be identified and quantified via Thermal-Extraction-Desorption-Gas Chromatography-Mass Spectrometry (TED-GC-MS). This newly developed and fast screening method allows the simultaneous detection of microplastics and TW mass contents and requires minimal to no sample preparation. Firstly the sample is thermally extracted in a thermobalance under a nitrogen atmosphere. The resulting specific decomposition products are sorbed on a solid phase adsorber, which is then transferred to a GC-MS via an autosampler, where the products are desorbed, separated and identified. Cyclohexenylbenzene is used as a specific marker for SBR. Here we investigated top layer soil samples, collected at the roadside of highly frequented German highways. Samples were analyzed without sample preparation, and SBR was detected in all investigated samples in mass contents ranging from 67.2 to 2230 mg kg-1. A correlation between SBR and Zn content in the soil was confirmed, while the correlation between SBR and Corg was hardly pronounced. We successfully demonstrated the application of TED-GC-MS as a screening method for tire wear in soil samples. The present study will discuss these analytical results in detail as well as sampling parameters like sampling depth and distance to the roadside, and the effect of the particle size on the particle transport by water runoff and air. T2 - SETAC 2020 SciCon CY - Online meeting DA - 03.05.2020 KW - Microplastic KW - Analysis KW - Tire wear KW - Soil PY - 2020 AN - OPUS4-51086 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Axel A1 - Goedecke, Caroline A1 - Eisentraut, Paul A1 - Piechotta, Christian A1 - Braun, Ulrike T1 - Microplastic analysis using chemical extraction followed by LC‑UV analysis: a straightforward approach to determine PET content in environmental samples N2 - Background: The ubiquitous occurrence of microplastic particles in marine and aquatic ecosystems was intensively investigated in the past decade. However, we know less about the presence, fate, and input paths of microplastic in terrestrial ecosystems. A possible entry path for microplastic into terrestrial ecosystems is the agricultural application of sewage sludge and solid bio-waste as fertilizers. Microplastic contained in sewage sludge also includes Polyethylene terephthalate (PET), which could originate as fiber from textile products or as a fragment from packaging products (foils, bottles, etc.). Information about microplastic content in such environmental samples is limited yet, as most of the used analytical methods are very time-consuming, regarding sample preparation and detection, require sophisticated analytical tools and eventually need high user knowledge. Results: Here, we present a simple, specific tool for the analysis of PET microplastic particles based on alkaline extraction of PET from the environmental matrix and subsequent determination of the monomers, terephthalic acid, using liquid chromatography with UV detection (LC-UV). The applicability of the method is shown for different types of PET in several soil-related, terrestrial environmental samples, e.g., soil, sediment, compost, fermentation residues, but also sewage sludge, suspended particles from urban water management systems, and indoor dust. Recoveries for model samples are between 94.5 and 107.1%. Limit of determination and limit of quantification are absolute masses of 0.031 and 0.121 mg PET, respectively. In order to verify the measured mass contents of the environmental samples, a method comparison with thermal extraction-desorption-gas chromatography–mass spectrometry (TED-GC/MS) was conducted. Both methods deliver similar results and corroborated each other. PET mass contents in environmental samples range from values below LOQ in agriculture soil up to 57,000 mg kg−1 in dust samples. Conclusions: We demonstrate the potential of an integral method based on chemical extraction for the Determination of PET mass contents in solid environmental samples. The method was successfully applied to various matrices and may serve as an analytical tool for further investigations of PET-based microplastic in terrestrial ecosystems. KW - Soil KW - Analysis KW - Microplastic KW - PET KW - LC-UV PY - 2020 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-509060 DO - https://doi.org/10.1186/s12302-020-00358-x IS - 32 SP - 85 PB - Springer Open CY - Berlin AN - OPUS4-50906 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Evsevleev, Sergei A1 - Müller, Bernd R. A1 - Osenberg, Markus A1 - Manke, Ingo A1 - Hentschel, Manfred P. A1 - Bruno, Giovanni T1 - Optimizing the visibility of X-ray phase grating interferometry N2 - The performance of grating interferometers coming up now for Imaging interfaces within materials depends on the efficiency (visibility) of their main component, namely the phase grating. Therefore, experiments with monochromatic synchrotron radiation and corresponding simulations are carried out. The visibility of a Phase grating is optimized by different photon energies, varying detector to grating distances and continuous rotation of the phase grating about the grid lines. Such kind of rotation changes the projected grating shapes, and thereby the distribution profiles of phase shifts. This yields higher visibilities than derived from ideal rectangular shapes. By continuous grating rotation and variation of the propagation distance, we achieve 2D visibility maps. Such maps provide the visibility for a certain combination of grating orientation and detector position. Optimum visibilities occur at considerably smaller distances than in the standard setup. KW - Synchrotron, BAMline KW - Talbot-Lau interferometer KW - X-ray imaging KW - X-ray refraction KW - Grating interferometry KW - X-ray phase contrast PY - 2017 DO - https://doi.org/10.3139/120.111097 SN - 0025-5300 VL - 59 IS - 11-12 SP - 974 EP - 980 PB - Hanser Verlag AN - OPUS4-42955 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Bernd R. A1 - Cooper, R.C. A1 - Lange, Axel A1 - Kupsch, Andreas A1 - Wheeler, M. A1 - Hentschel, Manfred P. A1 - Staude, Andreas A1 - Pandey, A. A1 - Shyam, A. A1 - Bruno, Giovanni T1 - Stress-induced microcrack density evolution in β-eucryptite ceramics: Experimental observations and possible route to strain hardening N2 - In order to investigate their microcracking behaviour, the microstructures of several β-eucryptite ceramics, obtained from glass precursor and cerammed to yield different grain sizes and microcrack densities, were characterized by laboratory and synchrotron x-ray refraction and tomography. Results were compared with those obtained from scanning electron microscopy (SEM). In SEM images, the characterized materials appeared fully dense but computed tomography showed the presence of pore clusters. Uniaxial tensile testing was performed on specimens while strain maps were recorded and analyzed by Digital Image Correlation (DIC). X-ray refraction techniques were applied on specimens before and after tensile testing to measure the amount of the internal specific surface (i.e., area per unit volume). X-ray refraction revealed that (a) the small grain size (SGS) material contained a large specific surface, originating from the grain boundaries and the interfaces of TiO2 precipitates; (b) the medium (MGS) and large grain size (LGS) materials possessed higher amounts of specific surface compared to SGS material due to microcracks, which decreased after tensile loading; (c) the precursor glass had negligible internal surface. The unexpected decrease in the internal surface of MGS and LGS after tensile testing is explained by the presence of compressive regions in the DIC strain maps and further by theoretical arguments. It is suggested that while some microcracks merge via propagation, more close mechanically, thereby explaining the observed X-ray refraction results. The mechanisms proposed would allow the development of a strain hardening route in ceramics. KW - Beta-eucryptite KW - Microcracked ceramics KW - X-ray refraction KW - Tensile load KW - Strain hardening KW - Synchrotron KW - BAMline KW - Computed Tomography KW - CT PY - 2018 UR - http://www.sciencedirect.com/science/article/pii/S1359645417308881 DO - https://doi.org/10.1016/j.actamat.2017.10.030 SN - 1359-6454 SN - 1873-2453 VL - 144 IS - Supplement C SP - 627 EP - 641 PB - Elsevier B.V. AN - OPUS4-43024 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Shashev, Yury A1 - Kupsch, Andreas A1 - Lange, Axel A1 - Evsevleev, Sergei A1 - Britzke, Ralf A1 - Bruno, Giovanni A1 - Müller, Bernd R. T1 - Talbot-Lau Röntgen-Interferometrie für die zerstörungsfreie Prüfung N2 - Im vergangenen Jahrzehnt sind gitterinterferometrische Röntgenabbildungen zunehmend in den Fokus des Interesses gerückt. Sie sind insbesondere dann Vorteil, wenn der in der Standardradiographie erreichbare Kontrast nicht genügt, schwach absorbierende Mikro- und Nanostrukturen abzubilden. Auf Kosten mehrerer Aufnahmen gestattet die Talbot-Lau Gitterinterferometrie, die Beiträge aus Absorption, Refraktion und (refraktiver) Streuung zu trennen. Dazu werden die Störungen der Interferenzmuster von Phasengittern ausgewertet. Im Gegensatz zu einer Vielzahl anderer refraktionsbasierter Abbildungsmethoden kann diese Technik mit konventionellen Röntgenröhren (mit divergenter, polychromatischer