TY - CONF A1 - Ewert, Uwe A1 - Beckmann, Jörg A1 - von Chrzanowski, Lars A1 - Brekow, Gerhard A1 - Brackrock, Daniel T1 - Time of flight diffraction (ToFD) with THz radiation - an alternative to the ultra sound - ToFD technique for non-metallic materials N2 - A time domain spectrometer in the range of 0.5–2 THz was used for time of flight (ToF) measurements of THz pulses for imperfection detection in non metallic materials. The measurements were performed in comparison to the established ultra sound pulse echo (PE) and time of flight diffraction (ToFD) technique. No coupling agent and no contact to the surface is required for THz ToFD measurements. Plastic test specimen with notches, voids and drilled side holes were used to study reflected and diffracted response signals. No major differences were observed between the UT and THz ToFD records for the first surface of the notches, voids and holes. Additionally to the UT records also signals were obtained from its back side and a second raw of holes. The THz measurement is fast and has the potential to substitute UT applications in some industrial areas. Within the German project 'Handheld' the potential for miniaturization of the time domain equipment is explored for efficient application. KW - Spectrometers KW - Ultrasonic diffraction KW - Acoustic signal processing KW - Voids (solid) KW - Terahertz time domain spectroscopy KW - Ultrasonic KW - Time of flight diffraction KW - Non destructive testing KW - Polymers PY - 2011 DO - https://doi.org/10.1063/1.3591898 SN - 0094-243X VL - 1335 SP - 541 EP - 548 PB - American Institute of Physics CY - Melville, NY, USA AN - OPUS4-23895 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -