TY - JOUR A1 - Bachmann, Marcel A1 - Carstensen, J. A1 - Bergmann, L. A1 - dos Santos, J. F. A1 - Wu, C. S. A1 - Rethmeier, Michael T1 - Numerical simulation of thermally induced residual stresses in friction stir welding of aluminum alloy 2024-T3 at different welding speeds N2 - The paper deals with a numerical finite element simulation of the residual stress evolution in friction stir welding of 6 mm thick aluminum alloy AA2024-T3. The transient thermal field during the welding process was calculated with the commercial code COMSOL Multiphysics 5.0. Therefore, a thermal-pseudo-mechanical (TPM) heat source was implemented. A subsequent mechanical simulation was performed with varying hardening models for different welding speeds of 60 and 300 mm/min. The influence of softening of the material, which was due to hardening precipitation dissolution associated to the heating, was also investigated. Experiments in terms of thermocouple measurements as well as Vickers hardness and X-ray measurements of the residual stresses were conducted and compared to numerically obtained results. A qualitatively as well as quantitatively good agreement was found for different applied welding speeds. KW - Friction stir welding KW - Residual stress KW - Finite element simulation KW - Thermal softening KW - Aluminum alloy 2024-T3 PY - 2017 DO - https://doi.org/10.1007/s00170-016-9793-8 SN - 0268-3768 SN - 1433-3015 VL - 91 SP - 1443 EP - 1452 PB - Springer CY - London AN - OPUS4-40511 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER - TY - JOUR A1 - Feltin, N. A1 - Crouzier, L. A1 - Delvallée, A. A1 - Pellegrino, F A1 - Maurino, V. A1 - Bartczak, D. A1 - Goenaga-Infante, H. A1 - Taché, O. A1 - Marguet, S. A1 - Testard, F. A1 - Artous, S. A1 - Saint-Antonin, F. A1 - Salzmann, Christoph A1 - Deumer, J. A1 - Gollwitzer, C. A1 - Koops, R. A1 - Sebaïhi, N. A1 - Fontanges, R. A1 - Neuwirth, M. A1 - Bergmann, D. A1 - Hüser, D. A1 - Klein, T. A1 - Hodoroaba, Vasile-Dan T1 - Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles N2 - The study described in this paper was conducted in the framework of the European nPSize project (EMPIR program) with the main objective of proposing new reference certified nanomaterials for the market in order to improve the reliability and traceability of nanoparticle size measurements. For this purpose, bimodal populations as well as complexly shaped nanoparticles (bipyramids, cubes, and rods) were synthesized. An inter-laboratory comparison was organized for comparing the size measurements of the selected nanoparticle samples performed with electron microscopy (TEM, SEM, and TSEM), scanning probe microscopy (AFM), or small-angle X-ray scattering (SAXS). The results demonstrate good consistency of the measured size by the different techniques in cases where special care was taken for sample preparation, instrument calibration, and the clear definition of the measurand. For each characterization method, the calibration process is described and a semi-quantitative table grouping the main error sources is proposed for estimating the uncertainties associated with the measurements. Regarding microscopy-based techniques applied to complexly shaped nanoparticles, data dispersion can be observed when the size measurements are affected by the orientation of the nanoparticles on the substrate. For the most complex materials, hybrid approaches combining several complementary techniques were tested, with the outcome being that the reliability of the size results was improved. KW - Certified reference nanomaterials KW - Traceable nanoparticle size measurements; KW - Hybrid metrology KW - Scanning probe microscopy KW - Small-angle X-ray scattering KW - Electron microscopy PY - 2023 UR - https://nbn-resolving.org/urn:nbn:de:kobv:b43-571902 DO - https://doi.org/10.3390/nano13060993 SN - 2079-4991 VL - 13 IS - 6 - Special Issue "Identification and Quantification of Nanomaterials" SP - 1 EP - 25 PB - MDPI CY - Basel, CH AN - OPUS4-57190 LA - eng AD - Bundesanstalt fuer Materialforschung und -pruefung (BAM), Berlin, Germany ER -