Strahlung) angewendet werden. Damit ist die Technik geeignet, typische ZfP-Fragestellungen zu lösen. Hier stellen wir Untersuchungen zur Effizienz von Phasengittern vor. Die Visibilität (d.h. die Höhe der Oszillation im Interferenzmuster) wird als Funktion verschiedener geometrischer Parameter verfolgt. Eine Rotation um die Achse parallel zu den Gitterstegen ändert die Form des Gitterprofils (d.h. die Verteilung der Phasenschiebungen). Die kontinuierliche Variation des Winkels und des Detektionsabstandes führt zur Identifikation von ausgezeichneten Kombinationen mit maximaler Visibilität, wobei die Abstände deutlich geringer sind als im Standardaufbau mit senkrechter Gitterbestrahlung. Unsere Studie umfasst Simulationen für monochromatische Quelle und den Vergleich zu experimentellen Ergebnissen mit der Synchrotronstrahlung. In der Literatur wurden die Vorteile der Talbot-Lau Interferometrie für die zerstörungsfreie Prüfung von Faserkompositen und Verbundwerkstoffen demonstriert. Hier werden als Beispiele Messungen an Aluminiumtitanat (Al2TiO5) Pulver gezeigt. T2 - DGZfP 2017 CY - Koblenz, Germany DA - 22.05.2017 KW - Gitterinterferometrische Röntgenabbildung KW - Phasengitter KW - Talbot-Lau Interferometrie KW - Zerstörungsfreie Prüfung PY - 2017 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-404691 SP - 1 EP - 10 PB - DGZfP AN - OPUS4-40469 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Evsevleev, Sergei A1 - Müller, Bernd R. A1 - Lange, Axel A1 - Kupsch, Andreas T1 - Refraction driven X-ray caustics at curved interfaces N2 - X-ray refraction related interaction has received rising interest since about two decades in the field of imaging, beam shaping and analysis although being discovered a century ago. Due to refraction at interfaces in inhomogeneous media X-rays undergo natural focusing (or defocusing) of waves, revealing caustics. Such Kind of intensity patterns are well-known for visible light, but have been sparsely discussed for X-rays. The Variation of irradiation density may be predicted in case of known shapes. Analogously to light optics, the intensity distributions cover several orders of magnitude including complete extinction. The partly convergent (and divergent) caustic stripes originate from narrow zones of typical size of some 10−6 of the boundary curvature radius. For the deflection of plane wave synchrotron radiation (energy in the range of some keV to some ten keV) at rods and tubes of several μm diameter, we find good Agreement between experiments and modeling by ray tracing according to Snell’s law without additional diffraction contributions. Apart from Basic Research implications, caustics may influence the performance of irradiation technologies such as sterilization or molecular cross-linking. KW - X-ray caustics KW - X-ray refraction KW - Irradiation KW - Radiation shielding KW - Synchrotron Radiation PY - 2019 UR - http://www.sciencedirect.com/science/article/pii/S0168900218314591 DO - https://doi.org/10.1016/j.nima.2018.10.152 SN - 0168-9002 SN - 1872-9576 VL - 916 SP - 275 EP - 282 PB - Elsevier AN - OPUS4-46924 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Axel A1 - Vogler, M. A1 - Grathwohl, P. A1 - Hollert, H. A1 - Braun, Ulrike T1 - Analysis of microplastics in soil samples by using a thermal decomposition method N2 - While plastics have become indispensable in our daily lives over the last decades, the input into the environment has been increasing concurrently. Plastics often end up in the environment because of intensive use and poor waste management practice. They are subjected to aging and fragmentation and finally be deposited as microplastic particles or in short microplastics (MP). MP are defined as particles originating from synthetic polymers between 1 µm and 5 mm. Although the pervasive abundance of MP in aquatic environments has been demonstrated comprehensively, less is known about the occurrence and fate of MP in terrestrial ecosystems. It is still unclear if soil functions as a MP source or a sink for aquatic environments. MP can either be transported into water bodies by soil erosion or be retained in soils. The few studies published are not comparable because of non-existent harmonized and standardized methods for sampling, sample preparation, and analysis. For an assessment of a potential exposure situation of MP, the determination of a mass content in the soil is crucial. Consequently, spectroscopic methods like Raman or FTIR are not suitable, as they deliver information about the shape and size of individual particles. Therefore, we show the application of ThermoExtractionDesorption-GasChromatography-MassSpectrometry (TED-GC-MS) for MP analysis in the soil. In this method, the soil sample is heated up to 600 °C in a nitrogen atmosphere. The decomposition gases are sorbed on a solid phase, then transferred to a GS-MS system where they are desorbed, separated and identified. The method allows the rapid identification of individual polymers through the detection of specific decomposition products, but also the quantitative determination of the MP mass. Besides thermoplastics, elastomers originated from tire abrasion, can be detected. In the present study, several terrestrial ecosystems in south-west Germany were systematically sampled. Subsequent sample preparation included sieving in fractions of 5-100 µm, 100-1000 µm, and 1-5 mm. MP were extracted by density separation using ZnCl2 solutions. The detection was done by TED-GC-MS measurements. Data of agricultural areas and floodplains are presented exemplarily. A quantitative assessment of highly occurring MP from littering as well as tire abrasion is conducted. T2 - EGU 2019 - European Geoscience Union General Assembly 2019 CY - Wien, Austria DA - 07.04.2019 KW - TED-GC-MS KW - Soil KW - Microplastics KW - Analysis PY - 2019 AN - OPUS4-47822 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Müller, Axel A1 - Altmann, Korinna A1 - Kocher, B. A1 - Braun, U. T1 - Determination of tire wear markers in soil samples and their distribution in a roadside soil N2 - Tire wear (TW) constitutes a significant source of microplastic in terrestrial ecosystems. It is known that particles emitted by roads can have an effect up to 100 m into adjacent areas. Here, we apply for the first-time thermal extraction desorption gas chromatography-mass spectrometry (TED-GC/MS) to determine TW in soil samples by detection of thermal decomposition products of styrene-butadiene rubber (SBR), without additional enrichment. Additionally, zinc contents were determined as an elemental marker for TW. Mixed soil samples were taken along three transects along a German motorway in 0.3, 2.0, and 5.0 m distance from the road. Sampling depths were 0–2, 2–5, 5–10, and 10–20 cm. Four fine fractions, 1 000–500, 500–100, 100–50, and <50 μm, were analyzed. TW contents based on SBR ranged from 155 to 15 898 mg kg−1. TW contents based on zinc were between 413 and 44 812 mg kg−1. Comparison of individual values of SBR and zinc reveals SBR as a more specific marker. Results confirm that most TW ends up in the topsoil within a 2 m distance. The sampling strategy resulted in representative data for a larger area. Standard deviations of quadruple TED-GC/MS determination of SBR were <10% for all grain size fractions. TED-GC/MS is a suitable analytical tool for determining TW in soil samples without the use of toxic chemicals, enrichment, or special sample preparation. KW - Microplastic KW - TED-GC/MS KW - Tire wear PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-543344 DO - https://doi.org/10.1016/j.chemosphere.2022.133653 VL - 294 SP - 1 EP - 8 PB - Elsevier Ltd. AN - OPUS4-54334 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Axel A1 - Braun, U A1 - Altmann, Korinna T1 - Representative sampling of roadside soil and determination of tire wear contents by TED-GC/MS N2 - The presentation describes microplastic findings from tyre wear near roads. Both the sampling and the analysis are presented. T2 - Mikroplastik Workshop der Hochschule Zittau CY - Online meeting DA - 25.11.2021 KW - Mikroplastik KW - Reifenabrieb KW - TED-GC/MS KW - Probennahme PY - 2021 AN - OPUS4-53831 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Axel A1 - Becker, Roland A1 - Braun, Ulrike A1 - Dorgerloh, Ute T1 - Einfluss der Alterung auf das Sorptionsverhalten von Mikroplastik, eine Laborstudie mit BTEX und Etherverbindungen N2 - Die Präsenz von Mikroplastik in aquatischen Ökosystemen ist ein globales Problem und steht zunehmend im Fokus der Öffentlichkeit. In mehreren Studien konnten Anreicherungen hydrophober, organischer Schadstoffe an MP nachgewiesen werden. Der Einfluss des Alterungszustandes der MP-Partikel auf das Sorptionsverhalten von hydrophoben organischen Substanzen ist nicht hinreichend geklärt. Ziel der vorliegenden Arbeit war die Untersuchung des Sorptionsverhaltens von Schadstoffen mit Bedeutung für limnische Gewässer an künstlich gealterten Partikeln relevanter Polymere. Das Modell verwendete die Aromaten Benzol, Toluol, Ethylbenzol und Xylol (BTEX) sowie Etherverbindungen. Diese Substanzen sind oder waren Bestandteile in unterschiedlichen Kraftstoffen und finden sich daher in vielen aquatischen Ökosystemen weltweit. Als Sorbentien kamen teilkristallines Polypropylen (PP) und amorphes Polystyrol (PS) in Form von Industriepellets zum Einsatz. Die Pellets wurden jeweils sowohl unbehandelt als auch mittels UV-Bestrahlung künstlich gealtert verwendet und mikroskopisch sowie mittels XPS, FTIR und DSC charakterisiert. Die Alterung führte bei PS zu einer verringerten Sorptionskapazität, während bei PP keine Veränderung im Sorptionsverhalten beobachtet wurde. T2 - Wasser 2017 - Jahrestagung der Wasserchemischen Gesellschaft CY - Donaueschingen, Germany DA - 22.05.2017 KW - Mikroplastik KW - Organische Schadstoffe KW - Sorption KW - Polypropylen Polystyrol PY - 2017 SN - 978-3-947197-01-9 SP - 1 EP - 606 PB - Gesellschaft Dt. Chemiker AN - OPUS4-40447 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - CONF A1 - Müller, Axel A1 - Becker, Roland A1 - Dorgerloh, Ute A1 - Braun, Ulrike T1 - Einfluss der Alterung auf das Sorptionsverhalten von Mikroplastik, eine Laborstudie mit BTEX und Etherverbindungen N2 - Mikroplastik (MP) findet sich in aquatischen Ökosystemen weltweit und es konnte gezeigt werden, dass hydrophobe organische Schadstoffe an MP angereichert werden. Es ist bekannt, dass teilkristalline und amorphe Polymere unterschiedliche Sorptionsver-halten aufweisen. Der Einfluss des Alterungszustandes der MP-Partikel auf das Sorptionsverhalten ist nicht hinreichend geklärt. In dieser Studie wurden amorphes Polystyrol (PS) und teilkristallines Polypropylen (PP) in Form von Industriepellets gezielt gealtert und mikroskopisch sowie mittels XPS, FTIR und DSC charakterisiert. Anschließend wurde in Batchexperimenten die Sorption von potenziell wassergefährdenden Kraftstoffbestandteilen (Ether und BTEX) an den Pellets mittels Headspace-Gaschromatografie untersucht. T2 - Wasser 2017 - Jahrestagung der Wasserchemischen Gesellschaft CY - Donaueschingen, Germany DA - 22.05.2017 KW - Mikroplastik KW - Alterung KW - Sorption KW - BTEX PY - 2017 AN - OPUS4-40445 LA - deu AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Lackmann, C. A1 - Velki, M. A1 - Šimić, A. A1 - Müller, Axel A1 - Braun, U. A1 - Ečimović, S. A1 - Hollert, H. T1 - Two types of microplastics (polystyrene-HBCD and car tire abrasion) affect oxidative stress-related biomarkers in earthworm Eisenia andrei in a time-dependent manner N2 - Microplastics are small plastic fragments that are widely distributed in marine and terrestrial environments. While the soil ecosystem represents a large reservoir for plastic, research so far has focused mainly on the impact on aquatic ecosystems and there is a lack of information on the potentially adverse effects of microplastics on soil biota. Earthworms are key organisms of the soil ecosystem and are due to their crucial role in soil quality and fertility a suitable and popular model organism in soil ecotoxicology. Therefore, the aim of this study was to gain insight into the effects of environmentally relevant concentrations of microplastics on the earthworm Eisenia andrei on multiple levels of biological organization after different exposure periods. Earthworms were exposed to two types of microplastics: (1) polystyrene-HBCD and (2) car tire abrasion in natural soil for 2, 7, 14 and 28 d. Acute and chronic toxicity and all subcellular investigations were conducted for all exposure times, avoidance behavior assessed after 48 h and reproduction after 28 d. Subcellular endpoints included enzymatic biomarker responses, namely, carboxylesterase, glutathione peroxidase, acetylcholinesterase, glutathione reductase, glutathione S-transferase and catalase activities, as well as fluorescence-based measurements of oxidative stress-related markers and multixenobiotic resistance activity. Multiple biomarkers showed significant changes in activity, but a recovery of most enzymatic activities could be observed after 28 d. Overall, only minor effects could be observed on a subcellular level, showing that in this exposure scenario with environmentally relevant concentrations based on German pollution levels the threat to soil biota is minimal. However, in areas with higher concentrations of microplastics in the environment, these results can be interpreted as an early warning signal for more adverse effects. In conclusion, these findings provide new insights regarding the ecotoxicological effects of environmentally relevant concentrations of microplastics on soil organisms. KW - Microplastics KW - Earthworms KW - Toxicity KW - Biomarker KW - oxidative stress PY - 2022 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-545423 DO - https://doi.org/10.1016/j.envint.2022.107190 VL - 163 SP - 1 EP - 12 PB - Elsevier Ltd. AN - OPUS4-54542 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -